An image acquisition apparatus includes a measurement unit and a processing unit. The processing unit, for each coincidence event in which a first detector and a second detector perform coincidence detection of a pair of gamma-ray photons generated by an electron positron annihilation event in a positron emitting radionuclide, assuming that the gamma-ray photon arriving at one detector is a gamma-ray photon arriving without being Compton scattered in a subject, and the gamma-ray photon arriving at another detector is a gamma-ray photon arriving after being Compton scattered in the subject, determines a position at which the gamma-ray photon is Compton scattered in the subject based on a detection position and a detection time of the gamma-ray photon by each of the first detector and the second detector and a position of the positron emitting radionuclide.
G01T 1/29 - Mesure effectuée sur des faisceaux de radiations, p. ex. sur la position ou la section du faisceauMesure de la distribution spatiale de radiations
A height measurement apparatus includes: a light irradiation unit that irradiates a sample with irradiation light; a camera system that detects light from the sample irradiated with the irradiation light, and a control apparatus that calculates a height of the sample based on the wavelength information. The camera system includes an inclined dichroic mirror of which a transmittance and a reflectance change according to a wavelength in a predetermined wavelength range and which separates the light from the sample by transmitting and reflecting the light, a light detector that detects a reflected light quantity from light reflected by the inclined dichroic mirror, a light detector that detects a transmitted light quantity from light transmitted through the inclined dichroic mirror, and a processing unit that calculates the wavelength information based on a ratio between the reflected light quantity and the transmitted light quantity, to output the wavelength information.
G01B 11/06 - Dispositions pour la mesure caractérisées par l'utilisation de techniques optiques pour mesurer la longueur, la largeur ou l'épaisseur pour mesurer l'épaisseur
G01B 15/02 - Dispositions pour la mesure caractérisées par l'utilisation d'ondes électromagnétiques ou de radiations de particules, p. ex. par l'utilisation de micro-ondes, de rayons X, de rayons gamma ou d'électrons pour mesurer l'épaisseur
G01J 3/02 - SpectrométrieSpectrophotométrieMonochromateursMesure de la couleur Parties constitutives
G01J 9/00 - Mesure du déphasage des rayons lumineuxRecherche du degré de cohérenceMesure de la longueur d'onde des rayons lumineux
G02B 27/14 - Systèmes divisant ou combinant des faisceaux fonctionnant uniquement par réflexion
3.
POWER SOURCE SWITCHING DEVICE AND INSPECTION SYSTEM
An inspection system 1B inspects defect locations in a semiconductor sample 2, and comprises a power source switching device 10B, an OBIRCH analysis device 21, a light emission analysis power source 22, a heat generation analysis power source 23, a system control device 24, etc. The power source switching device 10B includes switches 11, 12, a switching control circuit 13B, an insulated power source 14B, and an insulated signal transmission unit 15. The switches 11, 12 select one from among the OBIRCH analysis device 21, the light emission analysis power source 22, and the heat generation analysis power source 23 to connect to the semiconductor sample 2. The insulated power source 14B is provided on a path supplying power from the system control device 24 to the switching control circuit 13B, and electrically insulates the system control device 24 and the switching control circuit 13B from each other. By having this configuration, it is possible to achieve an inspection system capable of performing inspection of defect locations in a semiconductor sample by OBIRCH analysis technology and other analysis technologies with high efficiency and low noise.
A dispersion measurement apparatus includes a pulse forming unit, a correlation optical system, a photodetection unit, and an operation unit. The pulse forming unit forms a light pulse train including a plurality of light pulses having time differences and center wavelengths different from each other from a measurement target light pulse output from a pulsed laser light source. The correlation optical system receives the light pulse train output from the pulse forming unit and outputs correlation light including a cross-correlation or an autocorrelation of the light pulse train. The photodetection unit detects a temporal waveform of the correlation light output from the correlation optical system. The operation unit estimates a wavelength dispersion amount of the pulsed laser light source based on a feature value of the temporal waveform of the correlation light.
G01J 3/453 - Spectrométrie par interférence par corrélation des amplitudes
G01J 11/00 - Mesure des caractéristiques d'impulsions lumineuses individuelles ou de trains d'impulsions lumineuses
G01M 11/00 - Test des appareils optiquesTest des structures ou des ouvrages par des méthodes optiques, non prévu ailleurs
H01S 3/00 - Lasers, c.-à-d. dispositifs utilisant l'émission stimulée de rayonnement électromagnétique dans la gamme de l’infrarouge, du visible ou de l’ultraviolet
An inspection device comprises circuitry configured to: acquire a first characteristic signal and a second characteristic signal each indicating electrical properties of an inspection target region in an object to be inspected to which a test voltage or a test current is applied; output a noise signal including noise included in the test voltage or the test current applied to the inspection target region; perform filtering on the noise signal; modify a parameter for the filtering in such a manner that a difference between noise included in the first characteristic signal and noise included in the noise signal after the filtering is reduced; perform a noise reduction to noise included in the second characteristic signal using the noise signal on which the filtering has been performed with the modified parameter.
This electron tube unit comprises: an electron tube; a first substrate to which the electron tube is electrically connected; and a second substrate to which at least part of a step-up circuit is provided. The first substrate and the second substrate are arranged spaced apart so as to at least partially overlap each other with one or more third substrates interposed therebetween, and each of the third substrates includes a conductive part for transmitting power supplied from the step-up circuit to the electron tube.
F21S 2/00 - Systèmes de dispositifs d'éclairage non prévus dans les groupes principaux ou , p. ex. à construction modulaire
F21V 23/00 - Agencement des éléments du circuit électrique dans ou sur les dispositifs d’éclairage
H01J 61/90 - Lampes conçues pour un fonctionnement exclusivement intermittent, p. ex. lampe-éclair
H01R 11/01 - Éléments de connexion individuels assurant plusieurs emplacements de connexion espacés pour des organes conducteurs qui sont ou qui peuvent être interconnectés de cette façon, p. ex. pièces d'extrémité pour fils ou câbles supportées par le fil ou par le câble et possédant des moyens pour faciliter la connexion électrique avec quelqu'autre fil, borne, ou organe conducteur, répartiteurs caractérisés par la forme ou par la disposition de l'interconnexion entre leurs emplacements de connexion
H01R 12/52 - Connexions fixes pour circuits imprimés rigides ou structures similaires se raccordant à d'autres circuits imprimés rigides ou à des structures similaires
H05B 41/18 - Circuits dans lesquels la lampe est alimentée par courant continu ou par courant alternatif à basse fréquence, p. ex. courant alternatif à 50 Hertz ayant un commutateur de démarrage
H05K 1/11 - Éléments imprimés pour réaliser des connexions électriques avec ou entre des circuits imprimés
H05K 1/14 - Association structurale de plusieurs circuits imprimés
H05K 3/36 - Assemblage de circuits imprimés avec d'autres circuits imprimés
This X-ray generation device comprises: an X-ray tube having an electron gun which generates an electron beam, a target which generates X-rays by collision of the electron beam therewith, and a vacuum housing which houses the electron gun and the target; an electron gun power supply part which supplies electric power to the electron gun; and a control part which, by controlling the electron gun power supply part, adjusts the focal spot diameter of the electron beam output from the electron gun. The control part controls the electron gun power supply part such that the focal spot diameter of the electron beam is made different between an actual use mode and a preliminary heating mode executed prior to the actual use mode, with the focal spot diameter of the electron beam in the preliminary heating mode being larger than the focal spot diameter of the electron beam in the actual use mode.
An optical comb control device (100) comprises: an optical comb generation unit (1) that generates an optical comb; an optical multiplexing unit (4) that multiplexes the optical comb and reference light having a prescribed reference wavelength; a light detection unit (5) that detects light multiplexed by the optical multiplexing unit (4) to detect a beat frequency between the optical comb and the reference light and a repetition frequency of the optical comb; a first control unit (6) that inputs the beat frequency detected by the light detection unit (5) and controls the repetition frequency such that the beat frequency is stabilized to a constant value; and a second control unit (7) that inputs the repetition frequency detected by the light detection unit (5) and controls an offset frequency of the optical comb such that the repetition frequency is stabilized to a constant value.
G02F 1/01 - Dispositifs ou dispositions pour la commande de l'intensité, de la couleur, de la phase, de la polarisation ou de la direction de la lumière arrivant d'une source lumineuse indépendante, p. ex. commutation, ouverture de porte ou modulationOptique non linéaire pour la commande de l'intensité, de la phase, de la polarisation ou de la couleur
G01J 9/00 - Mesure du déphasage des rayons lumineuxRecherche du degré de cohérenceMesure de la longueur d'onde des rayons lumineux
9.
METHOD, DEVICE, AND INFORMATION PROCESSING PROGRAM FOR DETERMINING NECROSIS CELL REGION
Disclosed are a method, device, and information processing program for determining a necrosis cell region in an object to be observed, using refractive-index distribution data pertaining to the object to be observed.
This method for manufacturing an optical integrated circuit comprises a detection step S01 for inputting inspection light L to an optical integrated circuit S having a structure including a waveguide Se and detecting the inspection light L output from the optical integrated circuit S, a calculation step S02 for calculating a feature amount of the time waveform or a feature amount of the wavelength spectrum of the inspection light L detected in the detection step S01; and a processing step S04 for performing refractive index adjustment processing to the waveguide Se on the basis of the result of comparison between the feature amount calculated in the calculation step S02 and a design value of a preset feature amount.
This blood glucose level measurement device comprises: an acquisition unit that outputs light to a living body and detects the light transmitted through the living body, thereby acquiring waveform calculation data for calculating an oxygenated hemoglobin waveform and a deoxygenated hemoglobin waveform; a phase difference calculation unit that calculates a temporal phase difference between the oxygenated hemoglobin waveform and the deoxygenated hemoglobin waveform; and a blood glucose level calculation unit that calculates the blood glucose level of the living body on the basis of the temporal phase difference. The acquisition unit is configured to be capable of executing first sampling for acquiring the waveform calculation data at a first sampling rate and second sampling for acquiring the waveform calculation data at a second sampling rate higher than the first sampling rate.
A61B 5/1455 - Mesure des caractéristiques du sang in vivo, p. ex. de la concentration des gaz dans le sang ou de la valeur du pH du sang en utilisant des capteurs optiques, p. ex. des oxymètres à photométrie spectrale
A61B 5/16 - Dispositifs pour la psychotechnieTest des temps de réaction
A61B 5/0245 - Mesure du pouls ou des pulsations cardiaques utilisant des capteurs engendrant des signaux électriques
An observation apparatus comprises an irradiation optical system 22, a scanning unit 3, an image-forming optical system 4, and an imaging device 5. The irradiation optical system 22 irradiates an observation object B with planar light L1. The scanning unit 3 moves the observation object B at a constant speed in a direction crossing the planar light L1, and allows the observation object B to pass through the irradiation surface La of the planar light L1. The image-forming optical system 4 has an observation axis P1 crossing the irradiation surface La, and forms an image from observation light L2 generated at the observation object B by irradiation with the planar light L1. Every time the observation object B moves by a prescribed distance, the imaging device 5 acquires image data D1 including an optical image of the observation light L2. The scanning unit 3 outputs, on the basis of the moving distance of a moving stage 33, position information S for determining the exposure start timing when the imaging device 5 acquires the image data D1.
This semiconductor device manufacturing method comprises: a first step for acquiring the thickness distribution of a first layer formed on a front surface of a wafer; a second step for forming a second layer by performing prescribed processing on the first layer; a third step for irradiating the wafer with light in a planar manner after the second step, imaging the light from the wafer, and deriving the distribution of a measurement parameter in the plane of the wafer on the basis of a signal related to the imaging; and a fourth step for deriving the thickness distribution of the second layer on the basis of the thickness distribution of the first layer acquired in the first step and the distribution of the measurement parameter derived in the third step.
A laser processing device includes a control unit, and the control unit executes a first process of controlling a laser irradiation unit according to a first processing condition set such that a modified region and a modified region are formed inside a wafer; a second process of identifying a state related to each of the modified regions, and of determining whether or not the first processing condition is proper; a third process of controlling the laser irradiation unit according to a second processing condition set such that the modified regions are formed and a modified region is formed between the modified regions in a thickness direction of the wafer inside the wafer; and a fourth process of identifying a state related to each of the modified regions, and of determining whether or not the second processing condition is proper.
B23K 26/53 - Travail par transmission du faisceau laser à travers ou dans la pièce à travailler pour modifier ou reformer le matériau dans la pièce à travailler, p. ex. pour faire des fissures d'amorce de rupture
B23K 26/03 - Observation, p. ex. surveillance de la pièce à travailler
B23K 103/00 - Matières à braser, souder ou découper
H01L 21/268 - Bombardement par des radiations ondulatoires ou corpusculaires par des radiations d'énergie élevée les radiations étant électromagnétiques, p. ex. des rayons laser
15.
METHOD FOR DETERMINING REGION OF CELL THAT HAS UNDERGONE PROGRAMMED CELL DEATH, DEVICE COMPRISING DETERMINATION UNIT, AND INFORMATION PROCESSING PROGRAM INCLUDING DETERMINATION STEP
Disclosed are a method, a device, and an information processing program for determining, by using refractive index distribution data pertaining to an object to be observed, the region of a cell that has undergone programmed cell death in the object to be observed.
G06V 20/69 - Objets microscopiques, p. ex. cellules biologiques ou pièces cellulaires
G16H 20/10 - TIC spécialement adaptées aux thérapies ou aux plans d’amélioration de la santé, p. ex. pour manier les prescriptions, orienter la thérapie ou surveiller l’observance par les patients concernant des médicaments ou des médications, p. ex. pour s’assurer de l’administration correcte aux patients
16.
DYE IMAGE ACQUISITION METHOD, DYE IMAGE ACQUISITION DEVICE, AND DYE IMAGE ACQUISITION PROGRAM
A dye image acquisition system 1 acquires C first fluorescence images (where C is an integer of 1 or larger) in a first image acquisition period by emitting C excitation light beams having a first wavelength distribution, acquires D second fluorescence images (where D is an integer of 1 or larger) in a second image acquisition period after the first image acquisition period by emitting D excitation light beams having a second wavelength distribution, generates, in a partial unmixing period, K pieces of first dye data (where K is an integer of 2 to C+D) partially indicating distributions of K dyes respectively, with regard to the C first fluorescence images, generates, in an unmixing period, K pieces of second dye data partially indicating distributions of K dyes, respectively, with regard to the D second fluorescence images, and also generates K dye images on the basis of the K pieces of first dye data and the K pieces of second dye data. At least a part of a partial unmixing process in the partial unmixing period is executed in parallel with the first image acquisition period or the second image acquisition period.
This blood glucose level measurement device comprises: a light output unit; a light detection unit that detects light output by the light output unit and transmitted through a living body; a temporal phase difference calculation unit that calculates the temporal phase difference between an oxygenated hemoglobin waveform and a deoxygenated hemoglobin waveform on the basis of the detection result from the light detection unit; a blood glucose level calculation unit that calculates the blood glucose level of the living body on the basis of the temporal phase difference calculated by the temporal phase difference calculation unit; and a blood glucose level calibration unit that calibrates the blood glucose level calculated by the blood glucose level calculation unit. The blood glucose level calibration unit carries out the calibration such that the blood glucose level calculated by the blood glucose level calculation unit during sleep of the living body or during a prescribed period or time after waking up from the sleep corresponds to a preset reference blood glucose level.
A61B 5/1455 - Mesure des caractéristiques du sang in vivo, p. ex. de la concentration des gaz dans le sang ou de la valeur du pH du sang en utilisant des capteurs optiques, p. ex. des oxymètres à photométrie spectrale
This blood glucose level measurement device comprises: a blood glucose level estimation unit that outputs light to a living body, detects light transmitted through the living body, calculates, on the basis of the result of the detection, a temporal phase difference between an oxygenated hemoglobin waveform relating to the oxygenated hemoglobin concentration of the blood in the living body and a deoxygenated hemoglobin waveform relating to the deoxygenated hemoglobin concentration of the blood in the living body, and calculates the blood glucose level of the living body on the basis of the calculated temporal phase difference; and a body movement detection unit that detects a parameter relating to body movement of the living body. In cases where the parameter detected by the body movement detection unit or the variation in the parameter is equal to or below a threshold value, the blood glucose level estimation unit stores the calculated blood glucose level in a storage unit.
A61B 5/1455 - Mesure des caractéristiques du sang in vivo, p. ex. de la concentration des gaz dans le sang ou de la valeur du pH du sang en utilisant des capteurs optiques, p. ex. des oxymètres à photométrie spectrale
A61B 5/11 - Mesure du mouvement du corps entier ou de parties de celui-ci, p. ex. tremblement de la tête ou des mains ou mobilité d'un membre
19.
Stabilized Diode Laser for Laser-Driven Light Source
A laser-driven light source includes a laser source that generates continuous wave sustaining light includes a diode laser that generates a CW laser beam at an output and an optical element optically coupled to the output of the diode laser. The optical element includes a region that passes a portion of the CW laser beam to the output of the laser source and a reflection region that reflects another portion of the CW laser beam back to the output of the diode laser. The reflection region is configured to select a spatial mode and wavelength of the laser beam generated by the diode laser, thereby generating the CW sustaining light with radiant flux and spectral shape that is stable as a function of time. A gas-filled bulb optically coupled to the output of the laser source such that the generated CW sustaining light sustains a CW plasma in the gas-filled bulb, thereby emitting light with radiant flux and spectral shape stable as a function of time.
H01S 5/40 - Agencement de plusieurs lasers à semi-conducteurs, non prévu dans les groupes
H05G 2/00 - Appareils ou procédés spécialement adaptés à la production de rayons X, n'utilisant pas de tubes à rayons X, p. ex. utilisant la génération d'un plasma
20.
METHOD FOR PRODUCING ALKALI VAPOR CELL AND ALKALI VAPOR CELL
A method for producing an alkali vapor cell includes a step of preparing a first member and a second member; a step of forming a first metal film on a surface of the first member; a step of forming a second metal film on a surface of the second member; a step of disposing a simple substance of the alkali metal; and a step of directly bonding the first metal film and the second metal film to each other in a normal temperature environment, in which in the step of forming the first metal film, the first metal film is formed so that a thickness of the first metal film is 100 nm or less, and in the step of forming the second metal film, the second metal film is formed so that a thickness of the second metal film is 100 nm or less.
G04F 5/14 - Appareils pour la production d'intervalles de temps prédéterminés, utilisés comme étalons utilisant des horloges atomiques
H03L 7/26 - Commande automatique de fréquence ou de phaseSynchronisation utilisant comme référence de fréquence les niveaux d'énergie de molécules, d'atomes ou de particules subatomiques
21.
METHOD FOR IMAGE PROCESSING, SYSTEM FOR IMAGE PROCESSING, PROGRAM FOR IMAGE PROCESSING, AND RECORDING MEDIUM
The present invention more accurately corrects blurring of a radiological image without actually measuring blurring for each imaging system. This method for image processing comprises: an acquisition step (S01) for acquiring information indicating the shape of the focal point of a radiation source included in an imaging system that performs imaging using radiation; and a blurring information generation step (S02) for, on the basis of the information acquired in the acquisition step, generating focal point blurring information indicating a response to radiation corresponding to the focal point of the radiation source in a radiological image obtained by imaging by an imaging system 20.
A61B 6/00 - Appareils ou dispositifs pour le diagnostic par radiationsAppareils ou dispositifs pour le diagnostic par radiations combinés avec un équipement de thérapie par radiations
A61B 6/42 - Agencements pour détecter des radiations spécialement adaptés au diagnostic par radiations
22.
IMAGE PROCESSING METHOD, IMAGE PROCESSING SYSTEM, IMAGE PROCESSING PROGRAM, AND RECORDING MEDIUM
The present invention corrects blur of a radiographic image more accurately without performing actual blur measurement on a per-imaging system basis. This image processing method comprises: an acquisition step (S01) for acquiring a radiographic image obtained through imaging using an imaging system that performs imaging using radiation and inference information, which is at least one of information related to the position of a subject of the imaging in the imaging direction, information related to a radiation source included in the imaging system, or information related to a radiation detector included in the imaging system; and a correction step (S02) for correcting blur of the radiographic image by inputting information based on the radiographic image and the inference information acquired to an inference model generated through machine learning training.
A61B 6/00 - Appareils ou dispositifs pour le diagnostic par radiationsAppareils ou dispositifs pour le diagnostic par radiations combinés avec un équipement de thérapie par radiations
A61B 6/42 - Agencements pour détecter des radiations spécialement adaptés au diagnostic par radiations
23.
WIND VELOCITY DETECTION DEVICE, WIND VELOCITY DETECTION METHOD, AND FLYING BODY CONTROL DEVICE
A wind velocity detection device 1 is provided with a control unit 15 that controls a state of measurement light Lm output from a measurement optical system 7 on the basis of a detection distance by the measurement light Lm, wherein the control unit 15 controls the measurement optical system 7 so that the measurement light Lm output into the atmosphere M is focused if the detection distance belongs to a short-distance range R1 at or below a first threshold T1, and controls the measurement optical system 7 so that the measurement light Lm output into the atmosphere M is made into parallel light if the detection distance belongs to a long-distance range R2 exceeding the first threshold T1.
G01S 17/95 - Systèmes lidar, spécialement adaptés pour des applications spécifiques pour la météorologie
G01S 7/481 - Caractéristiques de structure, p. ex. agencements d'éléments optiques
G01S 17/34 - Systèmes déterminant les données relatives à la position d'une cible pour mesurer la distance uniquement utilisant la transmission d'ondes continues, soit modulées en amplitude, en fréquence ou en phase, soit non modulées utilisant la transmission d'ondes continues modulées en fréquence, tout en faisant un hétérodynage du signal reçu, ou d’un signal dérivé, avec un signal généré localement, associé au signal transmis simultanément
24.
ANNEALING METHOD AND ANNEALING APPARATUS FOR CADMIUM TELLURIDE SERIES SEMICONDUCTOR CRYSTALS
The present application provides an annealing method and an annealing apparatus for cadmium telluride series semiconductor crystals, as well as a cadmium telluride series semiconductor crystal after annealing. The annealing method comprises: on the basis of a cadmium-containing chloride and/or an indium-containing chloride, preparing a molten-state annealing agent; and using the molten-state annealing agent to anneal a cadmium telluride series semiconductor crystal. In the present application, the molten-state annealing agent prepared from the cadmium-containing chloride and/or an indium-containing chloride is used for annealing, which can, during annealing, achieve Cd vacancy compensation and In element doping for the cadmium telluride series semiconductor crystal, thereby significantly improving the crystal quality uniformity, resistivity and carrier transport characteristics, and also reducing annealing time consumption, avoiding surface damage to the crystal, improving efficiency, and reducing energy consumption.
C30B 31/04 - Procédés de diffusion ou de dopage des monocristaux ou des matériaux polycristallins homogènes de structure déterminéeAppareillages à cet effet par contact avec la substance de diffusion à l'état liquide
A method for detecting a microcrack (34) generated on a surface (33) of a silicon substrate (32), the method comprising: detecting a height profile of the surface (33) of the silicon substrate (32) by using a quantitative phase microscope; extracting a raised region (35) of the surface (33) on the basis of the detected height profile; and identifying the extracted raised region (35) of the surface (33) as a region in which the microcrack (34) is present.
H01L 21/66 - Test ou mesure durant la fabrication ou le traitement
G01B 11/30 - Dispositions pour la mesure caractérisées par l'utilisation de techniques optiques pour mesurer la rugosité ou l'irrégularité des surfaces
G01N 21/88 - Recherche de la présence de criques, de défauts ou de souillures
26.
WIND SPEED DETECTION DEVICE, WIND SPEED DETECTION METHOD, AND FLYING BODY CONTROL DEVICE
A wind speed detection device 1 includes: an output unit 2 that outputs laser light L of which the frequency is nonlinearly and periodically modulated; a branching part 3 that branches the laser light L into measurement light Lm and reference light Lr; a first amplification unit (conversion unit) 5 that converts the measurement light Lm into pulsed light; a measurement optical system 7 that outputs the measurement light Lm into an atmosphere M and receives, as signal light Ls, scattered light Lf of the measurement light Lm in the atmosphere M; and a detection unit 9 that outputs a detection signal D based on an interference result between the reference light Lr and the signal light Ls.
A wind speed detection device 1 comprises: an output unit 2 that outputs laser light L having a frequency that is linearly modulated over time; a splitting unit 3 that splits the laser light L into measurement light Lm and reference light Lr; a first amplification unit (conversion unit) 5 that converts the measurement light Lm into pulse light; a measurement optical system 7 that outputs the measurement light Lm into the atmosphere M and receives scattered light Lf of the measurement light Lm in the atmosphere M as signal light Ls; and a detection unit 9 that outputs a detection signal D based on a result of interference between the reference light Lr and the signal light Ls.
G01S 17/95 - Systèmes lidar, spécialement adaptés pour des applications spécifiques pour la météorologie
G01S 17/34 - Systèmes déterminant les données relatives à la position d'une cible pour mesurer la distance uniquement utilisant la transmission d'ondes continues, soit modulées en amplitude, en fréquence ou en phase, soit non modulées utilisant la transmission d'ondes continues modulées en fréquence, tout en faisant un hétérodynage du signal reçu, ou d’un signal dérivé, avec un signal généré localement, associé au signal transmis simultanément
nn1,nn2,nn1,n2,n1,n2,n1,11,N2,12,N2,N on the focal plane and the other plane, and analyzes the temporal variation component. Thus, an observation device capable of acquiring three-dimensional function information of an observation object by suppressing an increase in the number of images to be acquired is realized.
G01N 21/45 - RéfringencePropriétés liées à la phase, p. ex. longueur du chemin optique en utilisant des méthodes interférométriquesRéfringencePropriétés liées à la phase, p. ex. longueur du chemin optique en utilisant les méthodes de Schlieren
G01J 9/02 - Mesure du déphasage des rayons lumineuxRecherche du degré de cohérenceMesure de la longueur d'onde des rayons lumineux par des méthodes interférométriques
G01N 21/17 - Systèmes dans lesquels la lumière incidente est modifiée suivant les propriétés du matériau examiné
A laser-driven light source includes a laser source that generates continuous wave sustaining light includes a diode laser that generates CW light and an optical element optically coupled to the output of the diode laser. The optical element includes a region that passes a portion of the CW light to the output of the laser source and a reflection region that reflects another portion of the CW light back to the diode laser. The reflection region is configured to select a spatial mode and wavelength of the laser light generated by the diode laser, thereby generating the CW sustaining light with radiant flux and spectral shape that is stable. A gasfilled bulb optically coupled to the output of the laser source such that the generated CW sustaining light sustains a CW plasma in the gas-filled bulb, thereby emitting light with radiant flux and spectral shape stable.
H01S 3/0941 - Procédés ou appareils pour l'excitation, p. ex. pompage utilisant le pompage optique par de la lumière cohérente produite par un laser à semi-conducteur, p. ex. par une diode laser
H01S 3/105 - Commande de l'intensité, de la fréquence, de la phase, de la polarisation ou de la direction du rayonnement, p. ex. commutation, ouverture de porte, modulation ou démodulation par commande de la position relative ou des propriétés réfléchissantes des réflecteurs de la cavité
H01S 3/139 - Stabilisation de paramètres de sortie de laser, p. ex. fréquence ou amplitude par commande de la position relative ou des propriétés réfléchissantes des réflecteurs de la cavité
30.
CELL SAMPLE ASSESSMENT METHOD AND ASSESSMENT DEVICE
Disclosed is a cell sample assessment method comprising, in the stated order: a step for labeling a cell sample with a labeling substance that, spontaneously and/or in response to a stimulus, undergoes a change in the refractive index at a prescribed wavelength; a step for obtaining a first refractive index information distribution by acquiring the refractive index information distribution of the cell sample at said prescribed wavelength; a step for causing the labeling substance, with which the cell sample is labeled, to undergo a change in the refractive index at the prescribed wavelength; a step for obtaining a second refractive index information distribution by re-acquiring the refractive index information distribution of the cell sample at the prescribed wavelength; and a step for comparing the first refractive index information distribution with the second refractive index information distribution and assessing the peripheral environment and/or the distribution of the labeling substance.
C12Q 1/02 - Procédés de mesure ou de test faisant intervenir des enzymes, des acides nucléiques ou des micro-organismesCompositions à cet effetProcédés pour préparer ces compositions faisant intervenir des micro-organismes viables
C12M 1/00 - Appareillage pour l'enzymologie ou la microbiologie
G01N 21/41 - RéfringencePropriétés liées à la phase, p. ex. longueur du chemin optique
G01N 33/48 - Matériau biologique, p. ex. sang, urineHémocytomètres
G01N 33/483 - Analyse physique de matériau biologique
31.
SPECTROSCOPIC MEASUREMENT DEVICE AND SPECTROSCOPIC MEASUREMENT METHOD
A spectroscopic measurement device 1A is provided with: a light source 3 that outputs light L1 of which the wavelength changes with time; an irradiation optical system 4 that irradiates an object S with the light L1 from the light source 3; a photodetector 5 that detects light L2 from the object S and outputs a signal G1 based on the detection result; and a synchronization control unit 6 that causes the light source 3 and at least one of the irradiation optical system 4 and the photodetector 5 to operate synchronously.
A high-voltage transformer 8 comprises a first isolation transformer 81, a second isolation transformer 82, and a wiring board 83 including a coil formed by a wiring pattern. The wiring board 83 has openings (a first opening 83a and a second opening 83b) for inserting a part of a first core 84 and a part of a second core 85 therethrough. The edges of the openings are respectively spaced apart from a part of the first core 84 and a part of the second core 85. The coil 834 is wound around the part of the first core 84 and the part of the second core 85 and thereby forms a secondary winding 81b of the first isolation transformer 81 and a primary winding 82a of the second isolation transformer 82, which are electrically connected to each other.
A photodetector (1) includes a light-receiving element (10) and a package (20). The package (20) has a bottom wall (30), a frame wall (40), and a window member (50). The frame wall (40) has: a first section (41) that surrounds the light-receiving element (10) and has an upper surface (41b) that faces an inner surface (50a) of the window member (50); and a second section (42) that is positioned on the first section (41) and has an inner surface (42c) that surrounds a side surface (50c) of the window member (50). The window member (50) is joined to the upper surface (41b) via an adhesive member (60) that is disposed between the inner surface (50a) and the upper surface (41b) and in contact with the side surface (50c). A vent hole (70) is provided between the window member (50) and the frame wall (40). The vent hole (70) is defined by a first space (71) between the inner surface (50a) and the upper surface (41b), and a second space (72) between the side surface (50c) and the inner surface (42c).
H10F 30/22 - Dispositifs individuels à semi-conducteurs sensibles au rayonnement dans lesquels le rayonnement commande le flux de courant à travers les dispositifs, p. ex. photodétecteurs les dispositifs ayant des barrières de potentiel, p. ex. phototransistors les dispositifs étant sensibles au rayonnement infrarouge, visible ou ultraviolet les dispositifs ayant une seule barrière de potentiel, p. ex. photodiodes
An electron gun drive power supply 30 drives an electron gun including a cathode electrode 5 that emits electrons E, an adjustment electrode 7 that adjusts the amount of the electrons E to be emitted from the cathode electrode 5, and an extraction electrode 8 that extracts the electrons E from the cathode electrode 5. The electron gun drive power supply comprises a potential switching unit 16 that switches between a state in which the potential of the cathode electrode 5 is lower than the potential of the extraction electrode 8 and a state in which the potential of the cathode electrode 5 is higher than or equal to the potential of the extraction electrode 8. The electron gun drive power supply 30 can rapidly switch between an ON state in which a target is irradiated with the electrons and an OFF state in which the target is not irradiated with the electrons.
Provided is a high-voltage power supply comprising: an insulation transformer 3 for defining a low-potential-side region 12 and a high-potential-side region 13; a step-up rectification circuit 4 for supplying, to a load RL, a high voltage Vout generated by stepping up and rectifying an output voltage transmitted from the insulation transformer 3; a detection unit 5 for generating a detection voltage Vdet indicating the magnitude of the high voltage Vout; a drive unit 7 for generating an instruction voltage Vdrc on the basis of deviation of the detection voltage Vdet from a target value; a transmission unit 8 for transmitting the instruction voltage Vdrc from the low-potential-side region 12 to the high-potential-side region 13; and a waveform stabilization circuit 9 for causing a current corresponding to the magnitude of the transmitted instruction signal to flow from a first input end 9a to an output end 9c.
H02M 7/48 - Transformation d'une puissance d'entrée en courant continu en une puissance de sortie en courant alternatif sans possibilité de réversibilité par convertisseurs statiques utilisant des tubes à décharge avec électrode de commande ou des dispositifs à semi-conducteurs avec électrode de commande
H02M 7/06 - Transformation d'une puissance d'entrée en courant alternatif en une puissance de sortie en courant continu sans possibilité de réversibilité par convertisseurs statiques utilisant des tubes à décharge sans électrode de commande ou des dispositifs à semi-conducteurs sans éléctrode de commande
This transistor drive circuit 8 comprises: a pulse transformer PT; a first control circuit 81 having a first portion 811 connected between a control terminal T1a and a first current terminal T1b; a second control circuit 82 connected between a second secondary winding N3, the control terminal T1a, and the first current terminal T1b; a drive pulse generation unit 83; and a stop pulse generation unit 84. The first portion 811 is in a maintenance state in which a voltage of a drive pulse signal is maintained, drives a drive target transistor T1 by using the maintained voltage, and when a stop pulse signal is input from the pulse transformer PT to the second control circuit 82, the second control circuit 82 releases the maintenance state of the first portion 811.
H02M 1/08 - Circuits spécialement adaptés à la production d'une tension de commande pour les dispositifs à semi-conducteurs incorporés dans des convertisseurs statiques
H03K 17/04 - Modifications pour accélérer la commutation
H03K 17/0412 - Modifications pour accélérer la commutation sans réaction du circuit de sortie vers le circuit de commande par des dispositions prises dans le circuit de commande
H03K 17/567 - Circuits caractérisés par l'utilisation d'au moins deux types de dispositifs à semi-conducteurs, p. ex. BIMOS, dispositifs composites tels que IGBT
H03K 17/691 - Commutation ou ouverture de porte électronique, c.-à-d. par d'autres moyens que la fermeture et l'ouverture de contacts caractérisée par l'utilisation de composants spécifiés par l'utilisation, comme éléments actifs, de dispositifs à semi-conducteurs les dispositifs étant des transistors à effet de champ avec une isolation galvanique entre le circuit de commande et le circuit de sortie utilisant un couplage par transformateur
This high-voltage power supply comprises: at least one insulation substrate 31; and a high-voltage generation circuit unit formed on the at least one insulation substrate 31. The high-voltage generation circuit unit comprises: a first multistage voltage doubler rectification circuit unit 32 for generating a first DC voltage; a second multistage voltage doubler rectification circuit unit 33 for generating a second DC voltage by boosting and rectifying inputted AC voltage at a phase opposite to that of the first multistage voltage doubler rectification circuit unit 32; and a DC arm unit 34 for synthesizing the first DC voltage and the second DC voltage. The first multistage voltage doubler rectification circuit unit 32, the second multistage voltage doubler rectification circuit unit 33, and the DC arm unit 34 are concentrically arranged on the insulation substrate 31.
H02M 7/10 - Transformation d'une puissance d'entrée en courant alternatif en une puissance de sortie en courant continu sans possibilité de réversibilité par convertisseurs statiques utilisant des tubes à décharge sans électrode de commande ou des dispositifs à semi-conducteurs sans éléctrode de commande agencés pour la marche en série, p. ex. pour la multiplication de tension
H02M 7/04 - Transformation d'une puissance d'entrée en courant alternatif en une puissance de sortie en courant continu sans possibilité de réversibilité par convertisseurs statiques
38.
METHOD FOR EVALUATING THREE-DIMENSIONAL TISSUE CONTAINING EPITHELIAL CELLS, EVALUATION DEVICE, AND PROGRAM
A method for evaluating a three-dimensional tissue containing epithelial cells includes evaluating a formation process of an epithelial lumen formed in the three-dimensional tissue by using refractive index distribution data at a plurality of points in time of the three-dimensional tissue containing epithelial cells.
G01N 33/48 - Matériau biologique, p. ex. sang, urineHémocytomètres
C12N 5/071 - Cellules ou tissus de vertébrés, p. ex. cellules humaines ou tissus humains
C12Q 1/00 - Procédés de mesure ou de test faisant intervenir des enzymes, des acides nucléiques ou des micro-organismesCompositions à cet effetProcédés pour préparer ces compositions
G01N 33/483 - Analyse physique de matériau biologique
G01N 21/41 - RéfringencePropriétés liées à la phase, p. ex. longueur du chemin optique
39.
METHOD FOR PRODUCING MAMMALIAN CELLS LABELED BY CHROMOPROTEIN, AND METHOD FOR SCREENING CHROMOPROTEIN
Provided are: a method for producing mammalian cells labeled by a chromoprotein that includes culturing, at less than 37° C, mammalian cells into which a nucleic acid that expresses a chromoprotein has been introduced; and a method for screening a chromoprotein that includes culturing, at less than 37° C, mammalian cells into which a nucleic acid that expresses a candidate protein has been introduced and evaluating the visible light absorption of the mammalian cells.
C12N 15/11 - Fragments d'ADN ou d'ARNLeurs formes modifiées
C12Q 1/02 - Procédés de mesure ou de test faisant intervenir des enzymes, des acides nucléiques ou des micro-organismesCompositions à cet effetProcédés pour préparer ces compositions faisant intervenir des micro-organismes viables
40.
METHOD FOR MANUFACTURING ELECTRONIC COMPONENT, AND ELECTRONIC COMPONENT
This method for manufacturing an electronic component includes a step for irradiating a substrate 10 containing a thermosetting resin having a benzene ring in a structure thereof with laser light 21 to modify the thermosetting resin, thereby forming a conductive portion 13 containing graphene and/or graphite on a surface 11 of the substrate 10, inside the substrate 10, or both on the surface 11 and inside the substrate 10. The thermosetting resin may contain at least one resin of an epoxy resin and a phenol resin. The wavelength of the laser light 21 may be 200-1100 nm.
H05K 3/10 - Appareils ou procédés pour la fabrication de circuits imprimés dans lesquels le matériau conducteur est appliqué au support isolant de manière à former le parcours conducteur recherché
An X-ray generation device (1) comprises: a cathode electrode (5) that emits electrons (E); an adjustment electrode (7) that adjusts the amount of the electrons (E) emitted from the cathode electrode (5); an extraction electrode (8) that extracts the electrons (E) from the cathode electrode (5); a target (9) on which the electrons (E) are incident, thereby generating X-rays (R); a discharge detection unit (15) that detects the discharge between the cathode electrode (5) and the adjustment electrode (7); and a potential switching unit (16) that makes the potential of the extraction electrode (8) higher than the potential of the cathode electrode (5) during normal operation and makes the potential of the extraction electrode (8) equal to or lower than the potential of the cathode electrode (5) during discharge detection.
A power transmission circuit 1 connected to a circuit for boosting the voltage from a low potential side to a high potential side: performs, in a first period, power transmission for transmitting, to a rectifier circuit 16 via a first transformer 14 and a second transformer 15, a high voltage-side voltage generated by a low voltage-side control circuit 12 driving a low voltage side inverter circuit 13; and performs, in a second period different from the first period, a first signal transmission for transmitting, to the high voltage-side control circuit 18 via the first transformer 14 and the second transformer 15, a first signal generated by the low voltage-side control circuit 12 driving the low voltage-side inverter circuit 13.
H02M 3/28 - Transformation d'une puissance d'entrée en courant continu en une puissance de sortie en courant continu avec transformation intermédiaire en courant alternatif par convertisseurs statiques utilisant des tubes à décharge avec électrode de commande ou des dispositifs à semi-conducteurs avec électrodes de commande pour produire le courant alternatif intermédiaire
A resonance circuit 5 comprises: a resonance capacitor Cr that is connected in series to a primary winding N1; a resonance inductance Lr that is connected in series with the resonance capacitor Cr; a winding capacity Cp1; and a winding capacity Cp2. The resonance frequency of the resonance circuit 5 includes a first resonance frequency that is based on the resonance capacitor Cr and the resonance inductance Lr, and a second resonance frequency that is greater than the first resonance frequency on the basis of the resonance capacitor Cr, the resonance inductance Lr, and the winding capacities Cp1 and Cp2. An inverter control circuit 4 controls the inverter at a first driving frequency that follows the first resonance frequency in the case of a heavy load, and controls the inverter at a second driving frequency that is greater than the first driving frequency and is between the first resonance frequency and the second resonance frequency in the case of a light load.
H02M 3/28 - Transformation d'une puissance d'entrée en courant continu en une puissance de sortie en courant continu avec transformation intermédiaire en courant alternatif par convertisseurs statiques utilisant des tubes à décharge avec électrode de commande ou des dispositifs à semi-conducteurs avec électrodes de commande pour produire le courant alternatif intermédiaire
H05G 1/20 - Dispositions de l'alimentation en énergie pour alimenter le tube radiogène à rayons X avec du courant alternatif haute fréquenceDispositions de l'alimentation en énergie pour alimenter le tube radiogène à rayons X avec des trains d'impulsions
An electron tube includes: a photoelectric surface converting incident light into photoelectrons; a plurality of dynodes and an anode; an insulating substrate holding the dynodes and the anode in a state where the dynodes are electrically insulated from each other, and the dynode and the anode are electrically insulated from each other; and a housing accommodating the dynodes, the anode, and the insulating substrate, wherein the insulating substrate includes: a base layer made of a polycrystalline material and having an electrical insulation property; an intermediate layer made of an amorphous material and having an electrical insulation property; and a surface layer made of a material containing carbon and being smaller in electric resistance than the intermediate layer.
An imaging device (1) comprises, within a housing (10), a first detection substrate (5) that detects reflected light Lr, a second detection substrate (6) that detects transmitted light Lt, and a holding member (12). The first detection substrate (5) includes a first image sensor (51) that receives the reflected light Lr, and a first terminal serving as an output end of reflected-light luminance data. The second detection substrate (6) includes a second image sensor (61) for receiving the transmitted light Lt, and a second terminal serving as an output end of transmitted-light luminance data. The first detection substrate (5) and the second detection substrate (6) are held by the holding member (12) so as to protrude in mutually opposite directions from the holding member (12), the first terminal is positioned at the protruding portion of the first detection substrate (5), and the second terminal is positioned at the protruding portion of the second detection substrate (6).
G01J 3/26 - Production du spectreMonochromateurs en utilisant une réflexion multiple, p. ex. interféromètre de Fabry-Perot, filtre à interférences variables
G01J 3/36 - Étude de plusieurs bandes d’un spectre à l’aide de détecteurs distincts
G03B 19/06 - Appareils pour films en bobine prévus pour être chargés de plus d'un film, p. ex. avec exposition de l'un ou de l'autre à volonté
H04N 23/13 - Caméras ou modules de caméras comprenant des capteurs d'images électroniquesLeur commande pour générer des signaux d'image à partir de différentes longueurs d'onde avec plusieurs capteurs
H04N 23/45 - Caméras ou modules de caméras comprenant des capteurs d'images électroniquesLeur commande pour générer des signaux d'image à partir de plusieurs capteurs d'image de type différent ou fonctionnant dans des modes différents, p. ex. avec un capteur CMOS pour les images en mouvement en combinaison avec un dispositif à couplage de charge [CCD] pour les images fixes
An imaging apparatus 1 comprises: a first image sensor 51 for detecting the luminance of reflected light Lr from a first prism 3 to generate reflected light luminance data Dr; a second image sensor 61 for detecting luminance of transmitted light Lt from the second prism 4 to generate transmitted light luminance data Dt; and a processing unit P for generating reflected light image data Gr and transmitted light image data Gt on the basis of the reflected light luminance data Dr and the transmitted light luminance data Dt that are respectively outputted from the first image sensor 51 and the second image sensor 61 at the same timing, and generating an image dataset Gs in which image data based on reflected light image data Gr and transmitted light image data Gt are combined.
H04N 23/45 - Caméras ou modules de caméras comprenant des capteurs d'images électroniquesLeur commande pour générer des signaux d'image à partir de plusieurs capteurs d'image de type différent ou fonctionnant dans des modes différents, p. ex. avec un capteur CMOS pour les images en mouvement en combinaison avec un dispositif à couplage de charge [CCD] pour les images fixes
G01M 11/00 - Test des appareils optiquesTest des structures ou des ouvrages par des méthodes optiques, non prévu ailleurs
G01N 21/27 - CouleurPropriétés spectrales, c.-à-d. comparaison de l'effet du matériau sur la lumière pour plusieurs longueurs d'ondes ou plusieurs bandes de longueurs d'ondes différentes en utilisant la détection photo-électrique
This optical module includes an optical detection element in which a first semiconductor region of a first conductivity type is formed on a first surface side of a semiconductor substrate, and a second semiconductor region of a second conductivity type is formed on a second surface side. A through hole is formed in the semiconductor substrate. The inner surface of the through hole includes a section extending along a direction perpendicular to the first surface. The second semiconductor region is electrically connected to an electrode terminal of a support by a metal layer. The metal layer is formed so as to extend from the second surface and cover the inner surface of the through-hole. The metal layer includes a layered section containing an Au layer and an Al layer. The layered section is formed so as to extend from the second surface and reach the inner surface of the through-hole.
H10F 55/00 - Dispositifs à semi-conducteurs sensibles au rayonnement couverts par les groupes , ou structurellement associés à des sources lumineuses électriques et électriquement ou optiquement couplés avec lesdites sources
48.
SIGNAL PROCESSING METHOD, SIGNAL PROCESSING DEVICE, AND SIGNAL PROCESSING SYSTEM
A data processing device 12: acquires intensity signals of channels for an experiment target that is provided with a staining phosphor U; acquires intensity signals of the channels for the experiment target that is provided with a staining phosphor V; calculates a variation amount between the intensity signals; calculates, on the basis of the variation amount, an independent variation parameter representing an independent variation degree of mutual non-interference between the channels, and a correlation variation parameter representing a correlation variation degree of mutual interference between the channels; calculates, on the basis of the independent variation parameter, of the correlation variation parameter, and of the intensity signals of two channels for measurement targets, an evaluation value by evaluating the variation in the number of photons of signal light rays entering the channels, or the variation in the number of photoelectrons discharged from photoelectric conversion units of the channels; and executes data analysis on the basis of the evaluation value.
This laser-processing apparatus comprises: a light source that emits laser light; an optical fiber for propagating the laser light and heat radiation light emitted at an irradiation point, in a processing object, irradiated with the laser light; a monitor unit that has connected thereto the optical fiber, causes the laser light from the light source to enter the optical fiber, and detects the light intensity of the heat radiation light in response to entering of the heat radiation light propagated through the optical fiber; an optical scanning unit that has a reflection surface for reflecting the laser light outgoing from the optical fiber and the heat radiation light emitted at the irradiation point, scans the processing object with the laser light by varying the angle of the reflection surface, and causes the heat radiation light to enter the optical fiber; and a correction unit that corrects the light intensity detected by the monitor unit.
B23K 26/00 - Travail par rayon laser, p. ex. soudage, découpage ou perçage
B23K 26/02 - Mise en place ou surveillance de la pièce à travailler, p. ex. par rapport au point d'impactAlignement, pointage ou focalisation du faisceau laser
B23K 26/082 - Systèmes de balayage, c.-à-d. des dispositifs comportant un mouvement relatif entre le faisceau laser et la tête du laser
This laser processing device is provided with: a light source that emits laser light; an irradiation unit that irradiates an object to be processed with the laser light; a monitor unit that detects thermal radiation light emitted from an irradiation region of the laser light on the object to be processed; and a first optical fiber that propagates the laser light from the monitor unit to the irradiation unit and propagates the thermal radiation light from the irradiation unit to the monitor unit. The monitor unit causes the laser light to be incident on a first end surface of the first optical fiber, and detects the thermal radiation light emitted from the first end surface. When the outer diameter of a core included in the first optical fiber is defined as D1 and the outer diameter of a cladding included in the first optical fiber is defined as D2, the first optical fiber satisfies (D2 - D1) > D1 at least at the first end surface.
B23K 26/00 - Travail par rayon laser, p. ex. soudage, découpage ou perçage
B23K 26/02 - Mise en place ou surveillance de la pièce à travailler, p. ex. par rapport au point d'impactAlignement, pointage ou focalisation du faisceau laser
B23K 26/082 - Systèmes de balayage, c.-à-d. des dispositifs comportant un mouvement relatif entre le faisceau laser et la tête du laser
51.
ELECTRON BEAM DETECTION DEVICE AND TRANSMISSION ELECTRON MICROSCOPE
This electron beam detection device comprises: an image sensor; a first fiber optics plate disposed on the image sensor; a second fiber optics plate disposed on the first fiber optics plate; a scintillator layer disposed on the second fiber optics plate; and an immersion oil layer disposed between the first fiber optics plate and the second fiber optics plate. The immersion oil layer contacts a light output surface of the second fiber optics plate and a light input surface of the first fiber optics plate.
H01J 37/244 - DétecteursComposants ou circuits associés
G02B 6/08 - Guides de lumièreDétails de structure de dispositions comprenant des guides de lumière et d'autres éléments optiques, p. ex. des moyens de couplage formés par des faisceaux de fibres la position relative des fibres étant la même aux deux extrémités, p. ex. pour transporter des images le faisceau de fibres ayant la forme d'une plaque
This airtight structure comprises: a metal member having an opening and a first surface surrounding one opening end of the opening when viewed from a prescribed direction; a ceramic member having a second surface facing the first surface in the prescribed direction and surrounding the opening end when viewed from the prescribed direction, said ceramic member being attached to the metal member so as to close the opening end; wiring penetrating through the ceramic member in an airtight manner; and an O-ring disposed between the first surface and the second surface in a state of being in contact with the first surface and the second surface and being crushed, and surrounding the opening end when viewed from the prescribed direction. The arithmetic average roughness of the second surface is less than 0.3 μm.
This electron beam detection device comprises: a scintillator layer; and a CMOS image sensor that has a light-receiving region including a plurality of pixels, and that detects light emitted from the scintillator layer. The readout noise in each of the plurality of pixels is 0.15–5 [e-rms], and the scintillator layer includes GOS: Pr.
This radiation detector comprises an optical semiconductor element, support members that are positioned on one side of the optical semiconductor element in a first direction and are disposed in positions on both sides, in a second direction, of a region that overlaps a light receiving region when viewed from the first direction, a scintillator unit that is supported by the support members so as to face the optical semiconductor element in the first direction across the region, and a bonding member that is disposed in the region and is in contact with each of the optical semiconductor element, the support members, and the scintillator unit in the region, wherein the refractive index of a scintillator of the scintillator unit is 1.80 to 2.35 inclusive, and the refractive index of the bonding member is 1.60 to 2.00 inclusive.
G01T 1/20 - Mesure de l'intensité de radiation avec des détecteurs à scintillation
H10F 30/00 - Dispositifs individuels à semi-conducteurs sensibles au rayonnement dans lesquels le rayonnement commande le flux de courant à travers les dispositifs, p. ex. photodétecteurs
H10F 30/225 - Dispositifs individuels à semi-conducteurs sensibles au rayonnement dans lesquels le rayonnement commande le flux de courant à travers les dispositifs, p. ex. photodétecteurs les dispositifs ayant des barrières de potentiel, p. ex. phototransistors les dispositifs étant sensibles au rayonnement infrarouge, visible ou ultraviolet les dispositifs ayant une seule barrière de potentiel, p. ex. photodiodes la barrière de potentiel fonctionnant en régime d'avalanche, p. ex. photodiodes à avalanche
H10F 77/00 - Détails de structure des dispositifs couverts par la présente sous-classe
55.
SIGNAL PROCESSING METHOD, SIGNAL PROCESSING DEVICE, AND SIGNAL PROCESSING SYSTEM
A data processing device 12 is a signal processing device that processes the outputs of photomultiplier tubes 11a to 11d and that includes a processor which is configured to: acquire, in a time series, intensity signals output from the photomultiplier tubes 11a to 11d, which detect signal light generated by flow cytometry using a flow cytometer targeting a plurality of test samples; aggregate the frequency distribution of the intensities of the intensity signals on the basis of digital values DN of the time-series intensity signals, to generate a histogram; fit the histogram using an exponential function to calculate a ρ value representing the variation of each peak in the frequency distribution; and perform data analysis using the ρ value for the intensity signals output by the photomultiplier tubes 11a to 11d obtained by flow cytometry, targeting a plurality of target samples.
Provided is a laser processing device comprising: a fiber laser that is a light source that emits laser light; an optical fiber that propagates the laser light and heat radiation light emitted at an irradiation point in an object to be processed that is irradiated with the laser light; a monitor unit to which the optical fiber is connected, that causes the laser light from the fiber laser to be incident on the optical fiber, receives incidence of the heat radiation light propagated through the optical fiber, and detects the light intensity of the heat radiation light; a light scanning unit that has a reflection surface that reflects the laser light emitted from the optical fiber and the heat radiation light emitted at the irradiation point, scans the workpiece with the laser light by varying the angle of the reflection surface, and makes the heat radiation light incident on the optical fiber; and a correction unit that corrects the light intensity detected by the monitor unit.
B23K 26/00 - Travail par rayon laser, p. ex. soudage, découpage ou perçage
B23K 26/02 - Mise en place ou surveillance de la pièce à travailler, p. ex. par rapport au point d'impactAlignement, pointage ou focalisation du faisceau laser
B23K 26/082 - Systèmes de balayage, c.-à-d. des dispositifs comportant un mouvement relatif entre le faisceau laser et la tête du laser
This laser processing device includes: a light source that emits laser light; an optical fiber that propagates the laser light and heat radiation light emitted at an irradiation point which is on an object to be processed and which is irradiated with the laser light; a monitor unit, to which the optical fiber is connected, causes the laser light from the light source to enter the optical fiber, receives the entry of the heat radiation light propagated through the optical fiber, and detects the heat radiation light; and an optical scanning unit that includes a reflection surface for reflecting the laser light emitted from the optical fiber and the heat radiation light emitted at the irradiation point, scans the object to be processed with the laser light by varying an angle of the reflection surface, and causes the heat radiation light to enter the optical fiber. The reflection surface is formed of a metal material.
B23K 26/00 - Travail par rayon laser, p. ex. soudage, découpage ou perçage
B23K 26/02 - Mise en place ou surveillance de la pièce à travailler, p. ex. par rapport au point d'impactAlignement, pointage ou focalisation du faisceau laser
B23K 26/082 - Systèmes de balayage, c.-à-d. des dispositifs comportant un mouvement relatif entre le faisceau laser et la tête du laser
A laser processing apparatus comprising: a fiber laser as a light source that emits laser light; an optical fiber for propagating the laser light and thermal radiation light emitted at an irradiation point on a workpiece irradiated with the laser light; a monitor unit that is connected with the optical fiber, causes the laser light from the fiber laser to be incident on the optical fiber, receives the thermal radiation light propagated through the optical fiber, and detects the thermal radiation light; and an optical scanning unit that has a reflection surface for reflecting the laser light emitted from the optical fiber and the thermal radiation light emitted at the irradiation point, scans the workpiece with the laser light by varying the angle of the reflection surface, and causes the thermal radiation light to be incident on the optical fiber, wherein the reflection surface is made of metal material.
B23K 26/00 - Travail par rayon laser, p. ex. soudage, découpage ou perçage
B23K 26/02 - Mise en place ou surveillance de la pièce à travailler, p. ex. par rapport au point d'impactAlignement, pointage ou focalisation du faisceau laser
B23K 26/082 - Systèmes de balayage, c.-à-d. des dispositifs comportant un mouvement relatif entre le faisceau laser et la tête du laser
A semiconductor detector 1 includes a first semiconductor region 11, a plurality of second semiconductor regions 14, an electrode 21, a plurality of electrodes 15, an electrode 13, and a circuit 30. The plurality of second semiconductor regions 14 are formed in a first direction D1 with respect to the first semiconductor region 11, and are provided side by side in a second direction D2 intersecting the first direction D1. The electrode 21 is connected to the first semiconductor region 11. Each of the plurality of electrodes 15 is connected to the corresponding one of the plurality of second semiconductor regions 14. The circuit 30 applies a voltage to each of the electrode 21, the electrode 15, and the electrode 13. The first semiconductor region 11 has a groove 112 positioned between the plurality of second semiconductor regions 14 when viewed from the first direction D1. The electrode 13 is disposed in the groove 112 and faces the first semiconductor region 11. The circuit 30 sets the potential of the electrode 13 to a magnitude between the potential of the electrode 21 and the potential of the plurality of electrodes 15.
H10F 30/225 - Dispositifs individuels à semi-conducteurs sensibles au rayonnement dans lesquels le rayonnement commande le flux de courant à travers les dispositifs, p. ex. photodétecteurs les dispositifs ayant des barrières de potentiel, p. ex. phototransistors les dispositifs étant sensibles au rayonnement infrarouge, visible ou ultraviolet les dispositifs ayant une seule barrière de potentiel, p. ex. photodiodes la barrière de potentiel fonctionnant en régime d'avalanche, p. ex. photodiodes à avalanche
An surface plasmon microscope includes a light source, a polarization element, a beam splitter, an objective lens, a photodetector, an operation unit, and the like. An illumination optical system including lenses, the polarization element, the beam splitter, and the objective lens guides light output from the light source to converge the light by the objective lens, and illuminates a metal thin film with the light from a lower surface side of a transparent substrate and focuses the light on the metal thin film to generate a surface plasmon resonance. A detection optical system including the objective lens, the beam splitter, and a lens guides reflected light generated by the focused illumination on the metal thin film to the photodetector. The operation unit acquires refractive index information of a sample disposed in contact with the metal thin film based on the reflected light intensity detected by the photodetector.
The present invention appropriately removes noise from data even when sufficient training data cannot be acquired. This training method for generating an inference model, which is used for removing noise from data, includes: an acquisition step for training (S01, S02) for acquiring training data including noise and generating post-exponentiation training data from the training data; a noise removal step (S03) for generating noise-removed training data from the post-exponentiation training data by using an inference model that is being trained; a noise addition step (S03) for adding noise to the noise-removed training data to generate noise-added training data; and a training step (S04) for training the inference model by machine learning using, as the data including noise, a combination of the post-exponentiation training data and the noise-added training data.
G06F 18/21 - Conception ou mise en place de systèmes ou de techniquesExtraction de caractéristiques dans l'espace des caractéristiquesSéparation aveugle de sources
G06F 18/214 - Génération de motifs d'entraînementProcédés de Bootstrapping, p. ex. ”bagging” ou ”boosting”
G06N 3/0895 - Apprentissage faiblement supervisé, p. ex. apprentissage semi-supervisé ou auto-supervisé
G06T 5/60 - Amélioration ou restauration d'image utilisant l’apprentissage automatique, p. ex. les réseaux neuronaux
The present invention appropriately removes noise from data even when sufficient training data cannot be acquired. This training method generates an inference model used in order to remove noise from data, said method comprising: a training acquisition step (S01) for acquiring training data that contains noise; a noise-removing step (S02) for generating noise-removed training data from the training data using an inference model that is partway through training; a noise-adding step (S03) for adding preset noise to the noise-removed training data to generate noise-added training data; and a training step (S04) for training machine learning of the inference model using a combination of the training data and the noise-added training data as data that contains noise.
G06F 18/21 - Conception ou mise en place de systèmes ou de techniquesExtraction de caractéristiques dans l'espace des caractéristiquesSéparation aveugle de sources
G06F 18/214 - Génération de motifs d'entraînementProcédés de Bootstrapping, p. ex. ”bagging” ou ”boosting”
G06N 3/0895 - Apprentissage faiblement supervisé, p. ex. apprentissage semi-supervisé ou auto-supervisé
G06T 5/60 - Amélioration ou restauration d'image utilisant l’apprentissage automatique, p. ex. les réseaux neuronaux
Disclosed is a protein which includes a gfasCP mutant sequence that is an amino acid sequence having 90% or higher sequence identity with the amino acid sequence represented by SEQ ID NO: 1. In the gfasCP mutant sequence, an amino acid residue corresponding to a tyrosine residue located at position-63 in the amino acid sequence represented by SEQ ID NO: 1 is a tyrosine residue. The gfasCP mutant sequence satisfies a specific requirement for amino acid residues respectively corresponding to a serine residue located at position-61 and a glutamine residue located at position-62 in the amino acid sequence represented by SEQ ID NO: 1.
C12N 15/12 - Gènes codant pour des protéines animales
C07K 14/435 - Peptides ayant plus de 20 amino-acidesGastrinesSomatostatinesMélanotropinesLeurs dérivés provenant d'animauxPeptides ayant plus de 20 amino-acidesGastrinesSomatostatinesMélanotropinesLeurs dérivés provenant d'humains
C12N 15/62 - Séquences d'ADN codant pour des protéines de fusion
C12N 15/63 - Introduction de matériel génétique étranger utilisant des vecteursVecteurs Utilisation d'hôtes pour ceux-ciRégulation de l'expression
C12Q 1/02 - Procédés de mesure ou de test faisant intervenir des enzymes, des acides nucléiques ou des micro-organismesCompositions à cet effetProcédés pour préparer ces compositions faisant intervenir des micro-organismes viables
C12Q 1/68 - Procédés de mesure ou de test faisant intervenir des enzymes, des acides nucléiques ou des micro-organismesCompositions à cet effetProcédés pour préparer ces compositions faisant intervenir des acides nucléiques
64.
HOLOGRAM GENERATION METHOD, HOLOGRAM GENERATION APPARATUS, AND LIGHT IRRADIATION APPARATUS
A hologram generation method includes a pattern setting step, an intensity image calculation step, and an evaluation value calculation step. In the intensity image calculation step, zero padding is performed on a complex amplitude distribution acquired when a candidate pattern set in the pattern setting step is presented on an input plane, and a candidate intensity image is generated based on a result of a propagation calculation of the complex amplitude distribution after the zero padding. In the evaluation value calculation step, an evaluation value is obtained based on an intensity correlation between the candidate intensity image and a target intensity image. By using an optimization method, while changing the candidate pattern set in the pattern setting step, the respective steps are repeatedly performed, and any one candidate pattern is selected as a hologram to be presented on the input plane based on the evaluation value.
A light modulation device includes a light source; a controller; and a spatial light modulator. The light source outputs laser light having an intensity corresponding to a set intensity. The spatial light modulator includes a plurality of pixel electrodes, a liquid crystal layer, a driver, and a cooler. The liquid crystal layer modulates a phase of the laser light according to a magnitude of an electric field formed by each of the plurality of pixel electrodes. The driver applies a voltage to each of the plurality of pixel electrodes. The cooler cools the liquid crystal layer such that a temperature of the liquid crystal layer approaches a set temperature. The controller determines the set temperature of the cooler based on the set intensity of the laser light.
A radiation detector includes a plurality of pixel circuits each of which is provided corresponding to each of a plurality of pixels arranged along a predetermined direction and has at least one detection system configured to read out carriers from the corresponding pixel. The at least one detection system includes a counter counting the number of radiation hits, a first register holding first data which is a count value of the counter, a second register holding second data, an adder adding the first data and the second data to generate third data, and a third register holding the third data. The second data is the third data transferred from the third register of the pixel circuit provided corresponding to the pixel adjacent to the corresponding pixel in each of the plurality of pixel circuits.
Even when data to be used for generation of an inference model by training of machine learning includes data with an abnormality, this learning method appropriately detects the abnormality from the data without making distinction related to the abnormality. The learning method generates, from data, an inference model used for detecting an abnormality of an object related to the data, and comprises: a learning acquisition step (S01) of acquiring learning data; an abnormality removal step (S02) of using an inference model in training from the learning data to generate learning data after the abnormality removal; an abnormality addition step (S03) of adding a preset abnormality to the learning data after the abnormality removal to generate abnormality-added learning data; and a training step (S04) of using a combination of the learning data and the abnormality-added learning data to train the machine learning of the inference model.
This solid-state imaging device comprises: a plurality of photoelectric conversion units which is arranged along a first direction and generates charge in response to incident light; a plurality of transfer electrodes which is arranged along a second direction intersecting the first direction, is provided on the photoelectric conversion units, and transfers the charge in the second direction; and a plurality of voltage dividing resistors each of which is provided so as to correspond to the adjacent transfer electrodes, generates a transfer potential such that the transfer potential becomes higher from the transfer electrode on the upstream side in the second direction toward the transfer electrode on the downstream side in the second direction by dividing output voltage from a power source, and applies the transfer potential to the corresponding transfer electrodes.
A light detection device according to one embodiment comprises: a wiring substrate; a light-receiving substrate disposed on a surface of the wiring substrate; a plurality of conductive members that electrically connect a plurality of pad electrodes and a plurality of photodiodes; and an underfill material disposed between the wiring substrate and the light-receiving substrate. When viewed from a Z direction, an outer edge of the surface of the wiring substrate has a pair of long side parts that face each other and a pair of short side parts that face each other. Each of the pair of long side parts and the pair of short side parts of the wiring substrate is provided with a plurality of recessed parts that open to the surface and extend from the outer edge toward an inside of the wiring substrate when viewed from the Z direction. An inner surface of each of the plurality of recessed parts is formed in a tapered shape toward the inside of the wiring substrate when viewed from the Z direction.
A PET apparatus includes a detector ring, a processing unit, a position adjustment unit, and a control unit. The position adjustment unit adjusts a position of the detector ring by moving the detector ring relative to a subject in a body axis direction. The processing unit repeatedly obtains and outputs a position or a position change amount of the subject relative to the detector ring based on a coincidence detection event in which any two radiation detectors out of a plurality of radiation detectors in the detector ring detect a pair of gamma-rays. The control unit instructs the position adjustment unit to adjust the position of the detector ring such that the subject is positioned within a predetermined range in the body axis direction in the measurement space based on the position or the position change amount of the subject output from the processing unit.
A61B 6/00 - Appareils ou dispositifs pour le diagnostic par radiationsAppareils ou dispositifs pour le diagnostic par radiations combinés avec un équipement de thérapie par radiations
A61B 6/04 - Mise en position des patientsLits inclinables ou similaires
A61B 6/42 - Agencements pour détecter des radiations spécialement adaptés au diagnostic par radiations
Thise Fabry-Perot interference filter comprises a fixed layer including a fixed mirror part, and a movable layer including a movable mirror part facing the fixed mirror part, with a gap therebetween. The movable mirror portion includes a first portion corresponding to a light transmission region, and a second portion surrounding the first portion when viewed from the direction in which the fixed mirror portion and the movable mirror portion face each other. The area of a region in which the first portion is disposed and which corresponds to the light transmission region is larger than the area of an annular region in which the second portion is disposed and which surrounds the light transmission region. The distance between the outer edge of the first portion and the outer edge of the gap is greater than the thickness of the gap.
This scintillator panel comprises: a support layer; a scintillator layer disposed on the support layer and including a plurality of columnar crystals; an adhesive layer disposed on the scintillator layer; a release layer disposed on the adhesive layer and having releasability from the adhesive layer; and a first moisture-proof layer integrally covering an outer edge portion of the scintillator layer, an outer edge portion of the adhesive layer, and an outer edge portion of the release layer. Through use of this scintillator panel, the scintillator layer can be attached to another member when the scintillator panel is used, and the moisture-proof properties of the scintillator layer can be sufficiently secured when the scintillator panel is not in use.
G21K 4/00 - Écrans de conversion pour transformer une distribution spatiale de particules ou de rayonnements ionisants en images visibles, p. ex. écrans fluorescents
G01T 1/20 - Mesure de l'intensité de radiation avec des détecteurs à scintillation
80.
OPTICAL ELEMENT AND METHOD FOR MANUFACTURING OPTICAL ELEMENT
This optical element comprises: a wiring layer; an optical semiconductor element disposed on the wiring layer; a wire connecting the wiring layer and the optical semiconductor element; a sealing layer disposed on the wiring layer; an optical member disposed on the surface of the sealing layer; and an adhesive layer disposed between the sealing layer and the optical member. The optical member has a sheet part disposed on the adhesive layer, and a lens part formed on the sheet part. The thickness of the lens part in the thickness direction of the wiring layer is larger than the sum of the thickness of the sheet part and the thickness of the adhesive layer. When viewed from the thickness direction of the wiring layer, the end part, of the wire, connected to the wiring layer is positioned on the inner side of the outer edge of the lens part.
This scintillator unit comprises: a support; a scintillator layer disposed on the support and including a plurality of columnar crystals; an optical functional layer disposed on an effective portion of the scintillator layer; and a moisture-proof layer integrally covering both the scintillator layer and the optical functional layer. The moisture-proof layer is in contact with the plurality of columnar crystals at an outer edge of the scintillator layer and enters gaps of the plurality of columnar crystals.
This optical element is provided with a light-transmitting substrate having a first surface and a second surface, and a light-blocking layer and an optical layer disposed on the first surface. The optical layer covers a light-passing region of the first surface that overlaps a light-passing aperture of the light-blocking layer when viewed from the thickness direction of the light-transmitting substrate, and a light-blocking region of the surface of the light-blocking layer, the light-blocking region surrounding the light-passing aperture when viewed from the thickness direction of the light-transmitting substrate. The surface of the light-blocking layer has light reflectivity. At least one of the light-blocking region and a surrounding region of the surface of the optical layer that overlaps the light-blocking region, when viewed from the thickness direction of the light-transmitting substrate, is engraved.
G02B 26/00 - Dispositifs ou dispositions optiques pour la commande de la lumière utilisant des éléments optiques mobiles ou déformables
B81B 3/00 - Dispositifs comportant des éléments flexibles ou déformables, p. ex. comportant des membranes ou des lamelles élastiques
G01J 3/26 - Production du spectreMonochromateurs en utilisant une réflexion multiple, p. ex. interféromètre de Fabry-Perot, filtre à interférences variables
A radiation detector according to the present invention comprises a sensor panel and a scintillator panel that is provided on the sensor panel. The scintillator panel includes a support layer, a scintillator layer that is provided on the sensor panel side of the support layer, an adhesive layer that is provided on the sensor panel side of the scintillator layer and contacts the sensor panel, and a first moisture-proof layer that integrally covers an outer edge part of the scintillator layer and an outer edge part of the adhesive layer. An edge part of the first moisture-proof layer on the sensor panel side includes at least one of an inside portion that is between the sensor panel and the adhesive layer on the inside of an edge part of the adhesive layer and an outside portion that is on the sensor panel on the outside of the outer edge part of the adhesive layer.
Provided is an optical device, wherein an optical element includes a light-transmitting substrate that has a first surface and a second surface, a light-blocking layer that is disposed on the first surface or the second surface, and an optical layer that is disposed on the first surface. The optical layer covers a light-passing region of the first surface. The optical element is disposed in an opening of a package in a state in which the second surface is positioned on the Fabry-Pérot interference filter side of the element with respect to the first surface. An engraved mark is provided in a surrounding area of the optical layer. A straight line in contact with the engraved mark and passing through a light-passing opening of the light-blocking layer does not intersect a light-transmitting region of the Fabry-Pérot interference filter.
G01J 3/26 - Production du spectreMonochromateurs en utilisant une réflexion multiple, p. ex. interféromètre de Fabry-Perot, filtre à interférences variables
G02B 26/00 - Dispositifs ou dispositions optiques pour la commande de la lumière utilisant des éléments optiques mobiles ou déformables
This optical element is provided with: a light-transmitting substrate having a first surface and a second surface; a light-blocking layer that is disposed on the first surface and has a light-passing aperture; a first multilayer film filter that is disposed on the first surface and covers a light-passing region of the first surface that overlaps the light-passing aperture when viewed from the thickness direction of the light-transmitting substrate, and a light-blocking region of the surface of the light-blocking layer, said light-blocking region surrounding the light-passing aperture when viewed from the thickness direction of the light-transmitting substrate; and a second multilayer film filter that is disposed on the second surface and overlaps the light-passing region and the light-blocking region when viewed from the thickness direction of the light-transmitting substrate.
A spectroscopic measurement device 1 comprises an optical system 10, a photodetector 20, and a control unit 30, and acquires a spectrum of measurement light composed of repeating light pulses. A light receiving unit 21 of the photodetector 20 has a light receiving surface in which a plurality of pixels 22 are two-dimensionally arranged in (M1 + M2) rows and N columns. The light receiving surface is divided into a first region 21A of M1 rows and N columns, and a second region 21B of M2 rows and N columns. The control unit 30 controls operations including charge accumulation of each pixel in the first region 21A, transfer of the charge accumulated by each pixel of the first region 21A to a first output unit 23A, and output of a first electrical signal from the first output unit 23A in synchronization with light pulse generation timing. The control unit 30 controls operations in the same manner with respect to the second region 21B and a second output unit 23B. As a result, it is possible to achieve a spectroscopic measurement device capable of efficiently acquiring, with a simple configuration, a spectrum of measurement light composed of rapidly repeating light pulses under various exposure conditions.
This belt drive mechanism includes a plurality of rollers and a belt stretched over the plurality of rollers. The belt has a contact surface in contact with the plurality of rollers. The contact surface includes a conductive region having a surface resistivity of 1 × 104Ω/sq. to 1 × 1011Ω/sq.
B65G 15/42 - Courroies ou porte-charges sans fin analogues en caoutchouc ou en matière plastique avec nervures, stries ou autres saillies superficielles
G01N 23/04 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en transmettant la radiation à travers le matériau et formant des images des matériaux
G01N 23/18 - Recherche de la présence de défauts ou de matériaux étrangers
88.
OPTICAL INFORMATION ACQUISITION DEVICE AND OPTICAL INFORMATION ACQUISITION METHOD
A measurement system 1 comprises: a first line sensor unit that has a first pixel unit 23a in which a plurality of pixels are arranged, detects measurement light from an object S moving relative to the first pixel unit 23a, and outputs a first detection signal; a second line sensor unit that has a second pixel unit 23b in which a plurality of pixels are arranged in parallel with the first pixel unit 23a, and an LRG filter 31 that is disposed so as to cover the second pixel unit 23b and has a characteristic such that the transmittance thereof changes monotonically in accordance with wavelength in a prescribed wavelength band, and the second line sensor unit detects the measurement light from the object S moving relative to the second pixel unit 23b and outputs a second detection signal; and a computer 10 that acquires a characteristic value related to the wavelength spectrum of the measurement light on the basis of at least the first detection signal and the second detection signal.
G01N 21/27 - CouleurPropriétés spectrales, c.-à-d. comparaison de l'effet du matériau sur la lumière pour plusieurs longueurs d'ondes ou plusieurs bandes de longueurs d'ondes différentes en utilisant la détection photo-électrique
G01J 3/02 - SpectrométrieSpectrophotométrieMonochromateursMesure de la couleur Parties constitutives
G01J 3/51 - Mesure de couleurDispositifs de mesure de couleur, p. ex. colorimètres en utilisant des détecteurs électriques de radiations en utilisant des filtres de couleur
A method for identifying a structural polymorphism of a fibrous protein or peptide, the method including the steps of: obtaining a fluorescence decay curve for a sample containing a fibrous protein or peptide and thioflavin T; performing exponential fitting of four or more components based on a specific function G(t) on a function F(t) of the fluorescence decay curve to obtain fluorescence lifetime values τ1 to τn and weighting factors A1 to An (n is a natural number of 4 or more) of the respective exponential components; and identifying the structural polymorphism of the fibrous protein or peptide based on at least one or more values of the fluorescence lifetime values τ1 to τn and at least one or more values of the weighting factors A1 to An (a fluorescence lifetime value and a weighting factor in an exponential component derived from autofluorescence of thioflavin T are excluded).
G01N 33/68 - Analyse chimique de matériau biologique, p. ex. de sang ou d'urineTest par des méthodes faisant intervenir la formation de liaisons biospécifiques par ligandsTest immunologique faisant intervenir des protéines, peptides ou amino-acides
An inspection device 1 comprises: an optical element 4 that has a property that the transmittance and reflectance thereof monotonically change in a predetermined wavelength region; a light reception unit 5 that receives transmitted light beams Lt transmitted through the optical element 4 and receives reflected light beams Lr reflected by the optical element 4, among light beams Lb from an inspection target object S, and that outputs luminance data of the transmitted light beams Lt and luminance data of the reflected light beams Lr; an image generation unit 6 that generates gravity-center wavelength image data GC of the inspection target object S with respect to the light beams Lb from the inspection target object S, on the basis of the luminance data of the transmitted light beams Lt and the luminance data of the reflected light beams Lr; and an identification unit 7 that identifies the material of a foreign matter W in the inspection target object S, on the basis of the gravity-center wavelength image data GC.
G01N 21/88 - Recherche de la présence de criques, de défauts ou de souillures
G01N 21/27 - CouleurPropriétés spectrales, c.-à-d. comparaison de l'effet du matériau sur la lumière pour plusieurs longueurs d'ondes ou plusieurs bandes de longueurs d'ondes différentes en utilisant la détection photo-électrique
G01N 21/359 - CouleurPropriétés spectrales, c.-à-d. comparaison de l'effet du matériau sur la lumière pour plusieurs longueurs d'ondes ou plusieurs bandes de longueurs d'ondes différentes en recherchant l'effet relatif du matériau pour les longueurs d'ondes caractéristiques d'éléments ou de molécules spécifiques, p. ex. spectrométrie d'absorption atomique en utilisant la lumière infrarouge en utilisant la lumière de l'infrarouge proche
93.
TRAINING METHOD, INFERENCE MODEL, NOISE REDUCTION METHOD, NOISE REDUCTION SYSTEM, AND NOISE REDUCTION PROGRAM
The present invention appropriately reduces flicker due to random noise in an analysis image used for failure analysis of a semiconductor device. This training method generates an inference model used for reducing flicker due to random noise in an analysis image used for failure analysis of a semiconductor device. The training method comprises: a training purpose acquisition step (S01) for acquiring a training analysis image including random noise and a target signal pertaining to the semiconductor device, and a training noise image not including the target signal and including random noise; noise addition steps (S02, S03) for reducing the contrast of the training analysis image, adding random noise of a training noise image to the training analysis image with the reduced contrast, and generating a noise-added training image; and a training step (S04) for training machine learning of the inference model by using the noise-added training image.
A method MT1 comprises: an original image acquisition step (step ST1) in which an original image is acquired for each focus position regarding an object; a point spread information calculation step (step ST4) regarding the original image for each focus position; a focus position determination step (step ST3) in which, on the basis of the original image for each focus position, the focus position of each pixel is determined; a focus position correction step (step ST5) in which the focus position of each pixel is corrected on the basis of the point spread information; and an all-in-focus image generation step (step ST6) in which pixels corresponding to the respective corrected focus positions of the pixels are extracted, and an all-in-focus image is generated by combining the extracted pixels.
This blood glucose level measurement device comprises: a light output unit that outputs light; a light detection unit that detects light that has been output by the light output unit and passed through a living body; a temporal phase difference calculation unit that, on the basis of the detection result of the light detection unit, calculates the temporal phase difference between an oxygenated hemoglobin waveform pertaining to the oxygenated hemoglobin concentration of the blood of the living body and a deoxygenated hemoglobin waveform pertaining to the deoxygenated hemoglobin concentration of the blood of the living body; a blood glucose level calculation unit that calculates the blood glucose level of the living body on the basis of the calculated temporal phase difference; a level of similarity estimation unit that estimates the level of waveform similarity between the oxygenated hemoglobin waveform and the deoxygenated hemoglobin waveform; and a reliability estimation unit that estimates the reliability of the calculated blood glucose level. The reliability estimation unit estimates that the reliability becomes smaller as the level of waveform similarity becomes smaller.
A61B 5/1455 - Mesure des caractéristiques du sang in vivo, p. ex. de la concentration des gaz dans le sang ou de la valeur du pH du sang en utilisant des capteurs optiques, p. ex. des oxymètres à photométrie spectrale
96.
WAVELENGTH-VARIABLE LIGHT SOURCE AND WAVELENGTH CONTROL METHOD
A wavelength-variable light source (1) comprises: an oscillation unit (2) that oscillates light; first light output units (4, 5, 6) that variably change the wavelength of the light oscillated by the oscillation unit and output first light having a wavelength in a first wavelength band; a second light optical path (21) that propagates second light having a wavelength different from the first light; and a sum frequency light generation unit (8) that includes a nonlinear optical crystal and combines the first light (L1) output by the first light output units and the second light (L2) propagated in the second light optical path on the same optical axis, causes the combined light to enter the nonlinear optical crystal, and emits sum frequency light (L3) having a wavelength in a second wavelength band shorter than the first wavelength band from the nonlinear optical crystal by sum frequency generation.
An X-ray detection camera determines whether or not a reset operation of performing voltage control on a detection unit such that an electric charge is not collected by the detection unit is executable based on a signal from a target object sensor that senses an inspection target object irradiated with an X-ray, and executes the reset operation in a case where the reset operation is executable.
G01N 23/083 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en transmettant la radiation à travers le matériau et mesurant l'absorption le rayonnement consistant en rayons X
G01N 23/04 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en transmettant la radiation à travers le matériau et formant des images des matériaux
Provided is a semiconductor laser including: a semiconductor substrate; a semiconductor lamination portion laminated on a surface of the semiconductor substrate; and a first electrode and a second electrode. The semiconductor lamination portion includes an active layer, a first cladding layer located on the semiconductor substrate side with respect to the active layer, and a second cladding layer located on a side opposite to the semiconductor substrate with respect to the active layer, each of the first cladding layer and the second cladding layer includes an n-type cladding layer, one cladding layer of the first cladding layer and the second cladding layer further includes a p-type cladding layer located between the n-type cladding layer and the active layer.
H01S 5/343 - Structure ou forme de la région activeMatériaux pour la région active comprenant des structures à puits quantiques ou à superréseaux, p. ex. lasers à puits quantique unique [SQW], lasers à plusieurs puits quantiques [MQW] ou lasers à hétérostructure de confinement séparée ayant un indice progressif [GRINSCH] dans des composés AIIIBV, p. ex. laser AlGaAs
This photonic integrated circuit is provided with: a substrate; an optical waveguide layer that is disposed on the substrate and includes an input coupler and an optical waveguide; a light-emitting device that is disposed on the optical waveguide layer; and a first exhaust heat member that is disposed between the substrate and the light-emitting device so as not to overlap with the input coupler or the optical waveguide when viewed in a thickness direction of the substrate, and that is thermally connected to at least the light-emitting device. The light-emitting device includes a light-emitting layer and a phase modulation layer. The phase modulation layer includes a base layer and a plurality of regions with different refractive indices. The light-emitting layer overlaps with the input coupler when viewed in the thickness direction of the substrate. The thermal conductivity of the first exhaust heat member is greater than the thermal conductivity of a cladding layer located on the light-emitting device side of the optical waveguide layer.
An interferometric measurement device includes an interferometric optical system that includes a beam splitter that splits the measurement light into a first and second split lights, a first optical path that reflects the first split light and re-enters it into the beam splitter, and a second optical path in which the second split light is folded back by a mirror member via a rotating mirror, wherein the interferometric optical system combines the first and second split lights re-entered into the beam splitter, a photomultiplier tube that detects the interference light of the first and second split lights, and an analysis unit that acquires a signal waveform that associates a measurement value of the detected interference light with an optical path length difference. The analysis unit monitors the beam position displaced according to the rotation of the rotating mirror and acquires the signal waveform based on the beam position.
