Systems and methods for conducting optical material analysis, such as Raman spectroscopy, using two lasers. A sample location is simultaneously irradiated with two laser beams along different optical axes. A detector acquires signals by detecting scattered photons from the sample location. The acquired signals include Raman signal. The fluorescence signal in the acquired signals is suppressed due to stimulated emission depletion.
In one example, a method for detecting defocus of an optical probe includes obtaining a first sub-image and a second sub-image of an image projected by the optics of the corresponding optical system onto a wavelength-sensitive photodetector in response to a sample region being illuminated with a first light beam of a first wavelength range and a second light beam of a second wavelength range. The first sub-image is formed with light detected by the wavelength-sensitive pixelated photodetector within the first wavelength range. The second sub-image is formed with light detected by the wavelength-sensitive pixelated photodetector within the second wavelength range. The method further includes determining a degree of defocus based on the first sub-image and the second sub-image.
In one example, a method for detecting defocus of an optical probe includes obtaining a first sub-image and a second sub-image of an image projected by the optics of the corresponding optical system onto a wavelength-sensitive photodetector in response to a sample region being illuminated with a first light beam of a first wavelength range and a second light beam of a second wavelength range. The first sub-image is formed with light detected by the wavelength-sensitive pixelated photodetector within the first wavelength range. The second sub-image is formed with light detected by the wavelength-sensitive pixelated photodetector within the second wavelength range. The method further includes determining a degree of defocus based on the first sub-image and the second sub-image.
Disclosed herein are scientific instrument support systems, as well as related methods, computing devices, and computer-readable media. For example, in some embodiments, a method of supporting spectroscopic calibration may include: generating a base calibration model using data from multiple base spectroscopic instruments, and finetuning the base calibration model using data from a target spectroscopic instrument to generate a target calibration model for use with the target spectroscopic instrument. In some embodiments, the number of wavelengths used in generating the base calibration model and/or the target calibration model may be less than the total number of wavelengths represented in the output of the spectroscopic instruments.
G01N 21/27 - CouleurPropriétés spectrales, c.-à-d. comparaison de l'effet du matériau sur la lumière pour plusieurs longueurs d'ondes ou plusieurs bandes de longueurs d'ondes différentes en utilisant la détection photo-électrique
Spectrum series are generated based on acquired photons responsive to irradiating a location of a sample with multiple light pulses. The spectrum series is processed with a trained 2D neural network to generate Raman spectrum with reduced fluorescence.
Optical configurations for confocal structured illumination Raman (C-SIM Raman) microscopy systems are provided. One example includes a light source configured to project a light; a first set of optical components fixedly aligned along a first optical path, wherein the first set of optical components includes a vortex phase plate and a quarter wave plate, wherein the first set of optical components is configured to receive the light; and a second set of optical components configured to be adjusted between a first operating position and a second operating position. When in the first operating position, the second set of optical component is aligned on the first optical path and is configured to expand, in conjunction with the first set of optical components, the light into an expanded light. When in the second operating position, the second set of optical components is not aligned on the first optical path.
Systems and methods for Raman spectroscopy. In one example, a method for analysing a sample (404, 530) includes irradiating the sample (404, 530) with a second light and acquiring a fluorescence signal (504), and adjusting a first light (305) based on the fluorescence signal (504). The method includes irradiating the sample (404, 530) with the adjusted first light (305) and acquiring a Raman signal, and analysing a sample composition based on the Raman signal.
A method for quality control is executable by an electronic processing device. The method includes receiving a spectrum collected from a sample, inputting the spectrum to an autoencoder trained with a plurality of training spectra belonging to a class, and indicating whether the spectrum is a member of the class based on an output from the trained autoencoder.
An optical steering mechanism and methods for using the same. One optical steering mechanism includes a first lens defining a first focal length having a first magnitude and a first polarity and a second lens defining a second focal length having a second magnitude and a second polarity. The first and second magnitudes are substantially equal and the first and second polarities are opposite, and wherein the second lens is positioned to directly receive an optical beam passing through the first lens. The optical beam steering mechanism also includes at least one rotary motor coupled to one of the first lens and the second lens and configured to swing the lens coupled thereto in an arcuate path. An optical beam path of the optical beam passed through the second lens is adjustable by operating the rotary motor.
G02B 21/26 - PlatinesMoyens de réglage pour celles-ci
G02F 1/29 - Dispositifs ou dispositions pour la commande de l'intensité, de la couleur, de la phase, de la polarisation ou de la direction de la lumière arrivant d'une source lumineuse indépendante, p. ex. commutation, ouverture de porte ou modulationOptique non linéaire pour la commande de la position ou de la direction des rayons lumineux, c.-à-d. déflexion
12.
LINEARIZATION OF MERCURY CADMIUM TELLURIDE PHOTODETECTORS
Methods for linearization of photodetector response include establishing one or more static calibration coefficients based on comparison of test photodetector response to a linear reference photodetector. In some examples, dynamic calibration coefficients are determined based on average photodetector signals. In some applications such as FTIR, linearized ratios are obtained with a single calibration coefficient.
In accordance with the claimed invention, there is provided an apparatus for changing an oxidation state of a surface to be analysed of a sample, the apparatus comprising: a vacuum chamber; a sample holder inside the vacuum chamber, configured to hold a sample having a surface to be analysed; an inlet inside the vacuum chamber, configured to provide a localised supply, to the surface to be analysed, of an agent for changing an oxidation state of the surface to be analysed; and an energy source, configured to provide energy to the agent to facilitate changing the oxidation state of the surface to be analysed. There is also provided a process for changing an oxidation state of a surface to be analysed of a sample and a process for performing X-ray photoelectron spectroscopy, XPS, of a surface to be analysed of a sample.
G01N 23/2273 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en mesurant l'émission secondaire de matériaux en mesurant l'effet photo-électrique, p. ex. microscopie d'émission photo-électronique [PEEM] en mesurant le spectre photo-électronique, p. ex. spectroscopie électronique pour l’analyse chimique [ESCA] ou spectroscopie photo-électronique par rayon X [XPS]
G01N 31/00 - Recherche ou analyse des matériaux non biologiques par l'emploi des procédés chimiques spécifiés dans les sous-groupesAppareils spécialement adaptés à de tels procédés
14.
UNSUPERVISED TECHNIQUES FOR IDENTIFYING UNIVARIATE AND MULTIVARIATE ANOMALIES IN SCIENTIFIC INSTRUMENT RESULTS WITHIN A LABORATORY INFORMATION MANAGEMENT SYSTEM
FISHER SCIENTIFIC COSTA RICA SOCIEDAD DE RESPONSABILIDAD LIMITADA (Costa Rica)
THERMO ELECTRON LIMITED (Royaume‑Uni)
Inventeur(s)
Rodríguez García, Sebastián Darío
Hardy, David
Abrégé
A method of detecting sample anomalies within a laboratory information management system includes obtaining a first result for a sample, processing the first result via a univariate machine learning model, processing a plurality of results for the sample via a multivariate machine learning model in response to the univariate machine learning model generating a normal output for the first result, and flagging, within the laboratory information management system, the sample for rejection processing in response to the multivariate machine learning model generating an abnormal output for the plurality of samples. The first result represents a first type of result, the univariate machine learning model is trained using unsupervised machine learning, the plurality of results includes the first result, each of the plurality of results represents a different type of result for the sample, and the multivariate machine learning model trained using unsupervised machine learning.
G01N 35/00 - Analyse automatique non limitée à des procédés ou à des matériaux spécifiés dans un seul des groupes Manipulation de matériaux à cet effet
15.
UNSUPERVISED TECHNIQUES FOR IDENTIFYING UNIVARIATE AND MULTIVARIATE ANOMALIES IN SCIENTIFIC INSTRUMENT RESULTS WITHIN A LABORATORY INFORMATION MANAGEMENT SYSTEM
FISHER SCIENTIFIC COSTA RICA SOCIEDAD DE RESPONSABILIDAD LIMITADA (Costa Rica)
Inventeur(s)
Hardy, David
Rodriguez Garcia, Sebastian Dario
Abrégé
A method of detecting sample anomalies within a laboratory information management system includes obtaining a first result for a sample, processing the first result via a univariate machine learning model, processing a plurality of results for the sample via a multivariate machine learning model in response to the univariate machine learning model generating a normal output for the first result, and flagging, within the laboratory information management system, the sample for rejection processing in response to the multivariate machine learning model generating an abnormal output for the plurality of samples. The first result represents a first type of result, the univariate machine learning model is trained using unsupervised machine learning, the plurality of results includes the first result, each of the plurality of results represents a different type of result for the sample, and the multivariate machine learning model trained using unsupervised machine learning.
A method of analyzing a sample imaged by electron backscatter diffraction. The method comprises identifying a plurality of Kikuchi bands in an electron backscatter diffraction image of a position on the sample. The method further comprises forming, for each identified Kikuchi band, a respective vector representation of said Kikuchi band based at least in part on an estimate of the position on the sample. A configuration of the sample is determined by identifying a particular set of expected vector representations from a plurality of sets of expected vector representations as matching the vector representations of the plurality of identified Kikuchi bands.
G01N 23/203 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en utilisant la diffraction de la radiation par les matériaux, p. ex. pour rechercher la structure cristallineRecherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en utilisant la diffusion de la radiation par les matériaux, p. ex. pour rechercher les matériaux non cristallinsRecherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en utilisant la réflexion de la radiation par les matériaux en mesurant la rétrodiffusion
17.
SWAPPABLE DETECTOR MODULE FOR SPECTROSCOPE SYSTEMS
A removably insertable detector module for a spectroscope. An example microscope system includes a microscope plate, a plurality of posts fix-mounted to the microscope plate, and a detector module removably mounted to the microscope plate. The posts align the detector module with respect to the microscope plate. The detector module includes a detector base plate, a detector fix-mounted on the detector base plate, and an optical element fix-mounted on the detector base plate. The optical element is configured to receive a light and direct the light to the detector.
Disclosed herein are scientific instrument utilization tracking systems, as well as related methods, computing devices, and computer-readable media. For example, in some embodiments, a method of tracking utilization of a scientific instrument may include: receiving, at a computing system, first data from a power sensor associated with the scientific instrument, wherein the power sensor monitors power consumption by the scientific instrument; generating, by the computing system based on the first data, multiple power consumption ranges associated with corresponding operational states of the scientific instrument; receiving, at the computing system, second data from the power sensor associated with the scientific instrument; and outputting, by the computing system, indications of the operational states over time of the scientific instrument based on the second data and the power consumption ranges.
Apparatus can include an input aperture configured to provide an input beam, primary optics configured to collimate the input beam, a grism situated to receive the collimated input beam and to produce a wavelength dispersed beam, and secondary optics configured to receive and direct the wavelength dispersed beam to a detector. Primary optics can include a primary reflector including an off-axis parabolic mirror, wherein the off-axis parabolic mirror is configured to produce the collimated input beam. Secondary optics can include a first secondary reflector and a second secondary reflector, wherein the first secondary reflector is situated to receive and reflect the wavelength dispersed beam to the second secondary reflector and the second secondary reflector is situated to receive and direct the wavelength dispersed beam to the detector.
Methods and systems for detecting a sample via optical pathways are described herein. In one aspect, a light detection system can include: a first optical pathway configured to direct emissions from an interrogation site to a first detector; a second optical pathway configured to direct emissions from the interrogation site to a second detector; and an automated switching module configured to receive a signal that induces the automated switching module to switch between (i) a first state that directs emissions from the interrogation site to the first optical pathway or a second state that directs emissions from the interrogation site to the second optical pathway and (ii) the other of the first state and the second state.
Apparatus can include an input aperture configured to provide an input beam, primary optics configured to collimate the input beam, a grism situated to receive the collimated input beam and to produce a wavelength dispersed beam, and secondary optics configured to receive and direct the wavelength dispersed beam to a detector. Primary optics can include a primary reflector including an off-axis parabolic mirror, wherein the off-axis parabolic mirror is configured to produce the collimated input beam. Secondary optics can include a first secondary reflector and a second secondary reflector, wherein the first secondary reflector is situated to receive and reflect the wavelength dispersed beam to the second secondary reflector and the second secondary reflector is situated to receive and direct the wavelength dispersed beam to the detector.
A spectrograph includes a base, a first optic mounted with respect to the base, a second optic mounted with respect to the base, and a third optic mounted with respect to the base. A first relative position between the first optic and the second optic is adjustable about a first pivot axis. A second relative position between the second optic and the third optic is adjustable about a second pivot axis independently from the adjustability of the relative position between the first optic and the second optic. The second pivot axis is substantially coincident with the first pivot axis, and a distance between the third optic and the second optic is fixed during adjustment of the second relative position.
G01N 21/31 - CouleurPropriétés spectrales, c.-à-d. comparaison de l'effet du matériau sur la lumière pour plusieurs longueurs d'ondes ou plusieurs bandes de longueurs d'ondes différentes en recherchant l'effet relatif du matériau pour les longueurs d'ondes caractéristiques d'éléments ou de molécules spécifiques, p. ex. spectrométrie d'absorption atomique
Analytical instrument systems, components, and methods for stabilizing discharge formation are described. A spark gap device includes a first planar coil, defining an axis normal to a coil plane and defining a first aperture substantially centered about the axis. The spark gap device includes a second planar coil, offset from the first planar coil along the axis and substantially parallel with the coil plane, the second planar coil defining a second aperture substantially centered about the axis. The spark gap device also includes a conductive element disposed in the first aperture and substantially aligned with the axis.
G01N 21/67 - Systèmes dans lesquels le matériau analysé est excité de façon à ce qu'il émette de la lumière ou qu'il produise un changement de la longueur d'onde de la lumière incidente excité électriquement, p. ex. par électroluminescence en utilisant des arcs électriques ou des décharges électriques
Computer-implemented image processing methods with a computer processor and computer memory, comprise accessing, from the computer memory, a non-toroidal beam image component comprising a set of pixel intensities across an imaging area and a toroidal beam image component comprising a set of pixel intensities across the imaging area, scaling, with the computer processor, an image intensity of at least one pixel of one of the non-toroidal or toroidal beam image components by a ratio between a peak non-toroidal beam imaging pixel intensity across the imaging area and a peak toroidal beam imaging intensity across the imaging area to produce a scaled image intensity, and determining a difference between the scaled image intensity of the at least one pixel of the non-toroidal or toroidal image components and an image intensity of at least one pixel of the other of the non-toroidal or toroidal image components to form at least a portion of an image.
Interfering internal beams can be used to generate an internal reference interferogram. This interferogram can be used to compensate for changes in FTIR instrument performance in response to variable environmental conditions or other instrument variations. Acquisition of such internal interferograms can be done during, after, or prior to acquisition of actual sample data.
An optical measurement system measurement system for examining a sample. The measurement system comprises an internally reflective element, a stage, an optical assembly, a chassis, and a sensor. The internally reflective element has a contact surface. The stage is positioned below the internally reflective element. The stage and the internally reflective element are configured to apply a force to the sample. The optical assembly comprises a light source and a light detector. The optical assembly is configured to scan the sample by directing source light from the light source towards the contact surface and detecting source light optically interacting with the contact surface by the light detector. The chassis is configured to support the optical assembly and the internally reflective element. The sensor is mounted to the chassis and configured to detect the force applied to the sample by the internally reflective element and the stage.
G01N 21/3563 - CouleurPropriétés spectrales, c.-à-d. comparaison de l'effet du matériau sur la lumière pour plusieurs longueurs d'ondes ou plusieurs bandes de longueurs d'ondes différentes en recherchant l'effet relatif du matériau pour les longueurs d'ondes caractéristiques d'éléments ou de molécules spécifiques, p. ex. spectrométrie d'absorption atomique en utilisant la lumière infrarouge pour l'analyse de solidesPréparation des échantillons à cet effet
G01L 1/22 - Mesure des forces ou des contraintes, en général en mesurant les variations de la résistance ohmique des matériaux solides ou des fluides conducteurs de l'électricitéMesure des forces ou des contraintes, en général en faisant usage des cellules électrocinétiques, c.-à-d. des cellules contenant un liquide, dans lesquelles un potentiel électrique est produit ou modifié par l'application d'une contrainte en utilisant des jauges de contrainte à résistance
28.
SYSTEMS AND METHODS FOR ANALYZING MICROVOLUME SAMPLE
Systems and methods for analyzing a liquid sample. One system includes a first surface including at least a part of a first electrode and a second surface including at least a part of a second electrode. The second surface is positioned opposite the first surface for holding a microvolume liquid sample between the first surface and the second surface by surface tension. The system also includes an electronic processing unit electrically coupled to at least one of the first electrode and the second electrode for receiving electrical signals from the liquid sample to measure an electrochemical property of the liquid sample.
Systems and methods under the present disclosure can provide communication between instruments or resources at multiple locations. One example is a system of interconnection for various types of assets at multiple laboratories in different locations. Assets, devices, resources, or services at a location can multicast a beacon identifying itself. Verification of the asset, etc., can be done by communicating with a URI associated with that asset. Authentication of assets can be token-based to enable communication. Proxy servers at all or some of the locations can manage authentication and communication between locations and between assets. Tunnels can be implemented between different locations to help ensure secure communication.
Disclosed herein are various systems and methods for optical emission spectroscopy. In some examples a substrate can be formed from conductive layers separated by a dielectric layer, the substrate having at least one recess therein, and the recess having an aperture therethrough. A chamber then encloses the area over the recess, the chamber including chamber walls, a gas inlet, and a gas outlet to allow a gas to fill the chamber. An arc is then created across the substrate using the conductive layers. The arc may form a plasma using the gas inside the chamber. The plasma then ablates a surface of a specimen, generating photons that can then be analyzed by a spectrometer.
G01N 21/25 - CouleurPropriétés spectrales, c.-à-d. comparaison de l'effet du matériau sur la lumière pour plusieurs longueurs d'ondes ou plusieurs bandes de longueurs d'ondes différentes
G01N 21/67 - Systèmes dans lesquels le matériau analysé est excité de façon à ce qu'il émette de la lumière ou qu'il produise un changement de la longueur d'onde de la lumière incidente excité électriquement, p. ex. par électroluminescence en utilisant des arcs électriques ou des décharges électriques
31.
Microcavity Plasma Array for Optical Emission Spectroscopy
Disclosed herein are various systems and methods for optical emission spectroscopy. In some examples a substrate can be formed from conductive layers separated by a dielectric layer, the substrate having at least one recess therein, and the recess having a aperture therethrough. A chamber then encloses the area over the recess, the chamber including chamber walls, a gas inlet and a gas outlet to allow a gas to fill the chamber. An arc is then created across the substrate using the conductive layers. The arc may form a plasma using the gas inside the chamber. The plasma then ablates a surface of a specimen generating photons that can then be analyzed by a spectrometer.
G01N 21/71 - Systèmes dans lesquels le matériau analysé est excité de façon à ce qu'il émette de la lumière ou qu'il produise un changement de la longueur d'onde de la lumière incidente excité thermiquement
An absolute transmission accessory for a spectrometer. One example spectrometer system includes a base plate, a light source configured to transmit light, and an interferometer mounted to the base plate. The interferometer receives the light from the light source and output modulated light. The spectrometer system includes a first optical element configured to receive the modulated light and direct the modulated light, and a second optical element configured to receive the modulated light and focus the modulated light to a sample compartment. The spectrometer system includes a detector compartment including one or more detectors, the detector compartment configured to receive light from the sample compartment. The spectrometer system includes a sample holder coupled to the base plate. The modulated light is directed to the sample holder, and light exiting the sample holder is directed through the sample compartment and to the detector compartment via the second optical element.
G01N 21/35 - CouleurPropriétés spectrales, c.-à-d. comparaison de l'effet du matériau sur la lumière pour plusieurs longueurs d'ondes ou plusieurs bandes de longueurs d'ondes différentes en recherchant l'effet relatif du matériau pour les longueurs d'ondes caractéristiques d'éléments ou de molécules spécifiques, p. ex. spectrométrie d'absorption atomique en utilisant la lumière infrarouge
33.
POINT CLOUD FOR SAMPLE IDENTIFICATION AND DEVICE CONFIGURATION
Scientific instrument support systems and related methods, computing devices, and computer-readable media for aligning scientific instruments. The method includes, generating, with a first scientific instrument, a first point cloud representative of a sample, wherein the first point cloud is in an n-dimensional space and n is an integer, and generating, with a second scientific instrument different from the first scientific instrument, a second point cloud representative of the sample, wherein the second point cloud is in an m-dimensional space, different from the n-dimensional space associated with the first point cloud and wherein m is an integer. The method includes generating an offset between the first point cloud and the second point cloud using a transformation relating the n-dimensional space to the m-dimensional space, and aligning an output of the second scientific instrument with an output of the first scientific instrument based on the offset.
G01J 3/00 - SpectrométrieSpectrophotométrieMonochromateursMesure de la couleur
G01B 11/00 - Dispositions pour la mesure caractérisées par l'utilisation de techniques optiques
G06V 10/40 - Extraction de caractéristiques d’images ou de vidéos
G06V 10/70 - Dispositions pour la reconnaissance ou la compréhension d’images ou de vidéos utilisant la reconnaissance de formes ou l’apprentissage automatique
G06V 10/82 - Dispositions pour la reconnaissance ou la compréhension d’images ou de vidéos utilisant la reconnaissance de formes ou l’apprentissage automatique utilisant les réseaux neuronaux
A61B 5/00 - Mesure servant à établir un diagnostic Identification des individus
34.
Nano and Microscale Patterned Surfaces for Centering a Droplet
System and methods for spectrophotometers are described that can utilize ferrules configured to hold a sample test droplet therebetween via surface tension. Light sources in the systems can shine a light on the test droplet and an output of reflected or refracted light can be measured, which can assist in various testing and analysis procedures. Nanoscale or microscale structures can be incorporated on the ferrules to create hydrophobic or superhydrophobic surfaces. This helps prevent test droplets from wetting the ferrules surfaces and helps prevent polluting or mixing of test materials. The ferrules can therefore achieve certain self-cleaning capabilities and test results are more accurate.
System and methods for spectrophotometers are described that can utilize ferrules configured to hold a sample test droplet therebetween via surface tension. Light sources in the systems can shine a light on the test droplet and an output of reflected or refracted light can be measured, which can assist in various testing and analysis procedures. Nanoscale or microscale structures can be incorporated on the ferrules to create hydrophobic or superhydrophobic surfaces. This helps prevent test droplets from wetting the ferrules surfaces and helps prevent polluting or mixing of test materials. The ferrules can therefore achieve certain self-cleaning capabilities and test results are more accurate.
G01J 3/02 - SpectrométrieSpectrophotométrieMonochromateursMesure de la couleur Parties constitutives
G01N 21/01 - Dispositions ou appareils pour faciliter la recherche optique
G01J 3/10 - Aménagements de sources lumineuses spécialement adaptées à la spectrométrie ou à la colorimétrie
G01J 3/42 - Spectrométrie d'absorptionSpectrométrie à double faisceauSpectrométrie par scintillementSpectrométrie par réflexion
H01J 49/04 - Dispositions pour introduire ou extraire les échantillons devant être analysés, p. ex. fermetures étanches au videDispositions pour le réglage externe des composants électronoptiques ou ionoptiques
There is described a method of determining a chemical composition of a sample using electron spectroscopy, the method comprising: ablating material from an area on a surface of a sample by irradiating the area with one or more pulses of a laser; irradiating at least part of the area with an excitation beam of electrons or electromagnetic radiation; measuring intensities and energies of electrons emitted from the at least part of the area of the sample as a result of the excitation beam; and repeating the steps of: ablating material, irradiating with the excitation beam, and measuring intensities and energies, to determine a quantitative surface depth profile of the chemical composition of at least part of the sample. There is also described an electron spectroscopy apparatus for determining a chemical composition of a sample.
G01N 23/2273 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en mesurant l'émission secondaire de matériaux en mesurant l'effet photo-électrique, p. ex. microscopie d'émission photo-électronique [PEEM] en mesurant le spectre photo-électronique, p. ex. spectroscopie électronique pour l’analyse chimique [ESCA] ou spectroscopie photo-électronique par rayon X [XPS]
37.
SYSTEMS AND METHODS FOR SPECTROSCOPIC INSTRUMENT CALIBRATION
Disclosed herein are scientific instrument support systems, as well as related methods, computing devices, and computer-readable media. For example, in some embodiments, a method of supporting spectroscopic calibration may include: generating a base calibration model using data from multiple base spectroscopic instruments, and finetuning the base calibration model using data from a target spectroscopic instrument to generate a target calibration model for use with the target spectroscopic instrument. In some embodiments, the number of wavelengths used in generating the base calibration model and/or the target calibration model may be less than the total number of wavelengths represented in the output of the spectroscopic instruments.
G01J 3/18 - Production du spectreMonochromateurs en utilisant des éléments diffractants, p. ex. réseaux
G01D 18/00 - Test ou étalonnage des appareils ou des dispositions prévus dans les groupes
G01N 21/67 - Systèmes dans lesquels le matériau analysé est excité de façon à ce qu'il émette de la lumière ou qu'il produise un changement de la longueur d'onde de la lumière incidente excité électriquement, p. ex. par électroluminescence en utilisant des arcs électriques ou des décharges électriques
H01J 49/00 - Spectromètres pour particules ou tubes séparateurs de particules
An embodiment of a phase mask includes a light blocking layer disposed on a substrate, where the light blocking layer has a number of optically transmissive regions each configured as a first pattern. The first pattern includes two segments that have different phase configurations from each other, and the light blocking layer includes at least three angular orientations of the first pattern.
A beam extraction system is provided. The beam extraction system includes a first focusing optic, a second focusing optic, and an optic relay coupled to the first focusing optic and the second focusing optic. The first focusing optic is configured to form a light beam from light collected from a sample positioned at a focal point of the first focusing optic. The second focusing optic is configured to couple the light beam to a detector. The optic relay provides an optic path for the light beam from the first focusing optic to the second focusing optic.
A beam extraction system is provided. The beam extraction system includes a first focusing optic, a second focusing optic, and an optic relay coupled to the first focusing optic and the second focusing optic. The first focusing optic is configured to form a light beam from light collected from a sample positioned at a focal point of the first focusing optic. The second focusing optic is configured to couple the light beam to a detector. The optic relay provides an optic path for the light beam from the first focusing optic to the second focusing optic.
G01N 23/2251 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en mesurant l'émission secondaire de matériaux en utilisant des microsondes électroniques ou ioniques en utilisant des faisceaux d’électrons incidents, p. ex. la microscopie électronique à balayage [SEM]
Methods for linearization of photodetector response include establishing one or more static calibration coefficients based on comparison of test photodetector response to a linear reference photodetector. In some examples, dynamic calibration coefficients are determined based on average photodetector signals. In some applications such as FTIR, linearized ratios are obtained with a single calibration coefficient.
Methods and systems for automatically adjusting a sample position in a spectrometer, such as a Fourier-transform infrared (FTIR) spectrometer, are described. The sample may be automatically positioned using an auto-focusing procedure. For example, images including an aperture marker are acquired by directing light towards the sample via an aperture. The sample position may be adjusted based on features extracted from the aperture marker images.
G01J 3/02 - SpectrométrieSpectrophotométrieMonochromateursMesure de la couleur Parties constitutives
G01N 21/359 - CouleurPropriétés spectrales, c.-à-d. comparaison de l'effet du matériau sur la lumière pour plusieurs longueurs d'ondes ou plusieurs bandes de longueurs d'ondes différentes en recherchant l'effet relatif du matériau pour les longueurs d'ondes caractéristiques d'éléments ou de molécules spécifiques, p. ex. spectrométrie d'absorption atomique en utilisant la lumière infrarouge en utilisant la lumière de l'infrarouge proche
A web gauging system and methods of using the web gauging system are described. The web gauging system includes a supercontinuum Laser providing a light beam. A beam expander is configured to expand the light beam and provide an expanded beam to a sample illumination area. A detector unit configured to detect a sample light from the illumination area. A moving web can be placed in the illumination area, where the web gauging system measures parameters of the web.
G01B 11/06 - Dispositions pour la mesure caractérisées par l'utilisation de techniques optiques pour mesurer la longueur, la largeur ou l'épaisseur pour mesurer l'épaisseur
A microscope for examining a specimen configured to receive a first light source or a second light source. The first light source being configured to emit a first output light through a first pupil, and the second light source being configured to emit a second output light through a second pupil that is different than the first pupil. The microscope comprises a frame, a source objective, and first and second optical assemblies. The first and second optical assemblies are removably connectable to the frame. The first optical assembly comprises a first set of optical elements that are configured to pass the first output light to an imaging pupil of the source objective, and the second optical assembly comprises a second set of optical elements configured to pass the second output light to the imaging pupil.
A web gauging system and methods of using the web gauging system are described. The web gauging system includes a supercontinuum Laser providing a light beam. A beam expander is configured to expand the light beam and provide an expanded beam to a sample illumination area. A detector unit configured to detect a sample light from the illumination area. A moving web can be placed in the illumination area, where the web gauging system measures parameters of the web.
G01B 11/06 - Dispositions pour la mesure caractérisées par l'utilisation de techniques optiques pour mesurer la longueur, la largeur ou l'épaisseur pour mesurer l'épaisseur
Provided are systems and methods related to hybrid reflective microscope objectives and lens systems used in a spectroscopy system. The objective lens system includes a primary aspheric mirror having a first R-value; and a secondary aspheric mirror having a second R-value smaller than the first R-value, where in the objective lens system has a working distance of at least 20 mm and a numerical aperture of 0.29-0.65, and wherein surfaces of the primary and secondary aspheric mirrors have a non-zero sixth order aspheric parameter.
A measurement system configured to examine a sample. The system comprises an internally reflective element, a contact member, an actuator, an optical assembly, a sensor, and a controller. The contact member and the reflective element are configured to apply a force to the sample. The optical assembly is configured to scan the sample. Whereby prior to the scan, an initial force is applied to the sample, and after the scan, a resulting force is applied to the sample. The sensor is configured to detect the resulting force applied to the sample, and the controller is configured to receive a signal from the sensor indicative of the detected resulting force. The controller is further configured to control the actuator to adjust the force applied to the sample by the contact member and the internally reflective element from the resulting force to the initial force.
G01L 1/22 - Mesure des forces ou des contraintes, en général en mesurant les variations de la résistance ohmique des matériaux solides ou des fluides conducteurs de l'électricitéMesure des forces ou des contraintes, en général en faisant usage des cellules électrocinétiques, c.-à-d. des cellules contenant un liquide, dans lesquelles un potentiel électrique est produit ou modifié par l'application d'une contrainte en utilisant des jauges de contrainte à résistance
G01N 21/25 - CouleurPropriétés spectrales, c.-à-d. comparaison de l'effet du matériau sur la lumière pour plusieurs longueurs d'ondes ou plusieurs bandes de longueurs d'ondes différentes
G01N 21/35 - CouleurPropriétés spectrales, c.-à-d. comparaison de l'effet du matériau sur la lumière pour plusieurs longueurs d'ondes ou plusieurs bandes de longueurs d'ondes différentes en recherchant l'effet relatif du matériau pour les longueurs d'ondes caractéristiques d'éléments ou de molécules spécifiques, p. ex. spectrométrie d'absorption atomique en utilisant la lumière infrarouge
48.
Method and apparatus for determining a force applied to a sample during an optical interrogation technique
An optical measurement system measurement system for examining a sample. The measurement system comprises an internally reflective element, a stage, an optical assembly, a chassis, and a sensor. The internally reflective element has a contact surface. The stage is positioned below the internally reflective element. The stage and the internally reflective element are configured to apply a force to the sample. The optical assembly comprises a light source and a light detector. The optical assembly is configured to scan the sample by directing source light from the light source towards the contact surface and detecting source light optically interacting with the contact surface by the light detector. The chassis is configured to support the optical assembly and the internally reflective element. The sensor is mounted to the chassis and configured to detect the force applied to the sample by the internally reflective element and the stage.
G01N 21/35 - CouleurPropriétés spectrales, c.-à-d. comparaison de l'effet du matériau sur la lumière pour plusieurs longueurs d'ondes ou plusieurs bandes de longueurs d'ondes différentes en recherchant l'effet relatif du matériau pour les longueurs d'ondes caractéristiques d'éléments ou de molécules spécifiques, p. ex. spectrométrie d'absorption atomique en utilisant la lumière infrarouge
G01L 1/22 - Mesure des forces ou des contraintes, en général en mesurant les variations de la résistance ohmique des matériaux solides ou des fluides conducteurs de l'électricitéMesure des forces ou des contraintes, en général en faisant usage des cellules électrocinétiques, c.-à-d. des cellules contenant un liquide, dans lesquelles un potentiel électrique est produit ou modifié par l'application d'une contrainte en utilisant des jauges de contrainte à résistance
G01N 21/3563 - CouleurPropriétés spectrales, c.-à-d. comparaison de l'effet du matériau sur la lumière pour plusieurs longueurs d'ondes ou plusieurs bandes de longueurs d'ondes différentes en recherchant l'effet relatif du matériau pour les longueurs d'ondes caractéristiques d'éléments ou de molécules spécifiques, p. ex. spectrométrie d'absorption atomique en utilisant la lumière infrarouge pour l'analyse de solidesPréparation des échantillons à cet effet
An embodiment of a microscope system is described that comprises a sample stage configured to position a sample; and a spectrometer comprising an interferometer configure to provide a light beam to the sample stage and one or more detectors configured to detect light spectra in response to the light beam, wherein the spectrometer sends a notification to the sample stage after a scan comprising an acceptable measure of quality has been acquired from the detected light spectra at a first location, and the sample stage is further configured to count the notifications and initiate movement of the sample stage to a second location when a count value reaches a pre-determined number.
G01N 21/35 - CouleurPropriétés spectrales, c.-à-d. comparaison de l'effet du matériau sur la lumière pour plusieurs longueurs d'ondes ou plusieurs bandes de longueurs d'ondes différentes en recherchant l'effet relatif du matériau pour les longueurs d'ondes caractéristiques d'éléments ou de molécules spécifiques, p. ex. spectrométrie d'absorption atomique en utilisant la lumière infrarouge
A method and apparatus for detection of charged particles in spectroscopy. Charged particles, received from an energy dispersive spectroscopic analyser as a charged particle beam, are accelerated towards a detector. The accelerated charged particles are received at an array of detecting pixels, the array of detecting pixels forming the detector. The charged particles arriving at the detector have a spread in the energy dispersive direction.
G01N 23/2273 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en mesurant l'émission secondaire de matériaux en mesurant l'effet photo-électrique, p. ex. microscopie d'émission photo-électronique [PEEM] en mesurant le spectre photo-électronique, p. ex. spectroscopie électronique pour l’analyse chimique [ESCA] ou spectroscopie photo-électronique par rayon X [XPS]
An embodiment of a support structure for adjusting the position of a plurality of optical elements is described that comprises a base plate comprising a centering pin, a first translation slot, and a second translation slot; and a translatable plate configured to operatively couple with a plurality of the optical elements and move relative to the base plate, wherein the translatable plate comprises a centering slot configured to engage with the centering pin, a first cam configured to engage with the first translation slot and control movement of the translatable plate along a first axis, and a second cam configured to engage with the second translation slot and control movement of the translatable plate along a second axis.
G01J 3/02 - SpectrométrieSpectrophotométrieMonochromateursMesure de la couleur Parties constitutives
G02B 7/182 - Montures, moyens de réglage ou raccords étanches à la lumière pour éléments optiques pour prismesMontures, moyens de réglage ou raccords étanches à la lumière pour éléments optiques pour miroirs pour miroirs
An embodiment of a support structure for adjusting the position of a plurality of optical elements is described that comprises a base plate comprising a centering pin, a first translation slot, and a second translation slot; and a translatable plate configured to operatively couple with a plurality of the optical elements and move relative to the base plate, wherein the translatable plate comprises a centering slot configured to engage with the centering pin, a first cam configured to engage with the first translation slot and control movement of the translatable plate along a first axis, and a second cam configured to engage with the second translation slot and control movement of the translatable plate along a second axis.
Aspects of the disclosure relate to utilizing independently stored validation keys to enable auditing of instrument measurement data maintained in a blockchain. A computing platform may receive, from a first block generator, a first data block comprising first measurement data captured by a first instrument and associated with a sample. Subsequently, the computing platform may receive a first validation key for the first data block calculated from contents of the first data block. Then, the computing platform may store the first data block and the first validation key for the first data block in a blockchain associated with the data management computing platform. Next, the computing platform may send the first validation key for the first data block to a data escrow database system, which may cause the data escrow database system to store the first validation key in a validation keys database.
G06F 16/215 - Amélioration de la qualité des donnéesNettoyage des données, p. ex. déduplication, suppression des entrées non valides ou correction des erreurs typographiques
G06F 16/21 - Conception, administration ou maintenance des bases de données
54.
Methods and apparatus for electron backscatter diffraction sample characterisation
A method of analyzing a sample imaged by electron backscatter diffraction. The method comprises identifying a plurality of Kikuchi bands in an electron backscatter diffraction image of a position on the sample. The method further comprises forming, for each identified Kikuchi band, a respective vector representation of said Kikuchi band based at least in part on an estimate of the position on the sample. A configuration of the sample is determined by identifying a particular set of expected vector representations from a plurality of sets of expected vector representations as matching the vector representations of the plurality of identified Kikuchi bands.
G01N 23/203 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en utilisant la diffraction de la radiation par les matériaux, p. ex. pour rechercher la structure cristallineRecherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en utilisant la diffusion de la radiation par les matériaux, p. ex. pour rechercher les matériaux non cristallinsRecherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en utilisant la réflexion de la radiation par les matériaux en mesurant la rétrodiffusion
An embodiment of a shutter assembly is described that comprises a support structure with a number of stations and operatively coupled to a motor configured to translate each of the stations to a position in front of a detector, wherein a first station comprises a first aperture, a first charged particle filter, and a first window; and a second station comprises a second aperture larger than the first aperture, a second charged particle filter, and a second window thinner than the first window.
B22F 10/28 - Fusion sur lit de poudre, p. ex. fusion sélective par laser [FSL] ou fusion par faisceau d’électrons [EBM]
G01N 23/2252 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en mesurant l'émission secondaire de matériaux en utilisant des microsondes électroniques ou ioniques en utilisant des faisceaux d’électrons incidents, p. ex. la microscopie électronique à balayage [SEM] en mesurant les rayons X émis, p. ex. microanalyse à sonde électronique [EPMA]
B22F 10/30 - Commande ou régulation des opérations
An embodiment of a shutter assembly is described that comprises a support structure with a number of stations and operatively coupled to a motor configured to translate each of the stations to a position in front of a detector, wherein a first station comprises a first aperture, a first charged particle filter, and a first window; and a second station comprises a second aperture larger than the first aperture, a second charged particle filter, and a second window thinner than the first window.
G21K 1/04 - Dispositions pour manipuler des particules ou des rayonnements ionisants, p. ex. pour focaliser ou pour modérer utilisant des diaphragmes, des collimateurs utilisant des diaphragmes à ouverture variable, des obturateurs, des hacheurs
G21K 1/02 - Dispositions pour manipuler des particules ou des rayonnements ionisants, p. ex. pour focaliser ou pour modérer utilisant des diaphragmes, des collimateurs
An embodiment of a charged particle filter is described that comprises a plurality of magnets, each having a surface sloped at an angle relative to a plane defined by a line from a center of a field of view on a detector to the center of a field of view on a platform. In the described embodiment, the sloped surfaces are positioned to form a bore that comprises a magnetic field gradient that is strongest at a first aperture on a side of the bore proximate to the detector.
An embodiment of a charged particle filter is described that comprises a plurality of magnets, each having a surface sloped at an angle relative to a plane defined by a line from a center of a field of view on a detector to the center of a field of view on a platform. In the described embodiment, the sloped surfaces are positioned to form a bore that comprises a magnetic field gradient that is strongest at a first aperture on a side of the bore proximate to the detector.
An embodiment of a phase mask is described that comprises a light blocking layer disposed on a substrate, where the light blocking layer has a number of optically transmissive regions each configured as a first pattern. The first pattern includes two segments that have different phase configurations from each other, and the light blocking layer includes at least three angular orientations of the first pattern.
An embodiment of a phase mask includes a light blocking layer disposed on a substrate, where the light blocking layer has a number of optically transmissive regions each configured as a first pattern. The first pattern includes two segments that have different phase configurations from each other, and the light blocking layer includes at least three angular orientations of the first pattern.
A method and apparatus for detection of charged particles in spectroscopy. Charged particles, received from an energy dispersive spectroscopic analyser as a charged particle beam, are accelerated towards a detector. The accelerated charged particles are received at an array of detecting pixels, the array of detecting pixels forming the detector. The charged particles arriving at the detector have a spread in the energy dispersive direction.
G01T 1/29 - Mesure effectuée sur des faisceaux de radiations, p. ex. sur la position ou la section du faisceauMesure de la distribution spatiale de radiations
H01J 37/244 - DétecteursComposants ou circuits associés
H01J 49/02 - Spectromètres pour particules ou tubes séparateurs de particules Détails
An embodiment of a module system configured to interface with a microscope is described that comprises an input optical fiber configured to provide an excitation light beam from an external light source; dynamic alignment mirrors configured to adjust the position of the beams paths of the excitation light beam on a first plane; a coupling comprising a first end configured to engage with a complementary end, wherein the excitation light reflects off a turning mirror and travels along a beam path on a second plane through an orifice in the coupling; and an output optical fiber for delivering light from a sample to an external detector, wherein the light from the sample travels along the beam path on the second plane through the orifice in the coupling, reflects off the turning mirror and travels along one of the beam paths on the first plane to the output optical fiber.
G02B 27/10 - Systèmes divisant ou combinant des faisceaux
G02B 26/08 - Dispositifs ou dispositions optiques pour la commande de la lumière utilisant des éléments optiques mobiles ou déformables pour commander la direction de la lumière
Methods and apparatuses are disclosed whereby structured illumination microscopy (SIM) is applied to a scanning microscope, such as a confocal laser scanning microscope or sample scanning microscope, in order to improve spatial resolution. Particular aspects of the disclosure relate to the discovery of important advances in the ability to (i) increase light throughput to the sample, thereby increasing the signal/noise ratio and/or decreasing exposure time, as well as (ii) decrease the number of raw images to be processed, thereby decreasing image acquisition time. Both effects give rise to significant improvements in overall performance, to the benefit of users of scanning microscopy.
Methods and apparatuses are disclosed whereby structured illumination microscopy (SIM) is applied to a scanning microscope, such as a confocal laser scanning microscope or sample scanning microscope, in order to improve spatial resolution. Particular aspects of the disclosure relate to the discovery of important advances in the ability to (i) increase light throughput to the sample, thereby increasing the signal/noise ratio and/or decreasing exposure time, as well as (ii) decrease the number of raw images to be processed, thereby decreasing image acquisition time. Both effects give rise to significant improvements in overall performance, to the benefit of users of scanning microscopy.
G01B 11/25 - Dispositions pour la mesure caractérisées par l'utilisation de techniques optiques pour mesurer des contours ou des courbes en projetant un motif, p. ex. des franges de moiré, sur l'objet
66.
METHODS AND APPARATUS FOR ELECTRON BACKSCATTER DIFFRACTION SAMPLE CHARACTERISATION
A method of analyzing a sample imaged by electron backscatter diffraction. The method comprises identifying a plurality of Kikuchi bands in an electron backscatter diffraction image of a position on the sample. The method further comprises forming, for each identified Kikuchi band, a respective vector representation of said Kikuchi band based at least in part on an estimate of the position on the sample. A configuration of the sample is determined by identifying a particular set of expected vector representations from a plurality of sets of expected vector representations as matching the vector representations of the plurality of identified Kikuchi bands.
G01N 23/20058 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en utilisant la diffraction de la radiation par les matériaux, p. ex. pour rechercher la structure cristallineRecherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en utilisant la diffusion de la radiation par les matériaux, p. ex. pour rechercher les matériaux non cristallinsRecherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en utilisant la réflexion de la radiation par les matériaux en mesurant la diffraction des électrons, p. ex. la diffraction d’électrons lents [LEED] ou la diffraction d’électrons de haute énergie en incidence rasante [RHEED]
G01N 23/203 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en utilisant la diffraction de la radiation par les matériaux, p. ex. pour rechercher la structure cristallineRecherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en utilisant la diffusion de la radiation par les matériaux, p. ex. pour rechercher les matériaux non cristallinsRecherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en utilisant la réflexion de la radiation par les matériaux en mesurant la rétrodiffusion
An embodiment of a method of automatically generating a background measurement in a spectrometer is described that comprises the steps of: collecting a plurality of candidate scans in the spectrometer; determining for each of the plurality of candidate scans if the candidate scan correlates to an orthonormal basis set that is associated with a recent background description; saving each candidate scan that correlates to the orthonormal basis set as a background scan in a scan cache; and generating a new background measurement from a plurality of the background scans stored in the scan cache if a current background measurement is older than a preselected time interval.
G01N 21/00 - Recherche ou analyse des matériaux par l'utilisation de moyens optiques, c.-à-d. en utilisant des ondes submillimétriques, de la lumière infrarouge, visible ou ultraviolette
An embodiment of a method of automatically generating a background measurement in a spectrometer is described that comprises the steps of: collecting a plurality of candidate scans in the spectrometer; determining for each of the plurality of candidate scans if the candidate scan correlates to an orthonormal basis set that is associated with a recent background description; saving each candidate scan that correlates to the orthonormal basis set as a background scan in a scan cache; and generating a new background measurement from a plurality of the background scans stored in the scan cache if a current background measurement is older than a preselected time interval.
G01N 21/35 - CouleurPropriétés spectrales, c.-à-d. comparaison de l'effet du matériau sur la lumière pour plusieurs longueurs d'ondes ou plusieurs bandes de longueurs d'ondes différentes en recherchant l'effet relatif du matériau pour les longueurs d'ondes caractéristiques d'éléments ou de molécules spécifiques, p. ex. spectrométrie d'absorption atomique en utilisant la lumière infrarouge
An image analysis system includes a video camera that collects YUV color images of a liquid sample disposed between a capital and a pedestal, the color images being collected while a light source shines light through an optical beam path between the capital and the pedestal, and a processor adapted to i) obtain from the YUV color images a grayscale component image and a light scatter component image, and ii) obtain at least one binary image of the grayscale component image and at least one binary image of the light scatter component image.
G01N 21/51 - Dispersion, c.-à-d. réflexion diffuse dans un corps ou dans un fluide à l'intérieur d'un récipient, p. ex. dans une ampoule
G01N 21/25 - CouleurPropriétés spectrales, c.-à-d. comparaison de l'effet du matériau sur la lumière pour plusieurs longueurs d'ondes ou plusieurs bandes de longueurs d'ondes différentes
Aspects of the disclosure relate to utilizing independently stored validation keys to enable auditing of instrument measurement data maintained in a blockchain. A computing platform may receive, from a first block generator, a first data block comprising first measurement data captured by a first instrument and associated with a sample. Subsequently, the computing platform may receive a first validation key for the first data block calculated from contents of the first data block. Then, the computing platform may store the first data block and the first validation key for the first data block in a blockchain associated with the data management computing platform. Next, the computing platform may send the first validation key for the first data block to a data escrow database system, which may cause the data escrow database system to store the first validation key in a validation keys database.
G06F 16/215 - Amélioration de la qualité des donnéesNettoyage des données, p. ex. déduplication, suppression des entrées non valides ou correction des erreurs typographiques
G06F 16/21 - Conception, administration ou maintenance des bases de données
71.
UTILIZING INDEPENDENTLY STORED VALIDATION KEYS TO ENABLE AUDITING OF INSTRUMENT MEASUREMENT DATA MAINTAINED IN A BLOCKCHAIN
Aspects of the disclosure relate to utilizing independently stored validation keys to enable auditing of instrument measurement data maintained in a blockchain. A computing platform may receive, from a first block generator, a first data block comprising first measurement data captured by a first instrument and associated with a sample. Subsequently, the computing platform may receive a first validation key for the first data block calculated from contents of the first data block. Then, the computing platform may store the first data block and the first validation key for the first data block in a blockchain associated with the data management computing platform. Next, the computing platform may send the first validation key for the first data block to a data escrow database system, which may cause the data escrow database system to store the first validation key in a validation keys database.
G06F 21/62 - Protection de l’accès à des données via une plate-forme, p. ex. par clés ou règles de contrôle de l’accès
G06F 21/64 - Protection de l’intégrité des données, p. ex. par sommes de contrôle, certificats ou signatures
G06F 21/70 - Protection de composants spécifiques internes ou périphériques, où la protection d'un composant mène à la protection de tout le calculateur
G06F 21/71 - Protection de composants spécifiques internes ou périphériques, où la protection d'un composant mène à la protection de tout le calculateur pour assurer la sécurité du calcul ou du traitement de l’information
A laser mount assembly includes a lens holder including a collimating lens. A laser subassembly is positioned adjacent the lens holder and includes a vertical-cavity surface-emitting laser, a thermal electric cooler, and a thermistor. A printed circuit board is positioned adjacent the laser subassembly and includes a plurality of heating components. The heating components heat the area between the lens holder and the laser subassembly.
H01S 5/183 - Lasers à émission de surface [lasers SE], p. ex. comportant à la fois des cavités horizontales et verticales comportant uniquement des cavités verticales, p. ex. lasers à émission de surface à cavité verticale [VCSEL]
H01S 5/026 - Composants intégrés monolithiques, p. ex. guides d'ondes, photodétecteurs de surveillance ou dispositifs d'attaque
H01S 5/024 - Dispositions pour la gestion thermique
H01S 5/02253 - Découplage de lumière utilisant des lentilles
H01S 5/02326 - Dispositions pour le positionnement relatif des diodes laser et des composants optiques, p. ex. rainures dans le support pour fixer des fibres optiques ou des lentilles
G01K 7/22 - Mesure de la température basée sur l'utilisation d'éléments électriques ou magnétiques directement sensibles à la chaleur utilisant des éléments résistifs l'élément étant une résistance non linéaire, p. ex. une thermistance
74.
VERTICAL-CAVITY SURFACE EMITTING LASER SUPPORT ASSEMBLY
A laser mount assembly includes a lens holder including a collimating lens. A laser subassembly is positioned adjacent the lens holder and includes a vertical-cavity surface-emitting laser, a thermal electric cooler, and a thermistor. A printed circuit board is positioned adjacent the laser subassembly and includes a plurality of heating components. The heating components heat the area between the lens holder and the laser subassembly.
G02B 7/02 - Montures, moyens de réglage ou raccords étanches à la lumière pour éléments optiques pour lentilles
H01L 33/00 - DISPOSITIFS À SEMI-CONDUCTEURS NON COUVERTS PAR LA CLASSE - Détails
H01L 33/48 - DISPOSITIFS À SEMI-CONDUCTEURS NON COUVERTS PAR LA CLASSE - Détails caractérisés par les éléments du boîtier des corps semi-conducteurs
H01L 33/64 - DISPOSITIFS À SEMI-CONDUCTEURS NON COUVERTS PAR LA CLASSE - Détails caractérisés par les éléments du boîtier des corps semi-conducteurs Éléments d'extraction de la chaleur ou de refroidissement
A stray light reducing apparatus includes a light source and an entrance slit positioned to pass through light from the light source. A first monochromator mirror is positioned to reflect light passed through the entrance slit. A diffractive surface is positioned to receive and diffract light reflected by the first monochromator mirror. A second monochromator mirror is positioned to reflect light diffracted by the diffractive surface. An exit slit is positioned to pass through light reflected by the second monochromator mirror. A cuvette is positioned to pass through light passed through the exit slit. A long-pass interference filter is positioned to receive light from the light source, reflect light that has a wavelength below a selected value, and pass through light having a wavelength above the selected value. A first sample detector is positioned to receive light reflected by the long-pass interference filter.
A stray light reducing apparatus includes a light source and an entrance slit positioned to pass through light from the light source. A first monochromator mirror is positioned to reflect light passed through the entrance slit. A diffractive surface is positioned to receive and diffract light reflected by the first monochromator mirror. A second monochromator mirror is positioned to reflect light diffracted by the diffractive surface. An exit slit is positioned to pass through light reflected by the second monochromator mirror. A cuvette is positioned to pass through light passed through the exit slit. A long-pass interference filter is positioned to receive light from the light source, reflect light that has a wavelength below a selected value, and pass through light having a wavelength above the selected value. A first sample detector is positioned to receive light reflected by the long-pass interference filter.
G01J 3/18 - Production du spectreMonochromateurs en utilisant des éléments diffractants, p. ex. réseaux
G01J 3/02 - SpectrométrieSpectrophotométrieMonochromateursMesure de la couleur Parties constitutives
G01J 3/26 - Production du spectreMonochromateurs en utilisant une réflexion multiple, p. ex. interféromètre de Fabry-Perot, filtre à interférences variables
A diffuse reflectance apparatus includes a housing (58) having a window (56) formed therein, and a diffuse reflectance mirror (52) spaced from the window (56) and having an aperture (50) extending therethrough. A light source (34) provides a beam of light (36). A first mirror assembly (46) is positioned to reflect the beam of light (36) through the aperture (50) such that it passes through the window (56). A second mirror assembly (68) is positioned to reflect scattered light (66) from the concave mirror (52) to a detector (44).
A diffuse reflectance apparatus includes a housing having a window formed therein, and a diffuse reflectance mirror spaced from the window and having an aperture extending therethrough. A light source provides a beam of light. A first mirror assembly is positioned to reflect the beam of light through the aperture such that it passes through the window. A second mirror assembly is positioned to reflect scattered light from the concave mirror to a detector.
G01J 3/02 - SpectrométrieSpectrophotométrieMonochromateursMesure de la couleur Parties constitutives
G01N 21/35 - CouleurPropriétés spectrales, c.-à-d. comparaison de l'effet du matériau sur la lumière pour plusieurs longueurs d'ondes ou plusieurs bandes de longueurs d'ondes différentes en recherchant l'effet relatif du matériau pour les longueurs d'ondes caractéristiques d'éléments ou de molécules spécifiques, p. ex. spectrométrie d'absorption atomique en utilisant la lumière infrarouge
A process of analyzing a sample by Raman spectroscopy and X-ray photoelectron spectroscopy (XPS) includes providing a sample having a sample surface within a vacuum chamber, performing a Raman spectroscopic analysis on a plurality of selected areas of the sample surface within the vacuum chamber to map an area of the sample surface comprising the selected areas, the Raman spectroscopic analysis including identifying one or more face in one or more of the selected areas of the sample surface, and performing an X-ray photoelectron spectroscopy (XPS) analysis of one or more selected areas of the sample surface containing at least one chemical and/or structural feature identified by the Raman spectroscopic analysis, wherein the duration of the XPS analysis of a given selected area of the sample surface is longer than the duration of the Raman spectroscopic analysis of that given selected area.
G01N 23/2273 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en mesurant l'émission secondaire de matériaux en mesurant l'effet photo-électrique, p. ex. microscopie d'émission photo-électronique [PEEM] en mesurant le spectre photo-électronique, p. ex. spectroscopie électronique pour l’analyse chimique [ESCA] ou spectroscopie photo-électronique par rayon X [XPS]
G01N 21/17 - Systèmes dans lesquels la lumière incidente est modifiée suivant les propriétés du matériau examiné
83.
Mirror alignment in optical scientific instruments
A mirror assembly has one or more axes of motion and includes a mirror that is movable and forms an acute angle with a plane orthogonal to its axis of motion. The mirror assembly may include a first reflective mirror surface in the incoming optical path that is movable and forms an acute angle with a plane orthogonal to its axis of motion, and a second reflective mirror surface in the outgoing optical path that is movable and forms an acute angle with a plane orthogonal to its axis of motion and is moveable in a linear translation to scan the mirror in the interferometer in a way to generate a normal interferogram.
G02B 26/08 - Dispositifs ou dispositions optiques pour la commande de la lumière utilisant des éléments optiques mobiles ou déformables pour commander la direction de la lumière
G02B 7/182 - Montures, moyens de réglage ou raccords étanches à la lumière pour éléments optiques pour prismesMontures, moyens de réglage ou raccords étanches à la lumière pour éléments optiques pour miroirs pour miroirs
G01J 3/02 - SpectrométrieSpectrophotométrieMonochromateursMesure de la couleur Parties constitutives
A mixing apparatus (10) includes a well plate assembly (12) including a fixed support (30), and a well (14) movable with respect to the fixed support. A fixed sensor mount (18) has a first portion disposed above the well and a second portion disposed within the well. A plurality of electromagnets (26) are operable to move the well plate assembly vertically with respect to the fixed sensor mount and the fixed support.
A mixing apparatus includes a well plate assembly including a fixed support, and a well movable with respect to the fixed support. A fixed sensor mount has a first portion disposed above the well and a second portion disposed within the well. A plurality of electromagnets are operable to move the well plate assembly vertically with respect to the fixed sensor mount and the fixed support.
A mirror assembly has one or more axes of motion and includes a mirror that is movable and forms an acute angle with a plane orthogonal to its axis of motion. The mirror assembly may include a first reflective mirror surface in the incoming optical path that is movable and forms an acute angle with a plane orthogonal to its axis of motion, and a second reflective mirror surface in the outgoing optical path that is movable and forms an acute angle with a plane orthogonal to its axis of motion and is moveable in a linear translation to scan the mirror in the interferometer in a way to generate a normal interferogram.
G02B 7/182 - Montures, moyens de réglage ou raccords étanches à la lumière pour éléments optiques pour prismesMontures, moyens de réglage ou raccords étanches à la lumière pour éléments optiques pour miroirs pour miroirs
G01J 3/453 - Spectrométrie par interférence par corrélation des amplitudes
G02B 26/08 - Dispositifs ou dispositions optiques pour la commande de la lumière utilisant des éléments optiques mobiles ou déformables pour commander la direction de la lumière
A sensing device includes a first substrate having a plurality of TSVs extending therethrough, and a second substrate positioned adjacent the first substrate, with the TSVs being electrically connected to the second substrate. At least one carbon nanotube sensor is positioned on the first substrate. Each of a plurality of contact pads is positioned on the first substrate and on one of the carbon nanotube sensors such that each contact pad is electrically connected to one of the TSVs and the one of the carbon nanotube sensors, and such that an end of the one of the carbon nanotube sensors is embedded in the contact pad.
B82Y 15/00 - Nanotechnologie pour l’interaction, la détection ou l'actionnement, p. ex. points quantiques comme marqueurs en dosages protéiques ou moteurs moléculaires
G01N 27/12 - Recherche ou analyse des matériaux par l'emploi de moyens électriques, électrochimiques ou magnétiques en recherchant l'impédance en recherchant la résistance d'un corps solide dépendant de l'absorption d'un fluideRecherche ou analyse des matériaux par l'emploi de moyens électriques, électrochimiques ou magnétiques en recherchant l'impédance en recherchant la résistance d'un corps solide dépendant de la réaction avec un fluide
88.
Sensor device with carbon nanotube sensor positioned on first and second substrates
A sensing device includes a first substrate having a plurality of TSVs extending therethrough, and a second substrate positioned adjacent the first substrate, with the TSVs being electrically connected to the second substrate. At least one carbon nanotube sensor is positioned on the first substrate. Each of a plurality of contact pads is positioned on the first substrate and on one of the carbon nanotube sensors such that each contact pad is electrically connected to one of the TSVs and the one of the carbon nanotube sensors, and such that an end of the one of the carbon nanotube sensors is embedded in the contact pad.
H01L 23/48 - Dispositions pour conduire le courant électrique vers le ou hors du corps à l'état solide pendant son fonctionnement, p. ex. fils de connexion ou bornes
G01N 27/12 - Recherche ou analyse des matériaux par l'emploi de moyens électriques, électrochimiques ou magnétiques en recherchant l'impédance en recherchant la résistance d'un corps solide dépendant de l'absorption d'un fluideRecherche ou analyse des matériaux par l'emploi de moyens électriques, électrochimiques ou magnétiques en recherchant l'impédance en recherchant la résistance d'un corps solide dépendant de la réaction avec un fluide
H01L 23/00 - Détails de dispositifs à semi-conducteurs ou d'autres dispositifs à l'état solide
H01L 21/768 - Fixation d'interconnexions servant à conduire le courant entre des composants distincts à l'intérieur du dispositif
H01L 21/56 - Encapsulations, p. ex. couches d’encapsulation, revêtements
H01L 23/31 - Encapsulations, p. ex. couches d’encapsulation, revêtements caractérisées par leur disposition
B82Y 15/00 - Nanotechnologie pour l’interaction, la détection ou l'actionnement, p. ex. points quantiques comme marqueurs en dosages protéiques ou moteurs moléculaires
89.
CARBON NANOTUBE-BASED DEVICE FOR SENSING MOLECULAR INTERACTION
Devices and methods are disclosed having (a) an exposed semiconducting single walled carbon nanotube channel (10) on the surface of a substrate (20), wherein the exposed semiconducting single walled carbon nanotube channel is functionalized with a capture moiety cognate to a target analyte, (b) a source electrode and a drain electrode (50) connceting opposite ends of the exposed semiconducting single walled carbon nanotube channel, and (c) wherein the source electrode and the drain electrode are electrically connected in a manner to detect changes in current through the exposed semiconducting single walled carbon nanotube channel in response to analyte in contact therewith. Preferably the semiconducting carbon nanotube network is modified with pyrene butyric acid.
A spectroscopy system and method in which the optical path following the interferometer includes a Jacquinot stop having an aperture disposed substantially at its focal point. The Jacquinot stop includes a reflective surface substantially non-orthogonal to the longitudinal axis of the path and facing the source of the IR signal containing an interferogram. The aperture passes an inner portion of the incident IR signal, while the reflective surface reflects an outer portion. The reflected outer portion of the incident IR signal, which contains erroneous spectral information due to inherent flaws in the interferometer optics, is thereby effectively removed from the original incident IR signal ultimately used to irradiate the sample, and yet still be made available for use in monitoring background spectra of the sampling optics.
G01N 21/3577 - CouleurPropriétés spectrales, c.-à-d. comparaison de l'effet du matériau sur la lumière pour plusieurs longueurs d'ondes ou plusieurs bandes de longueurs d'ondes différentes en recherchant l'effet relatif du matériau pour les longueurs d'ondes caractéristiques d'éléments ou de molécules spécifiques, p. ex. spectrométrie d'absorption atomique en utilisant la lumière infrarouge pour l'analyse de liquides, p. ex. l'eau polluée
G01J 3/02 - SpectrométrieSpectrophotométrieMonochromateursMesure de la couleur Parties constitutives
G01J 3/10 - Aménagements de sources lumineuses spécialement adaptées à la spectrométrie ou à la colorimétrie
G01J 3/26 - Production du spectreMonochromateurs en utilisant une réflexion multiple, p. ex. interféromètre de Fabry-Perot, filtre à interférences variables
G01N 21/3504 - CouleurPropriétés spectrales, c.-à-d. comparaison de l'effet du matériau sur la lumière pour plusieurs longueurs d'ondes ou plusieurs bandes de longueurs d'ondes différentes en recherchant l'effet relatif du matériau pour les longueurs d'ondes caractéristiques d'éléments ou de molécules spécifiques, p. ex. spectrométrie d'absorption atomique en utilisant la lumière infrarouge pour l'analyse des gaz, p. ex. analyse de mélanges de gaz
G01N 21/35 - CouleurPropriétés spectrales, c.-à-d. comparaison de l'effet du matériau sur la lumière pour plusieurs longueurs d'ondes ou plusieurs bandes de longueurs d'ondes différentes en recherchant l'effet relatif du matériau pour les longueurs d'ondes caractéristiques d'éléments ou de molécules spécifiques, p. ex. spectrométrie d'absorption atomique en utilisant la lumière infrarouge
92.
Device for providing variable sized aperture for a sample
An apparatus for providing a variable sized aperture for an imaging device includes a first plate having a first plurality of plate apertures extending therethrough and a second plate having a second plurality of plate apertures extending therethrough. A first motor is operably connected to the first plate and a second motor is operably connected to the second plate. The first and second motors are configured to move the first plate and the second plate with respect to one another so as to align any of the first plurality of plate apertures with any of the second plurality of plate apertures to define a plurality of light beam apertures.
Aspects of the present disclosure are directed to a mirror bearing for an interferometer. An example mirror bearing includes a stationary mounting member and a mobile mirror assembly configured for slidable movement relative to the mounting member along its longitudinal axis. The mounting member is configured for rigid attachment to an interferometer body. A bore extends through the mounting member along its longitudinal axis. A drive coil receiving area of the mounting member is configured to hold a drive coil coupled thereto. The mobile mirror assembly includes a tube configured to receive, at one end of the tube, an end of the mounting member. The mobile mirror assembly also includes a mirror coupled to the opposite end of the tube. A drive magnet is disposed within the tube and is configured to be received within the bore of the mounting member when the mirror bearing is in an assembled configuration.
G02B 26/08 - Dispositifs ou dispositions optiques pour la commande de la lumière utilisant des éléments optiques mobiles ou déformables pour commander la direction de la lumière
G02B 7/182 - Montures, moyens de réglage ou raccords étanches à la lumière pour éléments optiques pour prismesMontures, moyens de réglage ou raccords étanches à la lumière pour éléments optiques pour miroirs pour miroirs
H02K 41/035 - Moteurs à courant continuMoteurs unipolaires
A spectroscopy system and method in which the optical path following the interferometer includes a Jacquinot stop (70) having an aperture disposed substantially at its focal point. The Jacquinot stop includes a reflective surface (74) substantially non-orthogonal to the longitudinal axis of the path and facing the source of the IR signal containing an interferogram. The aperture (72) passes an inner portion of the incident IR signal, while the reflective surface reflects an outer portion. The reflected outer portion of the incident IR signal, which contains erroneous spectral information due to inherent flaws in the interferometer optics, is thereby effectively removed from the original incident IR signal ultimately used to irradiate the sample, and yet still be made available for use in monitoring background spectra of the sampling optics.
Aspects of the present disclosure are directed to a mirror bearing for an interferometer. An example mirror bearing includes a stationary mounting member and a mobile mirror assembly configured for slidable movement relative to the mounting member along its longitudinal axis. The mounting member is configured for rigid attachment to an interferometer body. A bore extends through the mounting member along its longitudinal axis. A drive coil receiving area of the mounting member is configured to hold a drive coil coupled thereto. The mobile mirror assembly includes a tube configured to receive, at one end of the tube, an end of the mounting member. The mobile mirror assembly also includes a mirror coupled to the opposite end of the tube. A drive magnet is disposed within the tube and is configured to be received within the bore of the mounting member when the mirror bearing is in an assembled configuration.
G02B 7/182 - Montures, moyens de réglage ou raccords étanches à la lumière pour éléments optiques pour prismesMontures, moyens de réglage ou raccords étanches à la lumière pour éléments optiques pour miroirs pour miroirs
H02K 41/035 - Moteurs à courant continuMoteurs unipolaires
An apparatus (19) for providing a variable sized aperture for an imaging device includes a first plate (22) having a first plurality of plate apertures (24) extending therethrough and a second plate (30) having a second plurality of plate apertures (32) extending therethrough. A first motor (20) is operably connected to the first plate and a second motor (26) is operably connected to the second plate. The first and second motors are configured to move the first plate and the second plate with respect to one another so as to align any of the first plurality of plate apertures with any of the second plurality of plate apertures to define a plurality of light beam apertures.
An embodiment of a ruggedized interferometer is described that comprises a light source (210) that generates a beam of light; a fixed mirror (207); a moving mirror (205) that travels along a linear path; a beam splitter (215) that directs a first portion of the beam of light to the fixed mirror and a second portion of the beam of light to the moving mirror, wherein the beam splitter recombines the first portion reflected from the fixed mirror and the second portion reflected from the moving mirror; and a servo control (203) that applies a substantial degree of force to the moving mirror at initiation of a turnaround period, wherein the substantial degree of force is sufficient to redirect the moving mirror traveling at a high velocity to an opposite direction of travel on the linear path.
An embodiment of a ruggedized interferometer is described that comprises a light source that generates a beam of light; a fixed mirror; a moving mirror that travels along a linear path; a beam splitter that directs a first portion of the beam of light to the fixed mirror and a second portion of the beam of light to the moving mirror, wherein the beam splitter recombines the first portion reflected from the fixed mirror and the second portion reflected from the moving mirror; and a servo control that applies a substantial degree of force to the moving mirror at initiation of a turnaround period, wherein the substantial degree of force is sufficient to redirect the moving mirror traveling at a high velocity to an opposite direction of travel on the linear path.
An embodiment of a path length calibration system is described that comprises a swing arm coupled to a first surface; a base coupled to a second surface configured to receive the sample; a position sensor system comprising a first component coupled to the swing arm and a second component coupled to the base, wherein the position sensor system is configured to provide an output voltage when the swing arm is in a down position; and a processor configured to calibrate a zero path length using the output voltage.
G01N 21/27 - CouleurPropriétés spectrales, c.-à-d. comparaison de l'effet du matériau sur la lumière pour plusieurs longueurs d'ondes ou plusieurs bandes de longueurs d'ondes différentes en utilisant la détection photo-électrique
G01N 21/31 - CouleurPropriétés spectrales, c.-à-d. comparaison de l'effet du matériau sur la lumière pour plusieurs longueurs d'ondes ou plusieurs bandes de longueurs d'ondes différentes en recherchant l'effet relatif du matériau pour les longueurs d'ondes caractéristiques d'éléments ou de molécules spécifiques, p. ex. spectrométrie d'absorption atomique
G01R 33/07 - Mesure de la direction ou de l'intensité de champs magnétiques ou de flux magnétiques en utilisant des dispositifs galvano-magnétiques des dispositifs à effet Hall
G01R 33/09 - Mesure de la direction ou de l'intensité de champs magnétiques ou de flux magnétiques en utilisant des dispositifs galvano-magnétiques des dispositifs magnéto-résistifs
G01D 5/14 - Moyens mécaniques pour le transfert de la grandeur de sortie d'un organe sensibleMoyens pour convertir la grandeur de sortie d'un organe sensible en une autre variable, lorsque la forme ou la nature de l'organe sensible n'imposent pas un moyen de conversion déterminéTransducteurs non spécialement adaptés à une variable particulière utilisant des moyens électriques ou magnétiques influençant la valeur d'un courant ou d'une tension
