A test and measurement instrument may include a test channel to connect to a device under test (DUT) and analyze signals generated by the DUT. The instrument may include a processor configured to execute code to: measure a first ripple value of a power supply signal from a DUT; measure a first periodic jitter (PJ) value of a high-speed signal, where the high-speed signal is based on the power supply signal; determine a first time interval error (TIE) spectrum from the first PJ value; filter the first TIE spectrum of the first PJ value to receive a second TIE spectrum corresponding to a second PJ value; determine a second ripple value by applying a jitter ratio based on the second PJ value and the first PJ value and a noise factor to the first ripple value; and apply the second ripple value to the power supply signal.
A test and measurement instrument may include a test channel to connect to a device under test (DUT) and analyze signals generated by the DUT. The instrument may include a processor configured to execute code to: measure a first ripple value of a power supply signal from a DUT; measure a first periodic jitter (PJ) value of a high-speed signal, where the high-speed signal is based on the power supply signal; determine a first time interval error (TIE) spectrum from the first PJ value; filter the first TIE spectrum of the first PJ value to receive a second TIE spectrum corresponding to a second PJ value; determine a second ripple value by applying a jitter ratio based on the second PJ value and the first PJ value and a noise factor to the first ripple value; and apply the second ripple value to the power supply signal.
A test and measurement system includes a test and measurement instrument having one or more ports to connect to one or more devices under test (DUTs), a generative AI model, a user interface to allow a user to provide inputs to the system, and one or more processors to receive a user input identifying a test requirement specification, provide the test requirement specification to the generative AI model. receive a set of prerequisites from the generative AI model, use the set of prerequisites to generate an order for a set of tests for the DUT to minimize hardware changes for testing and minimize data collection instances from the DUT, perform the set of tests according to the order to acquire data from the DUT, and analyze the acquired data from the DUT to determine if the DUT has passed or failed one or more of the tests.
A test and measurement probe device is disclosed. In some implementations, the device may include one or more sensors. In addition, the device may include a plurality of analog signal paths, each analog signal path connected to one of the one or more sensors. The device may include an adjustable gain element within each analog signal path. Moreover, the device may include a combiner to combine the output of each adjustable gain element together to produce a probe output signal. Also, the device may include a digital path including a processor, where the processor is configured to compute a gain value for at least one adjustable gain element.
G01R 13/02 - Dispositions pour la présentation de variables électriques ou de formes d'ondes pour la présentation sous forme numérique des variables électriques mesurées
5.
TEST MONITOR INCLUDING SIGNAL SEPARATOR AND DATA RECORDER
A test monitor extracts waveforms from a differential transmission line of an automobile network without disrupting the differential transmission line, and stores the data decoded from the extracted waveforms. The test monitor includes a first input configured to receive a voltage waveform from a voltage probe electrically coupled to the differential transmission line that electrically connects a first ECU device and a second device, a second input configured to receive a current waveform from a current probe electrically coupled to the differential transmission line, and one or more processors configured to receive the voltage waveform and the current waveform and determine a voltage of the first ECU device and a voltage of the second device based on the voltage waveform and the current waveform. The test monitor may be embodied in an FPGA. The test monitor enables monitoring of message transfers across a network in a non-intrusive and non-invasive manner, without the necessity of using a repeater or switch.
A test and measurement probe device is disclosed. In some implementations, the device may include one or more sensors. In addition, the device may include a plurality of analog signal paths, each analog signal path connected to one of the one or more sensors. The device may include an adjustable gain element within each analog signal path. Moreover, the device may include a combiner to combine the output of each adjustable gain element together to produce a probe output signal. Also, the device may include a digital path including a processor, where the processor is configured to compute a gain value for at least one adjustable gain element.
G01R 23/15 - Indication de ce qu'une fréquence d'impulsions est, soit supérieure ou inférieure à une valeur prédéterminée, soit à l'intérieur ou à l'extérieur d'une plage de valeurs prédéterminée, en utilisant des éléments non linéaires ou numériques
G01R 23/00 - Dispositions pour procéder aux mesures de fréquencesDispositions pour procéder à l'analyse de spectres de fréquences
G01R 29/26 - Mesure du coefficient de bruitMesure de rapport signal-bruit
7.
TEST AND MEASUREMENT INSTRUMENT WITH BUILT-IN ADVANCED DATA PATTERN GENERATOR
A test and measurement instrument includes a display, one or more transmitters, one or more receivers, one or more channels configured to send and receive signals, a data pattern generator, and a high-speed serial trigger (HSST) circuit operating at 1 Gigabits per second or faster connected to the one or more receivers to receive data patterns from the data pattern generator to exercise the high-speed serial trigger circuit.
G01R 13/02 - Dispositions pour la présentation de variables électriques ou de formes d'ondes pour la présentation sous forme numérique des variables électriques mesurées
8.
MOST LIKELIHOOD SEQUENCE ESTIMATION ON REAL-TIME OSCILLOSCOPES
A real-time oscilloscope includes one or more ports to connect to a device under test (DUT) to establish a communication channel between the oscilloscope and the DUT, one or more analog-to-digital converters (ADCs) to sample a signal received from the DUT to convert the signal to a waveform, one or more processors to receive and sample a run-time signal including actual symbols from the DUT to create a run-time waveform, resample the run-time waveform to locate samples at a center of each unit interval, use a communication channel characterization, the samples at the center of each unit interval, a symbol constellation for the run-time waveform, and a configuration of a traceback length as inputs to a Most Likely Sequence Estimation (MLSE) process to estimate symbols in the run-time waveform, and compare the estimated symbols to the actual symbols to obtain a symbol error ratio.
A test and measurement instrument includes an input for accepting an input signal that varies in amplitude over time, the input signal formed of a number of waveform segments, a sampler structured to sample the input signal at regular intervals to produce a sampled signal, the sampled signal formed of a number of sample segments that each correspond to one of the waveform segments, an acquisition processor including a slew rate controller structured to determine an instant rate of change of amplitude in a selected one of the waveform segments of the input signal as an instant slew rate of the input signal, and a sampling filter structured to store the sampled segment corresponding to the selected one of the waveform segments of the input signal in an acquisition memory only during times that the instant slew rate of the selected segment of the input signal exceeds a slew rate threshold. Methods are also described.
A signal and power analysis instrument includes one or more high-bandwidth input channels configured as one or more real-equivalent time (RET) input channels and/or one or more radio frequency (RF) channels, one or more input channels configured as one or more low-bandwidth real-time (RT) input channels, one or more analog-to-digital converters (ADCs) having pipes, a first set of pipes connected to the one or more high-bandwidth input channels to produce high-bandwidth data, and a second set of the pipes connected to the one or more low-bandwidth RT input channels to produce low-bandwidth RT data, a system clock connected to high-bandwidth input channels and the low-bandwidth RT input channels, a memory connected to the system clock, the first set of pipes, and the second set pipes, and one or more processors to store low-bandwidth RT data and high-bandwidth data in the memory, and align the high-bandwidth data and the low-bandwidth data.
G01R 29/08 - Mesure des caractéristiques du champ électromagnétique
G01R 13/02 - Dispositions pour la présentation de variables électriques ou de formes d'ondes pour la présentation sous forme numérique des variables électriques mesurées
G01R 31/28 - Test de circuits électroniques, p. ex. à l'aide d'un traceur de signaux
11.
DYNAMIC PROBE COLORING AND STATUS INFORMATION USING PASSIVE OPTICAL FIBER
A probe may include a probe head with a probe tip for connecting to a device under test (DUT), and a probe body for electro-mechanically connecting to a channel of a test and measurement instrument, the channel having a pre-assigned color identifier. The probe may include a probe cable connected between the probe head and the probe body. The probe may include a light source, and an optical fiber having a first end coupled to the light source and a second end coupled to the probe head. The probe head has a channel indicator coupled to the optical fiber. The probe has communication and control circuitry configured to, when the probe is connected to the channel of the test and measurement instrument, cause the light source and the channel indicator to illuminate in a color matching the color identifier of the channel.
G01R 1/20 - Modifications des éléments électriques fondamentaux en vue de leur utilisation dans des appareils de mesures électriquesCombinaisons structurelles de ces éléments avec ces appareils
A test and measurement system, include one or more test and measurement instruments with at least one test and measurement instrument having one or more ports to connect to a device under test (DUT), one or more user interfaces, a generative artificial intelligence (AI) model connected to the one or more test and measurement instruments, and one or more processors to provide an application programming interface (API) of the generative AI model, receive a protocol specification and provide the protocol specification to the generative AI model, receive, through one of the one more user interfaces, configuration settings for a bus that operates in accordance with the protocol, provide the configuration settings to the generative AI model, receive a decoder file from the generative AI model, deploy the decoder file to the test and measurement instrument, use the decoder file on the test and measurement instrument to test a DUT.
A test and measurement system includes a test and measurement instrument, a computing device connected to the test and measurement instrument, and one or more processors configured to execute code that causes the one or more processors to collect measurement data from a full parameter sweep of a first device under test, the full parameter sweep comprising a total number of measurement points for every parameter combination of a number of parameters, identify core parameter sweeps from the full parameter sweep, the core parameter sweeps comprising a total number of measurement points for fewer parameter sweeps than the full parameter sweep, use the core parameter sweeps to calculate auxiliary parameters sweeps. use the core parameter sweeps and the auxiliary parameter sweeps to determine a reduced parameter sweep, and use the reduced parameter sweep for testing subsequent devices under test of a same type as the first device under test.
A test and measurement system includes a plurality of nodes, one or more nodes comprising sensors configured to receive signals, one or more generative adversarial network (GAN) models, one or more signal generators configured to generate and transmit signals, and one or more processors configured to execute code to cause the one or more processors to receive a request for a signal having a signal profile from a node of the plurality of nodes, send the signal profile and the request to one of the one or more GAN models, receive a matching signal profile that matches the signal profile, and transmit the matching signal profile to one of the one or more signal generators to generate and transmit a matching signal.
A test and measurement instrument includes one or more test channels to connect to a memory device under test (DUT) and analyze signals generated by the DUT, and one or more processors configured to execute code to cause the DUT to generate strobe and data signals using a first clock setting of the DUT, determine whether the period of the strobe signal and data signals are within a tolerance specification, and perform at least one additional measurement of the DUT when the period of the strobe and data signals are within the tolerance specification. Methods are also described.
A test and measurement instrument includes one or more test channels to connect to a memory device under test (DUT) and analyze signals generated by the DUT, and one or more processors configured to execute code to cause the DUT to generate strobe and data signals using a first clock setting of the DUT, determine whether the period of the strobe signal and data signals are within a tolerance specification, and perform at least one additional measurement of the DUT when the period of the strobe and data signals are within the tolerance specification. Methods are also described.
A test and measurement system includes one or more test and measurement instruments at least one of which connects to a device under test (DUT), one or more memories, a generative artificial intelligence (AI) model connected to the one or more test and measurement instruments, and the one or more memories, and one or more processors to provide an artificial intelligence (AI) assistant as an interface to the generative AI model, present a user interface that allows a user to enter a prompt, use the AI assistant to translate the prompt into one or more queries for the generative AI model, send commands to the test and measurement instrument connected to the DUT to perform one or more tests on the DUT, take results from the one or more tests and convert them to user-interpretable results, and provide the user with results from the prompt at the user interface.
G06F 11/22 - Détection ou localisation du matériel d'ordinateur défectueux en effectuant des tests pendant les opérations d'attente ou pendant les temps morts, p. ex. essais de mise en route
G06F 11/263 - Génération de signaux d'entrée de test, p. ex. vecteurs, formes ou séquences de test
A test and measurement instrument includes two or more channels to allow the test and measurement instrument to connect to a device under test (DUT), each channel comprising an analog-to-digital converter (ADC) and one or more trigger engines, each trigger engine to determine one or more trigger conditions, a display to allow the test and measurement instrument to display data from the ADC, a user interface, and one or more processors configured to execute code to cause the one or more processors to acquire data from the two or more channels at a different time than others of the two or more channels in response to one or more trigger conditions. A test and measurement instrument similar to the above except it has at least one channel that has an auxiliary input and a threshold detector instead of an ADC in addition to one or more channels having ADCs.
G01R 13/02 - Dispositions pour la présentation de variables électriques ou de formes d'ondes pour la présentation sous forme numérique des variables électriques mesurées
20.
DOMAIN-ADAPTED MULTIMODAL LARGE LANGUAGE MODELS BASED ON TENSOR BUILD FOR CALIBRATION AND MEASUREMENT
A test and measurement instrument includes a port to allow the test and measurement instrument to connect to a device under test (DUT) to receive signals from the DUT, one or more analog-to-digital converters (ADCs) to receive a signal from the DUT and convert the signal to one or more digital waveforms, a user interface to allow a user to enter a query, and one or more processors configured to execute code that causes the one or more processors to: build one or more images of the one or more digital waveforms from the one or more ADCs, send the one or more images to a domain-adapted multimodal large language model (MLLM), receive parameters from the domain-adapted MLLM, provide the user with parameters for the DUT in response to the query, and apply the parameters to the DUT.
G01R 19/25 - Dispositions pour procéder aux mesures de courant ou de tension ou pour en indiquer l'existence ou le signe utilisant une méthode de mesure numérique
G01R 19/252 - Dispositions pour procéder aux mesures de courant ou de tension ou pour en indiquer l'existence ou le signe utilisant une méthode de mesure numérique utilisant des convertisseurs analogiques/numériques du type à conversion de la tension ou du courant en fréquence et mesure de cette fréquence
21.
PULSE AMPLITUDE MODULATION TRANSITION DENSITY TRIGGER IN A TEST AND MEASUREMENT INSTRUMENT
A test and measurement instrument includes an input for receiving a pulse amplitude modulated n-level (PAMn) signal, an analog-to-digital converter (ADC) coupled to the input to digitize the PAMn signal, an acquisition memory coupled to the ADC and configured to store at least a portion of the digitized PAMn signal as a waveform, trigger circuitry coupled to the ADC and to the acquisition memory, and configured to generate a trigger signal to cause the test and measurement instrument to trigger an acquisition of the waveform, PAMn clock and data recovery (CDR) circuitry configured to decode bits from the PAMn signal, and transition detection logic circuitry coupled to the PAMn CDR circuitry and to the trigger circuitry, and configured to detect symbol transitions based on the decoded bits, and to cause the trigger circuitry to generate the trigger signal in response to detecting a particular symbol transition.
A power monitoring system includes one or more power vector analyzers, and a power controller having one or more ports to receive transient event data comprising one or more power images and associated metadata for a transient event from the one or more power vector analyzers, and one or more processors configured to execute code to cause the one or more processors to convert the one or more power images from the one or more power vector analyzers and the associated metadata to one or more transient event vectors, and store the one or more transient event vectors in a vector database.
G01R 19/00 - Dispositions pour procéder aux mesures de courant ou de tension ou pour en indiquer l'existence ou le signe
G01R 13/02 - Dispositions pour la présentation de variables électriques ou de formes d'ondes pour la présentation sous forme numérique des variables électriques mesurées
G01R 19/25 - Dispositions pour procéder aux mesures de courant ou de tension ou pour en indiquer l'existence ou le signe utilisant une méthode de mesure numérique
G06F 16/22 - IndexationStructures de données à cet effetStructures de stockage
G06F 16/28 - Bases de données caractérisées par leurs modèles, p. ex. des modèles relationnels ou objet
24.
SMART HARDWARE MONITORING AND FAULT DIAGNOSIS USING SENSOR DATA ANALYSIS
A test and measurement instrument includes one or more ports to connect to hardware under test (HUT), a set of sensors connected to the HUT and to the instrument, a display to display one or more signal representations from at least one of the HUT and one or more sensors from the set of sensors, and one or more processors configured to execute code to cause the one or more processors to: acquire data from the set of sensors; form one or more data sets from the data acquired from the set of sensors; apply one or more machine learning models to the one or more data sets; and receive a predictive analysis from the one or more machine learning model about the HUT.
A test and measurement instrument includes one or more ports to connect one or more devices under test (DUTs) through a bus to one or more channels of the test and measurement instrument, a user interface to allow a user to provide user inputs to the test and measurement instrument, a display to allow a user to view information about the one or more DUTs, one or more processors configured to execute code that causes the one or more processors to: receive a signal from one DUT of the one or more DUTs and convert the signal to a waveform, receive a user input indicating a bus type, use the bus type to identify parameters for autoset detection, autoset one or more parameter values for the bus, decode the waveform using the parameter values to produce decoded results, and display the decoded results on the user interface.
G01R 13/02 - Dispositions pour la présentation de variables électriques ou de formes d'ondes pour la présentation sous forme numérique des variables électriques mesurées
26.
DYNAMIC IDENTIFICATION OF KNOWLEDGE SETS FOR USE WITH ARTIFICIAL INTELLIGENCE ASSISTANTS
A test and measurement instrument includes one or more memories, a generative artificial intelligence (AI) model to access to the one or more memories, a display, user controls, and one or more processors configured to access an application programming interface (API) of an AI assistant for the generative AI model, receive one or more user inputs as a prompt through one or more of the API or a user interface, access a master vector database to retrieve a list of master candidates, compare the prompt to the list of master candidates to select ones of the master candidates, send the selected ones to a vector database, receive specific candidates from the vector database, send the prompt and the specific candidates to the generative AI model, receive a response, and display the response on the display.
A touch sensor has a first conductive material separated into one or more primary segments and a second conductive material positioned a predetermined distance from the first conductive material. The touch sensor also has a controller configured to receive input from each of the one or more primary segments of the first conductive material, and based on the received input, determine whether a touch is present at one of the one or more primary segments.
G06F 3/0488 - Techniques d’interaction fondées sur les interfaces utilisateur graphiques [GUI] utilisant des caractéristiques spécifiques fournies par le périphérique d’entrée, p. ex. des fonctions commandées par la rotation d’une souris à deux capteurs, ou par la nature du périphérique d’entrée, p. ex. des gestes en fonction de la pression exercée enregistrée par une tablette numérique utilisant un écran tactile ou une tablette numérique, p. ex. entrée de commandes par des tracés gestuels
G06F 3/044 - Numériseurs, p. ex. pour des écrans ou des pavés tactiles, caractérisés par les moyens de transduction par des moyens capacitifs
G06F 3/045 - Numériseurs, p. ex. pour des écrans ou des pavés tactiles, caractérisés par les moyens de transduction utilisant des éléments résistifs, p. ex. une seule surface uniforme ou deux surfaces parallèles mises en contact
28.
AI EMBEDDING VECTOR DATA BASE CALIBRATION ARCHITECTURE
A test and measurement system has a test and measurement instrument that includes a connection to a device under test (DUT); one or more analog-to-digital converters (ADCs) to receive and convert a signal from the DUT to one or more digital waveforms; and one or more processors to: receive the one or more digital waveforms corresponding to one set of tuning parameters applied to the DUT; build one or more image tensors of the one or more digital waveforms; use an artificial intelligence embedding model that generates one or more text strings from metadata and embeds the metadata and the one or more image tensors into a vector; access a vector database; receive a set of indexes having a number of indexes corresponding to a number of matches; use the set of indexes to find one or more sets of optimal tuning parameters; and validate operation of the DUT.
A computing device includes one or more memories including test and measurement knowledge, a generative artificial intelligence (AI) model having access to the one or more memories, a display, user controls to allow the user to provide inputs, and one or more processors configured to execute that code that causes the one or more processors to: access an application programming interface (API) of an AI assistant for the generative AI model to allow the user to interact with the AI assistant, receive one or more user inputs through one or more of the API or a user interface, the user inputs providing a description of one or more waveforms to be generated, use the AI assistant to develop each waveform definition from the description and access the generative AI model, receive one or more waveforms from the AI assistant, and store the one or more waveforms.
G01R 13/02 - Dispositions pour la présentation de variables électriques ou de formes d'ondes pour la présentation sous forme numérique des variables électriques mesurées
A test and measurement probe for measuring an electrical signal in a device under test (DUT) includes a probe body, a sensor head separate from the probe body, one or more transmission optical fibers to convey an optical measurement signal between the probe body and the sensor head, and a pluggable interface between the probe body and the sensor head. The probe body includes an optical source to produce the optical measurement signal, receiver circuitry to receive the optical measurement signal and convert the optical measurement signal to an electrical measurement signal, and a connector to output the electrical measurement signal to a test and measurement instrument. The sensor head includes one or more sensor head optical fibers configured to convey the optical measurement signal to cause the electrical signal in the DUT to modify a polarization state of the optical measurement signal.
A test and measurement probe for measuring an electrical signal in a device under test (DUT) includes a probe body, a sensor head separate from the probe body, one or more transmission optical fibers to convey an optical measurement signal between the probe body and the sensor head, and a pluggable interface between the probe body and the sensor head. The probe body includes an optical source to produce the optical measurement signal, receiver circuitry to receive the optical measurement signal and convert the optical measurement signal to an electrical measurement signal, and a connector to output the electrical measurement signal to a test and measurement instrument. The sensor head includes one or more sensor head optical fibers configured to convey the optical measurement signal to cause the electrical signal in the DUT to modify a polarization state of the optical measurement signal.
G01R 1/04 - BoîtiersOrganes de supportAgencements des bornes
G02B 6/12 - Guides de lumièreDétails de structure de dispositions comprenant des guides de lumière et d'autres éléments optiques, p. ex. des moyens de couplage du type guide d'ondes optiques du genre à circuit intégré
A test and measurement system includes a proximity coupling device to transmit a wireless carrier signal and a proximity integrated circuit card to load modulate the transmitted wireless carrier signal to generate a BPSK-modulated subcarrier signal on the transmitted wireless carrier. A test and measurement instrument acquires the wireless carrier signal and includes a BPSK subcarrier filtering demodulator to demodulate the carrier signal including the BPSK-modulated subcarrier signal without performing down conversion of the wireless carrier signal. The BPSK subcarrier filtering demodulator low pass filters the wireless carrier signal including the BPSK-modulated subcarrier signal to generate a low pass filtered BPSK-modulated subcarrier signal and detects amplitude peaks in the low pass filtered BPSK-modulated subcarrier signal. The BPSK subcarrier filtering demodulator generates a BPSK-demodulated signal in response to the detected amplitude peaks.
A test and measurement instrument includes one or more ports to connect one or more devices under test (DUTs) through a serial bus to one or more channels, a user interface to allow a user to provide inputs to including a designation of mixed mode for the serial bus, a display to allow a user to view information about the one or more DUTs, one or more processors to: receive one or more packets from one DUT of the one or more DUTs; determine a version of a serial bus standard with which the one DUT complies by identifying a characteristic of the packet; use the version of the serial bus standard to decode the packet to produce decoded data; and analyze the decoded packet to monitor traffic on the serial bus and determine if the one DUT of the one or more DUTs is operating correctly.
G06F 11/22 - Détection ou localisation du matériel d'ordinateur défectueux en effectuant des tests pendant les opérations d'attente ou pendant les temps morts, p. ex. essais de mise en route
G06F 11/273 - Matériel de test, c.-à-d. circuits de traitement de signaux de sortie
34.
METHOD TO IDENTIFY, ISOLATE AND REMOVE THE SOURCE(S) OF JITTER AFFECTING REFERENCE CLOCK AND DATA USING TIME INTERVAL ERROR
A test and measurement instrument includes one or more ports to connect to a device under test (DUT), the DUT having one or more clock signals and one or more power rails, one or more analog-to-digital converters (ADC) to receive a signal from the DUT and convert the signal to waveform data, a user interface to allow a user to input one or more frequency pairs, and one or more processors to: determine a time interval error between a time of received edges and an expected time of the received edges; design a filter based upon start and stop frequencies for each of the one or more frequency pairs; filter the received edges to produce filtered edges; produce corrected clock edges from the filtered edges to produce a clock waveform; and reconstruct data of the waveform using the clock waveform to produce a reconstructed waveform.
A test and measurement system includes one or more test and measurement instruments comprising at least one test and measurement instrument having one or more ports to connect the to a device under test (DUT), one or more memories including test and measurement knowledge, a generative artificial intelligence (AI) model connected to the one or more test and measurement instruments, and the one or more memories, one or more processors to: present a user interface having a prompt to a user, receive a request from the user, the request comprising one or more tasks to be performed by the one or more test and measurement instrument, access an application programming interface (API) of the generative AI model to translate the request to commands, send the commands to the one or more test and measurement instruments, and display an output on the user interface.
A test and measurement instrument includes one or more ports to receive a signal from a device under test (DUT), an array of analog to digital converters (ADC) to receive the signal, a data collector to output one sample from each ADCs during one ADC clock cycle, and one or more processors to provide a sample clock to each ADC having a different clock phase from other ADCs to cause non-uniform sample spacing at or below a Nyquist frequency, and to cause the ADCs to output samples with non-uniform spacing. A method includes receiving a signal from a device under test, providing a sample clock to each ADC in an array of ADCs having a different clock phase from clock phases provided to other ADCs causing non-uniform sample spacing at or below a Nyquist frequency, sampling the signal with a non-uniform sample clock, and outputting the samples with non-uniform spacing.
G01R 13/02 - Dispositions pour la présentation de variables électriques ou de formes d'ondes pour la présentation sous forme numérique des variables électriques mesurées
37.
ENTROPY BASED SOFTWARE CLOCK RECOVERY FOR REAL-EQUIVALENT-TIME OSCILLOSCOPES
An oscilloscope having a Nyquist frequency lower than an analog bandwidth includes an input configured to receive a signal under test; an analog-to-digital converter (ADC) to receive the signal under test, sample the signal under test at a sample rate, and produce digital samples of the signal under test; one or more processors configured to execute code that causes the one or more processors to: determine a set of candidate unit intervals by generating corresponding candidate histograms using the candidate unit intervals; determine a best unit interval from the candidate unit intervals based upon entropy measures of each candidate histogram; and reconstruct a representation of the signal under test using the digital samples and the best unit interval.
An oscilloscope includes one or more ports to connect to a device under test (DUT) and receive a signal, one or more analog-to-digital converter (ADC) to produce a waveform of digital samples of the signal, and one or more processors to: acquire and determine a measure of a noise waveform, acquire a waveform of a repeating pattern from the ADCs and determine its frequency spectrum, identify a spectral impulse portion of the frequency spectrum, determine a measure of a flat portion of the frequency spectrum, use the measure of the flat portion and the measure of the noise waveform to produce a noise compensation ratio, scale the flat portion with the noise compensation ratio and combine it with the spectral impulse portion of the frequency spectrum to produce a noise compensated frequency spectrum, convert the noise compensated frequency spectrum to a time domain waveform to measure performance of the DUT.
G01R 13/02 - Dispositions pour la présentation de variables électriques ou de formes d'ondes pour la présentation sous forme numérique des variables électriques mesurées
G01R 35/00 - Test ou étalonnage des appareils couverts par les autres groupes de la présente sous-classe
39.
DYNAMICAL LOCKING OF SEED VALUE FOR LFSR DESCRAMBLER FOR USB
A test and measurement instrument has one or more channels to receive data from a device under test through a test fixture, the data being transmitted by the DUT in accordance with the Universal Serial Bus protocol 3.x, and one or more processors to: acquire a state of a linear feedback shift register (LFSR), extract a known portion of the LFSR as an LFSR value; shift the LFSR value a predetermined number of times to produce a new value of the LFSR, compare the new value of the LFSR to a value of incoming data to determine if the incoming data comprises a potential control code, repeat to acquire a predetermined number of potential control codes, compare them to known control code values to determine if they are valid, and if so, lock a seed used to descramble the remaining incoming data.
G06F 11/22 - Détection ou localisation du matériel d'ordinateur défectueux en effectuant des tests pendant les opérations d'attente ou pendant les temps morts, p. ex. essais de mise en route
A test and measurement instrument to receive a signal from a device under test, one or more analog-to-digital converters to receive the signal and convert the signal to digital samples, a moving max filter to receive the digital samples and produce a max value waveform from the digital samples within an envelope width to trigger operation of the test and measurement instrument, and one or more buffers to store max values from the digital samples. A moving max filter includes a max build-up circuit connected to one or more buffers to produce a building up max value, a max build-down circuit connected to the one or more buffers to determine which stored max values can be cleared from the one or more buffers and produce a building down max value, and a comparison block to find a maximum between the building up max value and the building down max value and to output the maximum.
G01R 23/167 - Analyse de spectreAnalyse de Fourier en utilisant des filtres des filtres numériques
G01R 23/12 - Dispositions pour procéder à la mesure de fréquences, p. ex. taux de répétition d'impulsionsDispositions pour procéder à la mesure de la période d'un courant ou d'une tension par conversion de la fréquence en déphasage
G01R 23/15 - Indication de ce qu'une fréquence d'impulsions est, soit supérieure ou inférieure à une valeur prédéterminée, soit à l'intérieur ou à l'extérieur d'une plage de valeurs prédéterminée, en utilisant des éléments non linéaires ou numériques
G01R 23/00 - Dispositions pour procéder aux mesures de fréquencesDispositions pour procéder à l'analyse de spectres de fréquences
G01R 25/00 - Dispositions pour procéder aux mesures de l'angle de phase entre une tension et un courant ou entre des tensions ou des courants
G01R 25/04 - Dispositions pour procéder aux mesures de l'angle de phase entre une tension et un courant ou entre des tensions ou des courants faisant intervenir le réglage d'un déphaseur pour produire une différence de phase prédéterminée, p. ex. une différence nulle
G01R 19/25 - Dispositions pour procéder aux mesures de courant ou de tension ou pour en indiquer l'existence ou le signe utilisant une méthode de mesure numérique
G01R 19/30 - Mesure de la valeur maximale ou minimale d'un courant ou d'une tension atteinte dans un intervalle de temps
09 - Appareils et instruments scientifiques et électriques
Produits et services
Downloadable computer firmware, namely, a high-speed interface for facilitating data transfer from testing instruments to a personal computer; Downloadable computer software, namely, software delivering a high-speed interface for facilitating data transfer from testing instruments to a personal computer
42.
INTERCONNECTING A PRINTED-CIRCUIT-BOARD SUBSTRATE TO ANOTHER SUBSTRATE OR TO A DIE
A method of interconnecting a printed-circuit-board (PCB) substrate and an integrated-circuit (IC) die that includes dispensing epoxy into a die cavity of a PCB substrate, the die cavity having full-wrap edge-plating; positioning an IC die in the die cavity and substantially aligning a top surface of the IC die with a top surface of the PCB substrate; curing the dispensed epoxy; substantially filling a gap between the PCB substrate and the IC die with underfill; filling a remaining gap between the PCB substrate and the IC die with non-conductive, aerosol-printed material; curing the underfill and the non-conductive, aerosol-printed material; using additive manufacturing to dispense conductive traces at desired locations spanning the gap and interconnecting the PCB substrate and the IC die; and sintering the dispensed conductive traces. Related methods are also discussed.
A test and measurement instrument to receive a signal from a device under test, one or more analog-to-digital converters to receive the signal and convert the signal to digital samples, a moving max filter to receive the digital samples and produce a max value waveform from the digital samples within an envelope width to trigger operation of the test and measurement instrument, and one or more buffers to store max values from the digital samples. A moving max filter includes a max build-up circuit connected to one or more buffers to produce a building_up_max value, a max build-down circuit connected to the one or more buffers to determine which stored max values can be cleared from the one or more buffers and produce a building_down_max value, and a comparison block to find a maximum between the building_up_max value and the building_down_max value and to output the maximum.
A current measurement probe includes two or more magnetic field sensors having a known geometric relationship to allow conversion of signals from the field sensors to a current measurement using the relationship. A test and measurement system includes a current measurement probe including two or more magnetic field sensors having a known geometric relationship to allow conversion of signals from the magnetic field sensors to a current measurement, a test and measurement instrument having at least one port to connect to the current measurement probe, and circuitry to receive the signals from the magnetic field sensors and convert the signals to the current measurement. A method for measuring current includes applying a current measurement probe to a substrate having a conductor carrying current, the current measurement probe having at least two magnetic field sensors having a known geometric relationship, converting signals from the magnetic field sensors to a current measurement.
G01R 15/20 - Adaptations fournissant une isolation en tension ou en courant, p. ex. adaptations pour les réseaux à haute tension ou à courant fort utilisant des dispositifs galvano-magnétiques, p. ex. des dispositifs à effet Hall
G01R 19/25 - Dispositions pour procéder aux mesures de courant ou de tension ou pour en indiquer l'existence ou le signe utilisant une méthode de mesure numérique
45.
TIME-ALIGNED RF ANALYSIS FROM GEOGRAPHICALLY DISTRIBUTED RECEIVERS
Systems and methods for capturing a test signal through multiple signal sensors and thereafter time-aligning and displaying time-aligned samples of the test signal are disclosed. Multiple signal sensors may be distributed at different geographical locations, each signal sensor including a sample counter that sequentially generates sample counts that are used in generating internal time stamps for samples of the test signal acquired by the signal sensor. Each signal sensor receives a general reference clock signal that enables samples of the test signal from the multiple signal sensors to be time-aligned. A timing offset between an internal time stamp associated with a transition of the general reference clock signal and internal time stamps associated with samples of the test signal is determined for each signal sensor. The timing offsets enable samples of the test signal from the multiple signal sensors to be aggregated, time-aligned, and the time-aligned samples displayed for analysis.
G01R 31/28 - Test de circuits électroniques, p. ex. à l'aide d'un traceur de signaux
46.
ACCELERATION INSIGHTS, ENHANCING EFFICIENCY, AND ENABLING PREDICTIVE MAINTENANCE IN TEST AND MEASUREMENT SYSTEMS USING ARTIFICIAL INTELLIGENCE ASSISTANT
A test and measurement instrument includes one or more ports to connect to a device under test (DUT), a user interface having one or more controls, a display, a storage, one or more processors to receive test signals from the DUT through the one or more ports as test of the DUT, use the test signals to generate test data, display test data on the display, display a control button on the user interface indicating that an artificial intelligence (AI) assistant is available, receive an input through the control button to start the AI assistant, provide regions on the user interface to allow the user to interact with the AI assistant, and apply a machine learning model represented by the AI assistant to provide the user with additional information related to one or more of the test and the DUT.
G01R 13/02 - Dispositions pour la présentation de variables électriques ou de formes d'ondes pour la présentation sous forme numérique des variables électriques mesurées
A thermal management system for a test-and-measurement probe that includes a thermally insulated shroud and a fluid inlet conduit. The shroud is configured to enclose a first portion of a test-and-measurement probe within an interior cavity of the shroud, while permitting a second portion of the test-and-measurement probe head to extend out of the shroud into a testing environment. The shroud further includes a fluid outlet passageway configured to permit a heat-transfer fluid to pass from a probe-head end of the interior cavity, through the interior cavity of the shroud, and out of the shroud through an access portion of the shroud. A fluid inlet conduit enters the shroud through an access portion of the shroud, extends through the interior cavity of the shroud, and is configured to introduce a heat-transfer fluid to a probe-head portion of the test-and-measurement probe.
A universal power probe fixture (UPPF) that is configured to be installed into a power signal path between a source device and a load device has one or more UPPF base modules, each UPPF base module including an input terminal block, an output terminal block, and a power transfer circuit including a multiple signal lines electrically connected between the input terminal block and the output terminal block, the signal lines structured to convey high power, and each of the signal lines includes a current probe connection point and at least one voltage probe connection point. The UPPF also has a source device connector adapted to electrically connect the source device to the input terminal block, and a load device connector adapted to electrically connect the load device to the output terminal block. A test system using the UPPF, and an application-specific electric vehicle motor probe adapter are also disclosed.
A universal power probe fixture (UPPF) that is configured to be installed into a power signal path between a source device and a load device has one or more UPPF base modules, each UPPF base module including an input terminal block, an output terminal block, and a power transfer circuit including a multiple signal lines electrically connected between the input terminal block and the output terminal block, the signal lines structured to convey high power, and each of the signal lines includes a current probe connection point and at least one voltage probe connection point. The UPPF also has a source device connector adapted to electrically connect the source device to the input terminal block, and a load device connector adapted to electrically connect the load device to the output terminal block. A test system using the UPPF, and an application-specific electric vehicle motor probe adapter are also disclosed.
A power vector analyzer to analyze power from a device under test (DUT) includes one or more channels to measure a reference voltage signal from a power line connected to the DUT, one or more channels to measure a reference current signal from the power line, a user interface comprising a display and one or more controls, and a quadrature synchronous detector (QSD) for each phase of apparent power being measured, the QSD configured to use a reference voltage signal from the one or more channels and a reference current signal from the one or more channels to determine the apparent power for each phase of power being measured by the DUT and display the apparent power for each phase on the display.
G01R 31/319 - Matériel de test, c.-à-d. circuits de traitement de signaux de sortie
G01R 27/28 - Mesure de l'atténuation, du gain, du déphasage ou des caractéristiques qui en dérivent dans des réseaux électriques quadripoles, c.-à-d. des réseaux à double entréeMesure d'une réponse transitoire
G01R 35/00 - Test ou étalonnage des appareils couverts par les autres groupes de la présente sous-classe
52.
SYSTEM AND METHOD FOR DECIMATED SWEEP MEASUREMENTS OF A DEVICE UNDER TEST USING MACHINE LEARNING
A test and measurement instrument includes one or more ports to allow the test and measurement instrument to receive a signal from a device under test (DUT), a user interface to allow the user to send inputs to the test and measurement instrument and receive results, and one or more processors configured to acquire the signal from the DUT, make measurements on the signal to create a decimated measurement set, convert the decimated measurement set into a tensor, send the tensor to a machine learning network, and receive a pass/fail value from the machine learning network. A method includes acquiring a signal from a device under test (DUT), making measurements on the signal to create a decimated measurement set, convert the decimated measurement set into a tensor, sending the tensor to a machine learning network, and receiving a pass/fail value from the machine learning network.
Systems and methods implement measuring, in a test and measurement instrument, operational signal timing parameters of electrical signals being communicated over an electrical bus by a device under test. A bus timing characteristics analyzer identifies nominal signal timing parameters for the acquired electrical signals. The nominal signal timing parameters are defined by the bus protocol and defining timing criteria for the electrical signals. The analyzer measures operational signal timing parameters for each of the acquired electrical signals and compares, for each of the electrical signals, the operational signal timing parameters to the nominal signal timing parameters to determine whether the operational signal timing parameters satisfy the timing criteria. The analyzer then displays, on the test and measurement instrument, a visual indication for each of the electrical signals indicating whether the operational signal timing parameters for the electrical signal satisfy the timing criteria.
G01R 13/02 - Dispositions pour la présentation de variables électriques ou de formes d'ondes pour la présentation sous forme numérique des variables électriques mesurées
54.
AUTOMATED TESTING OF A PHOTOVOLTAIC POWER SYSTEM AND ASSOCIATED COMPONENTS USING AN OSCILLOSCOPE
An oscilloscope includes input channels for receiving at least one voltage signal and at least one current signal from at least one component of a photovoltaic power system under test (SUT), a user interface including a display and one or more controls for receiving one or more test configuration settings from a user, and one or more processors configured to acquire waveforms of the at least one voltage signal and the at least one current signal, and implement a photovoltaic power system compliance test module that automatically determines, in real-time, one or more SUT performance measurements based on the acquired voltage and current waveforms and the one or more test configuration settings, displays, in real-time, the one or more SUT performance measurements to the user on the display. Methods of performing automated hardware-in-the-loop testing of a photovoltaic power system under test using an oscilloscope are also disclosed.
H02S 50/10 - Tests de dispositifs PV, p. ex. de modules PV ou de cellules PV individuelles
G01R 19/25 - Dispositions pour procéder aux mesures de courant ou de tension ou pour en indiquer l'existence ou le signe utilisant une méthode de mesure numérique
A connector assembly that includes an electrical connector having a connector conductor, a connector housing, a PCB substrate bonded to a base, positioning pads extending away from the PCB substrate, and metallic bumps extending away from the PCB substrate. The connector housing has a housing conductor that is electrically connected to the connector conductor. The PCB substrate is brittle, and the housing conductor contacts an electrical signal path on the PCB substrate at an oblique angle. The positioning pads keep the mounting face of the connector housing away from the PCB substrate at a standoff distance. The metallic bumps are malleable and configured to provide an electrical connection between the PCB substrate and the mounting face of the connector housing.
H01R 43/18 - Appareils ou procédés spécialement adaptés à la fabrication, l'assemblage, l'entretien ou la réparation de connecteurs de lignes ou de collecteurs de courant ou pour relier les conducteurs électriques pour la fabrication de socles ou de boîtiers pour pièces de contact
56.
USE OF A DATA SYMBOL ERROR BOUNDARY VIOLATION AS A TRIGGER SOURCE FOR SIGNAL CAPTURE AND STORAGE
A test and measurement instrument includes an antenna to receive signals containing symbols from a system under test (SUT), one or more analog-to-digital converters (ADC) to sample the signals received from the SUT, a memory to selectively store samples from the ADC, and one or more processors configured to execute code that causes the one or more processors to: receive samples from the ADC, analyze the samples from the ADC to determine whether one or more of the symbols received from the SUT has exceeded an expected modulation boundary for the one or more symbols; identifying a time at which the one or more symbols exceeded the expected modulation boundary as a trigger time; and store samples from a predetermined window of time surrounding the trigger time in the memory.
A margin tester includes one or more ports to allow the margin tester to connect to a device under test (DUT), a memory, the memory containing a margin tester signature, a transmitter, a receiver to receive signals from the DUT, one or more processors configured to execute code that causes the one or more processors to: receive multiple signals from the receiver through the one or more ports, generate a performance indicator from the multiple signals, send the performance indicator and the margin tester signature to one or more machine learning networks, and receiving a result from the one or more machine learning networks containing a performance measurement prediction for the DUT.
A wideband signal generator has one or more digital-to-analog converters (DAC), each of the one or more DACs having one or more pipes and a sample rate, a multiplexer to receive analog outputs from at least two pipes from the one or more DACs and multiplex the analog outputs and zero into an output stream, a bandpass filter to receive the output stream and filter out frequency components in the output stream that are outside a target frequency band and produce a radio frequency (RF) output signal in the in the target frequency band, and one or more processors configured to execute code that causes the one or more processors to generate digital samples and transfer the digital samples to the one or more DACs, the digital samples generated to produce analog outputs that cause the RF output signal to match the target RF frequency band.
Methods and systems provide access to acquired waveforms from a test and measurement instrument for multiple users. A method includes storing acquired waveforms from the instrument in a cloud-based platform and rendering, on a display of a first remote user device, a timeline illustrating in chronological order each acquired waveform from the instrument in response to the acquired waveform being stored in the cloud-based platform. An acquired waveform on the timeline is selected for viewing and at least one user-selectable feature view configured to display corresponding characteristics of the selected acquired waveform. A file from the cloud-based platform is received including data for the at least one user-selectable feature view and the configurable viewing window including the at least one user-selectable feature view using the file received is rendered on the first remote user device. The configurable viewing window may be shared with at least one other remote user device.
G01R 13/02 - Dispositions pour la présentation de variables électriques ou de formes d'ondes pour la présentation sous forme numérique des variables électriques mesurées
G06F 3/0482 - Interaction avec des listes d’éléments sélectionnables, p. ex. des menus
H04L 67/10 - Protocoles dans lesquels une application est distribuée parmi les nœuds du réseau
60.
Real-equivalent-time oscilloscope clock data recovery with software equalizer
A test and measurement instrument has an input to receive a signal under test having a repeating pattern. one or more analog-to-digital converters (ADC) to sample the signal under test at a sample rate over many repeating patterns to digitize the signal, one or more processors configured to execute code to cause the one or more processors to: recover a clock from the sampled signal under test, use the clock to generate an original pattern waveform, interpolate and resample from the original pattern waveform to generate an evenly time-spaced pattern waveform, apply an equalizer to the evenly time-spaced pattern waveform to produce an equalized pattern waveform, interpolate and resample from the equalized pattern waveform to produce a new waveform having equalized samples at sample times of the sampled signal under test, recover an updated clock from the new waveform, and use the updated clock to produce an updated waveform.
G01R 13/02 - Dispositions pour la présentation de variables électriques ou de formes d'ondes pour la présentation sous forme numérique des variables électriques mesurées
61.
USER INTERFACE FOR A TENSOR BUILDER TO CONSTRUCT IMAGES FOR INPUT TO MACHINE LEARNING
A test and measurement instrument includes one or more ports to allow the test and measurement instrument to receive data from a device under test (DUT), a connection to a machine learning network, a display configured to display a user interface, one or more controls to allow the test and measurement instrument to receive inputs from a user, and one or more processors configured to execute code that causes the one or more processors to: render a menu on the display that displays different types of tensors, receive, from the one or more controls, a user selection that identifies a selected type of tensor, and build the selected type of tensor from the data from the DUT and send the selected type of tensor to the machine learning network. A method of providing a user interface is also disclosed.
G06F 3/0482 - Interaction avec des listes d’éléments sélectionnables, p. ex. des menus
G06F 3/0484 - Techniques d’interaction fondées sur les interfaces utilisateur graphiques [GUI] pour la commande de fonctions ou d’opérations spécifiques, p. ex. sélection ou transformation d’un objet, d’une image ou d’un élément de texte affiché, détermination d’une valeur de paramètre ou sélection d’une plage de valeurs
A heat spreader may include a body having a first surface and a second surface opposite the first surface. Also, the heat spreader may include a wall disposed along a perimeter of the body, the wall extending from the first surface, the wall having a plurality of cut-outs. Furthermore, the heat spreader may include at least one channel extending from a first edge of the body to a second edge of the body parallel to the first edge, where the at least one channel disposed in a first cut-out of a first side of the wall and in a second cut-out of a second side of the wall opposite the first side.
A method and system of separating and determining components total jitter for a signal under test includes determining a time interval error (TIE) spectrum for the signal under test. The TIE spectrum includes a plurality of frequency bins. The method identifies frequency bins in the TIE spectrum containing deterministic jitter. The method includes determining components of total jitter for the signal under test based on frequency bins in an N-UI spectrum for the signal under test corresponding to the identified frequency bins in the TIE spectrum.
A test and measurement accessory has an input to receive an input signal from a device under test (DUT), a pilot signal generator to generate a pilot signal, an E/O converter to convert the input signal and the pilot signal to a combined optical signal, an O/E converter to convert the combined optical signal to a combined electrical signal, a signal separator to separate the pilot signal from the combined electrical signal, an amplitude detector to determine amplitude of the separated pilot signal, and circuitry to adjust a gain of a signal path using the amplitude. A test and measurement accessory has an input to receive an input signal from a DUT, an E/O converter to produce an optical signal, an optical splitter to split the optical signal into a feedback portion and a remaining portion, a feedback photodiode to produce a feedback electrical signal to adjust the optical signal.
G01R 13/02 - Dispositions pour la présentation de variables électriques ou de formes d'ondes pour la présentation sous forme numérique des variables électriques mesurées
65.
METHOD FOR SEPARATING AND MODELING N-UI JITTER BASED ON SPECTRUM
A method and system of separating and determining components total jitter for a signal under test includes determining a time interval error (TIE) spectrum for the signal under test. The TIE spectrum includes a plurality of frequency bins. The method identifies frequency bins in the TIE spectrum containing deterministic jitter. The method includes determining components of total jitter for the signal under test based on frequency bins in an N-UI spectrum for the signal under test corresponding to the identified frequency bins in the TIE spectrum.
A test and measurement device includes a signal generator to generate a test signal, a signal analyzer to receive a response signal from an adaptive system under test (SUT), communications ports to allow reception of the response signal, and one or more processors to send a signal to the signal generator to generate a first test signal, receive a response signal from the signal analyzer, measure performance of the response signal, and report the performance to at least one of the SUT and a user workspace on the test and measurement device. A method of testing a system under test (SUT) includes generating and sending a test signal with a signal generator, receiving a response signal from the SUT at a signal analyzer, measuring performance of the response signal with respect to the test signal, and reporting the performance to at least one of the SUT and a user workspace.
A test and measurement instrument having an integrated analog front end that includes one or more amplifiers, the one or more amplifiers implemented on a high-speed amplifier integrated circuit die, a controlled-impedance signal path between an input and a reference voltage, the controlled-impedance signal path including one or more signal taps and one or more controlled-impedance attenuator stages, the one or more controlled-impedance attenuator stages implemented on the amplifier integrated circuit die, and a switching network structured to selectively couple a signal tap of the controlled-impedance signal path to a respective amplifier of the one or more amplifiers, the switching network implemented on the amplifier integrated circuit die
A test and measurement system includes a device under test (DUT) interface structured to couple to at least one DUT and a measurement instrument coupled to the interface. The instrument includes one or more processors configured to, when testing the DUT, accept a measurement signal at a first input channel and generate a first sample waveform from the measurement signal using a first set of parameters, accept the measurement signal at a second input channel and generate a second sample from the measurement signal using a second set of parameters, and generate a measurement waveform from a combination of the first sample waveform and the second sample waveform. Additionally, the measurement instrument is structured to determine settling errors in the first pulse of a double-pulse test, and then compensate measurements made in subsequent pulses for the settling errors.
A test and measurement system includes a device under test (DUT) interface structured to couple to at least one DUT and a measurement instrument coupled to the interface. The instrument includes one or more processors configured to, when testing the DUT, accept a measurement signal at a first input channel and generate a first sample waveform from the measurement signal using a first set of parameters, accept the measurement signal at a second input channel and generate a second sample from the measurement signal using a second set of parameters, and generate a measurement waveform from a combination of the first sample waveform and the second sample waveform. Additionally, the measurement instrument is structured to determine settling errors in the first pulse of a double-pulse test, and then compensate measurements made in subsequent pulses for the settling errors.
A test and measurement instrument includes an array of data pipes, in which each of the array of data pipes further includes an input coupled to an output of an interleaved Analog-to-Digital Converter (ADC), a hysteresis processor coupled to the input to receive a present pipe data value, and coupled to another hysteresis processor in the array of data pipes to receive a previous data value and a previous data direction, the hysteresis processor structured to perform a comparison of the present pipe data value to the previous data value to determine whether a magnitude of a difference between the present pipe data value and the previous data value exceeds a hysteresis value, and a pipeline trigger comparator. Methods are also described.
G01R 13/02 - Dispositions pour la présentation de variables électriques ou de formes d'ondes pour la présentation sous forme numérique des variables électriques mesurées
71.
TEST AND MEASUREMENT INSTRUMENT WITH INTEGRATED ANALOG FRONT END
A test and measurement instrument having an integrated analog front end that includes one or more amplifiers, the one or more amplifiers implemented on a high-speed amplifier integrated circuit die, a controlled-impedance signal path between an input and a reference voltage, the controlled-impedance signal path including one or more signal taps and one or more controlled-impedance attenuator stages, the one or more controlled-impedance attenuator stages implemented on the amplifier integrated circuit die, and a switching network structured to selectively couple a signal tap of the controlled-impedance signal path to a respective amplifier of the one or more amplifiers, the switching network implemented on the amplifier integrated circuit die
G01R 13/02 - Dispositions pour la présentation de variables électriques ou de formes d'ondes pour la présentation sous forme numérique des variables électriques mesurées
72.
Optical tuning test system using parallel oven pipelines with parallel instrument channels and machine learning assistance
A test system includes a test and measurement instrument, ovens to hold devices under test (DUT), each oven having an oven switch selectably connected to the DUTs, channel switches selectably connected to the oven switches and to one channel of the instrument, one or more processors to: select an oven and its oven switch, connect that oven switch to a subset of DUTs in that oven, connect the channel switches to that oven switch to receive signals from the subset of DUTs, send the signals to channels of the instrument to acquire waveforms from the subset of DUTs in parallel, and repeat connecting of the channel switches and that oven switch until the instrument has acquired waveforms from each DUT in that oven, use machine learning to tune each DUT, test whether each DUT in that oven is optimally tuned, and repeat until all DUTs have been tuned and tested.
A test and measurement instrument includes an array of data pipes, in which each of the array of data pipes further includes an input coupled to an output of an interleaved Analog-to-Digital Converter (ADC), a hysteresis processor coupled to the input to receive a present pipe data value, and coupled to another hysteresis processor in the array of data pipes to receive a previous data value and a previous data direction, the hysteresis processor structured to perform a comparison of the present pipe data value to the previous data value to determine whether a magnitude of a difference between the present pipe data value and the previous data value exceeds a hysteresis value, and a pipeline trigger comparator. Methods are also described.
A test and measurement instrument includes one or more processors to acquire first, second, and third phase drive signals applied to a three-phase motor. A motor drive analyzer performs a direct-quadrature-zero, DQZ, transformation on the acquired first, second, and third phase drive signals to produce direct (D), quadrature (Q), and zero (Z) components, and generates an overlapped DQ phasor plot illustrating the D and Q components along with frequency domain representations of the D and Q components. The motor driver analyzer displays, on a user interface, the generated overlapped DQ phasor plot and an overlapped DQ spectra plot from the frequency domain representations of the D and Q components to enable a user to detect motor defects through visual characteristics of the overlapped DQ phasor and DQ spectra plots. The motor driver analyzer removes an offset and filters the D and Q components prior generating the overlapped DQ phasor plot.
A broadband balun structure has a single-ended port, a balanced port, a first transmission line connected between the single-ended port and one side of the balanced port, and a second transmission line connected to the other side of the balanced port, the first transmission line positioned to allow coupling of a first portion of the first transmission line simultaneously to both a second portion of the first transmission line and a portion of the second transmission line. A broadband balun structure includes a 180° hybrid using coupled-line structures, and a phase-shift network using coupled-line structures, the coupled-line structures positioned to couple at least one line section simultaneously to two other line sections. A test and measurement system and a test and measurement instrument, and at least one balun structure.
G01R 27/02 - Mesure de résistances, de réactances, d'impédances réelles ou complexes, ou autres caractéristiques bipolaires qui en dérivent, p. ex. constante de temps
A test and measurement system for a frequency-hopping communication system includes a radio frequency antenna structured to receive a signal from a frequency-hopping data transmitting device including at least two frames of data in which the at least two frames of data are sent at two or more unique radio frequencies, and a decoder structured to decode the at least two frames of data without prior knowledge at which radio frequencies the frequency-hopping device were to be sent. Methods are also described.
A test and measurement instrument includes one or more channels to receive a signal under test, each channel comprising an input port, a filter, and a sampler, at least one analog-to-digital converter (ADC), the at least one ADC having two pipes connected to the sampler of one of the one or more channels, the at least one ADC to produce digital samples of the signal at a sample rate, and one or more processors configured to execute code that causes the one more processors to acquire a spectrum of the digital samples for each pipe in the at least one ADC, and use the spectrums of the digital samples for each pipe in the at least one ADC to reconstruct the spectrum of the signal under test. A method of operating a test and measurement instrument, and a method a method of calibrating a test and measurement instrument is included.
A test and measurement accessory includes a shunt configured to be located in a current path including a device under test, the shunt comprising a wire bundle of individually insulated wires as a resistive portion and a sense lead, the wire bundle and the sense lead electrically connected at a first end, a first electrical contact electrically connected to the sense lead at a second end, and a second electrical contact electrically connected to the wires of the wire bundle at the second end to allow measurement of a voltage drop across the first and second electrical contacts. A test and measurement system includes a test and measurement instrument and the test and measurement accessory. A method includes measuring current using the accessory.
G01R 1/20 - Modifications des éléments électriques fondamentaux en vue de leur utilisation dans des appareils de mesures électriquesCombinaisons structurelles de ces éléments avec ces appareils
A communication network has multiple nodes, each node having one or more antennas, one or more input ports to receive communication signals from the antenna, a memory to store data associated with the communication signals, and one or more processors to gather local data about an environment, communicate with other nodes as needed, and use the local data to determine optimized operational settings for the node. A sensor device has one or more antennas to receive communication signals from other nodes in a communication network, one or more input ports to receive the communication signals, one or more output ports to transmit communication signals, a memory to store data associated with the communication signals, and one or more processors to determine a position of the sensor, transmit signals, receive return signals, produce return signal data, and use a machine learning system on the return signal data to identify unblocked ports.
A reconfigurable, automatically self-adjusting test and measurement instrument includes an interface configured to receive one or more static data preconditions for data received in an input signal and one or more dynamic data preconditions for data received in the input signal, the one or more static data preconditions and dynamic data preconditions defining one or more rules for data received during an input signal acquisition period to conform; and one or more processors configured to receive the one or more static and dynamic data preconditions, configure testing parameters of the test and measurement instrument to satisfy the one or more static preconditions, acquire the input signal, and analyze data received in the input signal to determine whether the one or more dynamic data preconditions are met.
G01R 13/02 - Dispositions pour la présentation de variables électriques ou de formes d'ondes pour la présentation sous forme numérique des variables électriques mesurées
81.
Automating PCIe 6.0 tx equalizer calibration using a multivariable approach
A receiver test and measurement system includes a signal generator to provide a stressed signal. The stressed signal needs to be calibrated as per specification for several parameters. Some parameters including a set of two or more equalization parameters can be calibrated by a test and measurement instrument that captures the stressed signal and executes a calibration operation. A multi-variable model is created establishing a relationship between parameters that are set in the signal generator and the measured values of these parameters in a test and measurement equipment like an oscilloscope. The multi-variable model calculates coefficients that allows us to calculate setting values that need to be set in the signal generator for any desired combination of two or more equalization parameters. This allows receiver tests to be done for any combination of desired equalization parameters in a calibrated manner.
G06F 11/22 - Détection ou localisation du matériel d'ordinateur défectueux en effectuant des tests pendant les opérations d'attente ou pendant les temps morts, p. ex. essais de mise en route
G06F 13/42 - Protocole de transfert pour bus, p. ex. liaisonSynchronisation
82.
Methods and systems of phase aligning a replica carrier signal for use in demodulating a subcarrier signal
A test and measurement system includes a proximity coupling device to transmit a modulated carrier signal and a proximity integrated circuit card to load modulate the transmitted modulated carrier signal and generate a modulated subcarrier signal on the wireless carrier signal. A test and measurement instrument acquires the modulated carrier signal and includes a phase-aligned subcarrier demodulator to demodulate the carrier signal including the modulated subcarrier signal. A demodulator detects commands and responses in the modulated carrier signal, removes the commands, and identifies a correlation index for each response. Each correlation index indicates a phase of the modulated carrier signal of the corresponding response relative to a replica carrier signal. The demodulator adjusts the phase of the replica carrier signal based on the correlation index for each response and down converts each response using the phase-aligned replica carrier signal. The modulated subcarrier signal is low pass filtered to demodulate response.
A test and measurement system includes a radio frequency antenna structured to receive a wireless carrier signal generated by an NFC vicinity coupling device and to receive load-modulated wireless carrier signals generated by one or more vicinity integrated circuit cards in response to the wireless carrier signal, and a response detector structured to determine if any load-modulated wireless carrier signals generated by one or more vicinity integrated circuit cards were received by the antenna. The response detector may use cross-correlation to determine if the load-modulated wireless carrier signals are present.
H04B 5/73 - Systèmes de transmission en champ proche, p. ex. systèmes à transmission capacitive ou inductive spécialement adaptés à des fins spécifiques pour la prise de mesures, p. ex. en utilisant des bobines de détection
A receiver test and measurement system includes a signal generator to provide a stressed signal. The stressed signal needs to be calibrated as per specification for several parameters. Some parameters including a set of two or more equalization parameters can be calibrated by a test and measurement instrument that captures the stressed signal and executes a calibration operation. A multi-variable model is created establishing a relationship between parameters that are set in the signal generator and the measured values of these parameters in a test and measurement equipment like an oscilloscope. The multi-variable model calculates coefficients that allows us to calculate setting values that need to be set in the signal generator for any desired combination of two or more equalization parameters. This allows receiver tests to be done for any combination of desired equalization parameters in a calibrated manner.
A test and measurement system includes a proximity coupling device to transmit a modulated carrier signal and a proximity integrated circuit card to load modulate the transmitted modulated carrier signal and generate a modulated subcarrier signal on the wireless carrier signal. A test and measurement instrument acquires the modulated carrier signal and includes a phase-aligned subcarrier demodulator to demodulate the carrier signal including the modulated subcarrier signal. A demodulator detects commands and responses in the modulated carrier signal, removes the commands, and identifies a correlation index for each response. Each correlation index indicates a phase of the modulated carrier signal of the corresponding response relative to a replica carrier signal. The demodulator adjusts the phase of the replica carrier signal based on the correlation index for each response and down converts each response using the phase-aligned replica carrier signal. The modulated subcarrier signal is low pass filtered to demodulate response.
H04L 27/06 - Circuits de démodulationCircuits récepteurs
H04L 7/02 - Commande de vitesse ou de phase au moyen des signaux de code reçus, les signaux ne contenant aucune information de synchronisation particulière
H04L 27/22 - Circuits de démodulationCircuits récepteurs
H04B 5/73 - Systèmes de transmission en champ proche, p. ex. systèmes à transmission capacitive ou inductive spécialement adaptés à des fins spécifiques pour la prise de mesures, p. ex. en utilisant des bobines de détection
86.
Technique to analyze and report accurate data, synchronizing multiple signals in a memory chip
A test and measurement system includes a multi-stack test subsystem including a plurality of test and measurement instruments, each instrument coupled to a device under test (DUT) to receive a plurality of test signals from the DUT during a test mode of operation. One test and measurement instrument is designated as a master and the remainder are designated as extension test and measurement instruments. The master communicates control signals to each of the extensions to synchronize the test and measurement instruments to simultaneously acquire the plurality of test signals provided by the DUT. An automation engine is coupled to the multi-stack test subsystem to receive the acquired plurality of test signals from the master, and the automation engine analyzes the acquired test signals to perform validation testing for each of plurality of test signals and simultaneously display results of the validation testing for the plurality of test signals.
A test and measurement instrument includes one or more ports to allow the instrument to connect to a DUT, a memory, a user interface including a display to display waveform signals received from the DUT and controls to allow a user to select settings for the instrument, and one or more processors configured to execute code that causes the one or more processors to: receive a signal from the DUT having multiple signal levels and multiple jitter thresholds; and adjust each measurement of the signal from the DUT using a jitter compensation value for each jitter threshold to produce a final measurement. A method includes receiving a waveform signal having multiple signal levels and multiple jitter thresholds from a device under test (DUT), and adjusting measurements of each level of the signal using a jitter compensation value for each level to produce final measurements.
G01R 13/02 - Dispositions pour la présentation de variables électriques ou de formes d'ondes pour la présentation sous forme numérique des variables électriques mesurées
G01R 29/26 - Mesure du coefficient de bruitMesure de rapport signal-bruit
90.
AUTOMATED CHANNEL CHARACTERIZATION FOR MACHINE-LEARNING-BASED RIS-AIDED MIMO SYSTEMS
A method of characterizing a communication channel includes receiving a first signal from a set of transmitters reflected along a reflected channel from each element of a reconfigurable intelligent surface (RIS) set at a nominal angle, receiving a second signal reflected in the reflected channel from each element of the RIS set at an adjusted angle, using the first and second signals to determine a transfer function for a combined channel comprised of a reflected channel and a direct channel, and using the transfer function as an input to a machine learning network to determine optimized settings for the elements of the RIS. A communications system includes a set of transmitters, a reconfigurable intelligent surface (RIS), one or more receivers positioned to receive signals reflected by the RIS from the set of transmitters, and a machine learning system configured to produce optimized angles for elements of the RIS.
H04B 7/04 - Systèmes de diversitéSystèmes à plusieurs antennes, c.-à-d. émission ou réception utilisant plusieurs antennes utilisant plusieurs antennes indépendantes espacées
A test and measurement system includes a test and measurement instrument, including a port to receive a signal from a device under test (DUT), and one or more processors, configured to execute code that causes the one or more processors to: adjust a set of operating parameters for the DUT to a first set of reference parameters; acquire, using the test and measurement instrument, a waveform from the DUT; repeatedly execute the code to cause the one or more processors to adjust the set of operating parameters and acquire a waveform, for each of a predetermined number of sets of reference parameters; build one or more tensors from the acquired waveforms; send the one or more tensors to a machine learning system to obtain a set of predicted optimal operating parameters; adjust the set of operating parameters for the DUT to the predicted optimal operating parameters; and determine whether the DUT passes a predetermined performance measurement when adjusted to the set of predicted optimal operating parameters.
H04B 10/073 - Dispositions pour la surveillance ou le test de systèmes de transmissionDispositions pour la mesure des défauts de systèmes de transmission utilisant un signal hors service
H04B 10/077 - Dispositions pour la surveillance ou le test de systèmes de transmissionDispositions pour la mesure des défauts de systèmes de transmission utilisant un signal en service utilisant un signal de surveillance ou un signal supplémentaire
A composite analog-to-digital converter (ADC) has a low resolution ADC configured to receive and digitize analog data, the low resolution ADC having a low resolution and a high operating speed, one or more high resolution ADCs configured to receive and digitize the analog data, the one or more high resolution ADCs having a resolution higher than the low resolution ADC, and an operating speed lower than the high operating speed of the low resolution ADC, a sample clock generator to provide a sample clock signal to the low resolution ADC and to a clock divider, a mixer to receive the analog data and connected to the one or more high resolution ADCs, a local oscillator connected to the mixer to allow one or more high resolution ADCs to be tuned to sample a portion of a spectrum of the low resolution ADC. A test and measurement instrument contains a composite ADC. A method of operating a composite analog-to-digital converter (ADC), includes receiving an analog signal at a low resolution ADC that operates at a high speed, receiving the analog signal at one or more high resolution ADCs that operate at a resolution higher than the low resolution ADC and at a lower speed than the operating speed of the low resolution ADC, tuning the high resolution ADC to phase align and time align a signal path for the one or more high resolution ADCs to the signal path for the low resolution ADC, producing a spectrum from the low resolution ADC, and producing a portion of the spectrum from the one or more high resolution ADCs.
G01R 13/02 - Dispositions pour la présentation de variables électriques ou de formes d'ondes pour la présentation sous forme numérique des variables électriques mesurées
A method of training a machine learning system to determine operating parameters for optical transceivers includes connecting the transceiver to a test and measurement device, tuning the transceiver with a set of parameters, capturing a waveform from the transceiver, sending the waveform and the set of parameters to a machine learning system, and repeating the tuning, capturing, and sending until a sufficient number of samples are gathered.
H04B 10/079 - Dispositions pour la surveillance ou le test de systèmes de transmissionDispositions pour la mesure des défauts de systèmes de transmission utilisant un signal en service utilisant des mesures du signal de données
H04B 10/07 - Dispositions pour la surveillance ou le test de systèmes de transmissionDispositions pour la mesure des défauts de systèmes de transmission
H04B 10/077 - Dispositions pour la surveillance ou le test de systèmes de transmissionDispositions pour la mesure des défauts de systèmes de transmission utilisant un signal en service utilisant un signal de surveillance ou un signal supplémentaire
A machine learning management system includes a repository having one or more partitions, the one or more partitions being separate from others of the partitions, a communications interface, and one or more processors configured to execute code to: receive a selected model and associated training data for the selected model through the communications interface from a customer; store the selected model and the associated training data in a partition dedicated to the customer; and manage the one or more partitions to ensure that the customer can only access the customer's partition. A method includes receiving a selected model and associated training data for the selected model from a customer, storing the selected model and the associated training data in a partition dedicated to the customer in a repository, and managing the one or more partitions to ensure that the customer can only access the partition dedicated to the customer.
A test and measurement instrument includes a port to connect to a device under test (DUT) to receive waveform data, a connection to a machine learning network, and one or more processors configured to: receive one or more inputs about a three-dimensional (3D) tensor image; scale the waveform data to fit within the 3D tensor image; build the 3D tensor image; send the 3D tensor image to the machine learning network; and receive a predictive result from the machine learning network. A method includes receiving waveform data from one or more device under test (DUT), receiving one or more inputs about a three-dimensional (3D) tensor image, scaling the waveform data to fit within the 3D tensor image, building the 3D tensor image, sending the 3D tensor image to a pre-trained machine learning network, and receiving a predictive result from the machine learning network.
An input selector for electrically connecting one of a plurality of test signals from one or more devices under test to a test and measurement instrument, the input selector includes a first multiplexer having a first set of multiple inputs, each of the first set of multiple inputs coupled to a different one of the plurality of test signals from one or more devices under test, and having a first output of a selected one of the first multiple inputs, and a second multiplexer having a second set of multiple inputs, each of the second set of multiple inputs coupled to a different one of the plurality of test signals from the one or more devices under test, and having a second output of a selected one of the multiple inputs. Methods are also described.
A test and measurement system includes one or more remote heads, each of the one or more remote heads configured to be coupled to a respective device under test (DUT) to receive an electrical test signal from the DUT and each of the one or more remote heads including an electrical-to-optical (EOM) configured to convert the received electrical test signal into an optical test signal. Optical interconnection circuity receives the optical test signal from the EOM of the one or more remote heads and, in response to control signals, selects one of the optical test signals to be provided to a test and measurement system. The optical interconnection circuitry further converts the selected optical test signal into an electrical test signal to be supplied to a test port of the test and measurement instrument. Methods are also described.
G01R 15/24 - Adaptations fournissant une isolation en tension ou en courant, p. ex. adaptations pour les réseaux à haute tension ou à courant fort utilisant des dispositifs modulateurs de lumière
G01R 15/12 - Circuits pour appareils de test à usage multiple, p. ex. pour mesurer, au choix, tension, courant ou impédance
G01R 31/319 - Matériel de test, c.-à-d. circuits de traitement de signaux de sortie
H04B 10/80 - Aspects optiques concernant l’utilisation de la transmission optique pour des applications spécifiques non prévues dans les groupes , p. ex. alimentation par faisceau optique ou transmission optique dans l’eau
H04Q 11/00 - Dispositifs de sélection pour systèmes multiplex
98.
INTEROPERABILITY PREDICTOR USING MACHINE LEARNING AND REPOSITORY OF TX, CHANNEL, AND RX MODELS FROM MULTIPLE VENDORS
A test system includes a repository of component models containing characteristic parameters for each component model, one or more processors to receive a list of selected component models through a user interface to be tested as a combination, access the characteristic parameters for each selected component model, build a tensor image using the characteristic parameters, send the tensor image to one or more trained neural networks to predict interoperability of the combination, and receive a prediction about the combination. A method includes receiving a list of selected component models through a user interface to be tested as a combination, accessing characteristic parameters for the selected component models, building a tensor image for each combination of the selected component models, sending the tensor image to one or more trained neural networks to predict interoperability of the combination, and receiving a prediction about the combination.
09 - Appareils et instruments scientifiques et électriques
Produits et services
Hardware and software, as a component feature of an oscilloscope for signal acquisition that optimizes the oscilloscope's noise floor based on the input signal frequency content.
100.
Split-path multiplexing accessory for a test and measurement instrument
An input selector for electrically connecting one of a plurality of test signals from one or more devices under test to a test and measurement instrument, the input selector includes a first multiplexer having a first set of multiple inputs, each of the first set of multiple inputs coupled to a different one of the plurality of test signals from one or more devices under test, and having a first output of a selected one of the first multiple inputs, and a second multiplexer having a second set of multiple inputs, each of the second set of multiple inputs coupled to a different one of the plurality of test signals from the one or more devices under test, and having a second output of a selected one of the multiple inputs. Methods are also described.
