An X-ray detector 1 includes: an X-ray line sensor 3 which is arranged in a straight line in the horizontal direction such that a plurality of X-ray detecting elements 35 face an X-ray source 5; and a collimator portion 2, which comprises a pair of plate-shaped portions arranged facing each other in the vertical direction, is disposed on the X-ray source 5 side of an end portion of the X-ray line sensor 3 so as to sandwich the X-ray line sensor 3 when viewed from the X-ray source 5 side, and which introduces an X-ray 7 into the X-ray detecting elements 35. A movement control mechanism 11 has a first drive portion 11a and a second drive portion 11b that move the X-ray detector 1 such that the direction in which the X-ray 7 is introduced into the collimator portion 2 is directed toward the X-ray source 5. An X-ray introduction width d2 of the collimator portion 2 is greater than a thickness d1 of the X-ray detecting elements 35, and a blocking portion 2S for blocking the incidence of the X-ray 7 is provided on the outside, in the vertical direction, of the X-ray line sensor 3.
G01N 23/04 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by transmitting the radiation through the material and forming images of the material
G01N 23/18 - Investigating the presence of defects or foreign matter
G01T 7/00 - Details of radiation-measuring instruments
An X-ray image capture system includes an X-ray source, an X-ray detector that includes a plurality of X-ray line sensors where respective X-ray detection elements are arranged in a one-dimensional manner with respect to a horizontal direction and respective X-ray detection element groups are arranged to be back-to-back or front-to-front and a collimator that is provided on end parts of the plurality of X-ray line sensors that face the X-ray source, a signal processing circuit that processes a measurement signal that is measured by the X-ray detector to produce an X-ray transmission image, and a driving control mechanism that moves the X-ray detector in upward and downward directions and rotates the X-ray detector around an axis in pixel pitch directions of the X-ray line sensors in association with movement of the X-ray detector to tilt the X-ray detector with respect to a horizontal plane.
G01T 1/29 - Measurement performed on radiation beams, e.g. position or section of the beamMeasurement of spatial distribution of radiation
G01N 23/04 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by transmitting the radiation through the material and forming images of the material
G01T 1/20 - Measuring radiation intensity with scintillation detectors
G21K 1/02 - Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diaphragms, collimators
An X-ray image capture system includes an X-ray source, an X-ray detector that includes an X-ray line sensor with X-ray detection elements that are arranged in a one-dimensional manner with respect to a horizontal direction and a collimator that is provided on an end part of the X-ray line sensor that faces the X-ray source, an X-ray introduction width of the collimator being greater than widths of the X-ray detection elements, a signal processing circuit that processes a measurement signal that is measured by the X-ray detector to produce an X-ray transmission image, and a driving control mechanism that moves the X-ray detector in upward and downward directions and rotates the X-ray detector around an axis in a pixel pitch direction of the X-ray line sensor in association with movement of the X-ray detector to tilt the X-ray detector with respect to a horizontal plane.
G01N 23/04 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by transmitting the radiation through the material and forming images of the material
G01N 23/083 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by transmitting the radiation through the material and measuring the absorption the radiation being X-rays
The objective of the present invention is to provide an X-ray detector of an X-ray imaging system that can tolerate minute angular displacement of the X-ray detector, which employs an X-ray line sensor that is scanned. To this end, the X-ray detector includes an X-ray line sensor 3 in which X-ray detecting elements are disposed one-dimensionally with respect to a horizontal direction, and a collimator 2 provided at an end portion of the X-ray line sensor 3 facing an X-ray source, wherein: the X-ray detector is provided with a drive control mechanism for moving the X-ray detector in a vertical direction and, in conjunction with said movement, causing the X-ray detector 1 to be inclined relative to a horizontal plane by rotating the same about a pixel pitch direction of the X-ray line sensor 3, to cause a radiation direction of radiated X-rays to coincide with an X-ray introduction direction of the collimator 2; and an X-ray introduction width d2 of the collimator 2 is greater than a width d1 of the X-ray detecting elements.
G01N 23/04 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by transmitting the radiation through the material and forming images of the material
G01N 23/083 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by transmitting the radiation through the material and measuring the absorption the radiation being X-rays
G01T 7/00 - Details of radiation-measuring instruments
The objective of the present invention is to provide an X-ray detector of an X-ray imaging system with which it is simple to obtain an X-ray transmission image having a desired resolution or detection sensitivity, for a case in which the X-ray transmission image is acquired by means of an X-ray detector employing an X-ray line sensor that is scanned. To this end, an X-ray detector 40 comprises: a plurality of X-ray line sensors 41, 42 in each of which X-ray detecting elements are arranged one-dimensionally with respect to a horizontal direction, and X-ray detecting element groups are arranged back-to-back or facing one another; and a collimator provided at an end portion of the X-ray line sensors 41, 42 facing an X-ray source. Further, each X-ray detecting element group has a different ray receiving area size S1, S2.
G01N 23/083 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by transmitting the radiation through the material and measuring the absorption the radiation being X-rays
G01N 23/04 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by transmitting the radiation through the material and forming images of the material
G01T 7/00 - Details of radiation-measuring instruments
6.
Radiation detector, radiation inspecting device, and method for processing radiation detection signal
Provided is a detector capable of appropriately and highly accurately detecting radiation even under an environment where a wide range of radiation is irradiated.
The radiation detector is configured in such a manner that a plurality of light receiving devices are arranged in each cell of a scintillator that is divided into a plurality of cells, photoelectric conversion of scintillation light emitted by each individual cell is dividedly performed by the plurality of light receiving devices to reduce a charge amount of an output signal of each light receiving device, and the output signals are input into an integrated circuit to generate a radiation detection signal of each cell.
G01T 1/20 - Measuring radiation intensity with scintillation detectors
G01N 23/04 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by transmitting the radiation through the material and forming images of the material
G01N 23/06 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by transmitting the radiation through the material and measuring the absorption
7.
RADIATION DETECTOR, RADIATION INSPECTING DEVICE, AND METHOD FOR PROCESSING RADIATION DETECTION SIGNAL
The objective of the present invention is to configure a detector capable of detecting radiation appropriately and with a high degree of accuracy even in an environment irradiated with a wide range of radiation. This radiation detector is configured in such a way that a plurality of light receiving devices are arranged in each cell of a scintillator that is divided into a plurality of cells, photoelectric conversion of scintillation light emitted by each individual cell is performed by being divided between a plurality of light receiving devices, a charge amount of an output signal of each light receiving device is reduced, and the output signals are input into an integrated circuit which performs processing to generate a radiation detection signal of the cell.
G01T 1/20 - Measuring radiation intensity with scintillation detectors
G01N 23/04 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by transmitting the radiation through the material and forming images of the material
G01N 23/087 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by transmitting the radiation through the material and measuring the absorption the radiation being X-rays using polyenergetic X-rays
G01N 23/10 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by transmitting the radiation through the material and measuring the absorption the material being confined in a container, e.g. in luggage X-ray scanners
G01N 23/20 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by using diffraction of the radiation by the materials, e.g. for investigating crystal structureInvestigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materialsInvestigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by using reflection of the radiation by the materials
C09K 11/00 - Luminescent, e.g. electroluminescent, chemiluminescent, materials
C09K 11/61 - Luminescent, e.g. electroluminescent, chemiluminescent, materials containing inorganic luminescent materials containing fluorine, chlorine, bromine, iodine or unspecified halogen elements
G01T 1/20 - Measuring radiation intensity with scintillation detectors
G01T 1/202 - Measuring radiation intensity with scintillation detectors the detector being a crystal
G21K 4/00 - Conversion screens for the conversion of the spatial distribution of particles or ionising radiation into visible images, e.g. fluoroscopic screens
C30B 11/00 - Single-crystal-growth by normal freezing or freezing under temperature gradient, e.g. Bridgman- Stockbarger method
C30B 11/06 - Single-crystal-growth by normal freezing or freezing under temperature gradient, e.g. Bridgman- Stockbarger method adding crystallising materials or reactants forming it in situ to the melt at least one but not all components of the crystal composition being added
C09K 11/74 - Luminescent, e.g. electroluminescent, chemiluminescent, materials containing inorganic luminescent materials containing arsenic, antimony or bismuth
The present invention pertains to a scintillator having crystals that contain thallium (Tl) and bismuth (Bi), with CsI (cesium iodide) as the matrix, and provides a novel scintillator with which it is possible to further enhance the afterglow characteristics while maintaining high output. Proposed is a scintillator having crystals that contain thallium (Tl), bismuth (Bi), and O, with CsI (cesium iodide) as the matrix, wherein the scintillator is characterized in that the Bi content concentration a relative to Cs in the crystals is 0.001 at. ppm ≤ a ≤ 5 at. ppm, and the ratio (a/b) of the O content concentration b relative to I in the crystals and the Bi content concentration a relative to Cs in the crystals is 0.05 × 10-4 to 200 × 10-4.
C09K 11/00 - Luminescent, e.g. electroluminescent, chemiluminescent, materials
C09K 11/61 - Luminescent, e.g. electroluminescent, chemiluminescent, materials containing inorganic luminescent materials containing fluorine, chlorine, bromine, iodine or unspecified halogen elements
G01T 1/20 - Measuring radiation intensity with scintillation detectors
G01T 1/202 - Measuring radiation intensity with scintillation detectors the detector being a crystal
G21K 4/00 - Conversion screens for the conversion of the spatial distribution of particles or ionising radiation into visible images, e.g. fluoroscopic screens
2 or less, or, in which the standard deviation of the distances of the Delaunay edges in a diagram from a Delaunay decomposition of the distribution of etch-pits of the (111) plane is 80 μm or less.
G02B 1/02 - Optical elements characterised by the material of which they are madeOptical coatings for optical elements made of crystals, e.g. rock-salt, semiconductors
C30B 11/04 - Single-crystal-growth by normal freezing or freezing under temperature gradient, e.g. Bridgman- Stockbarger method adding crystallising materials or reactants forming it in situ to the melt
2 or less, or, in which the standard deviation of the distances of the Delaunay edges in a diagram from a Delaunay segmentation of the distribution of etch-pits of the (111) plane is 80 μm or less.
2 crystal. A fluorite production method is proposed, wherein heat-treatment is carried out by providing, through compartment walls in the periphery of a fluorite crystal, a fluoride gas trap layer containing a fluoride gas-adsorbing material.
G02B 1/02 - Optical elements characterised by the material of which they are madeOptical coatings for optical elements made of crystals, e.g. rock-salt, semiconductors
C30B 11/00 - Single-crystal-growth by normal freezing or freezing under temperature gradient, e.g. Bridgman- Stockbarger method
The present invention improves the afterglow characteristics of cesium iodide:thallium (CsI:Tl) which is obtained by doping CsI as the host with thallium. A scintillator with improved afterglow characteristics can be obtained by subjecting a crystalline material which consists of cesium iodide (CsI) as the host and thallium (Tl) as the emission center to doping with bismuth (Bi).
Disclosed is a fluorite with even greater laser durability than conventional fluorites. Specifically disclosed is a fluorite with a standard deviation for the area of a Voronoi region in a diagram wherein the etch pit distribution of a surface (111) is Voronoi-segmented is 6,000µm2 or less, or the standard deviation of the distance of a Delaunay side in a diagram wherein the etch pit distribution of a surface (111) is Delaunay-segmented is 80 µm or less.
G02B 1/02 - Optical elements characterised by the material of which they are madeOptical coatings for optical elements made of crystals, e.g. rock-salt, semiconductors
H01L 21/027 - Making masks on semiconductor bodies for further photolithographic processing, not provided for in group or
Disclosed is a fluorite with excellent laser durability as a result of modifying a method for heat processing CaF2 crystals. Specifically disclosed is a production method for fluorite that is characterized by the disposal of a fluoride gas trapping layer containing a fluoride gas adsorbent on the circumference of a fluorite crystal via a partition wall.
G02B 1/02 - Optical elements characterised by the material of which they are madeOptical coatings for optical elements made of crystals, e.g. rock-salt, semiconductors
A radiation detecting apparatus comprises: a first detector that detects incidence of radiation; a plate-shaped detection substrate including a second detector that detects an incident position of the radiation to at least the first detector, and a first terminal that is electrically connected to the second detector; a wiring substrate including a second terminal and an external terminal that is electrically connected to the second terminal; and a connecting member that electrically connects the first terminal and the second terminal. The first terminal is arranged at one end of a main surface of the plate-shaped detection substrate. The detection substrate is mounted on the wiring substrate such that the main surface is substantially perpendicular to the wiring substrate in a state that the one end faces the wiring substrate. The first detector is arranged opposite to the main surface of the detection substrate.
patents
