Endress+Hauser Optical Analysis, Inc.

United States of America

Back to Profile

1-1 of 1 for Endress+Hauser Optical Analysis, Inc. Sort by
Query
Patent
World - WIPO
Aggregations Reset Report
IPC Class
G01J 3/457 - Correlation spectrometry, e.g. of the intensity 1
G01N 21/3504 - Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing gases, e.g. multi-gas analysis 1
Found results for  patents

1.

METHOD FOR OBTAINING A MODEL FOR A SPECTROMETER OR A SPECTROSCOPE

      
Application Number US2023072455
Publication Number 2024/040214
Status In Force
Filing Date 2023-08-18
Publication Date 2024-02-22
Owner ENDRESS+HAUSER OPTICAL ANALYSIS, INC. (USA)
Inventor Ludlum, Kevin

Abstract

The present disclosure comprises a method for obtaining a model for a spectrometer or a spectroscope, wherein a model comprises a relationship between a spectrum of a gas mixture or gas and parameters of the gas mixture or gas, in particular the composition and/or concentrations of individual components of the gas mixture, including: - acquiring a reference spectrum of a predetermined gas or gas mixture by means of the spectrometer or spectroscope and parameters of the predetermined gas or gas mixture, in particular the composition and/or concentrations of concentrations of the individual components of the predetermined gas mixture; encrypting the spectrum and/or the parameters by means of a homomorphic encryption method; and analyzing the spectrum and parameters without decoding the spectrum, or parameters.

IPC Classes  ?

  • G01N 21/3504 - Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing gases, e.g. multi-gas analysis
  • G01J 3/457 - Correlation spectrometry, e.g. of the intensity