Next-tip, S.L.

Spain

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        United States 1
        World 1
Date
2023 1
2021 1
IPC Class
G01Q 70/12 - Nanotube tips 2
G01Q 70/14 - Particular materials 2
G01Q 70/18 - Functionalisation 2
G01Q 60/06 - SNOM [Scanning Near-field Optical Microscopy] combined with AFM [Atomic Force Microscopy] 1
G01Q 60/38 - Probes, their manufacture or their related instrumentation, e.g. holders 1
Status
Pending 1
Registered / In Force 1
Found results for  patents

1.

SCANNING PROBE MICROSCOPE (SPM) TIP

      
Application Number 17998815
Status Pending
Filing Date 2021-05-17
First Publication Date 2023-06-29
Owner NEXT-TIP, S.L. (Spain)
Inventor
  • Sanz Sanz, Belén
  • Espinosa Rodríguez, Manuel

Abstract

The present invention refers to a method for modifying a scanning probe microscope (SPM) tip, a modified SPM tip obtainable by the method, a modified SPM tip, to the use of the modified SPM tip, to a scanning probe comprising the modified SPM tip and to the use of the scanning probe.

IPC Classes  ?

2.

SCANNING PROBE MICROSCOPE (SPM) TIP

      
Application Number EP2021062967
Publication Number 2021/233817
Status In Force
Filing Date 2021-05-17
Publication Date 2021-11-25
Owner NEXT-TIP, S.L. (Spain)
Inventor
  • Sanz Sanz, Belén
  • Espinosa Rodríguez, Manuel

Abstract

The present invention refers to a method for modifying a scanning probe microscope (SPM) tip, a modified SPM tip obtainable by the method, a modified SPM tip, to the use of the modified SPM tip, to a scanning probe comprising the modified SPM tip and to the use of the scanning probe.

IPC Classes  ?