The present invention relates to a test socket capable of effectively dissipating heat generated when testing an element to be tested (for example, a semiconductor device). A test socket according to an embodiment comprises: a lower insulation sheet having a through-hole formed therethrough, the through-hole being formed at every position corresponding to a pad of a test device; a conductive part array in which a plurality of conductive parts are arranged in a plurality of conductive part rows and a plurality of conductive part columns, the conductive parts being formed in the through-holes of the lower insulation sheet, respectively; insulating parts arranged between the plurality of conductive parts forming the conductive part array to support the conductive part array; and a heat dissipating member which is disposed within an insulation part positioned between two adjacent conductive part columns among the conductive part array and in parallel with the conductive part columns, to collect heat generated in the two adjacent conductive part columns.
A test socket is capable of providing heat that is required to perform burn-in tests without any additional equipment, the test socket including: a connection portion 120; a frame 110 supporting the connection portion 120; and a heating wire 150 disposed on the frame 110.
A testing connector according to an exemplary embodiment is a testing connector disposed between a device under test and test equipment, and comprises: a conductive part extending in the vertical direction between the device under test and the test equipment, and electrically connecting the device under test and the test equipment to each other; and an insulating housing having a through-hole formed in the vertical direction so that the conductive part is accommodated therein, wherein the through-hole includes a plurality of supports that protrude toward the conductive part and are arranged to be spaced from each other in the circumferential direction of the through-hole.
This test connector is disposed between a test device and a device under test. The connector may comprise: a conductive housing including a plurality of conductive parts corresponding to a plurality of terminals of the device under test, respectively, a plurality of through holes accommodating the plurality of conductive parts, respectively, and a first shielding part surrounding the plurality of through holes from the outside; a plurality of first insulating parts extending between the plurality of conductive parts and the first shielding part; and a ball guide part disposed on the conductive housing. The ball guide part may comprise: a second shielding part disposed on the first shielding part and surrounding the plurality of terminals to shield the plurality of terminals while the device under test is being tested; and a second insulating part coming into contact with the second shielding part and surrounding the plurality of terminals while the device under test is being tested.
A test socket according to an embodiment of the present invention relates to a test socket which allows both of a terminal located at the center of a semiconductor device and a terminal located in the periphery portion thereof to be in stable contact with conductive portions of the test socket as a conductive portion located at the peripheral portion of the semiconductor device and a conductive portion located at the center thereof are uniformly pressurized when performing a test of a large-area semiconductor device by adjusting, for each region, the resistance of an insulating portion disposed between the conductive portions.
Provided is a testing connector arranged between a testing device and a device to be tested. The testing connector comprises: a lower support sheet; an upper support sheet; conductive portions which are supported in the vertical direction by at least one of the lower support sheet and the upper support sheet; an insulation sheet arranged between the lower support sheet and the upper support sheet; lower elastic pillars supporting the insulation sheet on the lower support sheet; and upper elastic pillars supporting the upper support sheet on the insulation sheet. The insulation sheet has buckling prevention portions which prevent buckling of the conductive portions due to a contact with the outer circumferential surface of the conductive portions in the horizontal direction. The lower elastic pillars and the upper elastic pillars are spaced apart from the buckling prevention portions so as to allow the conductive portions to expand.
The embodiments according to one aspect of the present disclosure relate to a connector for electrical connection, which is disposed between a device to be tested and test equipment and electrically connects the device to be tested and the test equipment to each other. The connector for electrical connection, according to an exemplary embodiment, comprises: a mesh sheet made of an insulating material and having a plurality of mesh holes; and a conductive part in which a mixture of conductive particles and liquid silicon is filled in each of the plurality of mesh holes and is cured to form a conductive path by the conductive particles in a vertical direction perpendicular to the mesh sheet.
The present invention relates to a pusher device for inspection and, more specifically, to an pusher device for inspection that is for pushing an inspection object requiring an electrical inspection toward an inspection device, the pusher device for inspection comprising: a base, which is fixedly provided at the inspection device, has, at the center thereof, an accommodation part in which the inspection object is accommodated, and has a step provided at the edge thereof; a cover member, which has an accommodation space therein, is open downward, and is detachably coupled to the base; a pusher member which passes through the opening of the cover member in the accommodation space of the cover member so as to be vertically movable, and of which the lower surface is in contact with the inspection object disposed in the accommodation part so that the inspection object can be pushed to the inspection device; a latch member which is rotatably coupled to the cover member, and of which the lower end is caught on the step of the base so that a closed state of the cover member is maintained; and a position adjustment means, which is provided on the cover member and moves the relative position of the latch member with respect to the cover member.
The present invention relates to a test socket, and more specifically, to a test socket for electrically connecting, to a testing board of a testing device, a device to be tested having a plurality of terminals, the test socket comprising: a housing mounted on the testing board and having a testing connector arranged therein; a cover coupled to the housing so as to be vertically movable; a latch device, which is operatively connected to the housing and the cover, is interconnected with movement of the cover, and moves between a pressing position at which the device to be tested is pressed onto the testing connector and a releasing position at which the device to be tested can be released from the testing connector; and a heating device which is provided at the latch device, and which is in contact with the device to be tested at the pressing position so as to raise the temperature of the device to be tested.
The present invention relates to an inspection probe and, more particularly, to an inspection probe disposed between a terminal to be inspected and an inspection pad to electrically connect the terminal and the pad, the inspection probe comprising: an upper plunger which comprises an upper part in contact with the terminal to be inspected, a first intermediate part disposed at a lower end of the upper part and into which a spring is inserted, and an insert part which extends downwardly from the first intermediate part; a lower plunger which comprises a lower part in contact with the inspection pad, a second intermediate part disposed on a top side of the lower part and into which a spring is inserted, and a contact part which extends upwardly from the second intermediate part into which the insert part is inserted and having an inner surface in contact with an outer surface of the insert part; and a spring member having one side engaged in the first intermediate part and the other side engaged in the second intermediate part, wherein the lower plunger is manufactured by pressing a plate.
A testing connector placed between a testing device and a device under test is provided. The testing connector includes a power conductive unit and a signal conductive unit. The power conductive unit has a first length which is a distance from the lower end of the power conductive unit to the upper end of the power conductive unit when in a non-pressurized state, and the signal conductive unit has a second length which is a distance from the lower end of the signal conductive unit to the upper end of the signal conductive unit when in a non-pressurized state. The second length is shorter than the first length. When a pressing force is applied to the testing connector, the power conductive unit is compressed before the signal conductive unit is compressed.
A center console accessory includes a tray body having a floor, a pair of side wall structures, a forward wall structure and a rearward wall structure that together define a concaved storage area. The forward wall structure includes a lower surface portion shaped and dimensioned to connect to a vehicle floor structure of a vehicle. The rearward wall structure is dimensioned and shaped to attach to a front area of a center console of the vehicle.
B60R 7/04 - Stowing or holding appliances inside of vehicle primarily intended for personal property smaller than suit-cases, e.g. travelling articles, or maps in driver or passenger space
Provided is an inspection pusher device comprising: a base; a top plate disposed on the base; a pusher inserted into an accommodation hole of the top plate; and a fastening means for fixing and coupling the top plate to the base so that the pusher can press, during an electrical inspection, a device to be inspected, wherein the fastening means includes an operating lever and a hook latch hinge-connected to the operating lever, and the operating lever is disposed to be substantially in parallel to the hook latch at a latching position.
A method for producing conductive particles of the present invention is a method for producing conductive particles which are provided inside a conductive part of a sheet-type connector that electrically connects a terminal of a device to be inspected and a pad of an inspection device to each other such that the device to be inspected can be electrically inspected, and which are distributed in an elastic insulating material to form the conductive part for electrical connection, the method comprising the steps of: (a) preparing a mold; (b) providing, in the mold, a particle-forming groove having a shape corresponding to a desired conductive particle; (c) filling the particle-forming groove with a mixed powder obtained by mixing a first metal powder made of a magnetic particle and a second metal powder made of a highly conductive particle; (d) heating the mixed powder to a predetermined heating temperature to produce a conductive particle in which the first metal powder and the second metal powder are fused and solidified; and (e) selectively removing only the first metal powder from the surface of the conductive particle by using an etching liquid to form a plurality of grooves on the surface of the conductive particle.
H01B 13/00 - Apparatus or processes specially adapted for manufacturing conductors or cables
H01B 1/22 - Conductive material dispersed in non-conductive organic material the conductive material comprising metals or alloys
H01B 1/24 - Conductive material dispersed in non-conductive organic material the conductive material comprising carbon-silicon compounds, carbon, or silicon
H01R 13/03 - Contact members characterised by the material, e.g. plating or coating materials
G01R 1/04 - HousingsSupporting membersArrangements of terminals
Provided is a testing connector disposed between a testing apparatus and a device to be tested to use in testing the latter, the connector comprising: first and second metal housings; elastic shielding parts; conductive parts; and insulating parts. The first metal housings have first through-holes, and the second metal housings have second through-holes. The elastic shielding parts are disposed between the first metal housings and the second metal housings, and electrically connect same. The conductive parts are disposed in the first through-holes and the second through-holes. The insulating parts are inserted in the first through-holes and the second through-holes. The insulating parts surround the conductive parts in a circumferential direction with respect to the central axis of the through-holes and position the conductive parts coaxially with the central axis.
An inspection connector according to a disclosed embodiment is an inspection connector arranged between a device to be inspected and test equipment to electrically connect the device to be inspected to the test equipment in a vertical direction, and comprises: an insulation part made of an elastic insulation material; and a conductive part which is arranged in the insulation part and enables electrical conduction in the vertical direction, wherein at least a partial section of the conductive part in the vertical direction is formed by making a plurality of conductive particles having a pillar shape and having an uneven surface contact each other, and the plurality of conductive particles may comprise: first conductive particles each having an upper bottom surface; and second conductive particles each having a lower bottom surface in contact with the upper bottom surface of each of the first conductive particles.
The present invention relates to conductive particles and, more specifically, to conductive particles applied to a connector for inspection that is disposed between terminals of a device to be inspected and a pad of an inspection device to perform an electrical inspection on the device to be inspected, a plurality of the conductive particles, disposed at each position corresponding to a terminal of the device to be inspected in an elastic insulating material, forming a conductive path due to the pressure from the device to be inspected. The conductive particles each comprises: a core particle including a ferromagnetic material; and a coating layer disposed on the surface of the core particle, wherein the coating layer is composed of a coating body surrounding the core particle, and a concave-convex portion formed on the outer surface of the coating body, the concave-convex portion being composed of a plurality of convex portions protruding from the outer surface of the coating body and concave portions provided between the convex portions, and formed by means of an etching process to protrude over the entire outer surface of the coating body.
H01B 5/16 - Non-insulated conductors or conductive bodies characterised by their form comprising conductive material in insulating or poorly conductive material, e.g. conductive rubber
G01R 1/04 - HousingsSupporting membersArrangements of terminals
G01R 31/28 - Testing of electronic circuits, e.g. by signal tracer
G01R 3/00 - Apparatus or processes specially adapted for the manufacture of measuring instruments
H01B 13/00 - Apparatus or processes specially adapted for manufacturing conductors or cables
18.
CONDUCTIVE PARTICLES FOR ELECTRICAL TESTING, TESTING CONNECTOR, AND CONDUCTIVE PARTICLE MANUFACTURING METHOD
The present invention relates to conductive particles, and to conductive particles which are used for a testing connector disposed between a test device and a testing device so as to electrically connect a terminal of the test device and a pad of the testing device, are distributed as a plurality in an elastic insulating material so as to be in contact with each other when in contact with the test device, thereby forming a conductive path for electrical signal transmission, and comprise: a body part, which has a flat lower surface disposed on the bottom surface thereof, has a width that decreases upward from the lower surface thereof, and is made of a conductive material; and a protrusion part, which protrudes downward from the lower surface of the body part, is integrally connected to the body part, has a width that is narrower than the bottom surface of the body part, and is made of a conductive material, wherein the body part has a curved part that becomes rounded from the bottom surface toward the top thereof.
The present disclosure provides a test connector disposed between a test device and a device to be inspected. The test connector includes at least one conductor configured to be conductive in a vertical direction and be elastically compressively deformable in the vertical direction when pressed, a support configured to support the conductor, and an insulator having at least one through hole into which the conductor is inserted in the vertical direction and being coupled to the support. A gap is formed between an inner circumferential surface of the through hole and an outer circumferential surface of the conductor. The insulator includes at least one elastic insulating layer that is elastically compressively deformable in the vertical direction and includes an elastic material, and at least one support insulating layer that is stacked in the vertical direction together with the insulating layer and has higher hardness than the insulating layer.
Provided is a test connector disposed between a test device and a test subject device and used to test the test subject device. The connector comprises a conductive portion, a frame, and a first elastic sheet. The conductive portion is positioned in a vertical direction and can conduct electricity in the vertical direction. The frame is positioned in a horizontal direction and maintains the conductive portion so that the conductive portion protrudes upward and downward. The first elastic sheet is disposed on one side of the frame. The first elastic sheet is formed such that the conductive portion is inserted therein. The first elastic sheet is elastically deformed by a pressing force applied by the test subject device.
The present invention relates to a method for manufacturing conductive particles which are provided inside a conductive part of a connector for electric connection, which electrically connects a terminal of a test target device and a pad of a testing device such that the test target device can be electrically tested, wherein the plurality of conductive particles are distributed in an elastic insulating material to form the conductive part for electrical connection. The method comprises the steps of: (a) preparing a mold; (b) providing, on the mold, a conductive particle-forming groove having a shape corresponding to a desired conductive particle; (c) filling the conductive particle-forming groove with a powder mixture obtained by mixing a first metal powder made of a magnetic material and a second metal powder made of a highly conductive material; (d) heating the powder mixture to a predetermined heating temperature to produce a conductive particle in which the first metal powder and the second metal powder are fused and solidified; and (e) selectively removing only the first metal powder from the surface of the conductive particle by using an etching liquid to form a plurality of grooves on the surface of the conductive particle.
H01B 13/00 - Apparatus or processes specially adapted for manufacturing conductors or cables
G01R 1/04 - HousingsSupporting membersArrangements of terminals
H01B 5/16 - Non-insulated conductors or conductive bodies characterised by their form comprising conductive material in insulating or poorly conductive material, e.g. conductive rubber
H01R 13/03 - Contact members characterised by the material, e.g. plating or coating materials
22.
FLEXIBLE COPPER CLAD LAMINATE FOR ELECTRONIC SUBSTRATE, AND FLEXIBLE PRINTED CIRCUIT BOARD
The present invention relates to a flexible copper clad laminate (FCCL) used for an electronic substrate such as a flexible printed circuit board, and a flexible printed circuit board (FPCB) including the flexible copper clad laminate (FCCL). The flexible copper clad laminate for an electronic substrate, according to the present invention, comprises: a flexible base film layer; a fluorine-based composite material layer formed on at least one surface of the base film layer; and a conductive layer arranged on the fluorine-based composite material layer.
H05K 3/38 - Improvement of the adhesion between the insulating substrate and the metal
H05K 1/09 - Use of materials for the metallic pattern
H05K 3/18 - Apparatus or processes for manufacturing printed circuits in which conductive material is applied to the insulating support in such a manner as to form the desired conductive pattern using precipitation techniques to apply the conductive material
A test connector is disposed between a test device and a device under test. The connector comprises a housing, a signal-conducting part, an insulating support part, and an air insulation part. The signal-conducting part is vertically disposed in a through hole of the housing and spaced apart from the through hole. The insulating support part surrounds the signal-conducting part between the through hole and the signal-conducting part, and positions the signal-conducting part coaxially with the central axis of the through hole. The insulating support part has a thickness smaller than the thickness of the housing. The air insulation part is a space formed by the inner circumferential surface of the through hole, the outer circumferential surface of the signal-conducting part, and the upper or lower surface of the insulating support part.
A communication cable composition, and a wire and a cable coated with same. the communication cable composition comprises 0.1-5 parts by weight of an antioxidant and 0.1-5 parts by weight of a lubricant with respect to 100 parts by weight of at least one polypropylene resin selected from among a thermoplastic olefin, a polypropylene block copolymer, and a polypropylene homopolymer. It A communication cable resin composition according to present disclosure has excellent communication performance, heat resistance, oil resistance, and chemical resistance by using a base resin and an antioxidant, wherein various polypropylene resins are used alone or, as appropriate, in combinations as the base resin. An insulated wire and a communication cable coated with such a composition improves the stability of the cable by increasing chemical resistance and oil resistance. In addition, the insulated wire and the communication cable increase heat resistance to the UL 105° C. level.
The present invention relates to a test socket which can provide heat required to perform a burn-in test without separate additional equipment, the test socket comprising: a connection part (120); a frame (110) which supports the connection part (120); and a heating wire (150) which is disposed in the frame (110).
Provided is an electrical connection connector arranged between an inspection device and a device to be inspected. The connector comprises a signal conduction part, a ground conduction part and a metal frame part. The signal conduction part comprises a transmission part and an insulation part. The transmission part is composed of a plurality of first conductive particles. The insulation part is integrated with the transmission part so as to encompass the transmission part, and has a horizontal thickness that is greater than the horizontal maximum width of the transmission part. The metal frame part vertically maintains and horizontally spaces the signal conduction part and the ground conduction part, is electrically connected to the ground conduction part, and comprises a plurality of metal frame layers that are vertically stacked.
A connector for electrical connection disposed between an inspection device and an inspected device is provided. The connector comprises a signal conductive part, a ground conductive part, and a frame part. The signal conductive part includes a transmission part and an insulating part. The transmission part is made of a plurality of first conductive particles that are conductively contacted. The insulating part is integrally formed with the transmission part to surround the transmission part and has a thickness in the horizontal direction that is greater than the maximum width of the transmission part. The frame part includes a metal frame layer and an insulating frame layer that are alternately stacked in the vertical direction while maintaining the signal conductive part and the ground conductive part in the vertical direction and allowing the signal conductive part and the ground conductive part to be spaced apart in the horizontal direction.
H01R 11/01 - Individual connecting elements providing two or more spaced connecting locations for conductive members which are, or may be, thereby interconnected, e.g. end pieces for wires or cables supported by the wire or cable and having means for facilitating electrical connection to some other wire, terminal, or conductive member, blocks of binding posts characterised by the form or arrangement of the conductive interconnection between their connecting locations
G01R 1/04 - HousingsSupporting membersArrangements of terminals
H01R 13/658 - High frequency shielding arrangements, e.g. against EMI [Electro-Magnetic Interference] or EMP [Electro-Magnetic Pulse]
H01R 33/76 - Holders with sockets, clips or analogous contacts, adapted for axially-sliding engagement with parallely-arranged pins, blades, or analogous contacts on counterpart, e.g. electronic tube socket
28.
FINE-PITCH SEMICONDUCTOR INSPECTION DEVICE AND FINE-PITCH SEMICONDUCTOR INSPECTION METHOD
The present invention relates to a fine-pitch semiconductor inspection device comprising: a connector for inspection in which a plurality of inspection sockets provided with multiple conductive portions are installed; a connector transfer part that grips and transfers the connector for inspection; a semiconductor transfer part that grips and transfers a semiconductor device; an inspection board for applying a signal for inspection to the inspection sockets; a first camera for photographing a pad of the inspection board and the conductive portions of the inspection sockets; a second camera for photographing a terminal of the semiconductor device and the conductive portions of the inspection sockets; and a control unit for receiving image data of the conductive portions, the terminal, and the pad received from the first camera and the second camera, and controlling the positions of the terminal, the conductive portions, and the pad so as to match.
G01R 31/28 - Testing of electronic circuits, e.g. by signal tracer
G01R 27/02 - Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
G01R 19/165 - Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values
29.
LOW-TOXICITY FLAME-RETARDANT POLYOLEFIN-BASED INSULATING RESIN COMPOSITION, INSULATED ELECTRIC CABLE, AND METHOD OF MANUFACTURING INSULATED ELECTRIC CABLE
The present disclosure relates a low-toxicity flame-retardant polyolefin-based insulating resin composition, a low-toxicity flame-retardant polyolefin-based insulated electric cable, and a method of manufacturing the insulated electric cable. The low-toxicity flame-retardant polyolefin-based insulating resin composition includes 100 parts by weight of a base resin and 120 to 140 parts by weight of a flame retardant. The base resin includes 20% to 40% by weight of polyethylene ethyl acrylate, 20% to 40% by weight of polyolefin elastomer, and 30% to 40% by weight of a linear low-density polyethylene resin grafted with maleic anhydride. The flame retardant is magnesium hydroxide that is surface-treated with a silane coupling agent. With the use of the composition, the low-toxicity flame-retardant insulated wire exhibiting good electrical insulation and anti-scratch characteristics and having good appearance can be obtained.
C08L 51/00 - Compositions of graft polymers in which the grafted component is obtained by reactions only involving carbon-to-carbon unsaturated bondsCompositions of derivatives of such polymers
C08J 3/24 - Crosslinking, e.g. vulcanising, of macromolecules
C08J 3/20 - Compounding polymers with additives, e.g. colouring
H01B 3/44 - Insulators or insulating bodies characterised by the insulating materialsSelection of materials for their insulating or dielectric properties mainly consisting of organic substances plasticsInsulators or insulating bodies characterised by the insulating materialsSelection of materials for their insulating or dielectric properties mainly consisting of organic substances resinsInsulators or insulating bodies characterised by the insulating materialsSelection of materials for their insulating or dielectric properties mainly consisting of organic substances waxes vinyl resinsInsulators or insulating bodies characterised by the insulating materialsSelection of materials for their insulating or dielectric properties mainly consisting of organic substances plasticsInsulators or insulating bodies characterised by the insulating materialsSelection of materials for their insulating or dielectric properties mainly consisting of organic substances resinsInsulators or insulating bodies characterised by the insulating materialsSelection of materials for their insulating or dielectric properties mainly consisting of organic substances waxes acrylic resins
H01B 7/295 - Protection against damage caused by external factors, e.g. sheaths or armouring by extremes of temperature or by flame using material resistant to flame
H01B 13/14 - Insulating conductors or cables by extrusion
A connector for electrical connection according to an embodiment of the present disclosure comprises: an insulating portion which is electrically insulating; a conductive portion which is electrically conductive, is supported by the insulating portion, and extends in a vertical direction; and a plurality of hollow particles which are inserted into at least one of the insulating portion and the conductive portion and form hollows inside.
A connector for electrical connection according to a disclosed embodiment is arranged between a device to be tested and test equipment and is electrically conducted in a vertical direction so as to electrically connect the device to be tested and the test equipment to each other. The connector for electrical connection comprises: a shielding unit which is divided into a plurality of grid areas arranged in a grid pattern and extends in a vertical direction; a conductive unit which extends in the vertical direction from each of the grid areas and conducts the upper end of each grid area and the lower end of each grid area; and an insulation unit which insulates the conductive unit and the shielding unit in each grid area.
The present invention relates to a communication cable composition, and a wire and a cable coated with same, the communication cable composition comprising 01-5 parts by weight of an antioxidant and 01-5 parts by weight of a lubricant with respect to 100 parts by weight of at least one polypropylene resin selected from among a thermoplastic olefin, a polypropylene block copolymer, and a polypropylene homopolymer. In the present invention, it is possible to produce a communication cable resin composition having excellent communication performance, heat resistance, oil resistance, and chemical resistance by using a base resin and an antioxidant, wherein various polypropylene resins are used alone or, as appropriate, in combinations as the base resin. An insulated wire and a communication cable coated with such a composition have the risk of being exposed to oil and various chemicals when used in industrial sites and automobiles and the like, and thus the stability of the cable can be further improved by increasing chemical resistance and oil resistance. In addition, the insulated wire and the communication cable increase heat resistance to the UL 105°C level when used in electronic/electrical appliances, home appliances, automobiles, etc., and thus can be used even in places requiring high heat resistance, and has the effect of reducing restrictions on installation sites as compared to existing wires and cables by achieving high heat resistance.
C08L 101/00 - Compositions of unspecified macromolecular compounds
C08L 53/00 - Compositions of block copolymers containing at least one sequence of a polymer obtained by reactions only involving carbon-to-carbon unsaturated bondsCompositions of derivatives of such polymers
C08L 23/16 - Ethene-propene or ethene-propene-diene copolymers
Provided is a conductive particle used for a conductive part of a connector for electrically connecting a testing device to a device to be tested. The conductive particle comprises a base contact part and multiple side contact parts, and the base contact part and the multiple side contact parts form the surface of the conductive particle. The base contact part has multiple sides. The multiple side contact parts meet the multiple sides of the base contact part, respectively, and are formed to narrow in a first direction perpendicular to the base contact part. Neighboring side contact parts, among the multiple side contact parts, meet each other in a second direction which is the circumferential direction of the first direction.
H01R 11/01 - Individual connecting elements providing two or more spaced connecting locations for conductive members which are, or may be, thereby interconnected, e.g. end pieces for wires or cables supported by the wire or cable and having means for facilitating electrical connection to some other wire, terminal, or conductive member, blocks of binding posts characterised by the form or arrangement of the conductive interconnection between their connecting locations
H01R 43/00 - Apparatus or processes specially adapted for manufacturing, assembling, maintaining, or repairing of line connectors or current collectors or for joining electric conductors
H01B 5/16 - Non-insulated conductors or conductive bodies characterised by their form comprising conductive material in insulating or poorly conductive material, e.g. conductive rubber
The present invention relates to a connecting device for testing, comprising: a housing having an air circulation hole; and a conductive rubber connector including a first conductive rubber sheet having a first through hole, a second conductive rubber sheet having a second through hole, and an intermediate substrate having an air passage therein, wherein the air circulation hole, the first through hole, the air passage and the second through hole form an air movement path for air flow so that, when a vacuum means is connected to the upper part of the air circulation hole, a device to be tested, disposed below the second conductive rubber sheet, is adsorbed.
Provided is an electrical connection connector arranged between an inspection device and a device to be inspected. The electrical connection connector includes at least one conductive part for transferring a signal in the vertical direction. The conductive part includes: a central conductive part including a first elastic material and enabling conduction in the vertical direction; and a first peripheral part including a second elastic material and encompassing the central conductive part in the vertical direction. The first elastic material and the second elastic material have different rates of expansion in a pressurized state in the vertical direction of the conductive part.
Provided is a connector for electrical connection, which is arranged between an inspection apparatus and a device to be inspected. The connector for electrical connection comprises an upper conductive module, a lower conductive module, and an insulation portion. The upper conductive module has at least one upper elastic conductive portion extending in a vertical direction. The lower conductive module has at least one lower elastic conductive portion corresponding to the upper elastic conductive portion and extending in a vertical direction. The insulation portion has a through hole into which the upper elastic conductive portion is inserted from above to the bottom and the lower elastic conductive portion is inserted from below to the top. The insulation portion is detachably coupled to the upper and lower conductive modules between the upper and lower conductive modules.
TAI HAN ELECTRIC WIRE CO., LTD. (Republic of Korea)
HDC HYUNDAI ENGINEERING PLASTICS CO., LTD. (Republic of Korea)
TSC CO.,LTD. (Republic of Korea)
MOKPO NATIONAL MARITIME UNIVERSITY INDUSTRY-ACADEMIC COOPERATION FOUNDATION (Republic of Korea)
KOREA ELECTRICAL INDUSTRY TECHNOLOGY RESEARCH ASSOCIATION (Republic of Korea)
Inventor
Kim, Min Ah
Kim, Dong Uk
Ahn, Sung Won
Kim, Young Kwan
Lee, Yong Wook
Abstract
The present invention relates to an eco-friendly insulating composition for a direct current power cable, and a direct current power cable manufactured using same, the composition being effectively mixed with polypropylene and elastomer so as to exhibit high insulation and be useable under the condition of a maximum use temperature of 110℃ or higher.
H01B 3/44 - Insulators or insulating bodies characterised by the insulating materialsSelection of materials for their insulating or dielectric properties mainly consisting of organic substances plasticsInsulators or insulating bodies characterised by the insulating materialsSelection of materials for their insulating or dielectric properties mainly consisting of organic substances resinsInsulators or insulating bodies characterised by the insulating materialsSelection of materials for their insulating or dielectric properties mainly consisting of organic substances waxes vinyl resinsInsulators or insulating bodies characterised by the insulating materialsSelection of materials for their insulating or dielectric properties mainly consisting of organic substances plasticsInsulators or insulating bodies characterised by the insulating materialsSelection of materials for their insulating or dielectric properties mainly consisting of organic substances resinsInsulators or insulating bodies characterised by the insulating materialsSelection of materials for their insulating or dielectric properties mainly consisting of organic substances waxes acrylic resins
TAIHAN ELECTRIC WIRE CO., LTD. (Republic of Korea)
HDC HYUNDAI EP CO., LTD. (Republic of Korea)
TSC CO., LTD. (Republic of Korea)
MOKPO NATIONAL MARITIME UNIVERSITY INDUSTRY-ACADEMIC COOPERATION FOUNDATION (Republic of Korea)
KOREA ELECTRICAL INDUSTRY TECHNOLOGY RESEARCH ASSOCIATION (Republic of Korea)
Inventor
Ahn, Sung Won
Kim, Dong Uk
Kim, Min Ah
Kim, Young Kwan
Lee, Yong Wook
Abstract
An interfacial pressure measuring device, according to the present invention, comprises: a cable part having a mounting groove part; a mounting bar part detachably mounted on the mounting groove part; an interfacial pressure measuring sensor module part detachably mounted on the mounting bar part; and a connection member provided on the cable part so as to be in close contact with the cable part, the mounting bar part, and the interfacial pressure measuring sensor module part, wherein the interfacial pressure measuring sensor module part measures interfacial pressure that is generated as the connection member comes into close contact with the cable part, the mounting bar part, and the interfacial pressure measuring sensor module part.
G01L 5/00 - Apparatus for, or methods of, measuring force, work, mechanical power, or torque, specially adapted for specific purposes
G01L 1/26 - Auxiliary measures taken, or devices used, in connection with the measurement of force, e.g. for preventing influence of transverse components of force, for preventing overload
G01L 7/00 - Measuring the steady or quasi-steady pressure of a fluid or a fluent solid material by mechanical or fluid pressure-sensitive elements
H02G 1/02 - Methods or apparatus specially adapted for installing, maintaining, repairing, or dismantling electric cables or lines for overhead lines or cables
Provided is a connector for electrical connection, which is disposed between a tester and a device-under-test. The connector comprises: at least one elastic conductive part extending in the vertical direction; a support part for supporting the elastic conductive part; and an insulating part coupled to the support part and having at least one through-hole into which the elastic conductive part is inserted in the vertical direction. A gap, that is, a space formed by at least a portion of the inner circumferential surface of the through-hole and at least a portion of the outer circumferential surface of the elastic conductive part, is formed between the inner circumferential surface of the through-hole and the outer circumferential surface of the elastic conductive part.
Provided is a test socket for electrically connecting a device under test to a tester. The test socket comprises a housing, a probe, and an insulating member. The housing has a through-hole formed in the vertical direction. The probe is disposed in the through-hole in the vertical direction. The probe contracts and expands in the vertical direction, and is configured to perform signal transmission in the vertical direction. The insulating member is disposed between the inner circumferential surface of the through-hole and the outer circumferential surface of the probe, and is configured to place the probe in the through-hole. The insulating member contains a plurality of micro-pores.
Provided is a connector for electrical connection, which is arranged between an inspection device and a device under test. The connector includes a signal conductive unit, a ground conductive unit, and a metal frame unit. The signal conductive unit includes a transmission unit and an insulation unit. The transmission unit includes a plurality of first conductive particles that are electrically connected in a vertical direction. The insulation unit is integrally formed with the transmission unit so as to surround the transmission unit in a horizontal direction perpendicular to the vertical direction, and has a thickness in a horizontal direction greater than the maximum width of the transmission unit in the horizontal direction. The ground conductive unit is spaced apart from the signal conductive unit in the horizontal direction. The metal frame unit maintains the signal conductive unit and the ground conductive unit in the vertical direction, spaces the signal conductive unit and the ground conductive unit to be apart from each other in the horizontal direction, and is electrically connected to the ground conductive unit.
H01R 11/01 - Individual connecting elements providing two or more spaced connecting locations for conductive members which are, or may be, thereby interconnected, e.g. end pieces for wires or cables supported by the wire or cable and having means for facilitating electrical connection to some other wire, terminal, or conductive member, blocks of binding posts characterised by the form or arrangement of the conductive interconnection between their connecting locations
H01R 13/03 - Contact members characterised by the material, e.g. plating or coating materials
H01R 13/24 - Contacts for co-operating by abutting resilientContacts for co-operating by abutting resiliently mounted
42.
LOW-TOXICITY FLAME-RETARDANT POLYOLEFIN-BASED INSULATING RESIN COMPOSITION, INSULATED ELECTRIC WIRE, AND METHOD FOR PRODUCING INSULATED ELECTRIC WIRE
The present invention relates to a low-toxicity flame-retardant polyolefin-based insulation resin composition, an insulated electric wire, and a method for producing an insulated electric wire. Disclosed is a low-toxicity flame-retardant crosslinked polyolefin-based insulated electric wire having ultimately excellent electrically insulating property, excellent scratch resistance and appearance quality, and implementing low toxicity and flame retardancy, which can be provided by providing a low-toxicity flame-retardant polyolefin-based insulation resin composition comprising: 100 parts by weight of a base resin including 20 to 40 wt% of polyethylene ethyl acrylate, 20 to 40 wt% of polyolefin elastomer and 30 to 40 wt% of a linear low-density polyethylene resin that is grafted with maleic anhydride; and 120 to 140 parts by weight of magnesium hydroxide, as a flame retardant, the surface of which is treated with a silane coupling agent.
C08L 23/26 - Compositions of homopolymers or copolymers of unsaturated aliphatic hydrocarbons having only one carbon-to-carbon double bondCompositions of derivatives of such polymers modified by chemical after-treatment
H01B 3/44 - Insulators or insulating bodies characterised by the insulating materialsSelection of materials for their insulating or dielectric properties mainly consisting of organic substances plasticsInsulators or insulating bodies characterised by the insulating materialsSelection of materials for their insulating or dielectric properties mainly consisting of organic substances resinsInsulators or insulating bodies characterised by the insulating materialsSelection of materials for their insulating or dielectric properties mainly consisting of organic substances waxes vinyl resinsInsulators or insulating bodies characterised by the insulating materialsSelection of materials for their insulating or dielectric properties mainly consisting of organic substances plasticsInsulators or insulating bodies characterised by the insulating materialsSelection of materials for their insulating or dielectric properties mainly consisting of organic substances resinsInsulators or insulating bodies characterised by the insulating materialsSelection of materials for their insulating or dielectric properties mainly consisting of organic substances waxes acrylic resins
The disclosure includes a contact device for electrical test, the contact device for electrical test including a second body portion, a first body portion stacked above the second body portion, a middle portion stacked above the first body portion, and having a first protrusion that is sharp and has a first apex portion, the first protrusion being formed on an upper side of the middle portion, and the first body portion, the middle portion, and the contact portion are sequentially and upwardly stacked, the middle portion and the contact portion include materials different from each other, and a first protrusion is provided inside the second protrusion.
The present invention relates to a socket for inspection, the socket comprising: an intermediate sheet composed of a plurality of first conductive parts and an insulating support part provided between the first conductive parts and made of a first elastic body; an upper sheet disposed on the upper side of the intermediate sheet, provided between a plurality of second conductive parts and the second conductive parts, and made of a second elastic body; and a lower sheet disposed on the lower side of the intermediate sheet, and composed of a plurality of third conductive parts and a third insulating support part provided between the third conductive parts and made of a third elastic body, wherein the first elastic body is made of a material having a lower expansion coefficient at high temperatures than the second and third elastic bodies.
The present invention relates to a foreign substance cleaning sheet for a test socket and, more specifically, to a foreign substance cleaning sheet for a test socket, the foreign substance cleaning sheet being used in a test socket in order to remove foreign substances from the surface of the test socket, the test socket comprising a plurality of conductive portions in which a plurality of conductive particles are blended with silicone rubber and are arranged in the thickness direction at locations corresponding to terminals of a device to be tested, and insulation portions respectively supporting and insulating the conductive portions, and the foreign substance cleaning sheet comprising: a base sheet having a size corresponding to the size of the surface having foreign substances in the test socket; an adhesive sheet arranged on a surface of the base sheet and having adhesive strength so as to remove the foreign substances from the surface of the test socket; and protruding adhesive portions which are provided at each one of the positions on the adhesive sheet corresponding to the conductive portions of the test socket, and which protrude from the surface of the adhesive sheet and have a hemispherical shape and adhesive strength.
G01R 3/00 - Apparatus or processes specially adapted for the manufacture of measuring instruments
G01R 1/04 - HousingsSupporting membersArrangements of terminals
B32B 7/12 - Interconnection of layers using interposed adhesives or interposed materials with bonding properties
B32B 15/20 - Layered products essentially comprising metal comprising aluminium or copper
B32B 15/08 - Layered products essentially comprising metal comprising metal as the main or only constituent of a layer, next to another layer of a specific substance of synthetic resin
The present invention relates to an inspection socket comprising: a plurality of conductive parts which are arranged, respectively, at positions corresponding to the terminals of a device to be inspected, and which have a plurality of conductive particles that are arranged and aligned inside an elastic insulating material in the vertical direction so as to exhibit conductivity in the vertical direction; and an insulating part arranged around the conductive parts so as to support each conductive part while insulating the conductive parts from each other, wherein each conductive particle comprises: a barrel-shaped body extending in one direction, having an open upper end and lower end, and having a through-space formed therein; and a protrusion part protruding in the one direction from the end part of the barrel-shaped body, and the protrusion part of the conductive particle has a size enabling insertion into the through-space of the barrel-shaped body of another conductive particle, and thus, even when a conductive part is compressed during inspection, the protrusion part of a conductive particle is caught by another conductive particle so as not to break away therefrom.
Provided is a test socket for electrically connecting a device to be inspected and an inspection device. The test socket comprises: an insulation film having a first through hole and a second through hole that are spaced apart from each other in the horizontal direction; an elastic insulation sheet attached to the lower surface of the insulation film and having a third through hole communicating with the first through hole; and an anisotropic conductive sheet attached to the lower surface of the elastic insulation sheet and including a first conductive portion and an insulation portion. A second conductive portion connected to the first conductive portion is formed in the first through hole and the third through hole, the second through hole consists of an empty space, and the lower portion of the second through hole is blocked by the elastic insulation sheet.
The present disclosure according to one aspect relates to conductive powder comprising: core particles; and a polymer layer surrounding the surface of the core particles, wherein the polymer layer has a plurality of conductive particles bonded thereto, and the polymer contains one or more unsaturated hydrocarbons, aromatic hydrocarbons, or both. The present disclosure according to one aspect relates to a test connector comprising: a conductive part including the conductive powder; and a sheet of an insulating material. The conductive powder according to one aspect of the present disclosure may exhibit excellent deformation resistance, abrasion resistance, and resistance stability.
H01B 1/20 - Conductive material dispersed in non-conductive organic material
H01B 1/02 - Conductors or conductive bodies characterised by the conductive materialsSelection of materials as conductors mainly consisting of metals or alloys
H01B 3/44 - Insulators or insulating bodies characterised by the insulating materialsSelection of materials for their insulating or dielectric properties mainly consisting of organic substances plasticsInsulators or insulating bodies characterised by the insulating materialsSelection of materials for their insulating or dielectric properties mainly consisting of organic substances resinsInsulators or insulating bodies characterised by the insulating materialsSelection of materials for their insulating or dielectric properties mainly consisting of organic substances waxes vinyl resinsInsulators or insulating bodies characterised by the insulating materialsSelection of materials for their insulating or dielectric properties mainly consisting of organic substances plasticsInsulators or insulating bodies characterised by the insulating materialsSelection of materials for their insulating or dielectric properties mainly consisting of organic substances resinsInsulators or insulating bodies characterised by the insulating materialsSelection of materials for their insulating or dielectric properties mainly consisting of organic substances waxes acrylic resins
C08L 53/02 - Compositions of block copolymers containing at least one sequence of a polymer obtained by reactions only involving carbon-to-carbon unsaturated bondsCompositions of derivatives of such polymers of vinyl aromatic monomers and conjugated dienes
H01L 21/67 - Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereofApparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components
49.
ELECTRICAL CONNECTION CONNECTOR AND MANUFACTURING METHOD THEREFOR
Provided is a connector located between a test device and a device to be tested so as to electrically connect the test device with the device to be tested. The connector is stacked in a vertical direction and has first and second conductive sheets capable of conducting in the vertical direction. The first conductive sheet includes an insulating material and can perform conduction in the vertical direction. The second conductive sheet includes the insulating material and can perform conduction in the vertical direction. The first and second conductive sheets are stacked and bonded so as to be capable of performing conduction in the vertical direction. The bonding is formed through chemical bonding between molecules of the insulating materials of the first and second conductive sheets.
The present invention relates to a probe member for a pogo pin, a method of manufacturing the probe member, and a pogo pin including the probe member. An embodiment of the present invention provides a probe member including a first body portion and a second body portion that are stacked in a height direction based on the other end of a contact portion, wherein the probe member is used in a test socket in a state in which at least a portion of the probe member is inserted in a pipe having an internal space.
Provided is a connector which is located between a testing device and a tested device and electrically connects the testing device and the tested device. The connector includes a plurality of elastic conductive portions and an elastic insulating portion. The plurality of elastic conductive portions are conductive in a vertical direction. The elastic insulating portion separates and insulates the plurality of elastic conductive portions in a horizontal direction. The elastic insulating portion includes a plurality of electromagnetic wave shielding portions, and the plurality of electromagnetic wave shielding portions include a plurality of magnetic carbon nanotubes distributed and arranged in a vertical direction.
H01R 33/76 - Holders with sockets, clips or analogous contacts, adapted for axially-sliding engagement with parallely-arranged pins, blades, or analogous contacts on counterpart, e.g. electronic tube socket
H01R 13/646 - Details of coupling devices of the kinds covered by groups or specially adapted for high-frequency, e.g. structures providing an impedance match or phase match
H01R 13/24 - Contacts for co-operating by abutting resilientContacts for co-operating by abutting resiliently mounted
Provided is a connector which is disposed between an inspection device and a device-under-test to electrically connect same. The connector includes a plurality of elastic conductive parts and an elastic insulation part. Each of the elastic conductive parts includes a plurality of carbon nanotubes. The elastic insulation part spaces and insulates the plurality of elastic conductive parts in the horizontal direction. Each of the plurality of carbon nanotubes includes a plurality of magnetic particles. The plurality of carbon nanotubes are distributed and arranged along the vertical direction and come into contact with each other to become electro-conductive along the vertical direction.
An ID chip socket according to an embodiment disclosed herein includes: a contactor configured to be fixed to an upper side of the frame; a socket-conductive part penetrating the contactor in a vertical direction and configured to enable electrical connection in the vertical direction; an ID chip fixed to an upper side of the socket-conductive part and electrically connected to the socket-conductive part; and a cover configured to cover an upper surface of the ID chip and to be fixed to at least one of the contactor and the frame.
G06F 11/273 - Tester hardware, i.e. output processing circuits
G01R 31/28 - Testing of electronic circuits, e.g. by signal tracer
H01R 13/22 - Contacts for co-operating by abutting
H01R 33/76 - Holders with sockets, clips or analogous contacts, adapted for axially-sliding engagement with parallely-arranged pins, blades, or analogous contacts on counterpart, e.g. electronic tube socket
H01R 12/71 - Coupling devices for rigid printing circuits or like structures
54.
Probe member for pogo pin, method of manufacturing the probe member, pogo pin comprising the probe member
A probe member for a pogo pin, a method of manufacturing the probe member, and a pogo pin including the probe member are disclosed. The probe member for the pogo pin has a contact portion including a material having hardness greater than the hardness of a first body portion and a second body portion, and each of the first and second body portions includes a material having electrical conductivity equal to or greater than 50% IACS (International Annealed Copper Standard).
Disclosed according an embodiment is an inspection connector which is disposed between a device to be inspected and a test apparatus so as to electrically connect the device to be inspected and the test apparatus to each other, the inspection connector comprising: a sheet formed by mixing a silicone rubber and an iron oxide; and a conductive part which vertically extends in the sheet so as to allow vertical electric conduction.
An inspection connector according to a disclosed embodiment comprises: a sheet of insulating material; and a conductive part extending in the vertical direction in the sheet for enabling an electric current to be applied in the vertical direction. The conductive part comprises any one of PEDOT and PEDOT composite.
H01B 1/12 - Conductors or conductive bodies characterised by the conductive materialsSelection of materials as conductors mainly consisting of other non-metallic substances organic substances
H01B 1/02 - Conductors or conductive bodies characterised by the conductive materialsSelection of materials as conductors mainly consisting of metals or alloys
Provided is a probe head for fixing, to a circuit board assembly to be conductively connected to an inspection apparatus, a plurality of probes coming into contact with a device to be inspected. The probe head comprises a first plate, a second plate, nut members, and first bolt members. The first plate and the second plate maintain the plurality of probes. The second plate is placed below the first plate. The nut members are coupled to the second plate. The first bolt members are screw-coupled to the nut members at a first position and a second position through the circuit board assembly. The first bolt members are screw-coupled to the nut members at the first position such that the first plate and the second plate come into close contact with each other. The first bolt members are screw-coupled to the nut members at the second position such that the second plate is distanced from the first plate.
Provided is a conductive sheet disposed between a test apparatus and a device to be tested for testing of the device to be tested. The conductive sheet comprises a first sheet and a second sheet stacked in the vertical direction. The first sheet includes a plurality of first elastic conductive portions in the vertical direction and a first elastic insulation portion which separates and insulates the plurality of first elastic conductive portions in the horizontal direction. At least one first elastic conductive portion has a protrusion portion protruding in a direction perpendicular to the first elastic insulation portion. The second sheet includes a plurality of second elastic conductive portions in the vertical direction and a second elastic insulation portion which separates and insulates the plurality of second elastic conductive portions in the horizontal direction. At least one second elastic conductive portion has a concave portion which is concave in the vertical direction with respect to the second elastic insulation portion such that the protrusion portion of the first elastic conductive portion is fitted to the at least one second elastic conductive portion in the vertical direction.
TAIHAN ELECTRIC WIRE CO., LTD. (Republic of Korea)
HDC HYUNDAI EP CO., LTD. (Republic of Korea)
TSC CO., LTD. (Republic of Korea)
MOKPO NATIONAL MARITIME UNIVERSITY-ACADEMIC COOPERATION (Republic of Korea)
KOREA ELECTRICAL INDUSTRY TECHNOLOGY RESEARCH ASSOCIATION (Republic of Korea)
Inventor
Jung, Chun Sik
Kim, Dong Hak
Kong, Jung Ho
Park, Kyu Hwan
Abstract
The present invention relates to an insulating material composition and an insulating material prepared using same, wherein the insulating material composition comprises 50-90 wt% of polypropylene and 10-50 wt% of styrene-based elastomer, and the insulating material composition is prepared as an insulating material and then the insulating material is coated on a conductor of a power cable by extrusion processing to form an insulating layer. In the present invention, by preparing an insulating material without a cross-linking reaction, cross-linking byproducts are not generated and thus, problems such as degradation of insulation performance of a power cable do not arise, mechanical properties are secured due to the efficient mixing ratio of polypropylene and styrene-based elastomer, and extrusion processability is also facilitated.
H01B 3/44 - Insulators or insulating bodies characterised by the insulating materialsSelection of materials for their insulating or dielectric properties mainly consisting of organic substances plasticsInsulators or insulating bodies characterised by the insulating materialsSelection of materials for their insulating or dielectric properties mainly consisting of organic substances resinsInsulators or insulating bodies characterised by the insulating materialsSelection of materials for their insulating or dielectric properties mainly consisting of organic substances waxes vinyl resinsInsulators or insulating bodies characterised by the insulating materialsSelection of materials for their insulating or dielectric properties mainly consisting of organic substances plasticsInsulators or insulating bodies characterised by the insulating materialsSelection of materials for their insulating or dielectric properties mainly consisting of organic substances resinsInsulators or insulating bodies characterised by the insulating materialsSelection of materials for their insulating or dielectric properties mainly consisting of organic substances waxes acrylic resins
C08L 23/10 - Homopolymers or copolymers of propene
C08L 23/02 - Compositions of homopolymers or copolymers of unsaturated aliphatic hydrocarbons having only one carbon-to-carbon double bondCompositions of derivatives of such polymers not modified by chemical after-treatment
C08L 25/10 - Copolymers of styrene with conjugated dienes
60.
TEST CONNECTOR, METHOD FOR MANUFACTURING TEST CONNECTOR, AND METHOD FOR TESTING DEVICE-UNDER-TEST BY USING TEST CONNECTOR
A test connector according to one embodiment comprises: a sheet on XYZ orthogonal coordinates, the sheet being made of an insulating material; and a plurality of conductive units, which are made of a conductive material, extend in the Z-axis direction, are spaced from each other in the X-axis direction, are arranged on the sheet, and have both ends in the Z-axis direction exposed to the surface of the sheet. The plurality of conductive units are formed by allowing a plurality of support units to be etched when intertwined with the plurality of support units, which extend in the X-axis direction and are separated from each other in the Z-axis direction.
G01R 1/04 - HousingsSupporting membersArrangements of terminals
G01R 31/28 - Testing of electronic circuits, e.g. by signal tracer
61.
CONNECTOR FOR INSPECTION, METHOD FOR MANUFACTURING CONNECTOR FOR INSPECTION, AND METHOD FOR INSPECTING DEVICE TO BE INSPECTED USING CONNECTOR FOR INSPECTION
A connector for inspection according to a disclosed embodiment includes: a sheet of an insulating material; a plurality of conductive parts which are made of a conductive material, extend in a Z-axis direction, and are spaced apart from each other in an X-axis direction; and a plurality of support parts which are made of an insulating material, extend in the X-axis direction, and are spaced apart from each other in the Z-axis direction.
The present invention relates to a test socket and, more specifically, to a test socket comprising: a housing which has an accommodation space accommodating a device-to-be-tested on which an electrical test is to be performed, and which has an open upper part; a cover capable of opening/closing the open upper part of the housing; a pusher device provided in the cover so as to downwardly press the device-to-be-tested placed in the housing; a temperature control means for injecting air or a refrigerant of a predetermined temperature into the accommodation space so as to regulate the temperature in the accommodation space; and a sealing means capable of sealing the accommodation space from the outside when the cover closes the housing, wherein the sealing means comprises: a first packer which is disposed on the housing upper surface facing the cover and which encompasses the accommodation space; a second packer spaced apart from the first packer, and disposed on the housing upper surface so as to encompass the first packer; and a vacuuming means for forming a vacuum state between the first packer and the second packer.
The present invention relates to a test socket and, more specifically, to a test socket comprising: a housing having an accommodation space, in which an test connector for electrically connecting, with a test device, a device to be tested and the device to be tested can be accommodated, and having an opened upper part; a cover capable of opening and closing the opened upper part of the housing; a pusher device, which is provided at the cover and is for pressing, toward the test connector, the device to be tested loaded in the housing; an air injection unit for adjusting the temperature in the accommodation space by injecting, into the accommodation space, air or refrigerant having a predetermined temperature; an air discharging unit for discharging, to the outside, the air or the refrigerant having been injected into the accommodation space; and a sealing means capable of sealing the accommodation space from the outside when the housing is closed by the cover.
The present invention relates to a test socket comprising carbon nanotubes and, more specifically, to a test socket comprising carbon nanotubes, comprising: a plurality of conductive parts located at respective positions corresponding to terminals of a device to be tested, and having a plurality of conductive particles arranged widthwise within a first insulative elastic material; insulative support parts arranged between the conductive parts so as to surround and support same, and made of a second insulative elastic material; and carbon nanotubes arranged so as to be dispersed inside the insulative support parts, wherein the surfaces of the carbon nanotubes are coated with silica.
The present invention relates to a test socket and conductive particles, and more specifically, to a test socket disposed between a device to be tested and a testing device so as to electrically connect a terminal of the device to be tested and a pad of the testing device. The test socket comprises: a plurality of conductive parts provided at each position corresponding to the terminal of the device to be tested, and having a plurality of conductive particles arranged in the vertical direction within an elastic insulating material; and insulating support parts provided between the plurality of conductive parts, and electrically insulating the conductive parts from each other while supporting each of the conductive parts, wherein at least one of the conductive particles includes: a body part made of a metal material and forming an outer shape of the conductive particle; and a plurality of silica particles having one part fixed within the body part, having the remaining part protruding from the body part, and making contact with the elastic insulating material, which forms the conductive parts, so as to be firmly coupled to the elastic insulating material.
The present invention relates to an inspection pressing device and, more specifically, to an inspection pressing device for pressing, toward an inspection apparatus, a device to be inspected, the inspection pressing device having a valve structure, which slides along a valve accommodation space and is in a no-load state while moving between an open position and a closed position.
The present invention relates to a probe member for a pogo pin, a manufacturing method therefor and a pogo pin comprising same. One embodiment of the present invention provides a probe member used in a test socket, the probe member comprising: at least one contact part having one end formed so as to be sharp and making contact with an object being inspected; a polygonal or cylindrical first body part having the other end of the contact part coupling to one end thereof; and a polygonal or cylindrical second body part having the other end of the first body part coupling to one end thereof, wherein the first body part and the second body part are stacked in the height direction with reference to the other end of the contact part, and at least one portion thereof are inserted in a pipe having an inner space formed therein.
The present invention relates to a probe member for a pogo pin, a manufacturing method therefor and a pogo pin comprising same. One embodiment of the present invention provides a probe member used in a test socket, the probe member comprising: at least one contact part having one end formed so as to be sharp and making contact with an object being inspected; a polygonal or cylindrical first body part having the other end of the contact part coupling to one end thereof; and a polygonal or cylindrical second body part having the other end of the first body part coupling to one end thereof, wherein the contact part is formed from a material having a greater hardness compared to the first body part and the second body part, and the first body part and the second body part are formed from a material exhibiting an electrical conductivity of at least 50% IACS (International Annealed Copper Standard), and at least one portion thereof are inserted in a pipe having an inner space formed therein.
The present invention relates to an inspection socket, and more particularly, to an inspection socket including: an anisotropic conductive sheet including a first conductive part, an insulating support part disposed around the first conductive part, and a second conductive part protruding upward from the first conductive part and disposed higher than the top surface of the insulating support part; a guide sheet disposed above the insulating support part while being spaced apart from the insulating support part, and provided with a through-hole at each position corresponding to the second conductive part; and a plurality of elastic bumps spaced apart from the second conductive part in a horizontal direction, wherein the bottom surface of each of the elastic bumps contacts the top surface of the insulating support part, and the top surface of each of the elastic bumps contacts the bottom surface of the guide sheet to support the guide sheet, and the elastic bump is made of a material softer than that of the guide sheet.
G01R 31/28 - Testing of electronic circuits, e.g. by signal tracer
70.
LIGHT GUIDE PLATE FOR TRANSPARENT DISPLAY HAVING FINE REFRACTIVE GROOVE FORMED THROUGH IMPRINTING METHOD, TRANSPARENT DISPLAY DEVICE COMPRISING SAME, AND METHOD FOR MANUFACTURING SAME
The present invention relates to a light guide plate for a transparent display having a fine refractive groove formed through an imprinting method, a transparent display device comprising the same, and a method for manufacturing the same. A technical objective of the present invention is to provide a light guide plate for a transparent display, which has increased optical efficiency and optical uniformity and thus has an improved front/back luminance ratio. Another technical objective is to provide a light guide plate configured such that the sparkling phenomenon, that is, the partial blazing of the final panel, can be improved by controlling the roughness of fine corrugations on the corner and the surface occurring when a conventional refractive groove is imprinted by a pattern mold formed by exposure to light. To this end, the present invention provides a light guide plate for a transparent display having a plurality of first refractive grooves formed in the shape of conical frustums or quadrangular frustums on the upper surface of resin provided on the upper surface of the transparent substrate. In addition, as another objective solving means, the present invention provides a light guide plate for a transparent display having a plurality of second refractive grooves formed in the shape of conical frustums or quadrangular frustums on the upper surface of the transparent substrate. The present invention is advantageous in that it is possible to provide a transparent display, the front/back luminance ratio of which can be improved 2-4 times compared with that of a conventional light guide plate for a transparent display, the maximum improved ratio being 24:1, and the problem of sparkling, that is, the partial blazing of the final panel of the transparent display, is improved, thereby reducing the degree of dazzling the user's eyes.
The present invention relates to a test socket apparatus and, more specifically, a test socket apparatus comprising: a body part fixedly disposed at a lower side of a test substrate; a cover part which is disposed at an upper side of the test substrate and elastically supported by the body part and thus can move upward and downward; an adaptor in which a device to be tested is stably placed and which is disposed between the body part and the cover part and installed at an upper side of the test substrate; and a latch means which moves in association with the upward and downward movement of the cover part and is rotatably connected to each of the body part and the cover part so as to pressurize, toward the test substrate, the upper portion of the device to be tested stably placed in the adaptor, wherein the cover part operates the latch means while at least a part thereof passes through the test substrate, with the concomitant upward and downward movement thereof with respect to the body part disposed at a lower side of the test substrate.
KOREA ELECTRIC POWER CORPORATION (Republic of Korea)
ISG CO., LTD (Republic of Korea)
Inventor
Hwang, Kyeong-Min
Jang, Jung-Bum
Kang, Tae-Kyung
Abstract
The present invention relates to a concrete foundation of a ground power distribution facility and an installation method thereof. The concrete foundation of a ground power distribution facility comprises: an upper foundation (110) having a space portion (111) which is open at the top and bottom formed in a central portion thereof and a through hole (113) passing through the top and bottom formed on the circumferential surface thereof; a lower foundation (120) having an opening (121) communicating with the space portion (111) of the upper foundation (110) and a bolt hole (123) communicating with the through hole (113), wherein the upper foundation (110) is mounted on the upper circumferential surface of the lower foundation; and a fixing bolt (130) inserted into the through hole (113) and the bolt hole (123) and fastened thereto so as to maintain a state where the upper foundation (110) is seated on the lower foundation (120). The present invention is advantageous in ensuring the structural safety of a power distribution facility and a foundation against earthquakes, and being easy to maintain.
The present invention relates to a testing socket, more specifically to a testing socket which is placed between a device to be tested and a testing apparatus to electrically connect a terminal of the former and a pad of the latter. The testing socket comprises: a plurality of conductive parts distanced from each other in the planar direction at each location corresponding to a terminal of a device to be tested, and having a plurality of conductive particles arrayed in the width-wise direction in flexible insulating material; and insulating support parts, placed between the plurality of conductive parts distanced from each other, for supporting each conductive part and insulating same in the planar direction, wherein each conductive particle comprises: a columnar trunk part; and two or more protrusions protruding from the top end of the trunk part, wherein between the adjacent protrusions is a groove which is recessed toward the trunk, and the angle between the opposing inner surfaces of the adjacent protrusions is an acute angle of less than 90°.
G01R 1/04 - HousingsSupporting membersArrangements of terminals
G01R 31/28 - Testing of electronic circuits, e.g. by signal tracer
G01R 3/00 - Apparatus or processes specially adapted for the manufacture of measuring instruments
H01B 5/14 - Non-insulated conductors or conductive bodies characterised by their form comprising conductive layers or films on insulating-supports
H01B 5/16 - Non-insulated conductors or conductive bodies characterised by their form comprising conductive material in insulating or poorly conductive material, e.g. conductive rubber
The present invention relates to a testing socket, more specifically to a testing socket which is placed between a device to be tested and a testing apparatus to electrically connect a terminal of the former and a pad of the latter. The testing socket comprises: a plurality of conductive parts distanced from each other in the planar direction at each location corresponding to a terminal of a device to be tested, and having a plurality of conductive particles arrayed in the width-wise direction in flexible insulating material; and insulating support parts, placed between the plurality of conductive parts distanced from each other, for supporting each conductive part and insulating same in the planar direction, wherein each conductive particle comprises: a columnar trunk part; and two or more protrusions protruding from the top end of the trunk part, wherein between the adjacent protrusions is a groove which is recessed toward the trunk, and the ends of the protrusions have a rounded convex shape, and the center of the groove has a rounded concave shape.
G01R 1/04 - HousingsSupporting membersArrangements of terminals
G01R 3/00 - Apparatus or processes specially adapted for the manufacture of measuring instruments
H01B 5/14 - Non-insulated conductors or conductive bodies characterised by their form comprising conductive layers or films on insulating-supports
H01B 5/16 - Non-insulated conductors or conductive bodies characterised by their form comprising conductive material in insulating or poorly conductive material, e.g. conductive rubber
G01R 31/28 - Testing of electronic circuits, e.g. by signal tracer
The present invention relates to a testing socket, more specifically to a testing socket which is placed between a device to be tested and a testing apparatus to electrically connect a terminal of the former and a pad of the latter. The testing socket comprises: a plurality of conductive parts distanced from each other in the planar direction at each location corresponding to a terminal of a device to be tested, and having a plurality of conductive particles arrayed in the width-wise direction in flexible insulating material; and insulating support parts, placed between the plurality of conductive parts distanced from each other, for supporting each conductive part and insulating same in the planar direction, wherein each conductive particle comprises: a columnar trunk part; and two or more protrusions protruding from the top end of the trunk part, wherein between the adjacent protrusions is a groove which is recessed toward the trunk, and the angle between the opposing inner surfaces of the adjacent protrusions is an obtuse angle of greater than 90°.
G01R 1/04 - HousingsSupporting membersArrangements of terminals
G01R 3/00 - Apparatus or processes specially adapted for the manufacture of measuring instruments
H01B 5/16 - Non-insulated conductors or conductive bodies characterised by their form comprising conductive material in insulating or poorly conductive material, e.g. conductive rubber
H01B 5/14 - Non-insulated conductors or conductive bodies characterised by their form comprising conductive layers or films on insulating-supports
G01R 31/28 - Testing of electronic circuits, e.g. by signal tracer
The present invention provides a bipartite probing device comprising: a barrel formed in a hollow cylindrical shape opened at both ends thereof so as to have a first opening and a second opening; an intermediate member disposed such that the same can slide along the inner circumferential surface of the barrel; a first plunger disposed such that the same partially protrudes from the first opening along the longitudinal direction of the barrel; a second plunger disposed such that the same partially protrudes from the second opening along the longitudinal direction of the barrel; a first elastic member disposed between the first plunger and the intermediate member so as to elastically support the same; and a second elastic member disposed between the second plunger and the intermediate member so as to elastically support the same.
An embodiment provides an anisotropic conductive sheet for electrically connecting a terminal of a device to be tested and a pad of a testing device, the sheet comprising a plurality of conductive portions which are formed in a thickness direction inside an insulating support portion and comprise multiple conductive particles, wherein the conductive particles are implemented by mixed particles including a highly-conductive metal and magnetic particles.
H01B 5/16 - Non-insulated conductors or conductive bodies characterised by their form comprising conductive material in insulating or poorly conductive material, e.g. conductive rubber
G01R 1/04 - HousingsSupporting membersArrangements of terminals
G01R 31/26 - Testing of individual semiconductor devices
H01B 1/02 - Conductors or conductive bodies characterised by the conductive materialsSelection of materials as conductors mainly consisting of metals or alloys
H01R 11/01 - Individual connecting elements providing two or more spaced connecting locations for conductive members which are, or may be, thereby interconnected, e.g. end pieces for wires or cables supported by the wire or cable and having means for facilitating electrical connection to some other wire, terminal, or conductive member, blocks of binding posts characterised by the form or arrangement of the conductive interconnection between their connecting locations
The present invention relates to a probe member for inspection and, more particularly, to a probe member for inspection in which at least a part thereof is inserted into a cylindrical body and an upper end thereof is in contact with a terminal of a semiconductor device, the probe member comprising: a first probe portion of a pointed shape having, at an upper end thereof, a first sharp end which is in contact with the terminal of the semiconductor device; a first probe plate extending downwardly from the first probe portion and comprising a first coupling portion inserted into the cylindrical body to be coupled to the cylindrical body; a second probe portion of a pointed shape having, at an upper end thereof, a second sharp end which is in contact with the terminal of the semiconductor device; and a second probe plate extending downwardly from the second probe portion and comprising a second coupling portion inserted into the cylindrical body to be coupled to the cylindrical body, wherein the first probe plate and the second probe plate are integrally combined in a state where the first probe and the second probe are staggered from each other.
The present invention relates to a semiconductor test contactor for inspecting a semiconductor having a fine pitch. According to an embodiment of the present invention, the semiconductor test contactor includes a first probe part, a second probe part, and an elastic part. One end portion of the first probe part is brought into electric contact with a terminal of an inspection target device. One end portion of the second probe part is brought into electric contact with a pad of an inspection device. The elastic part is formed in one piece with the first and second probe parts and electrically connects the first and second probe parts to each other. The elastic part is thinner than the first and second probe parts, and both end portions of the elastic part are respectively connected to one side of the other end portion of the first probe part and one side of the other end portion of the second probe part. The elastic part is curved in a direction toward a first imaginary connection line connecting the other side of the other end portion of the first probe part to the other side of the other end portion of the second probe part, in such a manner that a center portion of the elastic part is not beyond the first imaginary connection line.
The present invention relates to a camera module inspection device and, more specifically, to a camera module inspection device comprising: a rod block which is moved forward by a pneumatic cylinder; and a pusher part which is arranged at the rod block and presses a pogo pin block to move the pogo pin block to a location at which the pogo pin block comes into contact with the camera module.
The present invention relates to a pusher apparatus. More specifically, the present invention relates to a pusher apparatus for pressing terminals of a device to be tested against a test device, the apparatus comprising: a housing that includes a pusher receiving space disposed in the middle thereof and open at the bottom, a valve receiving space that is disposed adjacent to the pusher receiving space and in which a valve structure can be received, an inflow passage having one end connected with an external air-introducing part and an opposite end connected with the valve receiving space, an outflow passage having one end connected with the outside and an opposite end connected with the valve receiving space, and a connecting passage having one end connected with the valve receiving space and an opposite end connected with the pusher receiving space; the valve structure making the connecting passage selectively communicate with one of the inflow passage and the outflow passage; and a pressing means that moves downward by air pressure to make contact with the device - to - be - tested to press the device-to-be-tested against the test device, when the inflow passage communicates with the connecting passage so that air flows into the pusher receiving space from the air-introducing part, wherein the valve structure and the pressing means are disposed in a single housing.
The present invention relates to a connection connector and, more specifically, to a connection connector which is disposed between a device to be tested and a testing apparatus and is for electrically connecting a terminal of the device to be tested and a pad of the testing apparatus. The connection connector comprises: an anisotropic conductive sheet comprising a plurality of conductive parts, in which arranged are a plurality of conductive particles extending in the thickness direction inside an elastic insulating material and on places corresponding to the terminals of the device to be tested, and insulating support parts which are provided between each conductive part, support each conductive part and insulate the conductive parts from one another; and a sheet-type connector having a porous sheet, which is disposed between the upper side and lower side of the anisotropic conductive sheet, is inserted into the anisotropic conductive sheet, and has a plurality of gaps, and a plurality of electrodes which are disposed on places corresponding to the conductive parts and are integrally coupled to the porous sheet, wherein each electrode is formed from a metal material and is electrically connected to each conductive part.
The present invention relates to a testing connector and, more specifically, to a testing connector which is disposed between a device to be tested and a testing apparatus and is for electrically connecting a terminal of the device to be tested and a pad of the testing apparatus. The testing connector comprises: conductive parts which have a plurality of conductive particles arranged, in the thickness direction, inside an insulating elastic material and on places corresponding to the terminals of the device to be tested; insulating support parts which are disposed between the conductive parts, cover the conductive parts and support the conductive parts; and elastic bodies which are disposed inside each conductive part and have a conductive wire spirally wound, wherein the plurality of elastic bodies are adjacent to each other inside the conductive parts.
One embodiment of the present invention provides a test socket comprising: a plurality of conductive elastic parts arranged at a position corresponding to a terminal of a device to be inspected, and in which a plurality of conductive particles are aligned in a vertical direction within an insulating elastic material; an elastic support part for supporting the conductive elastic parts while covering the conductive elastic parts; an insulating support part having a first insertion hole in which the lower part of the conductive elastic part is inserted and supported, and a second insertion hole which is positioned under the first insertion hole and into which a pad of an inspection device is inserted; a plurality of guide parts coupled to the upper surface of the insulating support part, and guiding the movement of the terminal of the device to be inspected; and a conductive pad supported by and fixed to the guide parts such that a conduction part is disposed on the upper surface of the conductive elastic part, and formed to be attachable to and detachable from the guide parts.
An embodiment provides a film contactor for electrically connecting a terminal of a device to be tested and a pad of a testing device, the contactor comprising: an insulation sheet having the shape of a porous mesh; an electrode formed integrally with the insulation sheet at a location corresponding to the terminal of the device to be tested; and a metal layer laminated on an insulation region, in which the electrode is not formed, of the upper surface of the insulation sheet.
The present invention relates to a camera lens module test socket configured of: a base plate installed on a printed circuit board connected to an inspection device; a lens module seating portion installed on the base plate and having an image sensor installed thereon for detecting a test image acquired through a camera lens module; 3 pogo blocks making a connection at 3 surfaces of the camera lens module seated in the lens module seating portion; a cam plate connecting a first and a second pogo block at both sides from among the 3 pogo blocks to both side surface terminals of the camera lens module, and connecting the center pogo block to a rear surface terminal of the camera lens module; and a pneumatic cylinder for moving the cam plate forward and backward so as to connect the three pogo blocks at the 3 surfaces of the camera lens module, etc., wherein the lifespan of pogo pins can be improved through a linear connection between the camera lens module and the pogo blocks, inspection speed can be improved by a simple structure, the minimization of components can reduce weight and costs, and production costs can be reduced through the reduction of production manpower due to the minimization of assembly processes.
G01B 11/26 - Measuring arrangements characterised by the use of optical techniques for measuring angles or tapersMeasuring arrangements characterised by the use of optical techniques for testing the alignment of axes
The present invention relates to a camera module test socket comprising: a base plate disposed on and supported by a camera module test equipment; a socket cover, disposed on the base plate, for covering a camera module seating part; a down base disposed in the back of the socket cover and provided with a tapered hinged part hinged to the socket cover; a pneumatic cylinder support interposed between a pneumatic cylinder and the base plate; the pneumatic cylinder, disposed on the pneumatic cylinder support, for moving a roller block forward and backward; and the roller block which advances, by a part of the single stroke of the pneumatic cylinder, to induce the socket cover to cover and close the camera module seating part, and which pushes, by the progression of rest of the stroke of the pneumatic cylinder, the tapered hinged part of the down base so as to induce the tapered hinged part to descend, and as such, a vertical contact is established on the clamshell-type socket cover to receive the contact force vertically, and thus damage to a pogo pin can be prevented. Furthermore, as the lifespan of the pogo pin is extended due to the reduced impact thereto, economic benefits such as reduced maintenance expense and personnel can be attained.
The present invention relates to a suction-type camera module test socket comprising: a base plate comprising, at the front center thereof, a contact plate installation groove in which to install a contact plate provided on the upper side thereof with a pogo block, which is connected to a camera module, and a camera module mounting unit having a printed circuit board installed thereon; a lifting/lowering device support installed on the base plate and behind the contact plate installation groove; a lifting/lowering device installed on the lifting/lowering device support so as to lift/lower a rotary cylinder; the rotary cylinder, which is lifted/lowered by being installed on a lifting/lowering support plate lifted/lowered by the lifting/lowering device and reverses a suction reversal tray according to the application of pneumatic pressure; the suction reversal tray provided with a suction unit for sucking the camera module, turned upside down by the rotary cylinder, and lifted/lowered according to the lifting/lowering of the lifting/lowering device; and the contact plate having, installed thereon, the pogo block, which is installed correspondingly to the lowered position of the camera module sucked to the suction reversal tray and comes into contact with a terminal of the camera module, thereby: improving the lifespan of pogo pins by vertical contacts; improving the speed of a test process in comparison with conventional sockets owing to a simple structure; allowing weight lightening, cost saving, and assembly man-hour minimization by minimizing parts; and thus improving the rate of mounting the camera module and allowing consistency therefor.
The present invention relates to an electrical test socket and a method for manufacturing a conductive particle for an electrical test socket and, more specifically, to an electrical test socket, disposed between terminals of a device to be tested and pads of a test device to electrically connect the terminals and the pads, and a method for manufacturing a conductive particle for an electrical test socket. The electrical test socket comprises an anisotropic conductive sheet that includes: a plurality of conductive sections in the positions corresponding to the terminals of the device to be tested, each conductive section having a plurality of conductive particles arranged in the thickness direction within an insulating resilient material; and an insulating support section that insulates the conductive sections while supporting the same, wherein each conductive particle includes a conductive core and a conductive protrusion extending from the surface of the conductive core in the radial direction and integrally attached to the conductive core, and the conductive protrusions of the conductive particles adjacent to each other become entangled when the conductive particles are arranged in the insulating resilient material.
The present invention relates to an electrical connector for electrically connecting a device to be tested with a testing device, and a manufacturing method therefor, wherein the electrical connector improves high-current characteristics, durability and the like by comprising: a support sheet made of a porous insulation sheet having a plurality of through-holes formed at each location corresponding to connection terminals of the device to be tested; an elastic sheet formed of an elastic material at a lower side of the support sheet and comprising a conduction part formed by condensing conductive particles at the locations corresponding to the through-holes, and an insulating part formed adjacent to the conduction part so as to insulate and support the conduction part.
A test socket is configured to be disposed between a test target device and a test apparatus for electrically connecting terminals of the test target device to pads of the test apparatus. The test socket includes: a support sheet formed of an insulative material and including penetration holes at positions corresponding to the terminals of the test target device; inserts including first conductive parts and elastic insulative parts, wherein the first conductive parts are disposed in the penetration holes of the support sheet and formed by arranging a plurality of first conductive particles in an insulative elastic material in a thickness direction of the support sheet, and the elastic insulative parts are formed of an insulative elastic material and disposed between the first conductive parts and inner walls of the penetration holes to surround the first conductive parts; and an anisotropic sheet including second conductive parts and an insulative support part, wherein the second conductive parts are disposed under the first conductive parts and formed by arranging a plurality of second conductive particles in an insulative elastic material in a thickness direction of the anisotropic sheet at positions corresponding to the penetration holes, and the insulative support part is disposed under the support sheet to support and insulate the second conductive parts.
The present invention relates to a contact sheet which is in contact with a flexible circuit board having an electrode pattern having a predetermined arrangement, and is electrically connected to the flexible circuit board. The contact sheet comprises: a plurality of contact pads which are electrically connected to an electrode pattern of a flexible circuit board, exhibit conductivity in the thickness direction, and are spaced from each other; and an insulating peripheral unit which is disposed around the plurality of contact pads, supports each of the contact pads, and is integrally coupled to the contact pads. At least a portion of the contact pads has a shape corresponding to the electrode pattern of the flexible circuit board, and each of the contact pads is configured as a quadrangular pad. The contact pads are formed of a mixture of silicon rubber and a conductive powder contained in the silicon rubber.
H01R 11/01 - Individual connecting elements providing two or more spaced connecting locations for conductive members which are, or may be, thereby interconnected, e.g. end pieces for wires or cables supported by the wire or cable and having means for facilitating electrical connection to some other wire, terminal, or conductive member, blocks of binding posts characterised by the form or arrangement of the conductive interconnection between their connecting locations
H01R 12/51 - Fixed connections for rigid printed circuits or like structures
The present invention relates to a contact sheet, and more specifically, to a contact sheet which is electrically connected with a test target device by coming into contact with the test target device which has electrode patterns having a predetermined array, the contact sheet being provided in the form of a sheet having a predetermined area and thickness, wherein the contact sheet comprises: a sheet body which constitutes the main body, is made of an insulating material, and has a predetermined area; and a plurality of contact patterns which are arranged on the sheet body and are electrically connected to the electrode patterns on the test target device, and the contact sheet has the thickness of the outer part and the thickness of the center part to be different.
The present invention relates to a connection connector and a connection connector manufacturing method and, more specifically, to a connection connector and a manufacturing method therefor, and the connection connector arranged between a device to be inspected and an inspection device for which a mutual electrical connection is required and electrically connecting a terminal of the device to be inspected and a pad of the inspection device comprises: a connection sheet including a sheet member, which has a plurality of through-holes formed at every position corresponding to the terminal of the device to be inspected, has flexibility, and is made from an insulating material, and a conductive electrode coupled to the through-holes of the sheet member so as to protrude more than an upper side of the sheet member and a lower side of the sheet member; and an anisotropic sheet including conductive units arranged under the conductive electrode of the connection sheet and coming in contact with the conductive electrode so as to exhibit conductivity in a thickness direction, and an insulation unit for insulating the conductive units from each other while supporting the conductive units, wherein an edge of a part protruding more than the lower side of the sheet member in the conductive electrode of the connection sheet has a round shape.
H01R 11/01 - Individual connecting elements providing two or more spaced connecting locations for conductive members which are, or may be, thereby interconnected, e.g. end pieces for wires or cables supported by the wire or cable and having means for facilitating electrical connection to some other wire, terminal, or conductive member, blocks of binding posts characterised by the form or arrangement of the conductive interconnection between their connecting locations
H01R 43/00 - Apparatus or processes specially adapted for manufacturing, assembling, maintaining, or repairing of line connectors or current collectors or for joining electric conductors
95.
Test socket having high-density conductive unit, and method for manufacturing same
The present invention relates to a test socket having a high-density conductive unit, and to a method for manufacturing same, whereby an elastic conductive sheet is arranged at a position corresponding to the terminal of the device, and includes a first conductive unit arranged in the thickness direction of an elastic material and an insulating support unit for supporting the first conductive unit. A support sheet is attached to the elastic conductive sheet and has through-holes corresponding to the terminal of the device. A second conductive unit is arranged in the through-holes of the support sheet in the thickness direction in an elastic material.
G01R 3/00 - Apparatus or processes specially adapted for the manufacture of measuring instruments
H01R 43/00 - Apparatus or processes specially adapted for manufacturing, assembling, maintaining, or repairing of line connectors or current collectors or for joining electric conductors
H01R 12/71 - Coupling devices for rigid printing circuits or like structures
H01R 13/24 - Contacts for co-operating by abutting resilientContacts for co-operating by abutting resiliently mounted
H01R 12/73 - Coupling devices for rigid printing circuits or like structures coupling with the edge of the rigid printed circuits or like structures connecting to other rigid printed circuits or like structures
96.
METHOD FOR MANUFACTURING TEST SHEET, AND TEST SHEET
The present invention relates to a method for manufacturing a test sheet, the test sheet being arranged between a terminal of a device to be tested and a pad of a test device so as to electrically connect the terminal and the pad to each other. The method comprises the steps of: manufacturing a frame which has holes formed at every position corresponding to the terminal of the device to be tested; placing the frame within a mold and filling the mold with a liquid molding material; applying a magnetic field inside the mold in a thickness direction; curing the liquid molding material; and applying, to the frame, heat of a temperature greater than or equal to a predetermined temperature.
The present invention relates to a plate-shaped testing contactor for a semiconductor testing socket. A plurality of plate-shaped testing contactors are provided on a semiconductor testing socket, in order to test electric characteristics of a semiconductor device. The plate-shaped testing contactors electrically connect between a bump electrode of the semiconductor device and a pad of a test circuit board. To this end, a plate-shaped testing contactor comprises an upper plunger, a lower plunger, and a compression coil spring. The upper plunger has a body portion extending in the horizontal direction from both sides thereof and a guide portion formed as the extending part is rotated/bent so as to face the inner peripheral surface of a housing hole. Therefore, the plate-shaped testing contactor according to the present invention has the guide portion of the upper plunger formed in a circular shape as a whole such that, during a vertical movement inside the housing hole, the circular guide portion can prevent wearing of the housing hole and can improve the position precision and verticality.
The present invention relates to a probe device, and more specifically, to a probe device for electrically connecting a terminal of a blood test device to a pad of a testing apparatus, the probe device comprising: a first probe member comprising an upper probe portion of which an end part is brought into contact with the blood test device, and an accommodating portion which is arranged below the upper probe portion and is provided with an accommodation groove extending upward from the bottom end; a second probe member comprising a lower probe portion of which an end part is brought into contact with the pad of the testing apparatus, and an insertion portion which is arranged above the lower probe portion and is inserted into the inside of the accommodation groove; and a spring member for elastically biasing the first probe member in a direction away from the second probe member, wherein the inner surface of the spring member is coupled to the outer surface of the first probe member and the outer surface of the second probe member.
The present invention relates to a sheet-type connector and an electrical connector device and, particularly, to a sheet-type connector capable of easily aligning the positions of terminals of a device to be tested since a sheet member provided with through holes is attached to the upper side of a sheet member provided with electrodes, and an electrical connector device.
H01R 11/01 - Individual connecting elements providing two or more spaced connecting locations for conductive members which are, or may be, thereby interconnected, e.g. end pieces for wires or cables supported by the wire or cable and having means for facilitating electrical connection to some other wire, terminal, or conductive member, blocks of binding posts characterised by the form or arrangement of the conductive interconnection between their connecting locations
G01R 31/28 - Testing of electronic circuits, e.g. by signal tracer
H01L 21/66 - Testing or measuring during manufacture or treatment
Disclosed is an align socket unit of a semiconductor device. The align socket unit of the semiconductor device according to one embodiment of the present invention comprises: an insertion body having an opening which receives the semiconductor device so as to test a packaged semiconductor device; a guide sheet which is installed in the lower surface of the insertion body, and which is provided for an alignment of an insertion position of a ball terminal provided in the semiconductor device; a base part to which the lower surface of the insertion body is seated, and which comprises a plurality of probe pins disposed in a position facing the ball terminal; and a guide pad which is in close contact with the lower surface of the guide sheet, and which has guide holes where the upper ends of the probe pins are inserted partially so as to always guide the position of the probe pins to the right position.
patents
