HORIBA, Ltd.

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[Owner] HORIBA, Ltd. 390
Horiba ABX SAS 3
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Horiba Europe GmbH 2
Horiba Instruments Incorporated 2
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IPC Class
G01M 17/007 - Wheeled or endless-tracked vehicles 42
G01N 23/223 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence 41
G01N 1/22 - Devices for withdrawing samples in the gaseous state 36
G01N 15/02 - Investigating particle size or size distribution 35
G01N 1/00 - SamplingPreparing specimens for investigation 30
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1.

BATTERY CHARGING DEVICE, BATTERY CHARGING METHOD, AND BATTERY CHARGING PROGRAM

      
Application Number JP2024041531
Publication Number 2025/121172
Status In Force
Filing Date 2024-11-22
Publication Date 2025-06-12
Owner HORIBA, LTD. (Japan)
Inventor
  • Matsunaga, Shimpachi
  • Tatsukawa, Shogo

Abstract

The present invention is for efficiently measuring internal resistance for use as a battery degradation index during battery charging, and comprises: a battery charging unit 2 that supplies charging current and/or voltage to a battery B; a battery management unit 3 that manages the charging state of the battery B; a pulse signal generation unit 4 that superimposes, at one or more charging points corresponding to the charging state of the battery B, pulse current or voltage on the charging current or voltage and supplies the same to the battery; an internal resistance calculation unit 5 that calculates the internal resistance of the battery B on the basis of the current value and the voltage value of the battery obtained when charging power superposed with pulse power has been supplied; and a data management unit 6 that records, in a memory, the internal resistance calculated by the internal resistance calculation unit 5.

IPC Classes  ?

  • H02J 7/10 - Regulation of the charging current or voltage using discharge tubes or semiconductor devices using semiconductor devices only
  • G01R 31/382 - Arrangements for monitoring battery or accumulator variables, e.g. SoC
  • G01R 31/385 - Arrangements for measuring battery or accumulator variables
  • G01R 31/389 - Measuring internal impedance, internal conductance or related variables
  • G01R 31/392 - Determining battery ageing or deterioration, e.g. state of health
  • H01M 10/44 - Methods for charging or discharging
  • H01M 10/48 - Accumulators combined with arrangements for measuring, testing or indicating the condition of cells, e.g. the level or density of the electrolyte
  • H02J 7/00 - Circuit arrangements for charging or depolarising batteries or for supplying loads from batteries

2.

SAMPLE CARRIER AND SAMPLE ANALYSIS SYSTEM

      
Application Number JP2024038894
Publication Number 2025/115509
Status In Force
Filing Date 2024-10-31
Publication Date 2025-06-05
Owner HORIBA, LTD. (Japan)
Inventor
  • Kawakami, Shun
  • Park, Sangwoon

Abstract

This sample carrier is used in a sample analyzer for extracting and analyzing a component, as a gas, generated by heating a measurement sample, and is detachably attached to a predetermined sample input position provided to the sample analyzer. The sample carrier comprises: a container body which has an accommodation chamber for accommodating the measurement sample therein, and which has formed on the bottom surface thereof a sample outlet port for discharging the measurement sample in the accommodation chamber; a bottom plate which is rotatably attached to a bottom part of the container body through a seal member, and on which through-holes are formed in a manner opening to the upper surface and the lower surface; and a distance adjustment mechanism for adjusting an inter-surface distance between the upper surface of the bottom plate and the bottom surface of the container body. The sample carrier is configured such that, by having one of the container body and the bottom plate rotate with respect to the other, the sample outlet port moves between: a predetermined sealed position where the sample outlet port is blocked by the upper surface of the bottom plate and the accommodating chamber is sealed airtight; and an open position where the sample outlet port opens to the through-holes of the bottom plate and the measurement sample can be discharged. The distance adjustment mechanism adjusts an inter-surface distance while the sample outlet port is moving between the sealed position and the open position so as to be longer than the inter-surface distance when the sample outlet port is at the sealed position.

IPC Classes  ?

  • G01N 31/12 - Investigating or analysing non-biological materials by the use of the chemical methods specified in the subgroupsApparatus specially adapted for such methods using combustion
  • G01N 1/00 - SamplingPreparing specimens for investigation

3.

PROCESSING ADJUSTING DEVICE, PARTICLE SIZE DISTRIBUTION MEASURING SYSTEM, PROCESSING ADJUSTING METHOD, AND PROCESSING ADJUSTING PROGRAM

      
Application Number JP2024040665
Publication Number 2025/115654
Status In Force
Filing Date 2024-11-15
Publication Date 2025-06-05
Owner HORIBA, LTD. (Japan)
Inventor
  • Sakuramoto, Keijiro
  • Mori, Tetsuya

Abstract

This processing adjusting device is for adjusting processes in a particle size distribution measuring system comprising a particle size distribution measuring unit that measures the particle size distribution of a sample, and a sample supply unit that samples the sample and supplies the sample to the particle size distribution measuring unit, the processing adjusting device comprising: a sampling interval accepting unit that accepts a sampling interval, which is a time from the start of a sampling process for sampling the sample to the start of the next sampling process; and a process time adjusting unit that, if the sampling interval accepted by the sampling interval accepting unit is equal to or less than a prescribed value, adjusts the processing time of at least one of the sampling process for sampling the sample, a measuring process for measuring the particle size distribution of the sample, a cleaning process for cleaning the particle size distribution measuring unit or the sample supply unit, and a standby process for waiting until the start of the next sampling process.

IPC Classes  ?

  • G01N 15/0205 - Investigating particle size or size distribution by optical means
  • G01N 1/00 - SamplingPreparing specimens for investigation
  • G01N 15/00 - Investigating characteristics of particlesInvestigating permeability, pore-volume or surface-area of porous materials
  • G01N 35/00 - Automatic analysis not limited to methods or materials provided for in any single one of groups Handling materials therefor

4.

PARTICLE SIZE DISTRIBUTION MEASUREMENT SYSTEM, PARTICLE SIZE DISTRIBUTION MEASUREMENT METHOD, AND PARTICLE SIZE DISTRIBUTION MEASUREMENT PROGRAM

      
Application Number JP2024040664
Publication Number 2025/115653
Status In Force
Filing Date 2024-11-15
Publication Date 2025-06-05
Owner HORIBA, LTD. (Japan)
Inventor
  • Sakuramoto, Keijiro
  • Mori, Tetsuya

Abstract

This particle size distribution measurement system comprises: a particle size distribution measurement unit that measures the particle size distribution of specimens; a specimen supply unit that samples the specimens and supplies the sampled specimens to the particle size distribution measurement unit through a flow path through which the sampled specimens flow; and an arrival time calculation unit that calculates, on the basis of flow path information that is information about the flow path, an arrival time that is the period of time from when the specimens are sampled to when the specimens reach the particle size distribution measurement unit.

IPC Classes  ?

  • G01N 15/0205 - Investigating particle size or size distribution by optical means
  • G01N 1/00 - SamplingPreparing specimens for investigation
  • G01N 1/10 - Devices for withdrawing samples in the liquid or fluent state
  • G01N 15/00 - Investigating characteristics of particlesInvestigating permeability, pore-volume or surface-area of porous materials
  • G01N 15/0227 - Investigating particle size or size distribution by optical means using imagingInvestigating particle size or size distribution by optical means using holography

5.

ANALYSIS DEVICE, ANALYSIS SYSTEM, ANALYSIS METHOD, AND PROGRAM

      
Application Number JP2024038226
Publication Number 2025/105150
Status In Force
Filing Date 2024-10-25
Publication Date 2025-05-22
Owner HORIBA, LTD. (Japan)
Inventor Yamaguchi, Kazuki

Abstract

The objective of the present invention is to accurately calculate an amount of particulate matter without being affected by changes in the amount of light emitted onto the particulate matter. An analysis device (100) comprises: a holding member (1) that holds particulate matter (FP); a light source (3) that emits light toward an imaging target area (VA) including a holding area of the holding member (1) in which the particulate matter (FP) is held; a two-dimensional sensor (4) that images the imaging target area (VA); and a calculating unit (5) that calculates particle amount-related information relating to the amount of particulate matter (FP) on the basis of analysis image data acquired by employing the two-dimensional sensor (4) to image the imaging target area (VA) for use in analyzing the particulate matter (FP), and an impact resulting from a change in the amount of light from the light source (3) when the analysis image data were acquired, relative to a reference amount of light.

IPC Classes  ?

  • G01N 15/075 - Investigating concentration of particle suspensions by optical means
  • G01N 1/02 - Devices for withdrawing samples
  • G01N 21/17 - Systems in which incident light is modified in accordance with the properties of the material investigated
  • G06T 7/00 - Image analysis
  • G06V 20/69 - Microscopic objects, e.g. biological cells or cellular parts

6.

X-RAY ANALYSIS DEVICE

      
Application Number JP2024038984
Publication Number 2025/105205
Status In Force
Filing Date 2024-10-31
Publication Date 2025-05-22
Owner HORIBA, LTD. (Japan)
Inventor
  • Aoyama, Tomoki
  • Ohashi, Satoshi
  • Tajima, Mikiya

Abstract

An x-ray analysis device according to the present invention is to analyze the elements included in a measurement sample transported in a prescribed direction and comprises an x-ray irradiation unit that radiates x-rays toward the measurement sample, an x-ray detection unit that faces the measurement sample and detects x-ray fluorescence produced from the measurement sample, and a standard sample that has a known element content and is provided in a region of overlap between a region irradiated with the x-rays radiated from the x-ray irradiation unit and a region in which x-ray fluorescence can be detected by the x-ray detection unit.

IPC Classes  ?

  • G01N 23/223 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence

7.

HYDROGEN DETECTION DEVICE AND HYDROGEN DETECTION METHOD

      
Application Number JP2024033736
Publication Number 2025/100115
Status In Force
Filing Date 2024-09-20
Publication Date 2025-05-15
Owner HORIBA, LTD. (Japan)
Inventor
  • Shiba, Takumi
  • Naya, Hiroshi

Abstract

This hydrogen detection device for detecting hydrogen contained in a gas in a chamber or in a pipe comprises: a casing which is inserted into the chamber or the pipe and has an internal space into which the gas can be introduced; a physical quantity change part which is provided in the internal space and in which a physical quantity changes according to the concentration of the hydrogen; and a physical quantity detection part which is provided in the internal space and detects the physical quantity in the physical quantity change part. The internal space is separated into a first space and a second space by a separation member. The gas is introduced into the first space and the physical quantity change part is housed in the first space. The gas is not introduced into the second space and the physical quantity detection part is housed in the second space.

IPC Classes  ?

  • G01N 21/78 - Systems in which material is subjected to a chemical reaction, the progress or the result of the reaction being investigated by observing the effect on a chemical indicator producing a change of colour

8.

DYNAMIC LIGHT SCATTERING TYPE PARTICLE DIAMETER DISTRIBUTION MEASURING DEVICE, DYNAMIC LIGHT SCATTERING TYPE PARTICLE DIAMETER DISTRIBUTION MEASURING METHOD, AND DYNAMIC LIGHT SCATTERING TYPE PARTICLE DIAMETER DISTRIBUTION MEASURING PROGRAM

      
Application Number JP2024037561
Publication Number 2025/089267
Status In Force
Filing Date 2024-10-22
Publication Date 2025-05-01
Owner HORIBA, LTD. (Japan)
Inventor Sakuramoto, Keijiro

Abstract

Provided is a dynamic light scattering type particle diameter distribution measuring device comprising: a light irradiation unit that irradiates a sample flowing through a flow path with light; a light detection unit that detects light scattered by the sample; a particle diameter distribution calculation unit that calculates the particle diameter distribution of the sample on the basis of the light intensity obtained by the light detection unit; a flow rate acquisition unit that acquires the flow rate of the sample flowing through the flow path; and a particle diameter distribution correction unit that corrects the particle diameter distribution calculated by the particle diameter distribution calculation unit, on the basis of the flow rate acquired by the flow rate acquisition unit.

IPC Classes  ?

  • G01N 15/0205 - Investigating particle size or size distribution by optical means

9.

RADIATION DETECTION ELEMENT MANUFACTURING METHOD, RADIATION DETECTION ELEMENT, AND RADIATION DETECTOR

      
Application Number JP2024035360
Publication Number 2025/079486
Status In Force
Filing Date 2024-10-03
Publication Date 2025-04-17
Owner HORIBA, LTD. (Japan)
Inventor Ishikura, Koji

Abstract

Provided are a radiation detection element manufacturing method, a radiation detection element, and a radiation detector that make it possible to accurately detect radiation having low energy. This radiation detection element manufacturing method comprises: forming an oxide layer composed of an oxide of a semiconductor on a first semiconductor layer; forming a second semiconductor layer on the oxide layer; and implanting, into the first semiconductor layer via the second semiconductor layer and the oxide layer, ions of a dopant that alters a semiconductor forming the first semiconductor layer to a semiconductor of a different type, thereby forming a doping layer composed of a semiconductor doped with the dopant between the first semiconductor layer and the oxide layer.

IPC Classes  ?

  • G01T 1/24 - Measuring radiation intensity with semiconductor detectors

10.

X-RAY ANALYSIS DEVICE, X-RAY ANALYSIS METHOD, INFORMATION PROCESSING DEVICE, AND COMPUTER PROGRAM

      
Application Number JP2024034558
Publication Number 2025/070683
Status In Force
Filing Date 2024-09-27
Publication Date 2025-04-03
Owner HORIBA, LTD. (Japan)
Inventor Aoyama, Tomoki

Abstract

Provided are: an X-ray analysis device that is capable of individually measuring the amounts of elements contained in layers on the obverse surface side and the reverse surface side of a multilayer sample; an X-ray analysis method; an information processing device; and a computer program. This X-ray analysis device is provided with: an emission unit that emits X-rays to a sample in which a plurality of layers are laminated, so as to sequentially penetrate a first layer, an intermediate layer, and a second layer; a fluorescent X-ray detector that detects fluorescent X-rays generated from the first layer or the second layer; a penetrating X-ray detector that detects penetrating X-rays that have penetrated the sample; and an analysis unit. The analysis unit calculates the amount of a specific element contained in one of the first layer or the second layer in accordance with the intensity of fluorescent X-rays having a prescribed first energy, calculates the total amount of the specific element contained in the first layer and the second layer in accordance with the intensity of penetrating X-rays having a prescribed second energy higher than the first energy, and calculates the amount of the specific element contained in the other of the first layer or the second layer.

IPC Classes  ?

  • G01N 23/2206 - Combination of two or more measurements, at least one measurement being that of secondary emission, e.g. combination of secondary electron [SE] measurement and back-scattered electron [BSE] measurement
  • G01N 23/223 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence

11.

ANALYSIS DEVICE AND ANALYSIS METHOD

      
Application Number JP2024031091
Publication Number 2025/062997
Status In Force
Filing Date 2024-08-29
Publication Date 2025-03-27
Owner HORIBA, LTD. (Japan)
Inventor Park, Sangwoon

Abstract

This analysis device is provided with: an impulse heating furnace or a high-frequency heating furnace that heats a sample to generate a sample gas containing elements that constitute the sample; a suction flow path that sucks the sample gas generated in the impulse heating furnace or the high-frequency heating furnace by means of a suction unit; and an element detecting unit that is provided in the suction flow path to detect the elements contained in the sample gas.

IPC Classes  ?

  • G01N 31/12 - Investigating or analysing non-biological materials by the use of the chemical methods specified in the subgroupsApparatus specially adapted for such methods using combustion

12.

ANALYSIS DEVICE, SPECIMEN EVALUATION SYSTEM, AND ANALYSIS METHOD

      
Application Number JP2024031162
Publication Number 2025/053065
Status In Force
Filing Date 2024-08-30
Publication Date 2025-03-13
Owner
  • HORIBA, LTD. (Japan)
  • HORIBA ADVANCED TECHNO, CO., LTD. (Japan)
Inventor
  • Miyamura, Kazuhiro
  • Okada, Yoichi
  • Yamashita, Tsubasa

Abstract

Provided is an analysis device used in a specimen evaluation device that evaluates the state of a specimen by analyzing a waste liquid from the specimen. This analysis device comprises a component concentration measurement unit that is connected to a discharge gas flow passage through which a post-dilution waste liquid obtained by diluting the waste liquid discharged from the specimen by a diluent flows and that measures the concentration of a component contained in the post-dilution waste liquid.

IPC Classes  ?

  • H01M 8/0444 - ConcentrationDensity
  • C25B 15/023 - Measuring, analysing or testing during electrolytic production
  • G01N 1/22 - Devices for withdrawing samples in the gaseous state
  • G01N 5/00 - Analysing materials by weighing, e.g. weighing small particles separated from a gas or liquid
  • H01M 8/04 - Auxiliary arrangements, e.g. for control of pressure or for circulation of fluids
  • H01M 8/02 - Fuel cellsManufacture thereof Details
  • H01M 8/10 - Fuel cells with solid electrolytes
  • H01M 8/12 - Fuel cells with solid electrolytes operating at high temperature, e.g. with stabilised ZrO2 electrolyte

13.

SPECIMEN TESTING SYSTEM, INFORMATION PROCESSING METHOD, AND COMPUTER PROGRAM

      
Application Number JP2024028237
Publication Number 2025/047353
Status In Force
Filing Date 2024-08-07
Publication Date 2025-03-06
Owner HORIBA, LTD. (Japan)
Inventor
  • Tabata, Kunio
  • Shimura, Miyoko
  • Yamamoto, Mitsunobu

Abstract

Provided are a specimen testing system, an information processing method, and a computer program for preventing alteration of data pertaining to measurement. The specimen testing system comprises a measurement device and an information processing device. The measurement device acquires, in accordance with a prescribed rule, a measurement result required to assess the state of a specimen, generates measurement data representing the measurement result, and stores, in association with each other: protected device data that includes device data and a hash vale for the device data, said device data representing a result of testing whether the state of the measurement device follows the prescribed rule; and protected measurement data that includes the measurement data and a hash value for the measurement data.

IPC Classes  ?

  • G06F 21/64 - Protecting data integrity, e.g. using checksums, certificates or signatures

14.

ENERGY MANAGEMENT SYSTEM, ENERGY MANAGEMENT METHOD, AND ENERGY MANAGEMENT PROGRAM

      
Application Number JP2024027995
Publication Number 2025/033401
Status In Force
Filing Date 2024-08-06
Publication Date 2025-02-13
Owner HORIBA, LTD. (Japan)
Inventor
  • Iwao, Keijiro
  • Kakino, Toru
  • Ishikuma, Toru

Abstract

The present invention is an energy management system that realizes energy conservation focusing on a frequency distribution indicating the frequency of energy consumption amounts in an energy demand facility, the energy management system managing consumed energy in the energy demand facility, wherein the energy management system comprises a clustering unit for clustering past energy consumption amounts for the energy demand facility into a plurality of clusters on the basis of a prescribed condition, a modeling unit for modeling a frequency distribution indicating the frequency of the energy consumption amounts in each cluster into a distribution having at least one positive skew, and a schedule adjustment unit for adjusting the operation schedule of the energy demand facility so as to reduce the variance of the modeled distribution.

IPC Classes  ?

15.

RADIATION DETECTION DEVICE AND SIGNAL PROCESSING METHOD

      
Application Number JP2024021278
Publication Number 2025/013496
Status In Force
Filing Date 2024-06-12
Publication Date 2025-01-16
Owner HORIBA, LTD. (Japan)
Inventor
  • Matsunaga, Daisuke
  • Murata, Shunsuke
  • Ohashi, Satoshi
  • Valiev, Ildar
  • Aoyama, Tomoki
  • Okubo, Yuji

Abstract

Provided are a radiation detection device and a signal processing method that are capable of preventing damage to a radiation detector. The radiation detection device comprises: a radiation detector that outputs a signal in response to the entry of radiation or light; and a stop processing unit that determines whether excessive radiation or excessive light has entered the radiation detector on the basis of the signal output from the radiation detector, and that stops the operation of the radiation detector or stops the generation of radiation or light when it is determined that excessive radiation or excessive light has entered the radiation detector.

IPC Classes  ?

  • G01T 1/17 - Circuit arrangements not adapted to a particular type of detector
  • G01T 1/24 - Measuring radiation intensity with semiconductor detectors

16.

GAS ANALYSIS DEVICE, FUEL GAS SUPPLY MECHANISM, AND GAS ANALYSIS METHOD

      
Application Number JP2024018439
Publication Number 2025/004598
Status In Force
Filing Date 2024-05-20
Publication Date 2025-01-02
Owner HORIBA, LTD. (Japan)
Inventor
  • Kondo, Yosuke
  • Kasugai, Tetsuya
  • Nishigai, Hiroki

Abstract

The present invention is a fuel gas supply mechanism for replacing a fuel gas cylinder without causing an accidental fire of hydrogen flame in a hydrogen flame ionization detection device, and comprises a first fuel gas port 51 to which a first fuel gas cylinder 10a is connected, a second fuel gas port 52 to which a second fuel gas cylinder 10b is connected, a first fuel gas flow passage 53 that connects the first fuel gas port 51 and an FID detector 4, a second fuel gas flow passage 54 that connects the second fuel gas port 52 and the FID detector 4, and a fuel gas backflow prevention mechanism 50 that prevents backflow from the first fuel gas flow passage 53 to the second fuel gas flow passage 54 or backflow from the second fuel gas flow passage 54 to the first fuel gas flow passage 53.

IPC Classes  ?

  • G01N 27/626 - Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating the ionisation of gases, e.g. aerosolsInvestigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating electric discharges, e.g. emission of cathode using heat to ionise a gas
  • G01M 15/10 - Testing internal-combustion engines by monitoring exhaust gases

17.

ANALYSIS DEVICE AND ANALYSIS METHOD

      
Application Number JP2024021190
Publication Number 2025/004791
Status In Force
Filing Date 2024-06-11
Publication Date 2025-01-02
Owner HORIBA, LTD. (Japan)
Inventor
  • Nakamura, Ryuhei
  • Ito, Hiroshi
  • Matsumoto, Erika

Abstract

The present invention acquires analysis results relating to the mass concentration and the elements of an analysis object in a short time and with a simple device configuration. An analysis device (100) comprises a β ray source (51), a detection unit (7, 7', 7"), and an analysis unit (9). The β ray source (51) irradiates the analysis object with β rays. The detection unit (7, 7', 7") simultaneously detects transmitted β rays that have passed through the analysis object and fluorescent X-rays that have been produced by irradiating the analysis object with the β rays, and outputs detection signals. The analysis unit (9) acquires, from the detection signals, a first signal produced by detecting the transmitted β rays and a second signal produced by detecting the fluorescent X-rays. The analysis unit (9) calculates information relating to the mass concentration of the analysis object on the basis of the first signal, and calculates information relating to the elements included in the analysis object on the basis of the second signal.

IPC Classes  ?

  • G01N 23/2206 - Combination of two or more measurements, at least one measurement being that of secondary emission, e.g. combination of secondary electron [SE] measurement and back-scattered electron [BSE] measurement
  • G01N 23/02 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by transmitting the radiation through the material

18.

BATTERY CASE EVALUATION SYSTEM, BATTERY CASE EVALUATION PROGRAM, AND BATTERY CASE EVALUATION METHOD

      
Application Number JP2024023511
Publication Number 2025/005247
Status In Force
Filing Date 2024-06-28
Publication Date 2025-01-02
Owner HORIBA, LTD. (Japan)
Inventor
  • Matsunaga, Shimpachi
  • Hatakeyama, Hiroshi
  • Tatsukawa, Shogo

Abstract

A battery case evaluation system 100 for evaluating the thermal properties of a battery case BC constituting a battery pack or of a component of said battery case BC, said system being equipped with a simulation battery 10 which is installed in the battery case BC and simulates the thermal behavior of an actual battery which is a component of a battery pack, a power supply device 20 which supplies power to the simulation battery 10, and a control device 30 which controls the power supply device 20, wherein the control device 30 is configured so as to have: a parameter reception unit 31 which receives an input profile expressing the change over time in the current, voltage or power supplied to the actual battery as one evaluation parameter; a resistance value calculation unit 331 which calculates a resistance value of the actual battery which changes over time on the basis of the simulation battery temperature and the input profile; and a supply power control unit 33 which controls the power supply device 20 by using the resistance value calculated by the resistance value calculation unit 331.

IPC Classes  ?

  • G01R 31/367 - Software therefor, e.g. for battery testing using modelling or look-up tables
  • G01N 25/18 - Investigating or analysing materials by the use of thermal means by investigating thermal conductivity
  • G01R 31/382 - Arrangements for monitoring battery or accumulator variables, e.g. SoC
  • G01R 31/385 - Arrangements for measuring battery or accumulator variables
  • G01R 31/389 - Measuring internal impedance, internal conductance or related variables
  • G01R 31/392 - Determining battery ageing or deterioration, e.g. state of health
  • H01M 10/48 - Accumulators combined with arrangements for measuring, testing or indicating the condition of cells, e.g. the level or density of the electrolyte

19.

TEST SAMPLE TESTING SYSTEM, TEMPERATURE ADJUSTMENT DEVICE, TEST SAMPLE TESTING METHOD, AND TEST SAMPLE TESTING PROGRAM

      
Application Number JP2024021305
Publication Number 2025/004803
Status In Force
Filing Date 2024-06-12
Publication Date 2025-01-02
Owner HORIBA, LTD. (Japan)
Inventor
  • Tatsukawa, Shogo
  • Hatakeyama, Hiroshi
  • Matsunaga, Shimpachi

Abstract

The present invention is for testing a test sample while simulating heat input or heat dissipation via an actual power line during actual use, and is a test sample testing system 100 for testing a test sample W, which is an electrical device, the test sample testing system 100 comprising: a test power line 4 that is connected to the test sample W; and a temperature adjustment device 5 for adjusting the temperature of the test power line 4 connected to the test sample W.

IPC Classes  ?

  • G01M 17/007 - Wheeled or endless-tracked vehicles
  • G01R 31/36 - Arrangements for testing, measuring or monitoring the electrical condition of accumulators or electric batteries, e.g. capacity or state of charge [SoC]

20.

ANALYSIS DEVICE, ANALYSIS METHOD, AND PROGRAM

      
Application Number JP2024023176
Publication Number 2025/005137
Status In Force
Filing Date 2024-06-26
Publication Date 2025-01-02
Owner HORIBA, LTD. (Japan)
Inventor
  • Matsumoto, Erika
  • Ito, Hiroshi

Abstract

The present invention efficiently performs analysis regarding the amount of an analyte and analysis regarding an element. An analysis device (100) comprises a radiation source, a detector (5), and an analysis unit (6). The radiation source irradiates particulate matter (FP) with radiation. The detector (5) detects transmitted radiation passing through the particulate matter (FP) and a fluorescent X-ray generated through the irradiation of the particulate matter (FP) with radiation. The analysis unit (6) performs analysis regarding the amount of the particulate matter (FP) on the basis of the transmitted radiation detected by the detector (5), and performs analysis regarding an element contained in the particulate matter (FP) on the basis of the fluorescent X-ray detected by the detector (5).

IPC Classes  ?

  • G01N 23/2206 - Combination of two or more measurements, at least one measurement being that of secondary emission, e.g. combination of secondary electron [SE] measurement and back-scattered electron [BSE] measurement
  • G01N 1/02 - Devices for withdrawing samples
  • G01N 23/02 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by transmitting the radiation through the material
  • G01N 23/223 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence

21.

FUEL CELL EVALUATION SYSTEM, INCLINATION TEST DEVICE, FUEL CELL EVALUATION METHOD, AND PROGRAM FOR FUEL CELL EVALUATION SYSTEM

      
Application Number JP2024020546
Publication Number 2024/262315
Status In Force
Filing Date 2024-06-05
Publication Date 2024-12-26
Owner HORIBA, LTD. (Japan)
Inventor
  • Mizutaka, Toshio
  • Tabata, Kunio
  • Komada, Mineyuki

Abstract

This fuel cell evaluation system evaluates a test piece that is a fuel cell to be mounted on a movable body or a portion of the fuel cell, the fuel cell evaluation system comprising: a hydrogen gas supply line for supplying hydrogen gas to the test piece; an electric discharge unit that controls an electric discharge load on the test piece; and an inclination test device that has a mounting base on which the test piece is mounted and that inclines the mounting base so as to change the orientation of the test piece according to the movement state of the movable body.

IPC Classes  ?

  • H01M 8/04 - Auxiliary arrangements, e.g. for control of pressure or for circulation of fluids
  • H01M 8/00 - Fuel cellsManufacture thereof
  • H01M 8/04746 - PressureFlow

22.

TEST SPECIMEN TESTING SYSTEM, TEST SPECIMEN DRIVING SYSTEM, TEST SPECIMEN TESTING METHOD, AND TEST SPECIMEN TESTING PROGRAM

      
Application Number JP2024018448
Publication Number 2024/257552
Status In Force
Filing Date 2024-05-20
Publication Date 2024-12-19
Owner HORIBA, LTD. (Japan)
Inventor
  • Furukawa, Kazuki
  • Saito, Takashi

Abstract

The present invention relates to a test specimen testing system for testing a test specimen by controlling vehicle pedals of the test specimen to target operation amounts while imparting running resistance to the test specimen, the test specimen testing system comprising; a driving device 2 for driving the test specimen V by operating the vehicle pedals V3, V4 of the test specimen V or inputting operation signals corresponding to the operation of the vehicle pedals; a dynamometer 4 that imparts running resistance corresponding to the vehicle speed of the test specimen V being driven by the driving device 2; a data acquiring unit 31 that acquires target operation amount data, which are time-series data of the target operation amounts of the vehicle pedals V3, V4; and a driving device control unit 33 that performs feed-forward control of a driving robot 2 on the basis of the target operation amount data acquired by the data acquiring unit 31.

IPC Classes  ?

23.

ANALYSIS DEVICE, ANALYSIS METHOD, AND PROGRAM

      
Application Number JP2024018060
Publication Number 2024/247732
Status In Force
Filing Date 2024-05-16
Publication Date 2024-12-05
Owner HORIBA, LTD. (Japan)
Inventor
  • Shibuya, Kyoji
  • Niina, Kodai
  • Okuda, Naoki
  • Miyawaki, Daisuke
  • Ido, Takuya

Abstract

The purpose of the present invention is to easily determine whether an obtained analysis result is abnormal. An analysis device (100) is provided with an irradiation unit (5), a detection unit (75), and a calculation unit (91). The irradiation unit (5) has a laser that radiates a measurement light (L) toward a sample gas (SG). The detection unit (75) detects the measurement light (L) that has passed through the sample gas (SG). The calculation unit (91) outputs a signal for determining whether the analysis result of a predetermined gas is abnormal on the basis of a residual between detection signal information based on a detection signal obtained by detecting the measurement light (L) by the detection unit (75) and reference signal information based on a reference signal obtained in advance by causing the predetermined gas to absorb the measurement light (L).

IPC Classes  ?

  • G01N 21/3504 - Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing gases, e.g. multi-gas analysis
  • G01N 21/39 - Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using tunable lasers

24.

CELL FOR SPECTROSCOPIC ANALYSIS, SPECTROSCOPIC ANALYSIS DEVICE, AND SPECTROSCOPIC ANALYSIS METHOD

      
Application Number JP2024019843
Publication Number 2024/248081
Status In Force
Filing Date 2024-05-30
Publication Date 2024-12-05
Owner HORIBA, LTD. (Japan)
Inventor
  • Ueno, Kusuo
  • Murakami, Tatsuki
  • Minowa, Hiroki

Abstract

In order to prevent cracking of a translucent plate even in cases where a wide range of a sample is measured while speeding up the measurement in a non-exposed environment by pressing and flattening the sample with a translucent plate such as a glass plate, or in cases where the translucent plate is thin, this cell 100 which is used for spectroscopic analysis and holds a sample S is provided with: a base 10 for supporting the sample S; a sealing member 20 that surrounds the sample S on the base 10; a translucent plate 30 for having the sample S sandwiched between itself and the base 10; and a decompression flow path L that is in communication with a sample space which is surrounded by the base 10, the sealing member 20, and the translucent plate 30.

IPC Classes  ?

25.

RADIATION TEMPERATURE MEASUREMENT DEVICE, RADIATION TEMPERATURE MEASUREMENT METHOD, AND PROGRAM FOR RADIATION TEMPERATURE MEASUREMENT DEVICE

      
Application Number JP2024010200
Publication Number 2024/241674
Status In Force
Filing Date 2024-03-15
Publication Date 2024-11-28
Owner HORIBA, LTD. (Japan)
Inventor
  • Fujino, Sho
  • Tominaga, Koji

Abstract

Provided is a radiation temperature measurement device that measures the temperature of an object-to-be-measured having a substrate and a thin film formed on the surface of the substrate, wherein the radiation temperature measurement device comprises: an infrared detection unit that detects the amount of infrared rays radiated from the object-to-be-measured; a substrate spectral characteristic data storage unit that stores substrate spectral characteristic data indicating the temperature characteristics of the spectral characteristics of the substrate; an individual spectral characteristic data reception unit that receives an input of individual spectral characteristic data indicating information pertaining to the reflectance and transmittance of the object-to-be-measured at a prescribed temperature; a spectral characteristic calculation unit that calculates the temperature characteristics of the spectral characteristics of the object-to-be-measured on the basis of the substrate spectral characteristic data and the individual spectral characteristic data; and a temperature calculation unit that calculates the temperature of the object-to-be-measured on the basis of the amount of infrared rays detected by the infrared detection unit and the temperature characteristics of the spectral characteristics of the object-to-be-measured calculated by the spectral characteristic calculation unit.

IPC Classes  ?

  • G01J 5/70 - Passive compensation of pyrometer measurements, e.g. using ambient temperature sensing or sensing of temperature within housing
  • G01J 5/00 - Radiation pyrometry, e.g. infrared or optical thermometry
  • G01J 5/60 - Radiation pyrometry, e.g. infrared or optical thermometry using determination of colour temperature
  • H01L 21/66 - Testing or measuring during manufacture or treatment

26.

ANALYSIS DEVICE, PROGRAM FOR ANALYSIS DEVICE, AND ANALYSIS METHOD

      
Application Number JP2024017471
Publication Number 2024/241920
Status In Force
Filing Date 2024-05-10
Publication Date 2024-11-28
Owner HORIBA, LTD. (Japan)
Inventor
  • Shibuya, Kyoji
  • Hamauchi, Shota
  • Niina, Kodai
  • Yamamoto, Tomomi

Abstract

The present invention is an analysis device 100 that analyzes acetylene in a sample gas containing acetylene and at least one type of hydrocarbon other than acetylene. The analysis device 100 includes: a laser light source 2 that irradiates the sample gas with a laser beam; a photodetector 3 that detects the intensity of sample light, which is the laser beam that has passed through the sample gas; and a signal processing device 4 that calculates the concentration of acetylene on the basis of the output signal of the photodetector 3. The signal processing device 4 calculates the concentration of acetylene on the basis of the absorption of acetylene between 7.56 μm and 7.66 μm or between 7.27 μm and 7.83 μm.

IPC Classes  ?

  • G01N 21/3504 - Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing gases, e.g. multi-gas analysis
  • G01N 21/39 - Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using tunable lasers

27.

TEST SPECIMEN DISPLAY RECOGNITION DEVICE, TEST SPECIMEN TESTING SYSTEM, TEST SPECIMEN DISPLAY SETTING DEVICE, TEST SPECIMEN DISPLAY RECOGNITION METHOD, AND TEST SPECIMEN DISPLAY RECOGNITION PROGRAM

      
Application Number JP2024013028
Publication Number 2024/204704
Status In Force
Filing Date 2024-03-29
Publication Date 2024-10-03
Owner HORIBA, LTD. (Japan)
Inventor
  • Komatsu, Yoji
  • Michikita, Toshiyuki
  • Yoshinaka, Yuji
  • Prasad, Rohit Shiv
  • Yabushita, Hirotaka
  • Matsueda, Atsuo
  • Otake, Ryoga

Abstract

The present invention provides a test specimen display recognition device for identifying a test specimen display for indicating a state of a test specimen, from an image obtained by imaging a meter panel of the test specimen by means of a camera, the test specimen display recognition device comprising: a setting information accepting unit for accepting a selection signal indicating the type of an image recognition algorithm for identifying the test specimen display from the image; a setting information storage unit for storing the selection signal accepted by the setting information accepting unit as setting information; and a test sample display recognition unit for acquiring the setting information from the setting information storage unit and identifying an instructed value indicated by test specimen display on the basis of the setting information.

IPC Classes  ?

28.

CENTRIFUGAL SEDIMENTATION-TYPE MEASUREMENT APPARATUS AND CENTRIFUGAL SEDIMENTATION-TYPE MEASUREMENT METHOD

      
Application Number JP2024005978
Publication Number 2024/190313
Status In Force
Filing Date 2024-02-20
Publication Date 2024-09-19
Owner HORIBA, LTD. (Japan)
Inventor
  • Yamaguchi, Tetsuji
  • Igushi, Tatsuo
  • Sato, Yusui
  • Yashiki, Shota

Abstract

With the purpose of enabling multiple kinds of substances contained in a sample to be analyzed all at once without requiring replacement of light sources and other such labor by using a centrifugal sedimentation-type measurement apparatus, this invention additionally involves a second light source that illuminates a cell with light having a wavelength different from the wavelength of light from a first light source, and a second detector that detects secondary light generated due to the sample being illuminated with the light from the second light source.

IPC Classes  ?

  • G01N 15/04 - Investigating sedimentation of particle suspensions

29.

SPECIMEN ANALYZER, SPECIMEN ANALYSIS SYSTEM, AND SPECIMEN DISPENSING METHOD

      
Application Number JP2024007536
Publication Number 2024/190437
Status In Force
Filing Date 2024-02-29
Publication Date 2024-09-19
Owner HORIBA, LTD. (Japan)
Inventor
  • Hirata Katsuki
  • Sano Tomoki

Abstract

This specimen analyzer is provided with a specimen measuring cell and a dispensing mechanism for dispensing a specimen. The dispensing mechanism dispenses a specimen into the specimen measuring cell and a test device that is held at a different position from the specimen measuring cell.

IPC Classes  ?

  • G01N 35/10 - Devices for transferring samples to, in, or from, the analysis apparatus, e.g. suction devices, injection devices
  • G01N 35/00 - Automatic analysis not limited to methods or materials provided for in any single one of groups Handling materials therefor
  • G01N 35/08 - Automatic analysis not limited to methods or materials provided for in any single one of groups Handling materials therefor using a stream of discrete samples flowing along a tube system, e.g. flow injection analysis
  • G01N 37/00 - Details not covered by any other group of this subclass

30.

ELEMENTAL ANALYSIS DEVICE AND ELEMENTAL ANALYSIS METHOD

      
Application Number JP2024005932
Publication Number 2024/181221
Status In Force
Filing Date 2024-02-20
Publication Date 2024-09-06
Owner HORIBA, LTD. (Japan)
Inventor
  • Yamada, Takahiro
  • Kawakami, Shun
  • Park, Sangwoon

Abstract

An elemental analysis device 100 comprises: a heating furnace 1 that heats a sample to generate a sample gas G; a flow path L1 through which the sample gas G flows; a flow rate adjusting unit 3 provided in the flow path L1 to adjust the flow rate of the sample gas G; an oxidizer 4 provided downstream of the flow rate adjusting unit 3 in the flow path L1 to oxidize the sample gas G; and an analyzing unit 5 provided downstream of the oxidizer 4 in the flow path L1 to analyze elements contained in the sample gas G.

IPC Classes  ?

  • G01N 31/12 - Investigating or analysing non-biological materials by the use of the chemical methods specified in the subgroupsApparatus specially adapted for such methods using combustion
  • G01N 31/00 - Investigating or analysing non-biological materials by the use of the chemical methods specified in the subgroupsApparatus specially adapted for such methods

31.

PARTICLE DIAMETER DISTRIBUTION MEASUREMENT DEVICE, PARTICLE DIAMETER DISTRIBUTION MEASUREMENT METHOD, AND PARTICLE DIAMETER DISTRIBUTION MEASUREMENT PROGRAM

      
Application Number JP2024002288
Publication Number 2024/166705
Status In Force
Filing Date 2024-01-25
Publication Date 2024-08-15
Owner HORIBA, LTD. (Japan)
Inventor Sugasawa, Hirosuke

Abstract

A particle diameter distribution measurement device 100 comprising an imaging means 3 that images particles in a cell 1 and an analysis unit 41 that calculates a particle diameter distribution by calculating diffusion velocity due to Brownian motion of the particles in imaging data obtained by the imaging means 3, said particle diameter distribution measurement device 100 being provided with: a data group acquisition unit 43 that acquires, at each of a plurality of focus positions in the cell 1, an imaging data group which comprises a plurality of pieces of imaging data obtained by the imaging means 3; a variable value calculation unit 44 that calculates a variable value of a prescribed evaluation parameter obtained from each of the plurality of pieces of imaging data constituting the imaging data groups; and a focus position determination unit 45 that, on the basis of variable values respectively corresponding to the plurality of focus positions, determines a measurement focus position to be used during measurement.

IPC Classes  ?

  • G01N 15/0227 - Investigating particle size or size distribution by optical means using imagingInvestigating particle size or size distribution by optical means using holography
  • G03B 13/36 - Autofocus systems

32.

ANALYSIS DEVICE, ANALYSIS METHOD, AND OZONE DECOMPOSER

      
Application Number JP2023041259
Publication Number 2024/142653
Status In Force
Filing Date 2023-11-16
Publication Date 2024-07-04
Owner HORIBA, LTD. (Japan)
Inventor
  • Otsuka, Gaku
  • Yamada, Ryusuke
  • Mizumoto, Kazunori

Abstract

The present invention addresses the problem of generating, from a sample gas, a suitable reference gas from which components other than ozone are not excessively removed. An analysis device (100) comprises: a measurement cell (1) into which a sample gas (Gs) and a reference gas (Gr) are alternately introduced; a light source (3) that outputs measurement light (L); a detection unit (5) that detects measurement light (L) which has passed through the measurement cell (1); a computation unit (91) that analyzes the ozone contained in the sample gas (Gs); and an ozone decomposer (71) that generates the reference gas (Gr) from the sample gas (Gs) by means of heating. The ozone decomposer (71) includes: an introduction tube (71a) for introducing the sample gas (Gs); a heating unit (71b) that heats the introduction tube (71a); and a porous first filling material (71c) that is filled into the heated portion of the introduction tube (71a) heated by the heating unit (71b), and that comprises a substance which is inert to sulfur dioxide.

IPC Classes  ?

  • G01N 21/33 - Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using ultraviolet light
  • G01N 21/61 - Non-dispersive gas analysers

33.

SPECTROSCOPIC ANALYSIS DEVICE AND SPECTROSCOPIC ANALYSIS METHOD

      
Application Number JP2023045761
Publication Number 2024/143122
Status In Force
Filing Date 2023-12-20
Publication Date 2024-07-04
Owner HORIBA, LTD. (Japan)
Inventor
  • Wakabayashi, Satoru
  • Uchigashima, Mikiko
  • Naka, Nobuyuki

Abstract

Provided are a spectroscopic analysis device and a spectroscopic analysis method that can analyze components in a liquid sample over a wide concentration range. The spectroscopic analysis device comprises: a first analysis unit that performs fluorescence spectroscopic analysis and/or absorption spectroscopic analysis on a first component contained in a liquid sample by using secondary light generated from the liquid sample irradiated with primary light; a second analysis unit that performs Raman spectroscopic analysis on a second component contained in the liquid sample by using the secondary light generated from the liquid sample irradiated with primary light; a concentration measurement unit that measures the concentration of the first component and the second component contained in the liquid sample; and a control unit. The control unit causes the first analysis unit or the second analysis unit to perform analysis in accordance with the concentration measured by the concentration measurement unit.

IPC Classes  ?

  • G01N 21/65 - Raman scattering
  • G01N 21/17 - Systems in which incident light is modified in accordance with the properties of the material investigated
  • G01N 21/27 - ColourSpectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection
  • G01N 21/64 - FluorescencePhosphorescence

34.

VEHICLE DIAGNOSIS DEVICE, VEHICLE DIAGNOSIS METHOD, AND VEHICLE DIAGNOSIS PROGRAM

      
Application Number JP2023037166
Publication Number 2024/142547
Status In Force
Filing Date 2023-10-13
Publication Date 2024-07-04
Owner HORIBA, LTD. (Japan)
Inventor
  • Shiota Aoi
  • Kawazoe Hiroshi
  • Saito Takashi
  • Tanaka Sayaka
  • Nishikawa Masahiro

Abstract

This vehicle diagnosis device comprises: a feature data acquisition unit for acquiring a plurality of items of feature data included in a prescribed output pattern of a vehicle; a real data acquisition unit for acquiring output data based on real travel by the vehicle in a prescribed period in the past, and real measured data indicating real measured quantities with regard to a parameter required for vehicle diagnosis during travel of the vehicle in the prescribed period; an equivalent pattern generation unit for generating an equivalent output pattern regarded as equivalent to the prescribed output pattern by splicing out, from the output data of the prescribed period, points or segments similar to the plurality of items of feature data; and a real measured quantity extraction unit for extracting the real measured quantities of each of the points or each of the segments included in the equivalent output pattern from the real measured data in the prescribed period.

IPC Classes  ?

  • G01R 31/392 - Determining battery ageing or deterioration, e.g. state of health
  • B60L 3/00 - Electric devices on electrically-propelled vehicles for safety purposesMonitoring operating variables, e.g. speed, deceleration or energy consumption
  • B60L 15/20 - Methods, circuits or devices for controlling the propulsion of electrically-propelled vehicles, e.g. their traction-motor speed, to achieve a desired performanceAdaptation of control equipment on electrically-propelled vehicles for remote actuation from a stationary place, from alternative parts of the vehicle or from alternative vehicles of the same vehicle train for control of the vehicle or its driving motor to achieve a desired performance, e.g. speed, torque, programmed variation of speed
  • B60L 50/60 - Electric propulsion with power supplied within the vehicle using propulsion power supplied by batteries or fuel cells using power supplied by batteries
  • B60L 58/12 - Methods or circuit arrangements for monitoring or controlling batteries or fuel cells, specially adapted for electric vehicles for monitoring or controlling batteries responding to state of charge [SoC]
  • B60L 58/16 - Methods or circuit arrangements for monitoring or controlling batteries or fuel cells, specially adapted for electric vehicles for monitoring or controlling batteries responding to battery ageing, e.g. to the number of charging cycles or the state of health [SoH]
  • F02D 45/00 - Electrical control not provided for in groups
  • G01M 17/007 - Wheeled or endless-tracked vehicles
  • G01R 31/367 - Software therefor, e.g. for battery testing using modelling or look-up tables
  • G01R 31/382 - Arrangements for monitoring battery or accumulator variables, e.g. SoC
  • G01R 31/385 - Arrangements for measuring battery or accumulator variables
  • G01R 31/389 - Measuring internal impedance, internal conductance or related variables
  • H01M 10/42 - Methods or arrangements for servicing or maintenance of secondary cells or secondary half-cells
  • H01M 10/48 - Accumulators combined with arrangements for measuring, testing or indicating the condition of cells, e.g. the level or density of the electrolyte

35.

GAS MEASUREMENT SYSTEM AND GAS MEASUREMENT METHOD

      
Application Number JP2023040601
Publication Number 2024/142622
Status In Force
Filing Date 2023-11-10
Publication Date 2024-07-04
Owner HORIBA, LTD. (Japan)
Inventor
  • Oida Takuji
  • Ishida Kentaro
  • Yokota Yoshihiro
  • Fujiwara Masahiko

Abstract

A gas measurement system comprising a first oxygen concentration sensor which measures, as a first oxygen concentration, the concentration of oxygen in an exhaust gas exhausted from a test specimen on the basis of a pressure difference between the oxygen in the exhaust gas and a first reference gas in which the concentration of oxygen is a first predetermined concentration, a first reference gas supply unit which supplies the first reference gas to the first oxygen concentration sensor, and a calculation unit which calculates an oxygen consumption amount of the test specimen on the basis of a flow amount of the exhaust gas and the first oxygen concentration. The first predetermined concentration of the first reference gas is set within a first predetermined range with respect to the first oxygen concentration.

IPC Classes  ?

  • B60L 58/30 - Methods or circuit arrangements for monitoring or controlling batteries or fuel cells, specially adapted for electric vehicles for monitoring or controlling fuel cells
  • G01N 1/22 - Devices for withdrawing samples in the gaseous state
  • G01N 27/74 - Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables of fluids

36.

ANALYSIS DEVICE, ANALYSIS METHOD, AND PROGRAM

      
Application Number JP2023041258
Publication Number 2024/142652
Status In Force
Filing Date 2023-11-16
Publication Date 2024-07-04
Owner HORIBA, LTD. (Japan)
Inventor
  • Okuda, Tatsuya
  • Otsuka, Gaku
  • Mizumoto, Kazunori
  • Nagasawa, Kenya

Abstract

12111) is inputted, declines to or below a prescribed threshold (Th).

IPC Classes  ?

  • G01N 21/33 - Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using ultraviolet light
  • G01N 21/61 - Non-dispersive gas analysers

37.

SPECTROSCOPIC ANALYSIS DEVICE AND SPECTROSCOPIC ANALYSIS METHOD

      
Application Number JP2023045769
Publication Number 2024/143124
Status In Force
Filing Date 2023-12-20
Publication Date 2024-07-04
Owner HORIBA, LTD. (Japan)
Inventor Wakabayashi, Satoru

Abstract

Provided are a spectroscopic analysis device and a spectroscopic analysis method, whereby the precision of spectroscopic analysis can be enhanced by more accurately performing correction of detection results. The spectroscopic analysis device comprises: an imaging element that has a first region and a second region different from the first region, and detects light that is incident on the first region and the second region; a first optical system that radiates primary light to a sample and causes secondary light generated from the sample to be incident on the first region; a second optical system that causes reference light to be incident on the second region; and an analysis unit that corrects a result of detection of the secondary light incident on the first region, on the basis of a result of detection of the reference light incident on the second region.

IPC Classes  ?

38.

OPTICAL ANALYSIS DEVICE, OPTICAL ANALYSIS METHOD, AND PROGRAM FOR OPTICAL ANALYSIS DEVICE

      
Application Number JP2023026667
Publication Number 2024/134949
Status In Force
Filing Date 2023-07-20
Publication Date 2024-06-27
Owner HORIBA, LTD. (Japan)
Inventor Saito, Takashi

Abstract

Provided is an optical analysis device 1 that analyses a component of interest by leading, to a measuring cell 4, light which has been emitted from a light source 2 and detecting, with a detector, light which has passed through the measuring cell 4, said optical analysis device 1 comprising: a moving mirror 8 that reflects the light emitted from the light source 2 while reciprocating; a moving mechanism 9 that reciprocates the moving mirror 8; a movement control unit 11a that controls the application voltage or application current to the moving mechanism 9; and a cause inference unit 11f that uses actual waveform data, which indicates the application voltage or application current to the moving mechanism 9 at each time, and reference waveform data, which indicates the application voltage or application current to the moving mechanism 9 at each time and which has been obtained in advance, to infer a cause of an anomaly which affects the moving mirror.

IPC Classes  ?

  • G01N 21/35 - Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
  • G01J 3/02 - SpectrometrySpectrophotometryMonochromatorsMeasuring colours Details
  • G01J 3/45 - Interferometric spectrometry
  • G01N 21/45 - RefractivityPhase-affecting properties, e.g. optical path length using interferometric methodsRefractivityPhase-affecting properties, e.g. optical path length using Schlieren methods
  • G02B 26/06 - Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the phase of light

39.

TEST-SUBJECT-TESTING SYSTEM, TEST-SUBJECT-TESTING METHOD, AND TEST-SUBJECT-TESTING PROGRAM

      
Application Number JP2023037562
Publication Number 2024/135072
Status In Force
Filing Date 2023-10-17
Publication Date 2024-06-27
Owner HORIBA, LTD. (Japan)
Inventor Kawazoe, Hiroshi

Abstract

The present invention is a test-subject-testing system that tests a test subject while spraying water droplets in accordance with the velocity of the test subject and recreating rainfall or snowfall, the test-subject-testing system testing a test subject that is a vehicle or a part thereof, the test-subject-testing system comprising: a test device on which the test subject is placed or to which the test subject is connected; a spray unit for spraying water droplets towards the test subject from the surroundings of the test subject; and a changing unit for changing the spray speed, the position, or the angle of the spray unit according to the velocity of the test subject.

IPC Classes  ?

40.

GAS MEASURING SYSTEM, GAS MEASURING METHOD, AND GAS MEASURING PROGRAM

      
Application Number JP2023040600
Publication Number 2024/135153
Status In Force
Filing Date 2023-11-10
Publication Date 2024-06-27
Owner HORIBA, LTD. (Japan)
Inventor
  • Oida Takuji
  • Nakatani Shigeru
  • Ishida Kentaro

Abstract

This gas measuring system comprises: a flowmeter for measuring a flow rate of a gas flowing through a pipe, to acquire flow rate information comprising time-series data; a first gas sensor for measuring a concentration of a prescribed gas component contained in the gas, to acquire first concentration information comprising time-series data; a second gas sensor for measuring the concentration of the prescribed gas component contained in the gas, to acquire second concentration information comprising time-series data; and a computing unit for calculating a time difference between measuring times of the concentrations of the prescribed gas component contained in the gas, on the basis of the first concentration information and the second concentration information, and correcting a time deviation in the first concentration information or the second concentration information with respect to the flow rate information on the basis of the calculated time difference.

IPC Classes  ?

  • G01N 27/26 - Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating electrochemical variablesInvestigating or analysing materials by the use of electric, electrochemical, or magnetic means by using electrolysis or electrophoresis

41.

TEST SPECIMEN TESTING SYSTEM AND TEST SPECIMEN TESTING METHOD

      
Application Number JP2023041298
Publication Number 2024/135178
Status In Force
Filing Date 2023-11-16
Publication Date 2024-06-27
Owner HORIBA, LTD. (Japan)
Inventor Kawazoe, Hiroshi

Abstract

The present invention provides a test specimen testing system 100 for testing a test specimen while reproducing splashing generated from a vehicle traveling at the periphery thereof, the test specimen testing system being used to test a test specimen W, which is a vehicle or part thereof, and comprising: a testing device 2 having the test specimen W installed therein or connected thereto; and a splash simulating device 3 for simulating splashing from another vehicle.

IPC Classes  ?

42.

SPECTROSCOPIC ANALYSIS DEVICE, SPECTROSCOPIC ANALYSIS METHOD, SPECTROSCOPIC ANALYSIS PROGRAM, LEARNING DEVICE, LEARNING METHOD, AND LEARNING PROGRAM

      
Application Number JP2023043717
Publication Number 2024/135369
Status In Force
Filing Date 2023-12-06
Publication Date 2024-06-27
Owner HORIBA, LTD. (Japan)
Inventor
  • Saito, Takashi
  • Gyoten, Yuji
  • Nishimura, Katsumi

Abstract

The present invention provides a spectroscopic analysis device with which a concentration of a measurement target component is measured accurately from a measured spectrum without obtaining a calibration curve for each spectroscopic analysis device, the spectroscopic analysis device comprising: a spectrum generating unit 51 for generating a spectrum of light that has been transmitted through a sample; a storage unit 52 for storing a standard calibration curve created by a standard device 200 and a standard spectrum generated by the standard device 200, the standard spectrum serving as a standard for the spectroscopic analysis device; a correcting unit 53 for correcting either a measured spectrum, which is the spectrum of the sample generated by the spectrum generating unit 51, or the standard calibration curve, on the basis of a comparison result between a reference spectrum, which is a spectrum of a standard gas, generated by the spectrum generating unit 51, and the standard spectrum; and a concentration calculating unit 54 for calculating the concentration of the measurement target component on the basis of either the standard calibration curve and the corrected measured spectrum, or the corrected standard calibration curve and the measured spectrum.

IPC Classes  ?

  • G01N 21/27 - ColourSpectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection

43.

EQUIPMENT FOR CALIBRATING PARTICLE COUNT MEASUREMENT DEVICE, CALIBRATION PROGRAM, METHOD FOR DETERMINING PARTICLE SIZE FOR CALIBRATION, AND METHOD FOR CALIBRATING PARTICLE COUNT MEASUREMENT DEVICE

      
Application Number JP2023044809
Publication Number 2024/135520
Status In Force
Filing Date 2023-12-14
Publication Date 2024-06-27
Owner
  • NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY (Japan)
  • HORIBA, LTD. (Japan)
Inventor
  • Kojima Kentarou
  • Murashima Yoshiko
  • Sakurai Hiromu

Abstract

Provided are equipment for calibrating a particle count measurement device, a calibration program, a method for determining particle size for calibration, and a method for calibrating a particle count measurement device with which it is possible to reduce the effect of a post-classification particle size change and perform a more accurate calibration. The calibration equipment 1 is provided with: a particle generation unit 10; an input unit 51; a particle classification unit 20; a particle-sensing unit 30; a computation unit 52 that obtains, on the basis of the particle size distribution of the particles at the particle-sensing unit 30a or a physical quantity factor that causes a change in the particle size at the particle-sensing unit 30, a degree of change by which the particle size of particles arriving at the particle-sensing unit 30 has changed from a target particle size, and calculates, on the basis of the degree of change, a corrective amount for the particle size extracted by the particle classification unit 20 such that the particle size arriving at the particle-sensing unit 30 matches the target particle size; and a correction command unit 53 for issuing, on the basis of the corrective amount calculated by the computation unit 52, a command to the particle classification unit 20 so as to change the particle size of the particles extracted by the particle classification unit 20 to a particle size for calibration.

IPC Classes  ?

  • G01N 15/02 - Investigating particle size or size distribution

44.

MEASUREMENT DEVICE MANAGEMENT APPARATUS, MANAGEMENT METHOD, MANAGEMENT PROGRAM, AND MANAGEMENT SYSTEM

      
Application Number JP2023044863
Publication Number 2024/135532
Status In Force
Filing Date 2023-12-14
Publication Date 2024-06-27
Owner HORIBA, LTD. (Japan)
Inventor
  • Nakane Ikuya
  • Sakuta Hiromichi
  • Nishimori Masashi
  • Nakajima Kyosuke

Abstract

This measurement device management apparatus comprises a data reception unit that accepts, from a measurement device, data concerning recording of at least one of a first action after input of power to the measurement device and a second action prior to shut-down of operation of the measurement device, and a report creation unit that creates a report including a predetermined period of the data accepted by the data reception unit.

IPC Classes  ?

  • G16H 40/40 - ICT specially adapted for the management or administration of healthcare resources or facilitiesICT specially adapted for the management or operation of medical equipment or devices for the management of medical equipment or devices, e.g. scheduling maintenance or upgrades
  • G01N 35/00 - Automatic analysis not limited to methods or materials provided for in any single one of groups Handling materials therefor
  • G06Q 10/20 - Administration of product repair or maintenance

45.

VEHICLE TEST SYSTEM, VEHICLE TEST SYSTEM CABLE, AND VEHICLE TEST METHOD

      
Application Number JP2023043705
Publication Number 2024/128100
Status In Force
Filing Date 2023-12-06
Publication Date 2024-06-20
Owner HORIBA, LTD. (Japan)
Inventor Togawa, Susumu

Abstract

A vehicle test system 100 for testing a product X under test, which is a vehicle or part thereof, the vehicle test system including a test unit 10 that is provided in one of the inside or outside of the product X under test, a control unit 20 that is provided in the other of the inside or outside of the product X under test and controls the test unit 10, a cable 30 that connects the test unit 10 and control unit 20 and has a shielding layer 43 for noise shielding, and a leakage detection circuit 50 connected to the shielding layer 43.

IPC Classes  ?

  • G01R 31/58 - Testing of lines, cables or conductors
  • G01R 31/52 - Testing for short-circuits, leakage current or ground faults

46.

BATTERY EVALUATION DEVICE, MACHINE LEARNING DEVICE, BATTERY EVALUATION PROGRAM, BATTERY EVALUATION METHOD, MACHINE LEARNING PROGRAM, AND MACHINE LEARNING METHOD

      
Application Number JP2023044163
Publication Number 2024/128174
Status In Force
Filing Date 2023-12-11
Publication Date 2024-06-20
Owner HORIBA, LTD. (Japan)
Inventor
  • Ding, Li
  • Saito, Takashi
  • Yabushita, Hirotaka
  • Hirose, Jun

Abstract

The present invention makes it possible to accurately calculate the degradation state of a battery from EIS data of the battery, and comprises: a correlation data storage unit that stores correlation data indicating the correlation between DRT data related to relaxation time distribution obtained from EIS data of batteries and degradation states of the batteries; a DRT data acquisition unit that acquires DRT data of an EUT battery being evaluated; and a degradation state calculation unit that calculates the degradation state of the EUT battery on the basis of the DRT data acquired by the DRT data acquisition unit and the correlation data.

IPC Classes  ?

  • G01R 31/392 - Determining battery ageing or deterioration, e.g. state of health
  • G01R 31/367 - Software therefor, e.g. for battery testing using modelling or look-up tables
  • G01R 31/389 - Measuring internal impedance, internal conductance or related variables
  • H01M 10/42 - Methods or arrangements for servicing or maintenance of secondary cells or secondary half-cells
  • H01M 10/48 - Accumulators combined with arrangements for measuring, testing or indicating the condition of cells, e.g. the level or density of the electrolyte
  • H02J 7/00 - Circuit arrangements for charging or depolarising batteries or for supplying loads from batteries

47.

ANALYSIS DEVICE, MACHINE LEARNING DEVICE, CALCULATION DEVICE, ANALYSIS METHOD, AND ANALYSIS PROGRAM

      
Application Number JP2023042471
Publication Number 2024/127968
Status In Force
Filing Date 2023-11-28
Publication Date 2024-06-20
Owner HORIBA, LTD. (Japan)
Inventor
  • Gyoten, Yuji
  • Saito, Takashi

Abstract

The present invention highly accurately estimates the concentration of a measurement target component included in a measurement sample. The present invention comprises: a measurement sensor that measures a measurement sample and outputs a sensor signal; a correlation data storage unit that stores first correlation data and second correlation data which indicate a correlation between the concentration of the measurement target component included in the measurement sample and the sensor signal or a feature amount determined by the sensor signal and which differ from each other; a first concentration calculation unit that calculates a first concentration of the measurement target component on the basis of the first correlation data and of the sensor signal or the feature amount; a second concentration calculation unit that calculates a second concentration of the measurement target component on the basis of the second correlation data and of the sensor signal or the feature amount; and a third concentration calculation unit that synthesizes a prescribed frequency component of the first concentration and a prescribed frequency component of the second concentration and calculates a third concentration of the measurement target component.

IPC Classes  ?

  • G01N 21/3504 - Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing gases, e.g. multi-gas analysis

48.

SIGNAL PROCESSING METHOD, SIGNAL PROCESSING DEVICE, RADIATION DETECTING DEVICE, AND COMPUTER PROGRAM

      
Application Number JP2023044958
Publication Number 2024/128301
Status In Force
Filing Date 2023-12-15
Publication Date 2024-06-20
Owner HORIBA, LTD. (Japan)
Inventor
  • Murata, Shunsuke
  • Valiev, Ildar

Abstract

Provided are a signal processing method, a signal processing device, a radiation detecting device, and a computer program for obtaining an accurate radiation spectrum in a stable manner. The signal processing method involves: measuring a slope of a non-response line, which is a part, other than a staircase wave generated in response to radiation detection, included in a signal that includes the staircase wave; measuring a wave height of the staircase wave; and correcting the wave height in accordance with the slope.

IPC Classes  ?

  • G01T 1/17 - Circuit arrangements not adapted to a particular type of detector
  • G01T 1/36 - Measuring spectral distribution of X-rays or of nuclear radiation

49.

MEASUREMENT METHOD, MEASUREMENT SYSTEM AND TEST REAGENT KIT

      
Application Number JP2023035443
Publication Number 2024/095648
Status In Force
Filing Date 2023-09-28
Publication Date 2024-05-10
Owner
  • HORIBA, LTD. (Japan)
  • HORIBA ABX SAS (France)
Inventor
  • Manio Mark Christian Carizon
  • Nishimura Tanikawa Jun Ivan
  • Igushi Tatsuo
  • Donnarumma Dario

Abstract

A measurement method for determining the concentration of reticulocytes or nucleated red blood cells contained in a blood specimen, the measurement method including a staining step, a removal step and a measurement step. In the staining step, reticulocytes or nucleated red blood cells, among red blood cells contained in the blood specimen, are stained. In the removal step, a surfactant is added to the blood specimen to take out hemoglobin from the red blood cells. In the measurement step, the concentration of the reticulocytes or nucleated red blood cells contained in the blood specimen is determined using the blood specimen after the staining and removal steps.

IPC Classes  ?

  • G01N 33/49 - Physical analysis of biological material of liquid biological material blood

50.

ANALYSIS DEVICE, METHOD FOR DRIVING LASER ELEMENT, AND ANALYSIS METHOD

      
Application Number JP2023032392
Publication Number 2024/090042
Status In Force
Filing Date 2023-09-05
Publication Date 2024-05-02
Owner HORIBA, LTD. (Japan)
Inventor
  • Terakado, Tomoji
  • Adachi, Masayuki
  • Nakatani, Shigeru

Abstract

The present invention provides a high performance analysis device while utilizing a laser element that oscillates in a plurality of longitudinal modes. This analysis device comprises a laser element 31 that irradiates a sample with laser light L1, a drive unit 4 that drives the laser element 31, and a photodetector 5 that detects the laser light L1 that has passed through the sample. The laser element 31 oscillates in a plurality of longitudinal modes to emit the laser light L1 having a plurality of oscillation wavelengths. The drive unit 4 pulses the laser element 31 and causes the laser element 31 to sweep through the plurality of oscillation wavelengths for each pulse.

IPC Classes  ?

  • G01N 21/39 - Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using tunable lasers

51.

INSPECTION DEVICE, INSPECTION METHOD, AND INSPECTION PROGRAM

      
Application Number JP2023035235
Publication Number 2024/090109
Status In Force
Filing Date 2023-09-27
Publication Date 2024-05-02
Owner HORIBA, LTD. (Japan)
Inventor
  • Someya, Shota
  • Iida, Hiroshi
  • Kanzaki, Toyoki
  • Nakagawa, Kazuya

Abstract

The present invention comprises: a light irradiation unit 2 that irradiates a light-transmissive and film-like test object W with inspection light L1; a scattered light detection unit 3 for detecting scattered light L2 which is produced from the test object W; a diffracted light detection section 4 for detecting diffracted light L3 which is produced from the test object W; and a signal processing unit 5 that determines, on the basis of a scattered light intensity signal from the scattered light detection unit 3 and a diffracted light intensity signal from the diffracted light detection unit 4, the presence or absence of foreign matter S which has adhered to the test object W and the presence or absence of a pinhole P which has been formed in the test object W.

IPC Classes  ?

  • G03F 1/62 - Pellicles or pellicle assemblies, e.g. having membrane on support framePreparation thereof
  • G01N 21/894 - Pinholes

52.

BATTERY PERFORMANCE ESTIMATION METHOD, BATTERY PERFORMANCE ESTIMATION DEVICE, AND BATTERY PERFORMANCE ESTIMATION PROGRAM

      
Application Number JP2023035784
Publication Number 2024/080171
Status In Force
Filing Date 2023-09-29
Publication Date 2024-04-18
Owner HORIBA, LTD. (Japan)
Inventor Yoshida, Kotaro

Abstract

According to the present invention, the performance of a battery manufactured using carbon as a negative electrode active material is estimated with high accuracy from the physical properties of the carbon. A method for estimating the performance of a battery manufactured using carbon as a negative electrode active material from the physical properties of the carbon is characterized in that the performance of the battery is estimated using a machine learning model obtained on the basis of training data including the following physical properties (a) and (b) of carbon, and values related to the battery performance measured for the battery manufactured using the carbon as the negative electrode active material. (a) The ratio (ID/IG) of the peak top intensity (ID) of the D band calculated from the Raman spectrum to the peak top intensity (IG) of the G band or a value relating to the ratio (b) The width of the G band calculated from the Raman spectrum or a value relating to the width

IPC Classes  ?

  • H01M 10/48 - Accumulators combined with arrangements for measuring, testing or indicating the condition of cells, e.g. the level or density of the electrolyte
  • G01R 31/367 - Software therefor, e.g. for battery testing using modelling or look-up tables
  • G01R 31/382 - Arrangements for monitoring battery or accumulator variables, e.g. SoC
  • G01R 31/385 - Arrangements for measuring battery or accumulator variables
  • G01R 31/387 - Determining ampere-hour charge capacity or SoC
  • H02J 7/00 - Circuit arrangements for charging or depolarising batteries or for supplying loads from batteries

53.

RADIATION DETECTION ELEMENT, RADIATION DETECTOR, AND RADIATION DETECTION DEVICE

      
Application Number JP2023033568
Publication Number 2024/070737
Status In Force
Filing Date 2023-09-14
Publication Date 2024-04-04
Owner HORIBA, LTD. (Japan)
Inventor
  • Ishikura, Koji
  • Okubo, Yuji
  • Matsunaga, Daisuke

Abstract

Provided are a radiation detection element, a radiation detector, and a radiation detection device with which it is possible to increase a sensitive region. This radiation detection element comprises: a semiconductor part having an incident surface on which radiation is incident; a first electrode which is provided on a surface on the rear side of the incident surface, and into which charges, generated inside the semiconductor part by the incidence of radiation, flow; and a second electrode which is disposed on the incident surface and positioned on the rear side of the first electrode, and to which a voltage required for the inflow of the charges to the first electrode, wherein the radiation detection element includes a third electrode provided on the incident surface and disposed at a position surrounding the second electrode, the third electrode is electrically connected to the second electrode, and a voltage is applied across the second electrode and the third electrode such that the potential changes from the third electrode to the second electrode.

IPC Classes  ?

  • G01T 1/24 - Measuring radiation intensity with semiconductor detectors

54.

TEST SPECIMEN TESTING SYSTEM, TEST SPECIMEN TESTING METHOD, AND TEST SPECIMEN TESTING PROGRAM

      
Application Number JP2023034178
Publication Number 2024/070865
Status In Force
Filing Date 2023-09-21
Publication Date 2024-04-04
Owner HORIBA, LTD. (Japan)
Inventor
  • Komatsu, Yoji
  • Yoshinaka, Yuji
  • Koyama, Satoshi

Abstract

The objective of the present invention is to reduce the number of man-hours required for testing a vehicle that includes an automated driving system or an advanced driving assistance system, and to enable a development period for the same to be reduced, and to this end, the present invention provides a test specimen testing system 100 for testing a test specimen W, which is a vehicle including an ADAS or an AD, or a portion of said vehicle, the test specimen testing system 100 comprising a dynamometer 2 for causing the test specimen W to run in a simulated manner, an ambient environment input device 3 for inputting an ambient environment to the test piece W, and an automated driving robot 4 for performing a brake operation, an accelerator operation, or a steering wheel operation of the test specimen W, wherein, on the basis of an input from the ambient environment input device 3, the automated driving robot 4 causes an active running state in which the test specimen W runs actively by means of the ADAS or the AD, and a passive running state in which the test specimen W runs passively by means of the brake operation, the accelerator operation or the steering wheel operation, to be linked together.

IPC Classes  ?

55.

FLUORESCENCE ANALYSIS CELL, FLUORESCENCE ANALYSIS DEVICE, FLUORESCENCE ANALYSIS METHOD, AND METHOD FOR MANUFACTURING CELL TO BE SUBJECTED TO ANALYSIS

      
Application Number JP2023030431
Publication Number 2024/062833
Status In Force
Filing Date 2023-08-24
Publication Date 2024-03-28
Owner HORIBA, LTD. (Japan)
Inventor
  • Kitagawa, Yuichi
  • Higuchi,seiji
  • Mimura, Susumu

Abstract

Provided is a fluorescence analysis cell 10 for use in fluorescence analysis on a liquid X of interest, the fluorescence analysis cell 10 comprising a pair of translucent portions 11a, 11b opposed to each other with an internal space containing the liquid X of interest therebetween and a spacer portion 12 provided to surround the internal space so that the distance between opposed surfaces 111a, 111b of the pair of translucent portions 11a, 11b is 500 nm to 1 mm inclusive.

IPC Classes  ?

56.

SAMPLE INSERTING DEVICE, SAMPLE INSERTING SYSTEM, PARTICLE SIZE DISTRIBUTION MEASUREMENT SYSTEM, AND SAMPLE INSERTING METHOD

      
Application Number JP2023032788
Publication Number 2024/058063
Status In Force
Filing Date 2023-09-08
Publication Date 2024-03-21
Owner HORIBA, LTD. (Japan)
Inventor Tatewaki, Yasuhiro

Abstract

The present invention provides a sample inserting device for automating the insertion of a powder sample into a sample introduction unit of a particle size distribution measuring device, while performing the insertion reliably, the sample inserting device comprising: a movement mechanism 31 for causing a holding tube 41, which is capable of holding a powder sample S in a tip end opening portion 41x, to move between a collecting position P at which the tip end opening portion 41x is inserted into the powder sample S in a sample container 10 to collect the powder sample S, and an insertion position Q for inserting the powder sample S into the sample introduction unit 21; and a pushing out mechanism 32 which, in a state in which the holding tube 41 is at the insertion position Q, pushes the powder sample S held in the tip end opening portion 41x from the tip end opening portion 41x to the outside.

IPC Classes  ?

  • G01N 1/00 - SamplingPreparing specimens for investigation
  • G01N 15/02 - Investigating particle size or size distribution

57.

ANALYSIS SYSTEM AND ANALYSIS METHOD

      
Application Number JP2023029084
Publication Number 2024/053328
Status In Force
Filing Date 2023-08-09
Publication Date 2024-03-14
Owner HORIBA, LTD. (Japan)
Inventor
  • Matsumoto, Erika
  • Sando, Shota
  • Hirose, Jun

Abstract

The present invention chronologically monitors the environment within a prescribed facility at short time intervals. This analysis system (100) comprises a data acquisition unit (1) and an analysis unit (35). The data acquisition unit (1) collects, at prescribed intervals, particulate matter that is present within a prescribed facility, and calculates chronological data (RD) relating to the collected particulate matter. The analysis unit (35) acquires, on the basis of the data (RD) relating to the particulate matter calculated by the data acquisition unit (1), environment information relating to the environment within the prescribed facility. The data (RD) relating to the particulate matter includes element data relating to elements contained in the particulate matter.

IPC Classes  ?

  • G01N 15/00 - Investigating characteristics of particlesInvestigating permeability, pore-volume or surface-area of porous materials
  • G01N 15/10 - Investigating individual particles
  • G01N 23/02 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by transmitting the radiation through the material
  • G01N 23/2206 - Combination of two or more measurements, at least one measurement being that of secondary emission, e.g. combination of secondary electron [SE] measurement and back-scattered electron [BSE] measurement
  • G01N 23/223 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
  • G01N 1/02 - Devices for withdrawing samples

58.

VERIFICATION-CYCLE GENERATION METHOD, VERIFICATION-CYCLE GENERATION SYSTEM, AND VERIFICATION-CYCLE GENERATION PROGRAM

      
Application Number JP2023024823
Publication Number 2024/029257
Status In Force
Filing Date 2023-07-04
Publication Date 2024-02-08
Owner HORIBA, LTD. (Japan)
Inventor
  • Bates, Luke
  • Tabata, Kunio
  • Roberts, Philip
  • Whelan, Steven

Abstract

The present invention is a verification-cycle generation method for generating a verification cycle for automobile development, the verification cycle being realistic and satisfying boundary conditions for a plurality of automobiles, wherein a plurality of data sets concerning a driving cycle are input, the plurality of data sets are individually clustered and classified into a plurality of data groups, a plurality of verification cycles concerning automobile development are generated on the basis of the plurality of clustered data groups, each of the plurality of verification cycles is executed through simulation or with a real automobile, and a representative cycle, which best satisfies a criterion defined by a user, is selected from among the plurality of verification cycles.

IPC Classes  ?

59.

GAS ANALYZING DEVICE

      
Application Number JP2023026187
Publication Number 2024/019029
Status In Force
Filing Date 2023-07-18
Publication Date 2024-01-25
Owner HORIBA, LTD. (Japan)
Inventor
  • Nishimura, Katsumi
  • Nakatani, Shigeru

Abstract

The present invention is provided with: a multi-reflection cell 30 into which sample gas comprising a plurality of components is introduced; a first analyzing mechanism 10 that causes first light to enter the multi-reflection cell 30, that detects the first light passed through the multi-reflection cell 30, and that analyzes the components of the sample gas according to a first principle; and a second analyzing mechanism 20 that causes second light to enter the multi-reflection cell 30, that detects the second light passed through the multi-reflection cell, and that analyzes the components of the sample gas according to a second principle, which is different from the first principle.

IPC Classes  ?

  • G01J 3/02 - SpectrometrySpectrophotometryMonochromatorsMeasuring colours Details
  • G01N 21/3504 - Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing gases, e.g. multi-gas analysis
  • G01N 21/61 - Non-dispersive gas analysers

60.

GAS ANALYZING DEVICE, PRESSURE CONTROL METHOD, AND PROGRAM

      
Application Number JP2023021331
Publication Number 2024/009680
Status In Force
Filing Date 2023-06-08
Publication Date 2024-01-11
Owner HORIBA, LTD. (Japan)
Inventor
  • Nagasawa, Kenya
  • Yamada, Ryusuke
  • Mizumoto, Kazunori

Abstract

The objective of the present invention is to suppress pressure variations in a reaction unit. A gas analyzing device (100) comprises a reaction unit (1), an evacuating unit (3), a first gas line (L1), a pressure control unit (5), a pressure measuring unit (7), and a control unit (9). The reaction unit (1) causes an analysis target gas to interact with a luminescence-inducing gas. The evacuating unit (3) evacuates the reaction unit (1). The first gas line (L1) connects the reaction unit (1) and the evacuating unit (3). The pressure control unit (5) is connected to the first gas line (L1) and is capable of introducing an external gas into the first gas line (L1), and controls the pressure in the reaction unit (1) by controlling a flow rate of the gas introduced into the first gas line (L1). The pressure measuring unit (7) measures the absolute pressure in the reaction unit (1). The control unit (9) controls the pressure control unit (5) on the basis of the absolute pressure in the reaction unit (1) measured by the pressure control unit (7), thereby controlling the flow rate of the gas introduced into the first gas line (L1) such that the pressure in the reaction unit (1) is a predetermined pressure.

IPC Classes  ?

  • G01N 1/00 - SamplingPreparing specimens for investigation
  • G01N 21/76 - ChemiluminescenceBioluminescence

61.

GAS ANALYSIS DEVICE, GAS ANALYSIS METHOD, AND PROGRAM

      
Application Number JP2023021332
Publication Number 2024/009681
Status In Force
Filing Date 2023-06-08
Publication Date 2024-01-11
Owner HORIBA, LTD. (Japan)
Inventor
  • Mizumoto, Kazunori
  • Kagawa, Akifumi

Abstract

The present invention reduces the frequency of maintenance of a gas analysis device. A gas analysis device (100) comprises: a cell (1); a light source (3); a detection unit (5); and a control unit (7). The cell (1) has a sample gas (SG) introduced thereinto. The light source (3) emits measurement light (L1) onto the cell (1) at prescribed light-emitting intervals (T). The detection unit (5) detects light (L2) generated by causing the measurement light (L1) to enter the cell (1). The control unit (7) controls the gas analysis device (100). The control unit (7) changes the light-emitting interval (T) for the measurement light (L1) in accordance with the concentration of a gas to be analyzed which is included in the sample gas (SG).

IPC Classes  ?

  • G01N 21/64 - FluorescencePhosphorescence
  • G01N 21/33 - Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using ultraviolet light

62.

THICKNESS MEASUREMENT METHOD, X-RAY ANALYSIS DEVICE, INFORMATION PROCESSING DEVICE, AND COMPUTER PROGRAM

      
Application Number JP2023023772
Publication Number 2024/005006
Status In Force
Filing Date 2023-06-27
Publication Date 2024-01-04
Owner HORIBA, LTD. (Japan)
Inventor
  • Miyamoto, Shohei
  • Ohashi, Satoshi
  • Aoyama, Tomoki
  • Hirose, Jun

Abstract

Provided are a thickness measurement method, an X-ray analysis device, an information processing device, and a computer program, with which it is possible to measure the thickness of each layer of a multilayer material that heretofore has been difficult to measure. In this thickness measurement method, a material that includes a plurality of layers is irradiated with X-rays such that the X-rays pass through the plurality of layers; fluorescence X-rays generated from the material are detected; transmitted X-rays that have passed through the material are detected; a first relational expression and a second relational expression are created, the first relational expression representing the relationship between the intensity of the detected transmitted X-rays and the thickness of each layer, the second relational expression representing the relationship between the ratio between the theoretical intensities of the fluorescence X-rays and the transmitted X-rays and the ratio between the intensities of the fluorescence X-rays and the transmitted X-rays having been detected, the theoretical intensities being in accordance with the thickness of each layer; and a thickness is calculated for each layer so that the thickness satisfies both the first relational expression and the second relational expression at the same time.

IPC Classes  ?

  • G01B 15/02 - Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness
  • G01N 23/087 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by transmitting the radiation through the material and measuring the absorption the radiation being X-rays using polyenergetic X-rays
  • G01N 23/223 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence

63.

THICKNESS MEASURING METHOD, X-RAY ANALYSIS DEVICE, INFORMATION PROCESSING DEVICE, AND COMPUTER PROGRAM

      
Application Number JP2023023738
Publication Number 2024/004990
Status In Force
Filing Date 2023-06-27
Publication Date 2024-01-04
Owner HORIBA, LTD. (Japan)
Inventor
  • Ohashi, Satoshi
  • Miyamoto, Shohei
  • Aoyama, Tomoki
  • Miyasaka, Shintaro
  • Nagura, Makoto
  • Hirose, Jun
  • Matsunaga, Daisuke

Abstract

Provided are a thickness measuring method, an X-ray analysis device, an information processing device, and a computer program that can measure the thicknesses of more multilayer samples as compared to conventional means. This thickness measuring method comprises: irradiating a sample including a first layer and a second layer which are laminated, with X-rays such that the X-rays transmit through the first layer and the second layer in the stated order; detecting fluorescent X-rays generated from the first layer; detecting transmitting X-rays that have transmitted through the sample; identifying the density of the first layer and the absorption coefficient of X-rays at the first layer through elementary analysis based on the fluorescent X-rays; and calculating the thickness of the first layer on the basis of the absorption coefficient and the density, and the intensities of the transmitting X-rays at two different energies.

IPC Classes  ?

  • G01B 15/02 - Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness
  • G01N 23/087 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by transmitting the radiation through the material and measuring the absorption the radiation being X-rays using polyenergetic X-rays
  • G01N 23/223 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence

64.

GAS CONTINUOUS ANALYSIS SYSTEM, AND GAS CONTINUOUS ANALYSIS METHOD

      
Application Number JP2023021728
Publication Number 2023/243598
Status In Force
Filing Date 2023-06-12
Publication Date 2023-12-21
Owner HORIBA, LTD. (Japan)
Inventor
  • Tachibana, Kohei
  • Ido, Takuya
  • Ishizaki, Yukihiro
  • Tsukatani, Kosuke
  • Nakamura, Keishi

Abstract

The present invention reduces time for calibration or validation of an analyzer for analyzing a sample gas containing an adsorbable component, and comprises a main flow passage through which the sample gas containing the adsorbable component flows, an analyzer for analyzing the adsorbable component in the sample gas flowing through the main flow passage, a reference gas flow passage for supplying a reference gas for performing calibration or validation of the analyzer, and a purge gas flow passage for supplying a purge gas containing moisture to the analyzer, wherein: the sample gas is introduced into the main flow path, and the sample gas is continuously analyzed by the analyzer; midway through the continuous analysis the purge gas is supplied to the analyzer from the purge gas flow passage to purge the analyzer; and then the reference gas is supplied to the analyzer from the reference gas flow passage and the analyzer is calibrated or validated.

IPC Classes  ?

  • G01N 1/22 - Devices for withdrawing samples in the gaseous state
  • G01N 1/00 - SamplingPreparing specimens for investigation
  • G01N 30/04 - Preparation or injection of sample to be analysed

65.

RADIATION DETECTION DEVICE, INFORMATION PROCESSING METHOD, AND COMPUTER PROGRAM

      
Application Number JP2023019420
Publication Number 2023/234154
Status In Force
Filing Date 2023-05-25
Publication Date 2023-12-07
Owner HORIBA, LTD. (Japan)
Inventor
  • Matsunaga, Daisuke
  • Aoyama, Tomoki

Abstract

Provided are a radiation detection device in which malfunctioning of the radiation detection device can be suppressed, an information processing method, and a computer program. The radiation detection device comprises an illumination unit that turns on to illuminate a sample, a radiation detection element for detecting radiation generated from the sample, a voltage application unit that applies a voltage to the radiation detection element, and a control unit. The control unit, after causing the voltage application unit to stop voltage application to the radiation detection element, turns on the illumination unit, and, after turning off the illumination unit, causes the voltage application unit to start voltage application to the radiation detection element.

IPC Classes  ?

  • G01T 1/36 - Measuring spectral distribution of X-rays or of nuclear radiation
  • G01T 7/00 - Details of radiation-measuring instruments
  • G01N 23/223 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
  • G01N 23/2252 - Measuring emitted X-rays, e.g. electron probe microanalysis [EPMA]

66.

RADIATION DETECTION DEVICE, CONTROL METHOD, AND COMPUTER PROGRAM

      
Application Number JP2023019416
Publication Number 2023/234153
Status In Force
Filing Date 2023-05-25
Publication Date 2023-12-07
Owner HORIBA, LTD. (Japan)
Inventor
  • Matsunaga, Daisuke
  • Aoyama, Tomoki

Abstract

Provided are a radiation detection device, a control method, and a computer program which make it possible to suppress failure of a radiation detector. This radiation detection device comprises: a sample chamber which can be opened and closed and inside of which a sample is to be disposed; a radiation detector which is disposed inside the sample chamber and which detects radiation generated from the sample; an atmosphere adjustment unit which makes atmosphere adjustment for reducing the pressure inside the sample chamber in a closed state or filling the inside with a specific gas and which introduces air outside the sample chamber into the inside of the sample chamber in a state where atmosphere adjustment has been made; and a control unit. The radiation detector has: a radiation detection element; a temperature adjustment unit for adjusting the temperature of the radiation detection element; and a temperature sensor for measuring the temperature of the inside of the radiation detector. The control unit, on the basis of the temperature measured by the temperature sensor, controls the atmosphere adjustment unit so as to adjust a timing for introducing air outside the sample chamber into the inside of the sample chamber.

IPC Classes  ?

  • G01T 1/17 - Circuit arrangements not adapted to a particular type of detector
  • G01T 1/24 - Measuring radiation intensity with semiconductor detectors
  • G01T 7/00 - Details of radiation-measuring instruments
  • G01N 23/223 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
  • G01N 23/2252 - Measuring emitted X-rays, e.g. electron probe microanalysis [EPMA]

67.

MACHINE LEARNING DEVICE, VEHICLE TESTING SYSTEM, MACHINE LEARNING METHOD, AND VEHICLE TESTING METHOD

      
Application Number JP2023018105
Publication Number 2023/228795
Status In Force
Filing Date 2023-05-15
Publication Date 2023-11-30
Owner HORIBA, LTD. (Japan)
Inventor
  • Komatsu, Yoji
  • Nagaoka, Makoto

Abstract

The present invention simplifies the reproduction of loads such as road gradient resistance when traveling on an actual road, and comprises: a training data acquisition unit 51 that acquires training data comprising load data including the amount of fluctuation in travel resistance due to vehicle behavior and road gradient resistance of the travel route, and vehicle travel data including the vehicle speed, amount of accelerator pedal operation, and amount of brake pedal operation when the vehicle traveled on the travel route; and a machine learning unit 52 that machine learns correlations between the load data and the vehicle travel data, and generates a simulated gradient prediction model that shows the correlations between the load data and the vehicle travel data.

IPC Classes  ?

68.

VEHICLE-MOUNTED DRAIN SEPARATOR, AND VEHICLE-MOUNTED EXHAUST GAS ANALYSIS DEVICE

      
Application Number JP2023013691
Publication Number 2023/218795
Status In Force
Filing Date 2023-03-31
Publication Date 2023-11-16
Owner HORIBA, LTD. (Japan)
Inventor
  • Sato, Miho
  • Onda, Yoshihisa

Abstract

A vehicle-mounted drain separator 100 used in a vehicle-mounted exhaust gas analysis device 200, the vehicle-mounted drain separator 100 comprising: an exhaust gas flow path EL through which exhaust gas flows; and a dilution air flow path AL through which air drawn in from the exterior in order to dilute the exhaust gas flows, the dilution air flow path AL converging with the exhaust gas flow path EL at a convergence point CP provided at a downstream end section. The vehicle-mounted drain separator 100 is configured such that heat exchange is performed between the exhaust gas flowing through the exhaust gas flow path EL and the air flowing through the dilution air flow path AL at least at a location upstream from the convergence point CP.

IPC Classes  ?

  • G01N 1/22 - Devices for withdrawing samples in the gaseous state
  • G01M 15/10 - Testing internal-combustion engines by monitoring exhaust gases

69.

INFRARED GAS ANALYZER, AND INFRARED GAS ANALYSIS METHOD

      
Application Number JP2023016587
Publication Number 2023/218983
Status In Force
Filing Date 2023-04-27
Publication Date 2023-11-16
Owner HORIBA, LTD. (Japan)
Inventor
  • Sakakura, Seiji
  • Imamura, Yuki

Abstract

The present invention provides an infrared gas analyzer with which running costs are reduced by eliminating the need for a catalyst, which is a consumable, the infrared gas analyzer comprising: a measuring cell 2 into which a sample gas is introduced; an infrared light source 3 for emitting infrared light into the measuring cell 2; an infrared detector 4 for detecting infrared light that has been transmitted through the measuring cell 2; and a gas filter 5 filled with a plurality of interference components that interfere with a measurement component in the sample gas.

IPC Classes  ?

  • G01N 21/3504 - Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing gases, e.g. multi-gas analysis

70.

CONVEYANCE DEVICE, ANALYSIS SYSTEM, PROGRAM FOR CONVEYANCE DEVICE, AND CONVEYANCE METHOD

      
Application Number JP2023013580
Publication Number 2023/210259
Status In Force
Filing Date 2023-03-31
Publication Date 2023-11-02
Owner HORIBA, LTD. (Japan)
Inventor
  • Tatewaki, Yasuhiro
  • Mori, Tetsuya

Abstract

In order to provide a conveyance device that is more convenient than a conventional device, and to further improve workability, the conveyance device 102 which conveys containers Z having stored therein samples to an analyzer 101 is configured to comprise: a pallet 10 provided with a plurality of installation places 11 in which the containers Z are installed; sensors 20 that are provided corresponding to the respective installation places 11 and that acquire container information obtained upon installation of the containers Z; a conveyance means 30 for picking up the containers Z installed in the pallet 10 and for conveying the containers to the analyzer 101; and a conveyance control unit 42 that causes the conveyance means 30 to pick up the containers in a picking-up order determined on the basis of the container information.

IPC Classes  ?

  • G01N 35/04 - Details of the conveyor system
  • G01N 35/02 - Automatic analysis not limited to methods or materials provided for in any single one of groups Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations

71.

RADIATION DETECTION DEVICE AND RADIATION DETECTOR

      
Application Number JP2023016267
Publication Number 2023/210633
Status In Force
Filing Date 2023-04-25
Publication Date 2023-11-02
Owner HORIBA, LTD. (Japan)
Inventor
  • Matsunaga, Daisuke
  • Minowa, Hiroki

Abstract

Provided are a radiation detection device and a radiation detector that keep photoelectrons and illumination light from entering a radiation detection element therein. This radiation detection device comprises an illumination unit that illuminates a sample, an irradiation unit that irradiates the sample with an X-ray, and a radiation detection element that detects an X-ray generated from the sample. The radiation detection device also comprises a magnetic field generation unit that generates a magnetic field in a portion of a space from the sample to the radiation detection element and a block that holds the magnetic field generation unit. The block is disposed in a position that blocks light from the illumination unit to the radiation detection element.

IPC Classes  ?

  • G01N 23/223 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
  • G01T 1/24 - Measuring radiation intensity with semiconductor detectors

72.

PARTICLE ANALYZING DEVICE, PARTICLE ANALYSIS METHOD, AND PARTICLE ANALYSIS PROGRAM

      
Application Number JP2023007791
Publication Number 2023/189169
Status In Force
Filing Date 2023-03-02
Publication Date 2023-10-05
Owner HORIBA, LTD. (Japan)
Inventor Tatewaki, Yasuhiro

Abstract

In particle analysis employing a PTA method, in order to enable each particle to be analyzed by type while limiting an increase in device size and cost, even if excitation wavelengths of fluorescent markers or particles having autofluorescent properties overlap one another, this particle analyzing device is configured to comprise: a light emitting unit (2) for emitting exciting light onto a sample that emits fluorescence in a plurality of colors; one or a plurality of filters (5) that transmit the fluorescence in the plurality of colors while cutting the exciting light; an imaging unit (3) having a color discrimination capability, for imaging the fluorescence transmitted through the filters (5); and an analyzing unit (43) for analyzing a physical property of the particles contained in the sample by obtaining a diffusion speed, by Brownian motion, of the particles from fluorescence image data obtained by means of the imaging unit (3).

IPC Classes  ?

  • G01N 15/02 - Investigating particle size or size distribution
  • G01N 21/64 - FluorescencePhosphorescence

73.

PARTICLE ANALYSIS DEVICE, PARTICLE ANALYSIS DEVICE PROGRAM, AND PARTICLE ANALYSIS METHOD

      
Application Number JP2023012555
Publication Number 2023/190534
Status In Force
Filing Date 2023-03-28
Publication Date 2023-10-05
Owner HORIBA, LTD. (Japan)
Inventor
  • Sugasawa, Hirosuke
  • Tatewaki, Yasuhiro
  • Igushi, Tatsuo

Abstract

A particle analysis device 100 which, in order to ensure sufficient observation time using a PTA method and without being affected by the fading of particles having fluorescent markers or autofluorescence properties, can operate in a fluorescence observation mode in which fluorescent markers added to particles or fluorescence emitted by the particles themselves are imaged by irradiating the particles with excitation light, and a scattered light observation mode in which scattered light produced by irradiating the particles with light is imaged, said particle analysis device comprising: a particle identification unit 41 that identifies particles to which fluorescent markers have been added or particles emitting fluorescence from fluorescence image data obtained in the fluorescence observation mode; and an analysis unit 42 that analyzes the properties of the particles by finding the diffusion speed due to Brownian motion of the particles identified by the particle identification unit 41 from scattered light image data obtained in the scattered light observation mode, which has a higher frame rate than the fluorescence observation mode.

IPC Classes  ?

  • G01N 15/02 - Investigating particle size or size distribution
  • G01N 21/64 - FluorescencePhosphorescence
  • C12M 1/00 - Apparatus for enzymology or microbiology
  • C12M 1/34 - Measuring or testing with condition measuring or sensing means, e.g. colony counters

74.

PITOT TUBE FLOWMETER, GAS ANALYSIS DEVICE, AND GAS ANALYSIS METHOD

      
Application Number JP2023007823
Publication Number 2023/181835
Status In Force
Filing Date 2023-03-02
Publication Date 2023-09-28
Owner HORIBA, LTD. (Japan)
Inventor
  • Mizutani, Naoto
  • Nagaoka, Makoto
  • Inoue, Kentaro
  • Uraoka, Masaru
  • Iseki, Hirotaka

Abstract

The present invention, which limits the effect of a flow rate distribution due to the shape of a flow path on the upstream side of a pitot tube flowmeter, comprises a pitot tube 21 that has total pressure holes H1 for detecting the total pressure P1 of a fluid and static pressure holes H2 for detecting the static pressure P2 of the fluid and a differential pressure sensor 22 that is connected to the pitot tube 21 and that detects the differential pressure ΔP between the total pressure P1 and the static pressure P2, wherein: the pitot tube 21 has a main tube part 211 that has connection ports CP1, CP2 to which the differential pressure sensor 22 is connected and that has the total pressure holes H1 and the static pressure holes H2 formed therein, and a plurality of branch tube parts 212 that branch off from the main tube part 211 and that have the total pressure holes H1 and the static pressure holes H2 formed therein; and each of the main tube part 211 and the plurality of branch tube parts 212 have a shape that mitigates pressure loss.

IPC Classes  ?

75.

METHOD FOR VERIFYING DISEASE USING EXTRACELLULAR VESICLE SURFACE MOLECULES, AND VERIFICATION KIT

      
Application Number JP2023011891
Publication Number 2023/182508
Status In Force
Filing Date 2023-03-24
Publication Date 2023-09-28
Owner
  • INTERNATIONAL UNIVERSITY OF HEALTH AND WELFARE (Japan)
  • HORIBA, LTD. (Japan)
Inventor
  • Umemura, Tsukuru
  • Shibuta, Tatsuki
  • Saito, Kensuke
  • Irikura, Daisuke

Abstract

The present invention provides a verification method for assessing whether or not a subject has contracted heart disease, type 2 diabetes, or SARS-CoV-2 infection, wherein the method is characterized in that the expression amount of surface molecules in extracellular vesicles derived from a biological sample harvested from the subject is measured, and a specific surface factor that significantly increases or decreases in each disease is detected.

IPC Classes  ?

  • G01N 33/68 - Chemical analysis of biological material, e.g. blood, urineTesting involving biospecific ligand binding methodsImmunological testing involving proteins, peptides or amino acids
  • G01N 33/543 - ImmunoassayBiospecific binding assayMaterials therefor with an insoluble carrier for immobilising immunochemicals

76.

PARTICLE SIZE DISTRIBUTION MEASURING DEVICE, PARTICLE SIZE DISTRIBUTION MEASURING METHOD, PROGRAM FOR PARTICLE SIZE DISTRIBUTION MEASURING DEVICE, AND KIT FOR PARTICLE SIZE DISTRIBUTION MEASURING DEVICE

      
Application Number JP2023001312
Publication Number 2023/149206
Status In Force
Filing Date 2023-01-18
Publication Date 2023-08-10
Owner HORIBA, LTD. (Japan)
Inventor Tatewaki, Yasuhiro

Abstract

This particle size distribution measuring device comprises: a measuring cell having a sample accommodating space for accommodating a sample obtained by dispersing a plurality of particles in a dispersion medium; a stirring means for stirring the sample by suctioning and discharging the sample inside a measurement cell; a light irradiation unit for irradiating, with light, the sample in the measurement cell; a light detection unit for detecting scattered light or fluorescent light generated from the sample in the measurement cell; and an analysis unit for measuring the particle size distribution of a particle group composed of the plurality of particles by using a detection signal obtained by the light detection unit.

IPC Classes  ?

  • G01N 15/02 - Investigating particle size or size distribution

77.

PARTICLE SIZE DISTRIBUTION MEASUREMENT DEVICE, PARTICLE SIZE DISTRIBUTION MEASUREMENT METHOD, AND PROGRAM FOR PARTICLE SIZE DISTRIBUTION MEASUREMENT

      
Application Number JP2023001117
Publication Number 2023/140235
Status In Force
Filing Date 2023-01-17
Publication Date 2023-07-27
Owner HORIBA, LTD. (Japan)
Inventor
  • Sugasawa, Hirosuke
  • Koshikawa, Hiroyuki
  • Saihara, Koji

Abstract

In order to make it possible to automatically adjust a focus position in a short time in particle size distribution measurement by a PTA method, there is provided a particle size distribution measurement device 100 comprising an imaging means 3 for capturing an image of particles in a cell 1, and an analysis unit 41 for calculating a particle size distribution by calculating the diffusion velocity due to Brownian motion of the particles on the basis of imaging data obtained by the imaging means, the particle size distribution measurement device 100 further comprising: an upper/lower-limit focus position determination unit 45 for determining a lower-limit focus position which is the focus position at which particles begin to appear as the focus of the imaging means 2 is moved from the front to the back side of the cell 1, and an upper-limit focus position which is the focus position at which particles begin to appear as the focus of the imaging means 3 is moved from the back to the front side of the cell 1; a measurement focus position calculation unit 46 for calculating a measurement focus position which is used during measurement and is between the lower-limit focus position and the upper-limit focus position, on the basis of the lower-limit focus position and the upper-limit focus position; and an autofocus unit 42 for adjusting the focus of the imaging means to the measurement focus position during measurement.

IPC Classes  ?

  • G01N 15/02 - Investigating particle size or size distribution

78.

PARTICLE ANALYSIS DEVICE

      
Application Number JP2023001141
Publication Number 2023/140244
Status In Force
Filing Date 2023-01-17
Publication Date 2023-07-27
Owner HORIBA, LTD. (Japan)
Inventor
  • Sakuramoto, Keijiro
  • Mori, Tetsuya

Abstract

In order to enable a device to be installed in a limited space on the periphery of a line and to keep a path for transportation of a sample from the line short, the present invention is configured so as to comprise a flow cell C through which a sample including particles flows, a light source 10 for radiating light to the particles in the flow cell C, a photodetector 20 for detecting secondary light from the particles, and a computation circuit 30 for detecting an autocorrelation function from a light intensity signal outputted from the photodetector 20 and analyzing the autocorrelation function or the particles included in the sample, an optical system unit U1 including the flow cell C and the light source 10, and a control unit U2 including the photodetector 20 and the computation circuit 30 being separate from each other and connected via a light guiding member L1 for guiding the secondary light to the photodetector 20.

IPC Classes  ?

  • G01N 15/02 - Investigating particle size or size distribution

79.

DILUTION MECHANISM, PARTICLE SIZE DISTRIBUTION MEASUREMENT SYSTEM, PARTICLE SIZE DISTRIBUTION MEASUREMENT METHOD, AND PROGRAM FOR PARTICLE SIZE DISTRIBUTION MEASUREMENT

      
Application Number JP2023001142
Publication Number 2023/140245
Status In Force
Filing Date 2023-01-17
Publication Date 2023-07-27
Owner
  • HORIBA, LTD. (Japan)
  • HORIBA ADVANCED TECHNO, CO., LTD. (Japan)
Inventor
  • Sakuramoto, Keijiro
  • Mori, Tetsuya
  • Habu, Kazunori

Abstract

In order to make it possible to precisely control the concentration of particles included in a sample even when the particle size distribution of the particles included in the sample fluctuates, so as to guarantee measurement precision in particle size distribution measurement using a dynamic light scattering method, there is provided a dilution mechanism (10) used together with a particle size distribution measurement device (20) for measuring a particle size distribution by a dynamic light scattering method, the dilution mechanism (10) being configured so as to comprise a sample line (L1) for leading a sample including particles to the particle size distribution measurement device (20), a dilution line (L2) which merges with the sample line (L1) and in which a diluent flows, a concentration adjustment means (11) for adjusting the concentration of the particles included in the diluted sample, an electrical conductivity measurement means (12) for measuring the electrical conductivity of the diluted sample, and a control unit (13) for controlling the concentration adjustment means (11) so that an electrical conductivity-related value which is the electrical conductivity measured by the electrical conductivity measurement means (12) or a value calculated from the electrical conductivity is a prescribed target value.

IPC Classes  ?

  • G01N 1/38 - Diluting, dispersing or mixing samples
  • G01N 15/02 - Investigating particle size or size distribution

80.

CLEANING DEVICE, SAMPLE ANALYZING DEVICE, AND CLEANING METHOD

      
Application Number JP2022047122
Publication Number 2023/127646
Status In Force
Filing Date 2022-12-21
Publication Date 2023-07-06
Owner HORIBA, LTD. (Japan)
Inventor
  • Ikeda Motohide
  • Osawa Kenta
  • Oku Narihiro
  • Maeda Takuto
  • Ishii Yuki

Abstract

This cleaning device for cleaning a suction unit comprises: a first passage portion through the inside of which a suction pipe for sucking a sample moves; a first cleaning liquid supply flow passage portion and a cleaning liquid discharge flow passage portion that intersect the first passage portion; a hollow body including a second passage portion which is joined to the first passage portion in a movement direction of the suction pipe and through the inside of which the suction pipe moves; and a wall portion having an inside surface positioned surrounding an outside surface of the hollow body across a gap. The suction unit includes the suction pipe and the hollow body. The wall portion includes a second cleaning liquid supply flow passage portion which penetrates through an inside surface of the wall portion. The cleaning device cleans at least one of the suction pipe and the hollow body.

IPC Classes  ?

  • G01N 35/10 - Devices for transferring samples to, in, or from, the analysis apparatus, e.g. suction devices, injection devices

81.

MACHINE LEARNING DEVICE, EXHAUST GAS ANALYSIS DEVICE, MACHINE LEARNING METHOD, EXHAUST GAS ANALYSIS METHOD, MACHINE LEARNING PROGRAM, AND EXHAUST GAS ANALYSIS PROGRAM

      
Application Number JP2022039964
Publication Number 2023/127262
Status In Force
Filing Date 2022-10-26
Publication Date 2023-07-06
Owner HORIBA, LTD. (Japan)
Inventor
  • Nagaoka, Makoto
  • Saito, Takashi

Abstract

222 concentration obtained by an analyzer which is different than the exhaust gas analysis device, and also includes at least one of the spectrum data obtained by irradiating the exhaust gas with light, an individual component concentration which is selected on the basis of an elemental balance equation for obtaining the specific component concentration, and a calculated value of the specific component concentration which is calculated via the elemental balance equation by using the individual component concentration; and a machine learning unit 62 which, by using the training data, causes machine learning for the relationship between the reference value of the specific component concentration and the spectrum data, the individual component concentration or the calculated value of the specific component concentration.

IPC Classes  ?

  • G01N 21/3504 - Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing gases, e.g. multi-gas analysis

82.

ANALYSIS DEVICE AND ANALYSIS METHOD

      
Application Number JP2022045406
Publication Number 2023/120231
Status In Force
Filing Date 2022-12-09
Publication Date 2023-06-29
Owner HORIBA, LTD. (Japan)
Inventor
  • Ishida, Kentaro
  • Oida, Takuji

Abstract

The present invention makes it possible to analyze a plurality of components to be measured in a sample while simplifying an optical system, and provides an analysis device 100 that analyzes the concentration of components to be measured in the sample, the analysis device 100 comprising: a measuring cell 2 into which the sample is introduced; a light source 3 that irradiates the measuring cell 2 with light; a photodetector 4 that detects the light transmitted through the measuring cell 2; a variable filter 5 that is provided between the measuring cell 2 and the light source 3 or the photodetector 4, and changes the transmission wavelength depending on the light incident position; a filter moving mechanism 6 that moves the variable filter 5 to change the wavelength of light detected by the photodetector 4; and a concentration calculation unit 7 that calculates, on the basis of a detection signal of the photodetector 4, the concentration of the components to be measured.

IPC Classes  ?

  • G01N 21/3504 - Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing gases, e.g. multi-gas analysis

83.

EXHAUST GAS ANALYSIS DEVICE, EXHAUST GAS ANALYSIS METHOD, AND EXHAUST GAS ANALYSIS PROGRAM

      
Application Number JP2022043386
Publication Number 2023/120015
Status In Force
Filing Date 2022-11-24
Publication Date 2023-06-29
Owner HORIBA, LTD. (Japan)
Inventor
  • Kondo, Yosuke
  • Komatsu, Yoji

Abstract

The present invention provides an exhaust gas analysis device 100 that reduces cold spots of a sampling probe without providing the sampling probe with a heater and heating the sampling probe and that analyzes an exhaust gas exhausted from a vehicle or part of the vehicle. The exhaust gas analysis device 100 is provided with: a sampling probe 3 that samples an exhaust gas from a main flow path 2 through which the exhaust gas flows; a gas analyzer 5 that measures a component concentration in the exhaust gas sampled by the sampling probe 3; a heated gas supply mechanism 9 that supplies a heated gas to the sampling probe 3; and a control unit COM that controls an operation related to analysis of the exhaust gas. The control unit COM supplies the gas heated by the heated gas supply mechanism 9 to the sampling probe 3 before the sampling of the exhaust gas by means of the sampling probe 3 is started and starts the sampling of the exhaust gas by means of the sampling probe 3 in a state in which the sampling probe 3 has been heated.

IPC Classes  ?

  • G01N 1/22 - Devices for withdrawing samples in the gaseous state

84.

GAS ANALYSIS DEVICE, EXHAUST GAS ANALYSIS SYSTEM, AND GAS ANALYSIS METHOD

      
Application Number JP2022042840
Publication Number 2023/112597
Status In Force
Filing Date 2022-11-18
Publication Date 2023-06-22
Owner HORIBA, LTD. (Japan)
Inventor
  • Nishigai, Hiroki
  • Hanada, Takaaki
  • Nagura, Naoki

Abstract

Provided is a gas analysis device for analyzing the concentration of a component to be measured that is included in a sample gas, the gas analysis device comprising: a measurement cell; a gas introduction flow channel for introducing the sample gas to the measurement cell; a gas lead-out flow channel for leading the sample gas out from the measurement cell; a pressure sensor for measuring the pressure inside the measurement cell; a light source for radiating light to the measurement cell; a concentration calculation unit for calculating the concentration of a component to be measured that is included in the sample gas, on the basis of the light intensity of light transmitted through the measurement cell; and a concentration correction unit for correcting the calculated concentration of the component to be measured, on the basis of the pressure measured by the pressure sensor, the pressure sensor being provided with a sensor body and a communication tube for communicating the sensor body and the measurement cell, and the distal end of the communication tube being installed in the vicinity of an introduction port for the gas introduction flow channel or a lead-out port for the gas lead-out flow channel, formed in the measurement cell.

IPC Classes  ?

  • G01N 21/61 - Non-dispersive gas analysers
  • G01N 21/03 - Cuvette constructions
  • G01N 21/3504 - Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing gases, e.g. multi-gas analysis

85.

ANALYSIS DEVICE AND ANALYSIS METHOD

      
Application Number JP2022044356
Publication Number 2023/106196
Status In Force
Filing Date 2022-12-01
Publication Date 2023-06-15
Owner HORIBA, LTD. (Japan)
Inventor
  • Tsukatani, Kosuke
  • Hotta, Kohei
  • Yamamoto, Tomomi
  • Ido, Takuya
  • Shibuya, Kyoji

Abstract

Provided is an analysis device for radiating light to a measurement cell in which a sample is introduced, and detecting light transmitted through the measurement cell to analyze a component to be measured that is included in the sample, the analysis device comprising: two or more types of laser light sources selected from a first laser light source which is a quantum cascade laser, a second laser light source which is an interband cascade laser, and a third laser light source which is a semiconductor laser other than a quantum cascade laser and an interband cascade laser; a photodetector for detecting light emitted from each laser light source and transmitted through the measurement cell; and a light source control unit for causing pulse oscillation of laser light sources at mutually different timings.

IPC Classes  ?

  • G01N 21/01 - Arrangements or apparatus for facilitating the optical investigation
  • G01N 21/3504 - Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing gases, e.g. multi-gas analysis

86.

ANALYSIS SYSTEM, SERVER, ANALYSIS METHOD, AND PROGRAM

      
Application Number JP2022043916
Publication Number 2023/100854
Status In Force
Filing Date 2022-11-29
Publication Date 2023-06-08
Owner HORIBA, LTD. (Japan)
Inventor
  • Yamaguchi, Kazuki
  • Sando, Shota
  • Matsumoto, Erika
  • Nishizawa, Kyohei

Abstract

In the present invention, extraction of features included in data pertaining to particulate matter is performed efficiently and accurately. An analysis system (100) comprises a data acquisition unit (1), a feature extraction unit (35), and an output unit (37). The data acquisition unit (1) acquires related data (RD) related to the particulate matter. The feature extraction unit (35) executes prescribed feature extraction processing that takes the related data (RD) as input to extract features included in the related data (RD). The output unit (37) outputs information relating to the features extracted by the feature extraction unit (35).

IPC Classes  ?

  • G01W 1/10 - Devices for predicting weather conditions
  • G01N 35/00 - Automatic analysis not limited to methods or materials provided for in any single one of groups Handling materials therefor
  • G01N 23/02 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by transmitting the radiation through the material
  • G01N 23/223 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
  • G01N 1/02 - Devices for withdrawing samples

87.

OUTPUT DEVICE, BLOOD ANALYSIS DEVICE, BLOOD ANALYSIS METHOD, AND PROGRAM

      
Application Number JP2022043722
Publication Number 2023/100790
Status In Force
Filing Date 2022-11-28
Publication Date 2023-06-08
Owner HORIBA, LTD. (Japan)
Inventor
  • Nishimori Masashi
  • Ohashi Akika
  • Nakagawa Yohei

Abstract

This output device comprises: a measurement information reception unit that receives measurement information including a measuring result of a blood specimen; a code information generation unit that adds the measurement information to browsing destination information indicating a browsing destination of the measurement information and generates code information; and an output unit that outputs the code information.

IPC Classes  ?

  • G01N 35/00 - Automatic analysis not limited to methods or materials provided for in any single one of groups Handling materials therefor

88.

BLOOD ANALYZER, BLOOD ANALYSIS METHOD AND PROGRAM

      
Application Number JP2022043724
Publication Number 2023/100791
Status In Force
Filing Date 2022-11-28
Publication Date 2023-06-08
Owner HORIBA, LTD. (Japan)
Inventor
  • Isshiki Ryota
  • Ikeda Motohide
  • Osawa Kenta

Abstract

A blood analyzer that comprises: a container information acquiring unit that acquires container information relating to the type of a specimen container to be used; a needle for aspirating a blood specimen contained in the specimen container and discharging the same; a blood analysis unit provided with a chamber for receiving the blood specimen that is aspirated from the specimen container and discharged by the needle; and a control unit that controls the aspiration and discharge of the blood specimen by the needle on the basis of the container information. The control unit sets the amount of the blood specimen to be aspirated by the needle on the basis of the container information.

IPC Classes  ?

  • G01N 35/10 - Devices for transferring samples to, in, or from, the analysis apparatus, e.g. suction devices, injection devices

89.

ANALYSIS DEVICE, PROGRAM FOR ANALYSIS DEVICE, AND ANALYSIS METHOD

      
Application Number JP2022043508
Publication Number 2023/095864
Status In Force
Filing Date 2022-11-25
Publication Date 2023-06-01
Owner HORIBA, LTD. (Japan)
Inventor
  • Shibuya, Kyoji
  • Hamauchi, Shota
  • Tsukatani, Kosuke
  • Niina, Kodai
  • Ido, Takuya

Abstract

The present invention is for precisely measuring the concentration of a component to be measured in a processed gas. According to the present invention, the concentration of carbon dioxide is calculated on the basis of absorption at 4.23-4.24 μm or 4.34-4.35 μm by carbon dioxide, the concentration of carbon monoxide is calculated on the basis of absorption at 4.59-4.61 μm by carbon monoxide, the concentration of water is calculated on the basis of absorption at 5.89-6.12 μm by water, the concentration of acetylene is calculated on the basis of absorption at 7.56-7.66 μm or 7.27-7.81 μm by acetylene, the concentration of methane is calculated on the basis of absorption at 7.67-7.80 μm or 8.10-8.14 μm by methane, the concentration of ethylene is calculated on the basis of absorption at 8.46-8.60 μm by ethylene, the concentration of ethane is calculated on the basis of absorption at 6.13-6.14 μm or 6.09-6.45 μm by ethane, the concentration of ammonia is calculated on the basis of absorption at 6.06-6.25 μm or 8.62-9.09 μm by ammonia, and the concentration of methanol is calculated on the basis of absorption at 9.35-9.62 μm by methanol.

IPC Classes  ?

  • G01N 21/3504 - Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing gases, e.g. multi-gas analysis

90.

ANALYSIS DEVICE, PROGRAM FOR ANALYSIS DEVICE, AND ANALYSIS METHOD

      
Application Number JP2022043575
Publication Number 2023/095881
Status In Force
Filing Date 2022-11-25
Publication Date 2023-06-01
Owner HORIBA, LTD. (Japan)
Inventor
  • Shibuya, Kyoji
  • Hamauchi, Shota
  • Hanada, Takaaki
  • Fukushiro, Kensuke
  • Hara, Kenji
  • Nagura, Naoki
  • Tsukatani, Kosuke
  • Nina, Kodai
  • Ido, Takuya

Abstract

The present invention provides an analysis device 100 that employs light absorption to analyze a measurement target component contained in a sample, and that accurately measures a concentration of the measurement target component by reducing fluctuations in a modulation width of an oscillation wavelength of a laser light source resulting from ambient temperature variations, the analysis device 100 comprising: a laser light source 2 for emitting reference light onto the sample; an optical detector 5 for detecting the intensity of sample light, which is the reference light that has been transmitted through the sample; a temperature regulating unit 3 for regulating the temperature of the laser light source; a temperature sensor 4 for detecting the ambient temperature around the laser light source; a relationship data storage unit 73 for storing modulation correction relationship data representing a relationship between the ambient temperature around the laser light source 2 and a correction parameter for correcting a modulation width deviation relative to a default modulation width of the laser light source for measuring the measurement target component; and a control unit 7 for using the detected temperature from the temperature sensor 4 and the modulation correction relationship data to change a target temperature of the temperature regulating unit 3, or to change at least one of a drive voltage or a drive current that is applied for wavelength modulation of the laser light source 2.

IPC Classes  ?

  • G01N 21/3504 - Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing gases, e.g. multi-gas analysis

91.

INSPECTION METHOD FOR EXHAUST GAS ANALYSIS DEVICE, INSPECTION DEVICE, AND INSPECTION SYSTEM

      
Application Number JP2022043364
Publication Number 2023/095832
Status In Force
Filing Date 2022-11-24
Publication Date 2023-06-01
Owner HORIBA, LTD. (Japan)
Inventor Naya, Hiroshi

Abstract

The present invention is designed to objectively evaluate the accuracy of an exhaust gas analysis device, and comprises: an analysis step for supplying inspection gas to an exhaust gas analysis device from a gas container filled with inspection gas at an undisclosed concentration, and analyzing the inspection gas by means of the exhaust gas analysis device; and an inspection step for acquiring the analysis result from the exhaust gas analysis device and a reference gas concentration, and inspecting the exhaust gas analysis device by comparing the analysis result and the reference gas concentration.

IPC Classes  ?

  • G06Q 50/10 - Services
  • G01M 15/10 - Testing internal-combustion engines by monitoring exhaust gases

92.

ANALYSIS DEVICE AND ANALYSIS METHOD

      
Application Number JP2022043560
Publication Number 2023/095876
Status In Force
Filing Date 2022-11-25
Publication Date 2023-06-01
Owner HORIBA, LTD. (Japan)
Inventor
  • Hanada, Takaaki
  • Nagura, Naoki
  • Shibuya, Kyoji
  • Hara, Kenji

Abstract

The present invention provides an analysis device and an analysis method, each of which measures the concentration of a component to be measured in a combustion gas with high accuracy, wherein: the concentration of nitrogen monoxide is calculated on the basis of absorption of nitrogen monoxide of 5.24 to 5.26 µm; the concentration of nitrogen dioxide is calculated on the basis of absorption of nitrogen dioxide of 6.14 to 6.26 µm; the concentration of nitrous oxide is calculated on the basis of absorption of nitrous oxide of 7.84 to 7.91 µm; the concentration of ammonia is calculated on the basis of absorption of ammonia of 9.38 to 9.56 µm; the concentration of ethane is calculated on the basis of absorption of ethane of 3.33 to 3.36 µm; the concentration of formaldehyde or acetaldehyde is calculated on the basis of absorption of formaldehyde or acetaldehyde of 5.65 to 5.67 µm; the concentration of sulfur dioxide is calculated on the basis of absorption of sulfur dioxide of 7.38 to 7.42 µm; the concentration of methane is calculated on the basis of absorption of methane of 7.50 to 7.54 µm; and the concentration of methanol or ethanol is calculated on the basis of absorption of methanol or ethanol of 9.45 to 9.47 µm.

IPC Classes  ?

  • G01N 21/3504 - Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing gases, e.g. multi-gas analysis

93.

GAS ANALYSIS DEVICE, GAS ANALYSIS METHOD, AND PROGRAM FOR GAS ANALYSIS DEVICE

      
Application Number JP2022036925
Publication Number 2023/063136
Status In Force
Filing Date 2022-10-03
Publication Date 2023-04-20
Owner HORIBA, LTD. (Japan)
Inventor
  • Nagura, Naoki
  • Kawabuchi, Yasushi
  • Takahashi, Daichi
  • Hara, Kenji
  • Kikuta, Takayuki
  • Yoshioka, Masaya
  • Nakamura, Kotaro

Abstract

This gas analysis device comprises: a sample cell into which a sample gas is introduced; a light source that radiates light onto the sample cell; a photodetector that detects the light intensity of the light that has been emitted by the light source and passed through the sample cell; a concentration calculation unit that calculates the concentration of a component to be measured included in the sample gas on the basis of the light intensity output from the photodetector; and a light intensity output unit that outputs a calibration-time light intensity detected by the photodetector during calibration such that the calibration-time light intensity can be compared with a reference light intensity set in advance.

IPC Classes  ?

  • G01N 21/3504 - Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing gases, e.g. multi-gas analysis

94.

EXHAUST GAS SAMPLING DEVICE, EXHAUST GAS ANALYSIS SYSTEM, EXHAUST GAS SAMPLING METHOD, AND PROGRAM FOR EXHAUST GAS SAMPLING DEVICE

      
Application Number JP2022036938
Publication Number 2023/063139
Status In Force
Filing Date 2022-10-03
Publication Date 2023-04-20
Owner HORIBA, LTD. (Japan)
Inventor
  • Kimura, Takeshi
  • Kuriaki, Kazunori
  • Higuchi, Masahiro
  • Komatsu, Yoji
  • Tomita, Jun

Abstract

Provided is an exhaust gas sampling device which collects, in a sampling bag, an exhaust gas discharged from a vehicle including an engine or a part thereof, wherein the exhaust gas sampling device comprises: a main channel through which the exhaust gas flows; a main valve which opens and closes the main channel; a dilution gas channel which is connected to a downstream side of the main valve in the main channel, and introduces a dilution gas to the main channel; a purge gas channel which is branched from the dilution gas channel, and a downstream end of which is in a downstream side of the main valve in the main channel, and is connected to an upstream side of the junction of the dilution gas channel; and a purge pump which is provided in the purge gas channel, suctions a portion of the dilution gas that flows through the dilution gas channel, and delivers the portion of the dilution gas as a purge gas to the main channel.

IPC Classes  ?

  • G01M 15/10 - Testing internal-combustion engines by monitoring exhaust gases
  • G01N 1/22 - Devices for withdrawing samples in the gaseous state

95.

SPECIMEN TESTING SYSTEM, SPECIMEN TESTING PROGRAM, AND SPECIMEN TESTING METHOD

      
Application Number JP2022030777
Publication Number 2023/026873
Status In Force
Filing Date 2022-08-12
Publication Date 2023-03-02
Owner HORIBA, LTD. (Japan)
Inventor
  • Furukawa, Kazuki
  • Shiomi, Kenji
  • Kikuta, Takayuki

Abstract

The present invention is a specimen testing system 100 which not only performs long-term testing by automatically performing a charging process of an electric vehicle or a part thereof, but also tests the specimen under conditions that reproduce actual road driving, and which tests a specimen W, which is an electric vehicle or a part thereof, by charging the specimen W by means of a power supply device 3. The specimen testing system 100 comprises: a dynamometer 2 that applies a load to the specimen W; an information acquisition unit 6 that acquires information on the specimen W; and a test control unit 7 that controls the test of the specimen W on the basis of the information on the specimen W, wherein the test control unit 7 stops the operation of the specimen W and charges the specimen W by means of the power supply device 3 when the information on the specimen W satisfies a first condition, and stops the charging of the specimen W by means of the power supply device 3 and restarts the operation of the specimen W when the information on the specimen W satisfies a second condition.

IPC Classes  ?

  • G01R 31/387 - Determining ampere-hour charge capacity or SoC
  • G01M 17/007 - Wheeled or endless-tracked vehicles
  • G01R 31/382 - Arrangements for monitoring battery or accumulator variables, e.g. SoC

96.

RADIATION DETECTION ELEMENT, RADIATION DETECTOR, RADIATION DETECTION DEVICE, AND METHOD FOR MANUFACTURING RADIATION DETECTION ELEMENT

      
Application Number JP2022031152
Publication Number 2023/026939
Status In Force
Filing Date 2022-08-18
Publication Date 2023-03-02
Owner HORIBA, LTD. (Japan)
Inventor Ishikura, Koji

Abstract

Provided are a radiation detection element in which the precision of radiation detection is stabilized, a radiation detector, a radiation detection device, and a method for manufacturing a radiation detection element. The present invention provides a radiation detection element comprising a semiconductor part having an incidence surface on which radiation to be detected is incident, a first electrode provided to the incidence surface, and a second electrode provided to the incidence surface and disposed in a position surrounding the periphery of the first electrode, wherein the radiation detection element is a silicon drift-type radiation detection element, and comprises an insulating protective film for covering the second electrode.

IPC Classes  ?

  • G01T 1/17 - Circuit arrangements not adapted to a particular type of detector
  • G01T 1/24 - Measuring radiation intensity with semiconductor detectors
  • G01T 1/36 - Measuring spectral distribution of X-rays or of nuclear radiation
  • G01N 23/223 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence

97.

SIGNAL PROCESSING METHOD, SIGNAL PROCESSING DEVICE, RADIATION DETECTION DEVICE, AND COMPUTER PROGRAM

      
Application Number JP2022030812
Publication Number 2023/017866
Status In Force
Filing Date 2022-08-12
Publication Date 2023-02-16
Owner HORIBA, LTD. (Japan)
Inventor
  • Murata, Shunsuke
  • Valiev, Ildar

Abstract

Provided are a signal processing method, a signal processing device, a radiation detection device, and a computer program that allow sufficient elimination of a sum peak from a spectrum of radiation. This signal processing method for processing a signal containing an answering wave to be generated in response to detection of radiation executes correction processing including: measuring a feature amount corresponding to a time for which the answering wave or an answering wave group formed by a plurality of answering waves continues; counting, for each wave height, the number of the answering waves or the answering wave groups containing the measured feature amount within a predetermined first range containing the feature amount of a single answering wave; and deducting a specific value from the counted number in accordance with the answering wave or the answering wave group not containing the feature amount within the first range.

IPC Classes  ?

  • G01T 1/17 - Circuit arrangements not adapted to a particular type of detector
  • G01N 23/223 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence

98.

TEST SYSTEM, TEST METHOD, AND PROGRAM RECORDING MEDIUM FOR TEST SYSTEM

      
Application Number JP2022028632
Publication Number 2023/008373
Status In Force
Filing Date 2022-07-25
Publication Date 2023-02-02
Owner HORIBA, LTD. (Japan)
Inventor
  • Michikita, Toshiyuki
  • Kawazoe, Hiroshi
  • Furukawa, Kazuki
  • Hirose, Yoku
  • Shiomi, Kenji

Abstract

The present invention provides a test system for testing a vehicle provided with an electronic control device or a test piece that is a part of the vehicle. The test system is provided with: a driving test device for performing a driving test of the test piece; an automatic operation robot that operates the test piece; and a signal control unit that is connected to the test piece by wire or wirelessly and that transmits, to the electronic control device, a test signal for evaluating the electronic control device.

IPC Classes  ?

99.

VEHICLE ELEMENT RESPONSE LEARNING METHOD, VEHICLE ELEMENT RESPONSE CALCULATION METHOD, VEHICLE ELEMENT RESPONSE LEARNING SYSTEM, AND VEHICLE ELEMENT RESPONSE LEARNING PROGRAM

      
Application Number JP2022029238
Publication Number 2023/008547
Status In Force
Filing Date 2022-07-29
Publication Date 2023-02-02
Owner HORIBA, LTD. (Japan)
Inventor
  • Tabata, Kunio
  • Roberts, Phillip
  • Bates, Luke
  • Whelam, Steven

Abstract

The present invention accurately obtains response data of a vehicle element in a desired traveling environment by means of simulation without actual road traveling, and pertains to a vehicle element response learning method which generates a trained model pertaining to a response of a vehicle or a vehicle element that is a portion of the vehicle, wherein the method comprises: (1) an input step for imparting, to the vehicle element, inputs including parameters related to a vehicle speed, a load, and a temperature that presuppose actual traveling; (2) an acquisition step for acquiring response data of the vehicle element, and acquiring, as training data, the response data and input data that indicates the inputs; and (3) a generation step for generating, from the training data, a trained model pertaining to the response of the vehicle element by using machine-learning.

IPC Classes  ?

  • G01M 17/007 - Wheeled or endless-tracked vehicles
  • G01M 15/10 - Testing internal-combustion engines by monitoring exhaust gases
  • H01M 8/00 - Fuel cellsManufacture thereof
  • H01M 8/0432 - TemperatureAmbient temperature
  • H01M 8/0438 - PressureAmbient pressureFlow
  • H01M 8/04537 - Electric variables
  • H01M 8/04992 - Processes for controlling fuel cells or fuel cell systems characterised by the implementation of mathematical or computational algorithms, e.g. feedback control loops, fuzzy logic, neural networks or artificial intelligence

100.

MICROCHIP, SPECIMEN-TESTING DEVICE, AND SPECIMEN-TESTING METHOD

      
Application Number JP2022027569
Publication Number 2023/002898
Status In Force
Filing Date 2022-07-13
Publication Date 2023-01-26
Owner HORIBA, LTD. (Japan)
Inventor
  • Matsuda Yasunori
  • Hirata Katsuki

Abstract

A microchip (3) has a fluid circuit therein. The fluid circuit is provided with: a specimen introduction part (31) into which a specimen is introduced; a component separation part (32) that, when a centrifugal force occurs in the microchip (3) in a first direction (D1), separates a component contained in the specimen introduced into the specimen introduction part (31), by the centrifugal force in the first direction (D1); and a reagent reaction part (33) that has a support (330) supporting a reagent, and that causes a portion of the component introduced to the support (330) from the component separation part (32) to react with the reagent. When a centrifugal force occurs in the microchip (3) in a second direction (D2) different from the first direction (D1), the component separated by the component separation part (32) is introduced to the support (330) from the component separation part (32) by the centrifugal force in the second direction (D2).

IPC Classes  ?

  • G01N 37/00 - Details not covered by any other group of this subclass
  • G01N 35/00 - Automatic analysis not limited to methods or materials provided for in any single one of groups Handling materials therefor
  • G01N 35/08 - Automatic analysis not limited to methods or materials provided for in any single one of groups Handling materials therefor using a stream of discrete samples flowing along a tube system, e.g. flow injection analysis
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