Semiconductor Energy Laboratory Co., Ltd.

Japan

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2026 October (MTD) 40
2026 September 72
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IPC Class
H01L 29/786 - Thin-film transistors 3,983
H01L 27/12 - Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including integrated passive circuit elements with at least one potential-jump barrier or surface barrier the substrate being other than a semiconductor body, e.g. an insulating body 2,254
H01L 51/50 - Solid state devices using organic materials as the active part, or using a combination of organic materials with other materials as the active part; Processes or apparatus specially adapted for the manufacture or treatment of such devices, or of parts thereof specially adapted for light emission, e.g. organic light emitting diodes (OLED) or polymer light emitting devices (PLED) 1,389
H01L 27/32 - Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including components using organic materials as the active part, or using a combination of organic materials with other materials as the active part with components specially adapted for light emission, e.g. flat-panel displays using organic light-emitting diodes 1,137
H01L 29/66 - Types of semiconductor device 1,103
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09 - Scientific and electric apparatus and instruments 52
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40 - Treatment of materials; recycling, air and water treatment, 10
01 - Chemical and biological materials for industrial, scientific and agricultural use 4
45 - Legal and security services; personal services for individuals. 3
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1.

SEMICONDUCTOR DEVICE, DISPLAY DEVICE, DISPLAY MODULE, AND ELECTRONIC DEVICE

      
Application Number 19482032
Status Pending
Filing Date 2024-05-13
First Publication Date 2026-10-08
Owner SEMICONDUCTOR ENERGY LABORATORY CO., LTD. (Japan)
Inventor
  • Kimura, Hajime
  • Kawashima, Susumu

Abstract

A novel semiconductor device that is highly convenient, useful, or reliable can be provided. The semiconductor device includes a first functional layer, a second functional layer, and a first conductive layer. The second functional layer overlaps with the first functional layer and includes a functional element. The functional element includes a first electrode. The first functional layer includes a first layer, a spacer, and a transistor, and is sandwiched between the second functional layer and the spacer. The first layer includes a first opening portion and has an insulating property. The spacer includes a first plane, a second plane, a third plane, and a second opening portion. The first plane, the second plane, and the third plane each have an insulating property. The second plane faces the first plane, and the second plane is positioned closer to the first layer than the first plane is. The third plane connects the first plane and the second plane to each other and is positioned at the side surface of the second opening portion. The transistor includes a second electrode, a third electrode, a fourth electrode, a semiconductor layer, and an insulating layer. The first conductive layer electrically connects the third electrode and the first electrode to each other through the first opening portion.

IPC Classes  ?

  • G02F 1/1368 - Active matrix addressed cells in which the switching element is a three-electrode device
  • G02F 1/1362 - Active matrix addressed cells
  • H10D 86/40 - Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs
  • H10D 86/60 - Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs wherein the TFTs are in active matrices

2.

LIQUID CRYSTAL DISPLAY DEVICE AND MANUFACTURING METHOD THEREOF

      
Application Number 19294526
Status Pending
Filing Date 2025-08-08
First Publication Date 2026-10-08
Owner Semiconductor Energy Laboratory Co., Ltd. (Japan)
Inventor
  • Yamazaki, Shunpei
  • Ishitani, Tetsuji

Abstract

Disclosed is a liquid crystal display device which can be used in a variety of situations and applications. The liquid crystal display device comprises: a first substrate comprising a first display region, a second display region, and a third display region wherein the first display region, the second display region, and the third display region are continuously formed; a second substrate having a form which fits the first substrate; and a liquid crystal interposed between the first substrate and the second substrate. The second display region is interposed between the first display region and the second display region. The second display region is curved, and the first display region and the second display region are substantially flat.

IPC Classes  ?

  • G02F 1/13 - Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulatingNon-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
  • G02F 1/1333 - Constructional arrangements
  • H10D 86/01 - Manufacture or treatment
  • H10D 86/40 - Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs
  • H10D 86/60 - Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs wherein the TFTs are in active matrices

3.

DISPLAY DEVICE

      
Application Number 19711280
Status Pending
Filing Date 2026-06-17
First Publication Date 2026-10-08
Owner SEMICONDUCTOR ENERGY LABORATORY CO., LTD. (Japan)
Inventor
  • Hodo, Ryota
  • Yanagisawa, Yuichi
  • Sawai, Hiromi

Abstract

Provided is a display device with high display quality. A first pixel, a second pixel provided adjacent to the first pixel, a first insulating layer, a second insulating layer over the first insulating layer, and a third insulating layer over the second insulating layer are included; the first pixel includes a first pixel electrode, a first EL layer over the first pixel electrode, and a common electrode over the first EL layer; the second pixel includes a second pixel electrode, a second EL layer over the second pixel electrode, and the common electrode over the second EL layer; the first insulating layer and the third insulating layer each contain an inorganic material; the second insulating layer contains an organic material; the second insulating layer overlaps with the side surface of the first EL layer and the side surface of the second EL layer with the first insulating layer therebetween; the second insulating layer overlaps with the common electrode with the third insulating layer therebetween; and the third insulating layer is in contact with the first insulating layer in a region not overlapping with the second insulating layer.

IPC Classes  ?

  • H10K 59/122 - Pixel-defining structures or layers, e.g. banks
  • H10K 59/121 - Active-matrix OLED [AMOLED] displays characterised by the geometry or disposition of pixel elements
  • H10K 59/124 - Insulating layers formed between TFT elements and OLED elements
  • H10K 59/35 - Devices specially adapted for multicolour light emission comprising red-green-blue [RGB] subpixels

4.

METAL OXIDE FILM, SEMICONDUCTOR DEVICE, AND MANUFACTURING METHOD THEREOF

      
Application Number 19643891
Status Pending
Filing Date 2026-04-10
First Publication Date 2026-10-08
Owner SEMICONDUCTOR ENERGY LABORATORY CO., LTD. (Japan)
Inventor
  • Yamazaki, Shunpei
  • Jinbo, Yasuhiro
  • Kunitake, Hitoshi
  • Egi, Yuji
  • Takahashi, Masahiro
  • Kochi, Shuntaro

Abstract

A material having favorable ferroelectricity is provided. An embodiment of the present invention is a metal oxide film including a first layer and a second layer. The first layer contains first oxygen and hafnium, and the second layer contains second oxygen and zirconium. The hafnium and the zirconium are bonded to each other with the first oxygen positioned therebetween, and the second oxygen is bonded to the zirconium.

IPC Classes  ?

  • H10B 53/30 - Ferroelectric RAM [FeRAM] devices comprising ferroelectric memory capacitors characterised by the memory core region
  • H10B 53/10 - Ferroelectric RAM [FeRAM] devices comprising ferroelectric memory capacitors characterised by the top-view layout
  • H10D 30/01 - Manufacture or treatment
  • H10D 30/67 - Thin-film transistors [TFT]

5.

Light-Emitting Device

      
Application Number 19711261
Status Pending
Filing Date 2026-06-17
First Publication Date 2026-10-08
Owner Semiconductor Energy Laboratory Co., Ltd. (Japan)
Inventor
  • Watabe, Takeyoshi
  • Ohsawa, Nobuharu
  • Seo, Hiromi
  • Seo, Satoshi

Abstract

The light-emitting device includes a first electrode, a second electrode, and an organic compound layer between the first electrode and the second electrode. The organic compound layer includes a first light-emitting unit, an intermediate layer, and a second light-emitting unit in this order from the first electrode side. The first light-emitting unit includes a first light-emitting layer, and the second light-emitting unit includes a second light-emitting layer. The intermediate layer includes a first layer, a second layer, and a third layer in this order from the first electrode side, with the second layer being in contact with the first layer and the third layer. The spin density of the first layer is lower than or equal to 1×1017 spins/cm3. The LUMO level of a material included in the second layer is greater than or equal to −4.30 eV and less than or equal to −3.00 eV.

IPC Classes  ?

  • H10K 50/19 - Tandem OLEDs
  • H10K 50/11 - OLEDs or polymer light-emitting diodes [PLED] characterised by the electroluminescent [EL] layers
  • H10K 85/20 - Carbon compounds, e.g. carbon nanotubes or fullerenes
  • H10K 85/30 - Coordination compounds
  • H10K 85/60 - Organic compounds having low molecular weight
  • H10K 101/30 - Highest occupied molecular orbital [HOMO], lowest unoccupied molecular orbital [LUMO] or Fermi energy values
  • H10K 102/00 - Constructional details relating to the organic devices covered by this subclass

6.

SEMICONDUCTOR DEVICE, DISPLAY APPARATUS, AND ELECTRONIC DEVICE

      
Application Number 19108277
Status Pending
Filing Date 2023-09-01
First Publication Date 2026-10-08
Owner SEMICONDUCTOR ENERGY LABORATORY CO., LTD. (Japan)
Inventor
  • Kimura, Hajime
  • Inoue, Tatsunori

Abstract

A semiconductor device with stable operation is provided. The semiconductor device includes a first transistor, a second transistor, a third transistor, and a first capacitor. One of a source and a drain of the third transistor is electrically connected to one of a source and a drain of the second transistor. The other of the source and the drain of the third transistor is electrically connected to a gate of the first transistor and a first terminal of the first capacitor. One of a source and a drain of the first transistor is electrically connected to a gate of the second transistor and a second terminal of the first capacitor. Note that the semiconductor device can be provided in a driver circuit having a function of transmitting a signal for displaying an image to a display device.

IPC Classes  ?

  • G02F 1/133 - Constructional arrangementsOperation of liquid crystal cellsCircuit arrangements
  • H10K 59/121 - Active-matrix OLED [AMOLED] displays characterised by the geometry or disposition of pixel elements

7.

SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD OF THE SAME

      
Application Number 19714746
Status Pending
Filing Date 2026-06-22
First Publication Date 2026-10-08
Owner SEMICONDUCTOR ENERGY LABORATORY CO., LTD. (Japan)
Inventor
  • Toriumi, Satoshi
  • Hamada, Takashi
  • Maruyama, Tetsunori
  • Imoto, Yuki
  • Asano, Yuji
  • Honda, Ryunosuke
  • Yamazaki, Shunpei

Abstract

A minute transistor is provided that includes a first insulator, a second insulator, a first, conductor, a second conductor, and third conductor, in which an angle is formed between a side surface of the first insulator and a top surface of the first conductor, and a length between the first conductor and a surface of the second conductor closest to the first conductor is at least greater than a length between the first conductor and the third conductor.

IPC Classes  ?

  • H10D 30/67 - Thin-film transistors [TFT]
  • H10B 41/70 - Electrically erasable-and-programmable ROM [EEPROM] devices comprising floating gates the floating gate being an electrode shared by two or more components
  • H10D 62/80 - Semiconductor bodies, or regions thereof, of devices having potential barriers characterised by the materials
  • H10D 64/68 - Electrodes having a conductor capacitively coupled to a semiconductor by an insulator, e.g. MIS electrodes characterised by the insulator, e.g. by the gate insulator
  • H10D 84/03 - Manufacture or treatment characterised by using material-based technologies using Group IV technology, e.g. silicon technology or silicon-carbide [SiC] technology
  • H10D 86/40 - Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs
  • H10D 86/60 - Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs wherein the TFTs are in active matrices
  • H10D 87/00 - Integrated devices comprising both bulk components and either SOI or SOS components on the same substrate
  • H10D 88/00 - Three-dimensional [3D] integrated devices
  • H10F 39/18 - Complementary metal-oxide-semiconductor [CMOS] image sensorsPhotodiode array image sensors

8.

MATERIAL, LIGHT-EMITTING DEVICE, AND PURIFICATION METHOD

      
Application Number IB2026053085
Publication Number 2026/210332
Status In Force
Filing Date 2026-03-30
Publication Date 2026-10-08
Owner SEMICONDUCTOR ENERGY LABORATORY CO., LTD. (Japan)
Inventor
  • Kurihara, Miki
  • Kawakami, Sachiko
  • Kubota, Tomohiro
  • Yamaguchi, Tomoya

Abstract

An aspect of the present invention provides a material having a higher purity than conventional ones in order to enhance durability. Recycling for purification with a recycling liquid chromatography device is performed over a long time. Thereafter, one peak profile which includes a peak assigned to the structure of a desired iridium complex and is obtained from a chromatograph thus obtained with the recycling liquid chromatography device is divided into at least three portions. A recovery fraction including a maximal value of the peak is selectively recovered to perform purification.

IPC Classes  ?

  • C07F 15/00 - Compounds containing elements of Groups 8, 9, 10 or 18 of the Periodic Table
  • C09K 11/06 - Luminescent, e.g. electroluminescent, chemiluminescent, materials containing organic luminescent materials
  • H10K 50/12 - OLEDs or polymer light-emitting diodes [PLED] characterised by the electroluminescent [EL] layers comprising dopants
  • H10K 71/70 - Testing, e.g. accelerated lifetime tests
  • H10K 85/30 - Coordination compounds

9.

SEMICONDUCTOR DEVICE

      
Application Number IB2026053086
Publication Number 2026/210333
Status In Force
Filing Date 2026-03-30
Publication Date 2026-10-08
Owner SEMICONDUCTOR ENERGY LABORATORY CO., LTD. (Japan)
Inventor
  • Miyairi, Hidekazu
  • Nakashima, Motoki

Abstract

Provided is a miniaturized or highly integrated semiconductor device. The present invention has first to third transistors. The first transistor has a first semiconductor layer, a first conductive layer, and a second conductive layer. The second transistor has the first semiconductor layer, the first conductive layer, and a third conductive layer. The third transistor has a second semiconductor layer, a fourth conductive layer, and the second conductive layer. The first conductive layer has a first opening overlapping the second conductive layer and a second opening overlapping the third conductive layer. The fourth conductive layer has a third opening overlapping the second conductive layer. The first semiconductor layer is in contact with a side surface of the first conductive layer in the first opening and a side surface of the first conductive layer in the second opening. The second semiconductor layer is in contact with a side surface of the fourth conductive layer in the third opening. In plan view, the center-to-center distance between the first opening and the second opening is shorter than the center-to-center distance between the first opening and the third opening.

IPC Classes  ?

  • H10B 12/00 - Dynamic random access memory [DRAM] devices
  • H10B 41/70 - Electrically erasable-and-programmable ROM [EEPROM] devices comprising floating gates the floating gate being an electrode shared by two or more components
  • H10B 53/30 - Ferroelectric RAM [FeRAM] devices comprising ferroelectric memory capacitors characterised by the memory core region
  • H10D 1/68 - Capacitors having no potential barriers
  • H10D 30/67 - Thin-film transistors [TFT]
  • H10D 30/68 - Floating-gate IGFETs
  • H10D 84/80 - Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers characterised by the integration of at least one component covered by groups or , e.g. integration of IGFETs
  • H10D 84/83 - Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers characterised by the integration of at least one component covered by groups or , e.g. integration of IGFETs of only field-effect components of only insulated-gate FETs [IGFET]
  • H10D 86/40 - Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs
  • H10D 87/00 - Integrated devices comprising both bulk components and either SOI or SOS components on the same substrate

10.

SEMICONDUCTOR DEVICE

      
Application Number IB2026052794
Publication Number 2026/210280
Status In Force
Filing Date 2026-03-24
Publication Date 2026-10-08
Owner SEMICONDUCTOR ENERGY LABORATORY CO., LTD. (Japan)
Inventor
  • Watanabe, Kazunori
  • Kusunoki, Koji

Abstract

Provided is a novel semiconductor device. The gate of a second transistor is connected to a first terminal of a fifth transistor and a first terminal of a second capacitive element. A second terminal of the second capacitive element is connected to a first terminal of a first transistor, a first terminal of a sixth transistor, and a first terminal of a third capacitive element. A first terminal of the second transistor is connected to a second terminal of the fifth transistor, a first terminal of a third transistor, the gate of a fourth transistor, and a first terminal of a first capacitive element. A second terminal of the second transistor is connected to a second terminal of the sixth transistor. A first terminal of the fourth transistor is connected to a first terminal of a light-emitting element. The channel length of the second transistor is greater than the channel length of the fourth transistor.

IPC Classes  ?

  • G09F 9/30 - Indicating arrangements for variable information in which the information is built-up on a support by selection or combination of individual elements in which the desired character or characters are formed by combining individual elements
  • G09F 9/33 - Indicating arrangements for variable information in which the information is built-up on a support by selection or combination of individual elements in which the desired character or characters are formed by combining individual elements being semiconductor devices, e.g. diodes
  • G09G 3/20 - Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix
  • G09G 3/30 - Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix using controlled light sources using electroluminescent panels
  • G09G 3/32 - Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix using controlled light sources using electroluminescent panels semiconductive, e.g. using light-emitting diodes [LED]
  • G09G 3/3225 - Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix using controlled light sources using electroluminescent panels semiconductive, e.g. using light-emitting diodes [LED] organic, e.g. using organic light-emitting diodes [OLED] using an active matrix
  • G09G 3/3233 - Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix using controlled light sources using electroluminescent panels semiconductive, e.g. using light-emitting diodes [LED] organic, e.g. using organic light-emitting diodes [OLED] using an active matrix with pixel circuitry controlling the current through the light-emitting element
  • H10D 30/67 - Thin-film transistors [TFT]
  • H10D 84/80 - Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers characterised by the integration of at least one component covered by groups or , e.g. integration of IGFETs
  • H10D 84/83 - Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers characterised by the integration of at least one component covered by groups or , e.g. integration of IGFETs of only field-effect components of only insulated-gate FETs [IGFET]
  • H10D 86/40 - Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs
  • H10D 86/60 - Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs wherein the TFTs are in active matrices
  • H10H 20/00 - Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
  • H10H 29/10 - Integrated devices comprising at least one light-emitting semiconductor component covered by group
  • H10H 29/39 - Connection of the pixel electrodes to the driving transistors
  • H10K 50/82 - Cathodes
  • H10K 50/88 - Terminals, e.g. bond pads
  • H10K 59/12 - Active-matrix OLED [AMOLED] displays
  • H10K 59/80 - Constructional details
  • H10K 59/82 - Interconnections, e.g. terminals
  • H10K 59/121 - Active-matrix OLED [AMOLED] displays characterised by the geometry or disposition of pixel elements
  • H10K 59/123 - Connection of the pixel electrodes to the thin film transistors [TFT]
  • H10K 59/131 - Interconnections, e.g. wiring lines or terminals

11.

SEMICONDUCTOR DEVICE, MEMORY DEVICE, AND METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE

      
Application Number 19480478
Status Pending
Filing Date 2024-05-02
First Publication Date 2026-10-08
Owner Semiconductor Energy Laboratory Co., Ltd. (Japan)
Inventor
  • Okazaki, Yutaka
  • Nakashima, Motoki

Abstract

A semiconductor device with favorable electrical characteristics is to be provided. The semiconductor device includes a cylindrical semiconductor layer, a first conductive layer in contact with a bottom surface of the semiconductor layer, a second conductive layer in contact with a top surface of the semiconductor layer, a first insulating layer covering at least part of a side surface of the semiconductor layer, and a third conductive layer facing the side surface of the semiconductor layer with the first insulating layer therebetween. The first insulating layer includes a first region between the semiconductor layer and the third conductive layer and a second region between the first conductive layer and the third conductive layer. The width of the first region in the direction from the semiconductor layer toward the third conductive layer is equal to or substantially equal to the width of the second region in the direction from the first conductive layer toward the third conductive layer.

IPC Classes  ?

  • H10B 12/00 - Dynamic random access memory [DRAM] devices

12.

DOCUMENT SEARCH SYSTEM AND DOCUMENT SEARCH METHOD

      
Application Number 19460190
Status Pending
Filing Date 2026-01-26
First Publication Date 2026-10-08
Owner SEMICONDUCTOR ENERGY LABORATORY CO., LTD. (Japan)
Inventor
  • Yamamoto, Kunitaka
  • Momo, Junpei
  • Higashi, Kazuki

Abstract

A document search system that enables efficient document search regardless of the ability of a user is achieved. Document search is performed using a document search system in which database document data is stored. After first document data and second document data are input to the document search system, the document search system extracts a plurality of terms from the first document data. The extraction of the terms is performed using morphological analysis, for example. Next, the extracted terms are weighted on the basis of the second document data. For example, texts included in a document represented by the second document data are classified into first and second texts. Among the terms extracted from the first document data, the weight of the term included in the first text is set larger than the weights of the other terms. The classification of the texts can be performed in accordance with a rule basis or using machine learning. After that, the similarity of the database document data to the first document data is calculated on the basis of the weighted term.

IPC Classes  ?

13.

INFORMATION PROCESSING SYSTEM AND INFORMATION PROCESSING METHOD

      
Application Number 19577645
Status Pending
Filing Date 2026-03-25
First Publication Date 2026-10-08
Owner SEMICONDUCTOR ENERGY LABORATORY CO., LTD. (Japan)
Inventor
  • Momo, Junpei
  • Takase, Natsuko

Abstract

A novel information processing system that is highly convenient, useful, or reliable is provided. The information processing system includes a first component, a second component, and a third component. The first component has a function of receiving a document and transmitting it to the third component and a function of receiving and providing a comment. The second component has a function of generating a question, an answer, and the comment with the use of a large language model. The third component has a function of receiving the document, the question, the answer, and the comment and internally sharing them, and a function of transmitting a prompt to the second component. The third component also has a function of creating the prompt. Thus, the question, the answer, and the comment regarding the document can be generated.

IPC Classes  ?

  • G06F 40/40 - Processing or translation of natural language
  • G06F 16/248 - Presentation of query results
  • G06F 40/169 - Annotation, e.g. comment data or footnotes

14.

SEMICONDUCTOR DEVICE

      
Application Number 19482334
Status Pending
Filing Date 2024-06-03
First Publication Date 2026-10-08
Owner Semiconductor Energy Laboratory Co., Ltd. (Japan)
Inventor
  • Okamoto, Yuki
  • Koumura, Yusuke

Abstract

A novel semiconductor device is provided. The memory cell includes a first transistor and a first capacitor. A gate of the first transistor is electrically connected to a word line. One of a source and a drain of the first transistor is electrically connected to one terminal of the first capacitor. The other of the source and the drain of the first transistor is electrically connected to a gate of the second transistor and one of a source and a drain of the third transistor. One of a source and a drain of the second transistor and the other of the source and the drain of the third transistor are electrically connected to the second sensing circuit through a bit line. The second sensing circuit has a function of outputting first data corresponding to a potential of the bit line. The memory circuit has a function of retaining second data corresponding to the number of times the memory cell is accessed. The input/output circuit has a function of, in accordance with the second data, determining whether to invert or not to invert the first data and outputting the first data.

IPC Classes  ?

  • G11C 11/4091 - Sense or sense/refresh amplifiers, or associated sense circuitry, e.g. for coupled bit-line precharging, equalising or isolating
  • G11C 11/4096 - Input/output [I/O] data management or control circuits, e.g. reading or writing circuits, I/O drivers or bit-line switches
  • G11C 11/4097 - Bit-line organisation, e.g. bit-line layout, folded bit lines
  • H10B 12/00 - Dynamic random access memory [DRAM] devices
  • H10D 30/67 - Thin-film transistors [TFT]
  • H10D 62/83 - Semiconductor bodies, or regions thereof, of devices having potential barriers characterised by the materials being Group IV materials, e.g. B-doped Si or undoped Ge

15.

DISPLAY DEVICE AND ELECTRONIC DEVICE

      
Application Number 19482826
Status Pending
Filing Date 2024-05-13
First Publication Date 2026-10-08
Owner SEMICONDUCTOR ENERGY LABORATORY CO., LTD. (Japan)
Inventor
  • Yamazaki, Shunpei
  • Tsukamoto, Yosuke
  • Yoshizumi, Kensuke
  • Kawashima, Susumu

Abstract

To provide a display device in which the degree of freedom in the external shape can be increased. A display portion includes a first region, a second region, and a third region, the first to third regions each include a pixel circuit, the second region includes a component of a gate driver circuit, and the third region includes a component of a source driver circuit. A vertical transistor can be used as transistors that are components of the driver circuits. The vertical transistor has an advantage in that it can easily have a short channel length and a large channel width and thus can easily increase the on-state current. In addition, the vertical transistor can have a small occupation area, and components are easily distributed in a plurality of pixels.

IPC Classes  ?

16.

DISPLAY APPARATUS, DISPLAY MODULE, AND ELECTRONIC DEVICE

      
Application Number 19539707
Status Pending
Filing Date 2026-02-13
First Publication Date 2026-10-08
Owner SEMICONDUCTOR ENERGY LABORATORY CO., LTD. (Japan)
Inventor
  • Kubota, Daisuke
  • Kamada, Taisuke
  • Hatsumi, Ryo
  • Kusunoki, Koji
  • Watanabe, Kazunori
  • Kawashima, Susumu

Abstract

The resolution of a display apparatus having a light detection function is increased. The display apparatus includes a light-emitting device and a light-emitting and light-receiving device. The light-emitting device includes a first pixel electrode, a first light-emitting layer, and a common electrode; the light-emitting and light-receiving device includes a second pixel electrode, a second light-emitting layer, an active layer, and the common electrode; the active layer includes an organic compound; the first light-emitting layer is positioned between the first pixel electrode and the common electrode; the second light-emitting layer and the active layer are each positioned between the second pixel electrode and the common electrode; the light-emitting device has a function of emitting light of a first color; and the light-emitting and light-receiving device has a function of emitting light of a second color and a function of receiving light of the first color. The light-emitting and light-receiving device functions as both a light-emitting device and a light-receiving device, whereby a pixel can have a light-receiving function without an increase in the number of subpixels included in the pixel. Furthermore, the pixel can be provided with a light-receiving function without a reduction in the resolution of the display apparatus or a reduction in the aperture ratio of each subpixel.

IPC Classes  ?

  • H10K 59/35 - Devices specially adapted for multicolour light emission comprising red-green-blue [RGB] subpixels
  • H10K 39/30 - Devices controlled by radiation
  • H10K 59/65 - OLEDs integrated with inorganic image sensors
  • H10K 59/80 - Constructional details
  • H10K 102/00 - Constructional details relating to the organic devices covered by this subclass

17.

SECONDARY BATTERY

      
Application Number 19714860
Status Pending
Filing Date 2026-06-22
First Publication Date 2026-10-08
Owner SEMICONDUCTOR ENERGY LABORATORY CO., LTD. (Japan)
Inventor
  • Saito, Jo
  • Momma, Yohei
  • Fukushima, Kunihiro
  • Oguni, Teppei

Abstract

A secondary battery with little deterioration is provided. A highly reliable secondary battery is provided. A positive electrode active material included in the secondary battery includes a crystal of lithium cobalt oxide. The positive electrode active material includes a first region including a surface parallel to the (001) plane of the crystal and a second region including a surface parallel to a plane intersecting with the (001) plane. The positive electrode active material contains magnesium. The first region includes a portion with a magnesium concentration that is higher than or equal to 0.5 atomic % and lower than or equal to 10 atomic %. The second region includes a portion with a magnesium concentration that is higher than the magnesium concentration in the first region and is higher than or equal to 4 atomic % and lower than or equal to 30 atomic %. Furthermore, the second region includes a portion with a fluorine concentration that is higher than a fluorine concentration in the first region and is higher than or equal to 0.5 atomic % and lower than or equal to 10 atomic %.

IPC Classes  ?

  • H01M 4/62 - Selection of inactive substances as ingredients for active masses, e.g. binders, fillers
  • H01M 4/02 - Electrodes composed of, or comprising, active material
  • H01M 4/1315 - Electrodes based on mixed oxides or hydroxides, or on mixtures of oxides or hydroxides, e.g. LiCoOx containing halogen atoms, e.g. LiCoOxFy
  • H01M 4/134 - Electrodes based on metals, Si or alloys
  • H01M 4/525 - Selection of substances as active materials, active masses, active liquids of inorganic oxides or hydroxides of nickel, cobalt or iron of mixed oxides or hydroxides containing iron, cobalt or nickel for inserting or intercalating light metals, e.g. LiNiO2, LiCoO2 or LiCoOxFy
  • H01M 10/052 - Li-accumulators

18.

METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE

      
Application Number 19108228
Status Pending
Filing Date 2023-09-01
First Publication Date 2026-10-08
Owner SEMICONDUCTOR ENERGY LABORATORY CO., LTD. (Japan)
Inventor
  • Miyairi, Hidekazu
  • Yamazaki, Shunpei

Abstract

A semiconductor device that can be miniaturized or highly integrated is provided. Over a first layer, a second layer, a mask, and a first resist mask are formed in this order; a first opening portion is formed in the first resist mask; the first opening portion is reduced in size in a plan view; a second opening portion is formed in a position of the mask that overlaps with the first opening portion; the first resist mask is removed; a second resist mask is formed over the mask provided with the second opening portion; a third opening portion is formed in the second resist mask; the third opening portion is reduced in size in the plan view; a fourth opening portion is formed in a position of the mask that overlaps with the third opening portion and does not overlap with the second opening portion; the second resist mask is removed; a fifth opening portion is formed in each position of the second layer that overlaps with the second opening portion or overlaps with the fourth opening portion; the mask is removed; and an oxide semiconductor in contact with a side surface of the second layer and a top surface of the first layer is formed inside the fifth opening portion.

IPC Classes  ?

19.

LIGHT-EMITTING DEVICE

      
Application Number 19717817
Status Pending
Filing Date 2026-06-24
First Publication Date 2026-10-08
Owner Semiconductor Energy Laboratory Co., Ltd. (Japan)
Inventor
  • Hirakata, Yoshiharu
  • Jinbo, Yasuhiro
  • Yamazaki, Shunpei

Abstract

A light-emitting device can be folded in such a manner that a flexible light-emitting panel is supported by a plurality of housings which are provided spaced from each other and the light-emitting panel is bent so that surfaces of adjacent housings are in contact with each other. Furthermore, in the light-emitting device, in which part or the whole of the housings have magnetism, the two adjacent housings can be fixed to each other by a magnetic force when the light-emitting device is used in a folded state.

IPC Classes  ?

  • G09F 9/30 - Indicating arrangements for variable information in which the information is built-up on a support by selection or combination of individual elements in which the desired character or characters are formed by combining individual elements
  • G06F 1/16 - Constructional details or arrangements
  • H01F 1/147 - Alloys characterised by their composition
  • H05K 5/00 - Casings, cabinets or drawers for electric apparatus
  • H10K 50/84 - PassivationContainersEncapsulations
  • H10K 50/842 - Containers
  • H10K 50/844 - Encapsulations
  • H10K 59/12 - Active-matrix OLED [AMOLED] displays
  • H10K 59/121 - Active-matrix OLED [AMOLED] displays characterised by the geometry or disposition of pixel elements
  • H10K 59/40 - OLEDs integrated with touch screens
  • H10K 59/60 - OLEDs integrated with inorganic light-sensitive elements, e.g. with inorganic solar cells or inorganic photodiodes
  • H10K 59/80 - Constructional details
  • H10K 71/80 - Manufacture or treatment specially adapted for the organic devices covered by this subclass using temporary substrates
  • H10K 77/10 - Substrates, e.g. flexible substrates
  • H10K 102/00 - Constructional details relating to the organic devices covered by this subclass

20.

ORGANIC COMPOUND, LIGHT-EMITTING DEVICE, LIGHT-EMITTING APPARATUS, ELECTRONIC DEVICE, DISPLAY DEVICE, LIGHTING DEVICE

      
Application Number 19708680
Status Pending
Filing Date 2026-06-15
First Publication Date 2026-10-08
Owner SEMICONDUCTOR ENERGY LABORATORY CO., LTD. (Japan)
Inventor
  • Takeda, Kyoko
  • Suzuki, Kunihiko
  • Osaka, Harue
  • Seo, Satoshi
  • Suzuki, Tsunenori
  • Ishimoto, Takuya
  • Hashimoto, Naoaki

Abstract

A novel organic compound is provided. Alternatively, an organic compound that emits light with favorable chromaticity is provided. Alternatively, an organic compound that emits blue light with favorable chromaticity is provided. Alternatively, a light-emitting element with favorable emission efficiency is provided. Alternatively, an organic compound with an excellent carrier-transport property is provided. The organic compound includes any of a substituted or unsubstituted dibenzofurobisbenzofuran skeleton, a substituted or unsubstituted dibenzothienobisbenzothiophene skeleton, a substituted or unsubstituted benzobisbenzothienobenzofuran skeleton, and a substituted or unsubstituted dibenzothienobisbenzofuran skeleton and one or two amino groups. In the organic compound, the amino group includes a substituted or unsubstituted heteroaryl group and any of a substituted or unsubstituted aromatic hydrocarbon group having 6 to 25 carbon atoms and a substituted or unsubstituted heteroaryl group having 5 to 25 carbon atoms.

IPC Classes  ?

  • H10K 85/60 - Organic compounds having low molecular weight
  • C07D 493/14 - Ortho-condensed systems
  • C09K 11/06 - Luminescent, e.g. electroluminescent, chemiluminescent, materials containing organic luminescent materials
  • H10K 50/11 - OLEDs or polymer light-emitting diodes [PLED] characterised by the electroluminescent [EL] layers

21.

DISPLAY APPARATUS

      
Application Number IB2026052989
Publication Number 2026/210310
Status In Force
Filing Date 2026-03-27
Publication Date 2026-10-08
Owner SEMICONDUCTOR ENERGY LABORATORY CO., LTD. (Japan)
Inventor
  • Yamazaki, Shunpei
  • Okazaki, Kenichi
  • Aoyama, Tomoya
  • Sato, Rai
  • Idojiri, Satoru
  • Nakazawa, Yasutaka

Abstract

Provided is a display apparatus having a high display quality. The present invention has: a first light-emitting device having a first light-emitting layer; a second light-emitting device adjacent to the first light-emitting device and having a second light-emitting layer; a third light-emitting device adjacent to the second light-emitting device and having a third light-emitting layer; and partition walls between the first device and the second device and between the second device and the third device. The distance d1 between the first light-emitting device and the second light-emitting device is 3-25 times the distance d2 between the second light-emitting device and the third light-emitting device.

IPC Classes  ?

  • G09F 9/302 - Indicating arrangements for variable information in which the information is built-up on a support by selection or combination of individual elements in which the desired character or characters are formed by combining individual elements characterised by the form or geometrical disposition of the individual elements
  • G09F 9/30 - Indicating arrangements for variable information in which the information is built-up on a support by selection or combination of individual elements in which the desired character or characters are formed by combining individual elements
  • H05B 33/12 - Light sources with substantially two-dimensional radiating surfaces
  • H05B 33/14 - Light sources with substantially two-dimensional radiating surfaces characterised by the chemical or physical composition or the arrangement of the electroluminescent material
  • H10K 50/12 - OLEDs or polymer light-emitting diodes [PLED] characterised by the electroluminescent [EL] layers comprising dopants
  • H10K 50/13 - OLEDs or polymer light-emitting diodes [PLED] characterised by the electroluminescent [EL] layers specially adapted for multicolour light emission, e.g. for emitting white light comprising stacked EL layers within one EL unit
  • H10K 59/35 - Devices specially adapted for multicolour light emission comprising red-green-blue [RGB] subpixels
  • H10K 59/65 - OLEDs integrated with inorganic image sensors
  • H10K 59/122 - Pixel-defining structures or layers, e.g. banks

22.

SECONDARY BATTERY

      
Application Number 19477397
Status Pending
Filing Date 2024-04-24
First Publication Date 2026-10-01
Owner SEMICONDUCTOR ENERGY LABORATORY CO., LTD. (Japan)
Inventor
  • Yamazaki, Shunpei
  • Yokomizo, Kazune

Abstract

A positive electrode active material that can be used in a lithium-ion secondary battery and in which conductivity is improved and/or insertion and extraction of lithium ions are promoted is provided. A secondary battery includes a positive electrode active material; the positive electrode active material contains an additive element whose oxide can be a semiconductor, magnesium, and lithium cobalt oxide; the positive electrode active material includes a crack; the positive electrode active material includes a surface portion and a crack portion; the surface portion is a region within 10 nm from a surface other than the crack portion in a direction substantially perpendicular to the surface; the crack portion is a region within 10 nm from a surface of the crack portion in a direction substantially perpendicular to the surface and is a region other than the surface portion; magnesium is detected from the surface portion and the crack portion; the element whose oxide can be a semiconductor is detected from the surface portion; and the element whose oxide can be a semiconductor is one or two selected from nickel and titanium.

IPC Classes  ?

  • H01M 4/525 - Selection of substances as active materials, active masses, active liquids of inorganic oxides or hydroxides of nickel, cobalt or iron of mixed oxides or hydroxides containing iron, cobalt or nickel for inserting or intercalating light metals, e.g. LiNiO2, LiCoO2 or LiCoOxFy
  • H01M 4/02 - Electrodes composed of, or comprising, active material
  • H01M 4/36 - Selection of substances as active materials, active masses, active liquids
  • H01M 4/38 - Selection of substances as active materials, active masses, active liquids of elements or alloys
  • H01M 10/0525 - Rocking-chair batteries, i.e. batteries with lithium insertion or intercalation in both electrodesLithium-ion batteries

23.

SEMICONDUCTOR DEVICE, DRIVER CIRCUIT, AND DISPLAY APPARATUS

      
Application Number 19477588
Status Pending
Filing Date 2024-04-23
First Publication Date 2026-10-01
Owner SEMICONDUCTOR ENERGY LABORATORY CO., LTD. (Japan)
Inventor
  • Kawashima, Susumu
  • Ito, Minato
  • Kimura, Hajime
  • Inoue, Tatsunori

Abstract

A semiconductor device capable of low-speed operation is provided. The semiconductor device includes first to eighth transistors and first and second capacitor elements. Gates of the first transistor and the second transistor are connected to each other. A first terminal of the first transistor is electrically connected to a first terminal of the fourth transistor and a first terminal of the fifth transistor. A first terminal of the third transistor is electrically connected to a first terminal of the second transistor, a gate of the fourth transistor, a first terminal of the first capacitor element, a gate of the seventh transistor, and a first terminal of the eighth transistor. A second terminal of the fifth transistor is electrically connected to a gate of the sixth transistor and a first terminal of the second capacitor element. A first terminal of the sixth transistor is electrically connected to a second terminal of the second capacitor element, a first terminal of the seventh transistor, and a gate of the eighth transistor.

IPC Classes  ?

  • H10D 86/40 - Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs
  • G09G 3/32 - Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix using controlled light sources using electroluminescent panels semiconductive, e.g. using light-emitting diodes [LED]
  • G09G 3/3225 - Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix using controlled light sources using electroluminescent panels semiconductive, e.g. using light-emitting diodes [LED] organic, e.g. using organic light-emitting diodes [OLED] using an active matrix
  • G09G 3/3266 - Details of drivers for scan electrodes
  • G09G 3/3275 - Details of drivers for data electrodes
  • H10D 86/60 - Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs wherein the TFTs are in active matrices

24.

BATTERY MODULE

      
Application Number 19477862
Status Pending
Filing Date 2024-05-13
First Publication Date 2026-10-01
Owner SEMICONDUCTOR ENERGY LABORATORY CO., LTD. (Japan)
Inventor
  • Osada, Takeshi
  • Tsukamoto, Yosuke

Abstract

A battery module that includes a circuit for safe control and that is capable of space-saving is to be provided. The battery module includes a flexible printed circuit (FPC) board, an exterior body, a positive electrode, and a negative electrode; the FPC board includes a first resin layer, a second resin layer, a third resin layer, a first metal layer positioned between the first resin layer and the second resin layer, and a second metal layer positioned between the second resin layer and the third resin layer; the first resin layer and the exterior body are bonded to each other at a sealing portion; the positive electrode includes a positive electrode current collector; the negative electrode includes a negative electrode current collector; and in a sealed space surrounded by the first resin layer, the exterior body, and the sealing portion, the first resin layer includes a first opening reaching the first metal layer, the first resin layer, the first metal layer, and the second resin layer each include a second opening reaching the second metal layer, the positive electrode current collector is connected to the first metal layer in the first opening, and the negative electrode current collector is connected to the second metal layer in the second opening.

IPC Classes  ?

  • H01M 50/284 - MountingsSecondary casings or framesRacks, modules or packsSuspension devicesShock absorbersTransport or carrying devicesHolders with incorporated circuit boards, e.g. printed circuit boards [PCB]

25.

SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SEMICONDUCTOR DEVICE

      
Application Number 19480875
Status Pending
Filing Date 2024-05-13
First Publication Date 2026-10-01
Owner Semiconductor Energy Laboratory Co., Ltd. (Japan)
Inventor
  • Jintyou, Masami
  • Iguchi, Takahiro
  • Kurosaki, Daisuke
  • Koezuka, Junichi

Abstract

A semiconductor device including a transistor having a minute size is provided. A semiconductor device includes a semiconductor layer, first to fourth conductive layers, and first and second insulating layers. The second conductive layer is provided over the first conductive layer and includes a first opening overlapping with the first conductive layer. The third conductive layer is provided over the second conductive layer and includes a second opening overlapping with the first opening. The first insulating layer is in contact with a sidewall of the first opening. The semiconductor layer is provided over the first conductive layer, the first insulating layer, and the third conductive layer. The semiconductor layer includes a first region in contact with the top surface of the first conductive layer, a second region in contact with the side surface of the first insulating layer, and a third region in contact with the top surface of the third conductive layer. The second insulating layer is provided over the semiconductor layer. The fourth conductive layer is provided over the second insulating layer. The fourth conductive layer faces the second conductive layer with the second insulating layer, the semiconductor layer, and the first insulating layer therebetween. Each of the first region and the third region has a lower resistance than the second region.

IPC Classes  ?

26.

DISPLAY APPARATUS, DISPLAY MODULE, ELECTRONIC DEVICE, AND METHOD FOR MANUFACTURING DISPLAY APPARATUS

      
Application Number 19705889
Status Pending
Filing Date 2026-06-12
First Publication Date 2026-10-01
Owner Semiconductor Energy Laboratory Co., Ltd. (Japan)
Inventor
  • Okazaki, Kenichi
  • Nakamura, Daiki
  • Sato, Rai
  • Yamazaki, Shunpei

Abstract

A higher-definition or higher-resolution display apparatus is provided. The display apparatus includes a first light-emitting device, a second light-emitting device, a first insulating layer, a first coloring layer, and a second coloring layer. The first light-emitting device includes a first pixel electrode, a first light-emitting layer over the first pixel electrode, and a common electrode over the first light-emitting layer. The second light-emitting device includes a second pixel electrode, a second light-emitting layer over the second pixel electrode, and the common electrode over the second light-emitting layer. The first insulating layer covers side surfaces of the first pixel electrode, the second pixel electrode, the first light-emitting layer, and the second light-emitting layer. The first coloring layer is placed to overlap with the first light-emitting device. The second coloring layer is placed to overlap with the second light-emitting device. The first light-emitting device and the second light-emitting device have a function of emitting white light. The first coloring layer and the second coloring layer have a function of transmitting visible light of different colors.

IPC Classes  ?

  • H10K 59/38 - Devices specially adapted for multicolour light emission comprising colour filters or colour changing media [CCM]
  • H10K 50/10 - OLEDs or polymer light-emitting diodes [PLED]
  • H10K 50/15 - Hole transporting layers
  • H10K 50/16 - Electron transporting layers
  • H10K 50/17 - Carrier injection layers
  • H10K 59/12 - Active-matrix OLED [AMOLED] displays
  • H10K 59/80 - Constructional details
  • H10K 71/16 - Deposition of organic active material using physical vapour deposition [PVD], e.g. vacuum deposition or sputtering
  • H10K 71/60 - Forming conductive regions or layers, e.g. electrodes

27.

SEPARATOR, SECONDARY BATTERY, AND A METHOD FOR MANUFACTURING SEPARATOR

      
Application Number 19705898
Status Pending
Filing Date 2026-06-12
First Publication Date 2026-10-01
Owner Semiconductor Energy Laboratory Co., Ltd. (Japan)
Inventor
  • Ogita, Kaori
  • Ishitani, Tetsuji
  • Yoshitomi, Shuhei
  • Tanaka, Fumiko
  • Muratsubaki, Shotaro
  • Oguni, Teppei

Abstract

A secondary battery with little deterioration is provided. A secondary battery with high safety is provided. A separator having excellent characteristics is provided. A separator achieving the secondary battery with high safety is provided. A novel separator is provided. In the separator, a polymer porous film and a layer including a ceramic-based material containing a metal oxide microparticle are stacked, the thickness of the layer including a ceramic-based material is greater than or equal to 1 μm and less than or equal to 100 μm, and the film thickness of the polymer porous film is greater than or equal to 4 μm and less than or equal to 50 μm.

IPC Classes  ?

  • H01M 50/451 - Separators, membranes or diaphragms characterised by the material having a layered structure comprising layers of only organic material and layers containing inorganic material
  • H01M 10/0525 - Rocking-chair batteries, i.e. batteries with lithium insertion or intercalation in both electrodesLithium-ion batteries
  • H01M 50/403 - Manufacturing processes of separators, membranes or diaphragms
  • H01M 50/434 - Ceramics
  • H01M 50/491 - Porosity

28.

SEMICONDUCTOR DEVICE

      
Application Number IB2026052557
Publication Number 2026/202648
Status In Force
Filing Date 2026-03-17
Publication Date 2026-10-01
Owner SEMICONDUCTOR ENERGY LABORATORY CO., LTD. (Japan)
Inventor
  • Kimura, Kiyotaka
  • Tsuda, Kazuki
  • Yakubo, Yuto

Abstract

Provided is a novel semiconductor device. The semiconductor device comprises: a first circuit that has the function of supplying, to a second circuit, a current which has the same value as the total of currents supplied to n input terminals; and a second circuit that has the function of setting the value of the current which has been supplied from the first circuit to 1/n and supplying the current to an output terminal, wherein the first circuit has a transistor that includes an oxide semiconductor in a semiconductor layer in which a channel is formed, the second circuit has a transistor that includes silicon in a semiconductor layer in which a channel is formed, and the first circuit and the second circuit have mutually overlapping regions.

IPC Classes  ?

  • G06G 7/60 - Analogue computers for specific processes, systems, or devices, e.g. simulators for living beings, e.g. their nervous systems
  • G06G 7/12 - Arrangements for performing computing operations, e.g. amplifiers specially adapted therefor
  • G06G 7/14 - Arrangements for performing computing operations, e.g. amplifiers specially adapted therefor for addition or subtraction
  • G06G 7/16 - Arrangements for performing computing operations, e.g. amplifiers specially adapted therefor for multiplication or division
  • G06N 3/065 - Analogue means
  • H10D 84/83 - Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers characterised by the integration of at least one component covered by groups or , e.g. integration of IGFETs of only field-effect components of only insulated-gate FETs [IGFET]

29.

SEMICONDUCTOR DEVICE AND METHOD FOR PRODUCING SEMICONDUCTOR DEVICE

      
Application Number IB2026052558
Publication Number 2026/202649
Status In Force
Filing Date 2026-03-17
Publication Date 2026-10-01
Owner SEMICONDUCTOR ENERGY LABORATORY CO., LTD. (Japan)
Inventor
  • Koezuka, Junichi
  • Jintyou, Masami

Abstract

Provided is a semiconductor device comprising micro-sized transistors. The semiconductor device comprises two vertical transistors (a first transistor and a second transistor) and a first insulating layer. The first transistor is an n-channel transistor, and the second transistor is a p-channel transistor. The first insulating layer is provided in a band shape so as to have a region sandwiched between a source electrode and a drain electrode of the first transistor and between a source electrode and a drain electrode of the second transistor. The first transistor and the second transistor are connected in series. A semiconductor layer of the first transistor has a region facing a first side surface of the first insulating layer. A semiconductor layer of the second transistor has a region facing a second side surface of the first insulating layer. The first side surface and the second side surface of the first insulating layer face each other.

IPC Classes  ?

  • H10D 86/40 - Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs
  • G09F 9/00 - Indicating arrangements for variable information in which the information is built-up on a support by selection or combination of individual elements
  • G09F 9/30 - Indicating arrangements for variable information in which the information is built-up on a support by selection or combination of individual elements in which the desired character or characters are formed by combining individual elements
  • H10B 10/00 - Static random access memory [SRAM] devices
  • H10D 30/67 - Thin-film transistors [TFT]

30.

COMPUTATION DEVICE

      
Application Number IB2026052609
Publication Number 2026/202658
Status In Force
Filing Date 2026-03-18
Publication Date 2026-10-01
Owner SEMICONDUCTOR ENERGY LABORATORY CO., LTD. (Japan)
Inventor
  • Tsuda, Kazuki
  • Kimura, Kiyotaka
  • Yakubo, Yuto

Abstract

Provided is a computation device. The computation device has: a computation circuit unit that has a plurality of computation cells for retaining first data; a drive circuit that outputs second data to the computation circuit unit; a first sample-and-hold circuit unit; a switch unit; and a second sample-and-hold circuit unit. The computation circuit unit supplies a first current to the first sample-and-hold circuit unit, said first current corresponding to the sum of currents flowing through the computation cells to which the second data has been supplied. First sample-and-hold circuits retain a plurality of items of third data that correspond to the first current, by switching the second data. The switch unit supplies a second current to the second sample-and-hold circuit unit, said second current corresponding to the sum of currents flowing from the plurality of first sample-and-holds circuits via switches. Second sample-and-hold circuits retain a plurality of items of fourth data that correspond to the second current, by switching switch paths.

IPC Classes  ?

  • G06G 7/60 - Analogue computers for specific processes, systems, or devices, e.g. simulators for living beings, e.g. their nervous systems
  • G06G 7/14 - Arrangements for performing computing operations, e.g. amplifiers specially adapted therefor for addition or subtraction
  • G06G 7/16 - Arrangements for performing computing operations, e.g. amplifiers specially adapted therefor for multiplication or division
  • G06N 3/063 - Physical realisation, i.e. hardware implementation of neural networks, neurons or parts of neurons using electronic means
  • G06N 3/065 - Analogue means
  • H10B 12/00 - Dynamic random access memory [DRAM] devices
  • H10D 84/83 - Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers characterised by the integration of at least one component covered by groups or , e.g. integration of IGFETs of only field-effect components of only insulated-gate FETs [IGFET]

31.

SEMICONDUCTOR DEVICE

      
Application Number IB2026052610
Publication Number 2026/202659
Status In Force
Filing Date 2026-03-18
Publication Date 2026-10-01
Owner SEMICONDUCTOR ENERGY LABORATORY CO., LTD. (Japan)
Inventor
  • Tsuda, Kazuki
  • Kimura, Kiyotaka
  • Yakubo, Yuto

Abstract

Provided is a semiconductor device capable of calculating two different types of functions. The semiconductor device has first and second current generation circuits, a current source, and wiring. The first current generation circuit has a first input terminal and a first output terminal. The second current generation circuit has a second input terminal, a third input terminal, and a second output terminal. The current source has a third output terminal. The first output terminal is connected to the second input terminal and to the wiring, and the third input terminal is connected to the third output terminal. The first current generation circuit has, as a mirroring function, a function for generating a second current to flow through the first output terminal, with reference to a first current flowing through the first input terminal. The current source has a function for causing a fourth current to flow through the third output terminal. The second current generation circuit has, as a mirroring function, a function for generating a fifth current to be caused to flow to the second output terminal, such generation performed by referencing the smaller of: the amount of a differential current between the second current and a third current flowing through the wiring; and the amount of the fourth current.

IPC Classes  ?

  • G06G 7/60 - Analogue computers for specific processes, systems, or devices, e.g. simulators for living beings, e.g. their nervous systems
  • B64G 1/54 - Protection against radiation
  • G05F 3/26 - Current mirrors
  • G06G 7/14 - Arrangements for performing computing operations, e.g. amplifiers specially adapted therefor for addition or subtraction
  • G06G 7/16 - Arrangements for performing computing operations, e.g. amplifiers specially adapted therefor for multiplication or division
  • G06G 7/25 - Arrangements for performing computing operations, e.g. amplifiers specially adapted therefor for discontinuous functions, e.g. backlash, dead zone, limiting, absolute value, or peak value
  • G06N 3/063 - Physical realisation, i.e. hardware implementation of neural networks, neurons or parts of neurons using electronic means
  • G06N 3/065 - Analogue means
  • H10D 84/83 - Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers characterised by the integration of at least one component covered by groups or , e.g. integration of IGFETs of only field-effect components of only insulated-gate FETs [IGFET]
  • H10D 84/85 - Complementary IGFETs, e.g. CMOS
  • H10D 86/40 - Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs

32.

INFORMATION PROCESSING METHOD AND INFORMATION PROCESSING DEVICE

      
Application Number IB2026052656
Publication Number 2026/202667
Status In Force
Filing Date 2026-03-19
Publication Date 2026-10-01
Owner SEMICONDUCTOR ENERGY LABORATORY CO., LTD. (Japan)
Inventor
  • Tsutsui, Naoaki
  • Nakazato, Ryo
  • Tani, Chizuko

Abstract

Provided is an information processing device that contributes to smooth execution of design work. According to the present invention, design information including a design drawing such as a circuit diagram and a specification is accepted, after which a language model is caused to generate design commands based on the design information. Design is performed on the basis of the design commands, and design results are acquired. The language model is caused to extract any defect included in the design results and estimate the cause of the defect. Literature is acquired by performing a search on the basis of the defect and cause. The language model is caused to generate human resource search information on the basis of the acquired literature. The human resource search information includes the skills required to resolve the defect, the time required to resolve the defect, etc. A search for a human resource suitable for resolving the defect is performed on the basis of the human resource search information. Defect-related information including the defect, the cause, and the retrieved literature is transmitted to the retrieved human resource to request resolution of the defect.

IPC Classes  ?

  • G06F 30/27 - Design optimisation, verification or simulation using machine learning, e.g. artificial intelligence, neural networks, support vector machines [SVM] or training a model
  • G06F 30/30 - Circuit design
  • G06N 3/04 - Architecture, e.g. interconnection topology
  • G06N 3/0475 - Generative networks

33.

DISPLAY MODULE AND ELECTRONIC DEVICE

      
Application Number 19477622
Status Pending
Filing Date 2024-04-24
First Publication Date 2026-10-01
Owner SEMICONDUCTOR ENERGY LABORATORY CO., LTD. (Japan)
Inventor
  • Endo, Akio
  • Ikeda, Hisao
  • Hatsumi, Ryo

Abstract

A novel display module that is highly convenient, useful, or reliable is provided. The display module includes a first support, a second support, a first adhesive layer, a gap, a fluid layer, and a display apparatus. The first support overlaps with the second support. The first support has flexibility. The second support has higher elasticity than the first support. The first adhesive layer bonds the first support and the second support to each other. The first adhesive layer fomes the gap between the first support and the second support. The gap holds the fluid layer. The fluid layer has fluidity within the range of 0° C. to 80° C., and the difference in refractive index between the fluid layer and the first support is greater than 0 and less than or equal to 0.2. The display apparatus is sandwiched between the first support and the second support, has a function of performing display toward the first support, and includes a first display region, a second display region, and a third display region. The first display region is fixed between the first support and the first adhesive layer. The second display region is sandwiched between the first display region and the third display region, can be bent, and is positioned inside the gap. The third display region is positioned inside the gap and slides inside the gap in accordance with bending of the second display region.

IPC Classes  ?

  • G06F 1/16 - Constructional details or arrangements

34.

METHOD FOR FORMING POSITIVE ELECTRODE ACTIVE MATERIAL PARTICLE

      
Application Number 19630106
Status Pending
Filing Date 2026-03-26
First Publication Date 2026-10-01
Owner SEMICONDUCTOR ENERGY LABORATORY CO., LTD. (Japan)
Inventor
  • Takahashi, Masahiro
  • Hirahara, Takashi
  • Nakamura, Toshihiro
  • Sasaki, Kousuke

Abstract

A method for forming a lithium-rich positive electrode active material particle which enables high charge and discharge capacities and has a stable crystal structure is provided. The method for forming the positive electrode active material particle includes the steps of: mixing a lithium source and an M source (M is one or more selected from Mn, Ni, Co, Cr, Mo, Nb, V, Fe, Ti, and Ru) to form a first mixture; heating the first mixture at higher than or equal to 850° C. and lower than 950° C. to synthesize a first composite oxide; mixing the first composite oxide and an additive element source to form a second mixture; and heating the second mixture at higher than or equal to 850° C. and lower than or equal to 950° C. The additive element source includes a fluorine source and a magnesium source.

IPC Classes  ?

  • C01G 53/502 - Complex oxides containing nickel and at least one other metal element containing alkali metals, e.g. LiNiO2 containing manganese of the type (MnO2)n-, e.g. Li(NixMn1-x)O2 or Li(MyNixMn1-x-y)O2 containing lithium and cobalt
  • H01M 4/02 - Electrodes composed of, or comprising, active material
  • H01M 4/36 - Selection of substances as active materials, active masses, active liquids
  • H01M 4/505 - Selection of substances as active materials, active masses, active liquids of inorganic oxides or hydroxides of manganese of mixed oxides or hydroxides containing manganese for inserting or intercalating light metals, e.g. LiMn2O4 or LiMn2OxFy
  • H01M 4/58 - Selection of substances as active materials, active masses, active liquids of inorganic compounds other than oxides or hydroxides, e.g. sulfides, selenides, tellurides, halogenides or LiCoFySelection of substances as active materials, active masses, active liquids of polyanionic structures, e.g. phosphates, silicates or borates

35.

LIGHT-EMITTING ELEMENT, DISPLAY DEVICE, ELECTRONIC DEVICE, AND LIGHTING DEVICE

      
Application Number 19687599
Status Pending
Filing Date 2026-05-26
First Publication Date 2026-10-01
Owner SEMICONDUCTOR ENERGY LABORATORY CO., LTD. (Japan)
Inventor
  • Seo, Satoshi
  • Ohsawa, Nobuharu

Abstract

A light-emitting element containing a light-emitting material and having high light emission efficiency is provided. The light-emitting element includes a host material and a guest material. The host material includes at least a first molecule and a second molecule having the same molecular structure. The guest material has a function of exhibiting fluorescence or converting triplet excitation energy into light emission. The first molecule and the second molecule each include a first skeleton, a second skeleton, and a third skeleton, and the first skeleton and the second skeleton are bonded to each other through the third skeleton. The first skeleton includes at least one of a π-electron rich heteroaromatic skeleton and an aromatic amine skeleton and the second skeleton includes a π-electron deficient heteroaromatic skeleton. The first molecule and the second molecule have a function of forming an excited complex.

IPC Classes  ?

  • H10K 85/60 - Organic compounds having low molecular weight
  • C09K 11/02 - Use of particular materials as binders, particle coatings or suspension media therefor
  • C09K 11/06 - Luminescent, e.g. electroluminescent, chemiluminescent, materials containing organic luminescent materials
  • H10K 50/11 - OLEDs or polymer light-emitting diodes [PLED] characterised by the electroluminescent [EL] layers
  • H10K 101/00 - Properties of the organic materials covered by group
  • H10K 101/30 - Highest occupied molecular orbital [HOMO], lowest unoccupied molecular orbital [LUMO] or Fermi energy values

36.

LIGHT-EMITTING DEVICE, LIGHT-EMITTING APPARATUS, ELECTRONIC DEVICE, LIGHTING DEVICE, AND COMPOUND

      
Application Number 19695174
Status Pending
Filing Date 2026-06-02
First Publication Date 2026-10-01
Owner SEMICONDUCTOR ENERGY LABORATORY CO., LTD. (Japan)
Inventor
  • Okuyama, Takumu
  • Hashimoto, Naoaki
  • Takita, Yusuke
  • Kadoma, Hiroshi
  • Suzuki, Tsunenori
  • Seo, Satoshi
  • Hirose, Tomoya

Abstract

A novel light-emitting device is provided. A light-emitting device with high emission efficiency is provided. A light-emitting device having a long lifetime is provided. A light-emitting device with low driving voltage is provided. The light-emitting device includes an anode, a cathode, and an EL layer between the anode and the cathode. The EL layer includes a light-emitting layer and an electron-transport layer. The electron-transport layer is positioned between the light-emitting layer and the cathode. The electron-transport layer contains an electron-transport material. The electron-transport material is an organic compound including a first skeleton, a second skeleton, and a third skeleton. The first skeleton has a function of transporting electrons. The second skeleton has a function of accepting holes. The third skeleton includes a monocyclic π-electron deficient heteroaromatic ring.

IPC Classes  ?

  • H10K 85/60 - Organic compounds having low molecular weight
  • C07D 401/10 - Heterocyclic compounds containing two or more hetero rings, having nitrogen atoms as the only ring hetero atoms, at least one ring being a six-membered ring with only one nitrogen atom containing two hetero rings linked by a carbon chain containing aromatic rings
  • C07D 491/048 - Ortho-condensed systems with only one oxygen atom as ring hetero atom in the oxygen-containing ring the oxygen-containing ring being five-membered
  • H10K 50/11 - OLEDs or polymer light-emitting diodes [PLED] characterised by the electroluminescent [EL] layers
  • H10K 50/16 - Electron transporting layers
  • H10K 50/165 - Electron transporting layers comprising dopants
  • H10K 101/30 - Highest occupied molecular orbital [HOMO], lowest unoccupied molecular orbital [LUMO] or Fermi energy values
  • H10K 101/40 - Interrelation of parameters between multiple constituent active layers or sublayers, e.g. HOMO values in adjacent layers

37.

INPUT/OUTPUT PANEL, INPUT/OUTPUT DEVICE, AND SEMICONDUCTOR DEVICE

      
Application Number 19696548
Status Pending
Filing Date 2026-06-03
First Publication Date 2026-10-01
Owner SEMICONDUCTOR ENERGY LABORATORY CO., LTD. (Japan)
Inventor
  • Kimura, Hajime
  • Yamazaki, Shunpei

Abstract

An input/output device includes a first sensor electrode and a second sensor electrode. In addition, the input/output device includes a first electrode and a second electrode which are electrodes for a display element, and a substrate sandwiched between the first sensor electrode and the second sensor electrode. The second sensor electrode is formed concurrently with the first electrode using the same material. The input/output device sensors a change in capacitance of a capacitor formed between the first sensor electrode and the second sensor electrode. Furthermore, a third sensor electrode to which a floating potential is applied may be provided to overlap with the first electrode. In the input/output device, either a liquid crystal element or a light-emitting element may be used, or both the liquid crystal element and the light-emitting element may be used.

IPC Classes  ?

  • G06F 3/041 - Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means
  • G02F 1/1333 - Constructional arrangements
  • G02F 1/1335 - Structural association of cells with optical devices, e.g. polarisers or reflectors
  • G02F 1/1343 - Electrodes
  • G02F 1/1368 - Active matrix addressed cells in which the switching element is a three-electrode device
  • G06F 3/044 - Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means by capacitive means

38.

SEMICONDUCTOR DEVICE AND ELECTRONIC DEVICE

      
Application Number 19705692
Status Pending
Filing Date 2026-06-11
First Publication Date 2026-10-01
Owner SEMICONDUCTOR ENERGY LABORATORY CO., LTD. (Japan)
Inventor
  • Kobayashi, Yoshiyuki
  • Matsubayashi, Daisuke

Abstract

A semiconductor device of one embodiment of the present invention includes a semiconductor, an insulator, a first conductor, and a second conductor. In the semiconductor device, a top surface of the semiconductor has a region in contact with the insulator; a side surface of the semiconductor has a region in contact with the insulator; the first conductor has a first region overlapping with the semiconductor with the insulator positioned therebetween; the first region has a region in contact with the top surface of the semiconductor and a region in contact with the side surface of the semiconductor; the second conductor has a second region in contact with the semiconductor; and the first region and the second region do not overlap with each other.

IPC Classes  ?

  • H10D 30/67 - Thin-film transistors [TFT]
  • H10D 62/80 - Semiconductor bodies, or regions thereof, of devices having potential barriers characterised by the materials
  • H10D 86/40 - Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs
  • H10D 86/60 - Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs wherein the TFTs are in active matrices

39.

ORGANIC COMPOUND, MATERIAL FOR INTERMEDIATE LAYER, AND LIGHT EMITTING DEVICE

      
Application Number IB2026052742
Publication Number 2026/202684
Status In Force
Filing Date 2026-03-23
Publication Date 2026-10-01
Owner SEMICONDUCTOR ENERGY LABORATORY CO., LTD. (Japan)
Inventor
  • Kubota, Yuko
  • Kawakami, Sachiko
  • Ohsawa, Nobuharu
  • Yoshiyasu, Yui
  • Fukuzaki, Shinya

Abstract

Provided is a novel organic compound with which it is possible to provide a light emitting device having good reliability. Provided is an organic compound represented by structural formula (G1). In the organic compound expressed by general formula (G1), at least one from among R20to R27is a group represented by general formula (g1). In the group represented by general formula (g1), R1to R16each independently represent hydrogen (including deuterium) or a C1-C10 alkyl group, and s, t, u, and v each independently represent a value of 0-3. Ar1 represents a substituted or unsubstituted arylene group. m represents a value of 0-2. When m is 2, the two substituted or unsubstituted arylene groups may be the same or different from each other.

IPC Classes  ?

  • C07D 471/04 - Ortho-condensed systems
  • C09K 11/06 - Luminescent, e.g. electroluminescent, chemiluminescent, materials containing organic luminescent materials
  • H10K 50/16 - Electron transporting layers
  • H10K 50/19 - Tandem OLEDs
  • H10K 85/60 - Organic compounds having low molecular weight

40.

DISPLAY DEVICE AND DISPLAY DEVICE PRODUCTION METHOD

      
Application Number IB2026052743
Publication Number 2026/202685
Status In Force
Filing Date 2026-03-23
Publication Date 2026-10-01
Owner SEMICONDUCTOR ENERGY LABORATORY CO., LTD. (Japan)
Inventor
  • Nakazawa, Yasutaka
  • Iguchi, Takahiro
  • Sato, Rai
  • Idojiri, Satoru
  • Okazaki, Kenichi

Abstract

Provided is a display device with which high definition is easily achieved. The provided display device combines high display quality and high definition. The display device comprises pixel electrodes, EL layers, upper electrodes, first insulating layers, and partition walls. Each first insulating layer comprises a first portion, a second portion, and a third portion therebetween. The height of the second portion from a formation target surface is shorter than that of the first portion. The height of the upper surface of the third portion changes from the first portion to the second portion. Each partition wall has conductivity, is positioned on top of a first portion of a first insulating layer, and has a reverse tapered shape in a cross-sectional view. Each EL layer contains a light-emitting compound and is in contact with an upper surface of a pixel electrode and a second portion of a first insulating layer. Each upper electrode covers an upper surface and an end portion of an EL layer and is in contact with a side surface of a partition wall.

IPC Classes  ?

  • H10K 59/122 - Pixel-defining structures or layers, e.g. banks
  • G09F 9/30 - Indicating arrangements for variable information in which the information is built-up on a support by selection or combination of individual elements in which the desired character or characters are formed by combining individual elements
  • H10K 50/12 - OLEDs or polymer light-emitting diodes [PLED] characterised by the electroluminescent [EL] layers comprising dopants
  • H10K 50/824 - Cathodes combined with auxiliary electrodes
  • H10K 59/80 - Constructional details
  • H10K 59/131 - Interconnections, e.g. wiring lines or terminals
  • H10K 71/10 - Deposition of organic active material
  • H10K 71/20 - Changing the shape of the active layer in the devices, e.g. patterning
  • H10K 71/60 - Forming conductive regions or layers, e.g. electrodes

41.

DISPLAY DEVICE

      
Application Number 19425521
Status Pending
Filing Date 2025-12-18
First Publication Date 2026-09-24
Owner SEMICONDUCTOR ENERGY LABORATORY CO., LTD. (Japan)
Inventor
  • Yamazaki, Shunpei
  • Ikeda, Takayuki
  • Okazaki, Kenichi
  • Yamane, Yasumasa

Abstract

A high-resolution display device is provided. A display device with both high display quality and high resolution is provided. The display device includes a first light-emitting element and a second light-emitting element. The first light-emitting element includes a first pixel electrode, a first EL layer, and a common electrode. The second light-emitting element includes a second pixel electrode, a second EL layer, and the common electrode. An insulating layer is included between the first pixel electrode and the second pixel electrode. The insulating layer includes a first region overlapping with the first EL layer, a second region overlapping with the second EL layer, and a third region positioned between the first region and the second region. A side surface of the first EL layer and a side surface of the second EL layer are positioned over the insulating layer and are provided to face each other. The common electrode is provided along the side surface of the first EL layer, the side surface of the second EL layer, and a top surface of the insulating layer. A width of the insulating layer is greater than or equal to 2 times and less than or equal to 4 times that of a distance between the first pixel electrode and the second pixel electrode.

IPC Classes  ?

  • H10K 59/122 - Pixel-defining structures or layers, e.g. banks
  • H10K 50/13 - OLEDs or polymer light-emitting diodes [PLED] characterised by the electroluminescent [EL] layers specially adapted for multicolour light emission, e.g. for emitting white light comprising stacked EL layers within one EL unit
  • H10K 50/19 - Tandem OLEDs
  • H10K 59/124 - Insulating layers formed between TFT elements and OLED elements
  • H10K 59/35 - Devices specially adapted for multicolour light emission comprising red-green-blue [RGB] subpixels
  • H10K 59/80 - Constructional details

42.

SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE

      
Application Number 19473832
Status Pending
Filing Date 2024-05-02
First Publication Date 2026-09-24
Owner Semiconductor Energy Laboratory Co., Ltd. (Japan)
Inventor
  • Suzawa, Hideomi
  • Yoshizumi, Kensuke
  • Kikuchi, Akihiro

Abstract

A semiconductor device with favorable electrical characteristics is provided. Alternatively, a transistor in which the breakdown voltage of a gate insulating layer is high is provided. In the semiconductor device, a first conductive layer and a second conductive layer positioned at different levels with a first insulating layer therebetween are one and the other of a source electrode and a drain electrode of a first transistor. The first insulating layer has a first opening reaching the first conductive layer. The second conductive layer is provided over the first insulating layer. A semiconductor layer includes a first region covering the top surface of the first conductive layer, a second region covering a side surface of the first opening, and a third region covering the top surface of the second conductive layer and overlapping with a gate electrode. A gate insulating layer includes a fourth region provided to face a sidewall of the first opening, a fifth region covering the top surface of the third region, and a sixth region covering the top surface of the second conductive layer and being positioned outward from an end portion of the gate electrode in a top view. The thickness of the fifth region is larger than the thickness of the fourth region and the thickness of the sixth region.

IPC Classes  ?

  • H10B 12/00 - Dynamic random access memory [DRAM] devices

43.

DISPLAY DEVICE

      
Application Number 19682356
Status Pending
Filing Date 2026-05-19
First Publication Date 2026-09-24
Owner SEMICONDUCTOR ENERGY LABORATORY CO., LTD. (Japan)
Inventor
  • Nakamura, Daiki
  • Kato, Sho
  • Okazaki, Kenichi
  • Yamazaki, Shunpei

Abstract

A display device with both high display quality and high resolution is provided. The display device includes a light-emitting element and a connection portion. The connection portion is provided along an outer periphery of a display region where the light-emitting element is provided. The light-emitting element includes a pixel electrode, a first EL layer over the pixel electrode, a second EL layer over the first EL layer, and a common electrode over the second EL layer. The connection portion includes a connection electrode, a second EL layer over the connection electrode, and the common electrode over the second EL layer. The second EL layer includes a first region in contact with the connection electrode and a second region in contact with the common electrode. The area of a region where the first region and the second region overlap with each other in a top view is greater than or equal to 40000 square micrometers. The second EL layer includes a region where the film thickness is greater than or equal to 0.5 nm and less than or equal to 1.5 nm. The second EL layer contains a substance with a high electron-injection property.

IPC Classes  ?

  • H10K 59/80 - Constructional details
  • H10K 50/13 - OLEDs or polymer light-emitting diodes [PLED] characterised by the electroluminescent [EL] layers specially adapted for multicolour light emission, e.g. for emitting white light comprising stacked EL layers within one EL unit
  • H10K 50/17 - Carrier injection layers
  • H10K 59/131 - Interconnections, e.g. wiring lines or terminals
  • H10K 59/35 - Devices specially adapted for multicolour light emission comprising red-green-blue [RGB] subpixels
  • H10K 102/00 - Constructional details relating to the organic devices covered by this subclass

44.

SEMICONDUCTOR DEVICE AND MEMORY DEVICE

      
Application Number 18996205
Status Pending
Filing Date 2023-07-20
First Publication Date 2026-09-24
Owner SEMICONDUCTOR ENERGY LABORATORY CO., LTD. (Japan)
Inventor
  • Yamazaki, Shunpei
  • Hodo, Ryota
  • Endo, Toshiya

Abstract

A semiconductor device that can be miniaturized or highly integrated is to be provided. The semiconductor device includes a first conductor and a second conductor that are over an oxide and separated from each other; a third conductor in contact with a part of a top surface of the first conductor; a fourth conductor in contact with a part of a top surface of the second conductor; a first insulator that is positioned over the third conductor and the fourth conductor and has an opening overlapping with a region between the third conductor and the fourth conductor; a second insulator that is positioned in the opening of the first insulator and in contact with another part of the top surface of the first conductor, another part of the top surface of the second conductor, a side surface of the third conductor, and a side surface of the fourth conductor; a third insulator that is in contact with a top surface of the oxide, a side surface of the first conductor, a side surface of the second conductor, and a side surface of the second insulator; and a fifth conductor that is positioned over the third insulator. A distance between the first conductor and the second conductor is smaller than a distance between the third conductor and the fourth conductor. The second insulator includes a first layer and a second layer over the first layer. The first layer includes a nitride insulator, and the second layer includes an oxide insulator.

IPC Classes  ?

  • H10D 30/67 - Thin-film transistors [TFT]
  • H10B 12/00 - Dynamic random access memory [DRAM] devices
  • H10B 80/00 - Assemblies of multiple devices comprising at least one memory device covered by this subclass
  • H10D 30/01 - Manufacture or treatment
  • H10D 80/30 - Assemblies of multiple devices comprising at least one device covered by this subclass the at least one device being covered by groups , e.g. assemblies comprising integrated circuit processor chips
  • H10W 90/00 -

45.

DATA PROCESSING SYSTEM AND DATA PROCESSING METHOD

      
Application Number 19558589
Status Pending
Filing Date 2026-03-06
First Publication Date 2026-09-24
Owner Semiconductor Energy Laboratory Co., Ltd. (Japan)
Inventor
  • Momo, Junpei
  • Okano, Tatsuya

Abstract

A novel data processing system comprising a first component, a second component, and a third component is provided. The first component receives a document, prior art literature, and a scope of claims and transmits them to the third component; the second component performs processing with a large language model; and the third component shares the received data and creates prompts. The third component has a function of creating and executing a prompt chain and a function of creating an annotated document. The system is configured to find a description related to the scope of claims in the prior art literature and a description related to the description in the prior art literature from the document. The system is configured to attach an annotation to a position of the description in the document.

IPC Classes  ?

  • G06F 40/169 - Annotation, e.g. comment data or footnotes
  • G06F 40/40 - Processing or translation of natural language

46.

ELECTRONIC DEVICE

      
Application Number 19642804
Status Pending
Filing Date 2026-04-09
First Publication Date 2026-09-24
Owner Semiconductor Energy Laboratory Co., Ltd. (Japan)
Inventor
  • Godo, Hiromichi
  • Kurokawa, Yoshiyuki
  • Inoue, Seiko
  • Ohshima, Kazuaki
  • Yamazaki, Shunpei

Abstract

An electronic device that enables smooth communication is provided. The electronic device includes a display portion including a first camera; a second camera; and an image processing portion. The second camera is positioned in a region not overlapping with the display portion. The first camera has a function of generating a first image of a subject, and the second camera has a function of generating a second image of the subject. The image processing portion includes a generator that performs learning using training data. The training data includes an image including a person's face. The image processing portion has a function of making the first image clear when the first image is input to the generator and a function of tracking the gaze of the subject on the basis of the second image.

IPC Classes  ?

  • G06F 3/01 - Input arrangements or combined input and output arrangements for interaction between user and computer
  • G06T 1/20 - Processor architecturesProcessor configuration, e.g. pipelining
  • G06T 7/73 - Determining position or orientation of objects or cameras using feature-based methods
  • G06V 10/141 - Control of illumination
  • G06V 40/18 - Eye characteristics, e.g. of the iris
  • H04N 23/611 - Control of cameras or camera modules based on recognised objects where the recognised objects include parts of the human body
  • H04N 23/617 - Upgrading or updating of programs or applications for camera control
  • H04N 23/90 - Arrangement of cameras or camera modules, e.g. multiple cameras in TV studios or sports stadiums

47.

LIGHT-EMITTING DISPLAY DEVICE AND ELECTRONIC DEVICE INCLUDING THE SAME

      
Application Number 19681275
Status Pending
Filing Date 2026-05-19
First Publication Date 2026-09-24
Owner SEMICONDUCTOR ENERGY LABORATORY CO., LTD. (Japan)
Inventor
  • Arasawa, Ryo
  • Shishido, Hideaki

Abstract

An object is to provide a light-emitting display device in which a pixel including a thin film transistor using an oxide semiconductor has a high aperture ratio. The light-emitting display device includes a plurality of pixels each including a thin film transistor and a light-emitting element. The pixel is electrically connected to a first wiring functioning as a scan line. The thin film transistor includes an oxide semiconductor layer over the first wiring with a gate insulating film therebetween. The oxide semiconductor layer is extended beyond the edge of a region where the first wiring is provided. The light-emitting element and the oxide semiconductor layer overlap with each other.

IPC Classes  ?

  • H10H 20/817 - Bodies characterised by the crystal structures or orientations, e.g. polycrystalline, amorphous or porous
  • H10D 86/40 - Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs
  • H10D 86/60 - Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs wherein the TFTs are in active matrices

48.

SEMICONDUCTOR DEVICE

      
Application Number 19687427
Status Pending
Filing Date 2026-05-26
First Publication Date 2026-09-24
Owner SEMICONDUCTOR ENERGY LABORATORY CO., LTD. (Japan)
Inventor
  • Matsuzaki, Takanori
  • Saito, Toshihiko
  • Yamazaki, Shunpei

Abstract

A semiconductor device that can be miniaturized or highly integrated is provided. The semiconductor device includes a transistor, a capacitor, and a first insulating layer. The first insulating layer is provided over a first conductive layer and a second conductive layer and includes a first opening reaching the first conductive layer and a second opening reaching the second conductive layer. The transistor is a vertical transistor in which a channel formation region is provided along the side wall of the first opening. The capacitor is a vertical capacitor in which a pair of electrodes and a dielectric are provided along the side surface of the second opening.

IPC Classes  ?

  • H10B 12/00 - Dynamic random access memory [DRAM] devices

49.

Light-Emitting Apparatus, Lighting Device, Display Device, Module, and Electronic Device

      
Application Number 19692842
Status Pending
Filing Date 2026-05-29
First Publication Date 2026-09-24
Owner Semiconductor Energy Laboratory Co., Ltd. (Japan)
Inventor
  • Yamazaki, Shunpei
  • Kubota, Daisuke
  • Ohsawa, Nobuharu
  • Watabe, Takeyoshi
  • Kamada, Taisuke

Abstract

A display device that has a function of emitting visible light and infrared light and a function of detecting light. The display device is a display device including a first light-emitting device, a second light-emitting device, and a light-receiving device, in a display portion. The first light-emitting device includes a first pixel electrode, a first optical adjustment layer, a first light-emitting layer, a second light-emitting layer, and a common electrode. The second light-emitting device includes a second pixel electrode, a second optical adjustment layer, the first light-emitting layer, the second light-emitting layer, and the common electrode. The light-receiving device includes a third pixel electrode, an active layer, and the common electrode. The active layer includes an organic compound. The first light-emitting device emits infrared light emitted by the first light-emitting layer. The second light-emitting device emits visible light emitted by the second light-emitting layer. The light-receiving device has a function of absorbing at least part of visible light and infrared light.

IPC Classes  ?

  • H05B 45/20 - Controlling the colour of the light
  • H10K 59/32 - Stacked devices having two or more layers, each emitting at different wavelengths
  • H10K 59/80 - Constructional details
  • H10K 101/20 - Delayed fluorescence emission
  • H10K 102/00 - Constructional details relating to the organic devices covered by this subclass

50.

SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE

      
Application Number 19693744
Status Pending
Filing Date 2026-06-01
First Publication Date 2026-09-24
Owner Semiconductor Energy Laboratory Co., Ltd. (Japan)
Inventor
  • Yamazaki, Shunpei
  • Sawai, Hiromi
  • Komagata, Hiroki
  • Jinbo, Yasuhiro
  • Okuno, Naoki
  • Komatsu, Yoshihiro
  • Ando, Motoharu
  • Moriwaka, Tomoaki
  • Moriya, Koji
  • Ishikawa, Jun

Abstract

A semiconductor device with less variation in transistor characteristics is provided. The semiconductor device includes a semiconductor film, a pair of blocking films over the semiconductor film, and an insulating film provided over the semiconductor film and between the pair of blocking films. The semiconductor film includes a pair of n-type regions and an i-type region provided between the pair of n-type regions. The n-type regions overlap with the blocking films. The i-type region overlaps with the insulating film.

IPC Classes  ?

51.

VEHICLE AND CHARGING METHOD

      
Application Number IB2026052453
Publication Number 2026/196119
Status In Force
Filing Date 2026-03-13
Publication Date 2026-09-24
Owner SEMICONDUCTOR ENERGY LABORATORY CO., LTD. (Japan)
Inventor
  • Koganezawa, Zen
  • Tsukamoto, Yosuke

Abstract

Provided is a wireless power receiving device reduced in size, thickness, or weight. A vehicle comprises the wireless power receiving device. The wireless power receiving device is disposed at a bottom portion of a vehicle body of the vehicle and comprises a power receiving coil unit and a lifting/lowering device. The lifting/lowering device comprises a wire and a motor, the motor being fixed to the bottom portion of the vehicle body. The power receiving coil unit is connected to the motor via the wire, and is raised and lowered by rotation of the motor.

IPC Classes  ?

  • H02J 50/90 - Circuit arrangements or systems for wireless supply or distribution of electric power involving detection or optimisation of position, e.g. alignment
  • B60L 53/12 - Inductive energy transfer
  • H02J 50/10 - Circuit arrangements or systems for wireless supply or distribution of electric power using inductive coupling

52.

SEMICONDUCTOR DEVICE, STORAGE DEVICE, AND ELECTRONIC DEVICE

      
Application Number 19667830
Status Pending
Filing Date 2026-05-05
First Publication Date 2026-09-17
Owner Semiconductor Energy Laboratory Co., Ltd. (Japan)
Inventor
  • Matsuzaki, Takanori
  • Onuki, Tatsuya
  • Kato, Kiyoshi

Abstract

A semiconductor device with high storage capacity and low power consumption is provided. The semiconductor device includes first to third conductors, first and second transistors, and an MTJ element. The MTJ element includes a free layer and a fixed layer. In the semiconductor device, the first conductor, the second conductor, the free layer, the fixed layer, the first and second transistors, and the third conductor are provided in this order from the bottom. In particular, in a plan view, the third conductor is positioned in a region overlapping with the first conductor. The first conductor is electrically connected to the second conductor, and the second conductor is electrically connected to the free layer and a first terminal of the first transistor. The fixed layer is electrically connected to a first terminal of the second transistor, and a second terminal of the first transistor is electrically connected to a second terminal of the second transistor and the third conductor. The first transistor and the second transistor each include a metal oxide in a channel formation region.

IPC Classes  ?

  • H10N 50/10 - Magnetoresistive devices
  • G11C 11/16 - Digital stores characterised by the use of particular electric or magnetic storage elementsStorage elements therefor using magnetic elements using elements in which the storage effect is based on magnetic spin effect
  • H10B 61/00 - Magnetic memory devices, e.g. magnetoresistive RAM [MRAM] devices
  • H10N 50/85 - Materials of the active region
  • H10N 52/85 - Materials of the active region

53.

SEMICONDUCTOR DEVICE AND ELECTRONIC DEVICE

      
Application Number 19669139
Status Pending
Filing Date 2026-05-06
First Publication Date 2026-09-17
Owner Semiconductor Energy Laboratory Co., Ltd. (Japan)
Inventor
  • Yamazaki, Shunpei
  • Kimura, Hajime
  • Kunitake, Hitoshi
  • Egi, Yuji
  • Isaka, Fumito

Abstract

A semiconductor device that has lower power consumption and is capable of non-destructive reading is provided. The semiconductor device includes a first transistor, a first FTJ element, and a second FTJ element. A first terminal of the first transistor is electrically connected to an output terminal of the first FTJ element and an input terminal of the second FTJ element. In data writing, polarization is caused in each of the first FTJ element and the second FTJ element in accordance with the data. In data reading, voltage with which the polarization does not change is applied between the output terminal of the first FTJ element and the input terminal of the second FTJ element. At this time, the first transistor is turned on, whereby a differential current between current flowing through the first FTJ element and current flowing through the second FTJ element flows through the first transistor. Obtaining the differential current using a read circuit or the like enables the data written to the first FTJ element and the second FTJ element to be read.

IPC Classes  ?

  • H10B 51/30 - Ferroelectric RAM [FeRAM] devices comprising ferroelectric memory transistors characterised by the memory core region
  • H10B 51/40 - Ferroelectric RAM [FeRAM] devices comprising ferroelectric memory transistors characterised by the peripheral circuit region
  • H10B 53/30 - Ferroelectric RAM [FeRAM] devices comprising ferroelectric memory capacitors characterised by the memory core region
  • H10B 53/40 - Ferroelectric RAM [FeRAM] devices comprising ferroelectric memory capacitors characterised by the peripheral circuit region
  • H10B 63/10 - Phase change RAM [PCRAM, PRAM] devices
  • H10D 30/69 - IGFETs having charge trapping gate insulators, e.g. MNOS transistors
  • H10N 50/10 - Magnetoresistive devices

54.

LIQUID CRYSTAL DISPLAY DEVICE AND ELECTRONIC DEVICE INCLUDING THE SAME

      
Application Number 19675581
Status Pending
Filing Date 2026-05-13
First Publication Date 2026-09-17
Owner SEMICONDUCTOR ENERGY LABORATORY CO., LTD. (Japan)
Inventor
  • Kimura, Hajime
  • Umezaki, Atsushi

Abstract

A driver circuit includes a circuit 200, a transistor 101_1, and a transistor 101_2. A signal is selectively input from the circuit 200 to a gate of the transistor 101_1 and the transistor 101_2, so that the transistor 101_1 and the transistor 101_2 are controlled to be on or off. The transistor 101_1 and the transistor 101_2 are turned on or off; thus, the wiring 112 and the wiring 111 become conducting or non-conducting.

IPC Classes  ?

  • G09G 3/36 - Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix by control of light from an independent source using liquid crystals
  • G02F 1/1362 - Active matrix addressed cells
  • G02F 1/1368 - Active matrix addressed cells in which the switching element is a three-electrode device
  • G09G 3/20 - Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix
  • H10D 30/67 - Thin-film transistors [TFT]
  • H10D 62/80 - Semiconductor bodies, or regions thereof, of devices having potential barriers characterised by the materials
  • H10D 86/40 - Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs
  • H10D 86/60 - Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs wherein the TFTs are in active matrices

55.

DISPLAY DEVICE

      
Application Number 19682473
Status Pending
Filing Date 2026-05-20
First Publication Date 2026-09-17
Owner Semiconductor Energy Laboratory Co., Ltd. (Japan)
Inventor
  • Ikeda, Takayuki
  • Yanagisawa, Yuichi
  • Yamane, Yasumasa

Abstract

A display device that has high display quality is provided. A highly reliable display device is provided. A display device with low power consumption is provided and a display device that can easily achieve a higher resolution is provided. A display device with both high display quality and a high resolution is provided. A display device with high contrast is provided. The display device includes a first layer, a second layer over the first layer, and a third layer over the second layer. The first layer includes a first transistor including silicon in a channel formation region. The second layer includes a second transistor including a metal oxide in a channel formation region. The third layer includes a first light-emitting element, a second light-emitting element, a third light-emitting element, an EL layer including a light-emitting layer exhibiting white light, a first coloring layer over the first light-emitting element, a second coloring layer over the second light-emitting element, and a third coloring layer over the third light-emitting element. Crosstalk is not observed between the second light-emitting element and the third light-emitting element.

IPC Classes  ?

  • H10K 59/38 - Devices specially adapted for multicolour light emission comprising colour filters or colour changing media [CCM]
  • G09G 3/3225 - Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix using controlled light sources using electroluminescent panels semiconductive, e.g. using light-emitting diodes [LED] organic, e.g. using organic light-emitting diodes [OLED] using an active matrix
  • H10K 50/00 - Organic light-emitting devices
  • H10K 59/00 - Integrated devices, or assemblies of multiple devices, comprising at least one organic light-emitting element covered by group
  • H10K 59/80 - Constructional details

56.

LIGHT-EMITTING DEVICE, LIGHT-EMITTING APPARATUS, ELECTRONIC APPARATUS, AND LIGHTING DEVICE

      
Application Number 19682585
Status Pending
Filing Date 2026-05-20
First Publication Date 2026-09-17
Owner SEMICONDUCTOR ENERGY LABORATORY CO., LTD. (Japan)
Inventor
  • Ohsawa, Nobuharu
  • Seo, Satoshi
  • Watabe, Takeyoshi
  • Ueda, Airi
  • Kubota, Tomohiro
  • Hirahara, Takashi

Abstract

A light-emitting device with high emission efficiency and low driving voltage is provided. A light-emitting apparatus, an electronic device, and a lighting device with low power consumption are provided. The following organic compound is provided: the organic compound has an arylamine structure; and when the organic compound is deposited to be a film, the ordinary refractive index of the deposited film with respect to light with a wavelength of 458 nm is greater than or equal to 1.50 and less than or equal to 1.75, the birefringence Δn of the deposited film with respect to light with a wavelength of 458 nm is greater than or equal to 0 and less than or equal to 0.008, or the alignment order parameter of the deposited film with respect to light with a wavelength corresponding to the longest wavelength where an absorption peak appears in the absorption spectrum is greater than or equal to −0.07 and less than or equal to 0.00.

IPC Classes  ?

  • H10K 85/60 - Organic compounds having low molecular weight
  • C07C 211/61 - Compounds containing amino groups bound to a carbon skeleton having amino groups bound to carbon atoms of six-membered aromatic rings of the carbon skeleton having amino groups bound to carbon atoms of six-membered aromatic rings being part of condensed ring systems of the carbon skeleton with at least one of the condensed ring systems formed by three or more rings
  • H10K 50/15 - Hole transporting layers
  • H10K 50/17 - Carrier injection layers
  • H10K 59/12 - Active-matrix OLED [AMOLED] displays
  • H10K 59/80 - Constructional details

57.

SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SEMICONDUCTOR DEVICE

      
Application Number 19168549
Status Pending
Filing Date 2024-04-01
First Publication Date 2026-09-17
Owner Semiconductor Energy Laboratory Co., Ltd. (Japan)
Inventor
  • Yamazaki, Shunpei
  • Wakuda, Masahiro
  • Yamade, Naoto
  • Murakawa, Tsutomu
  • Kunitake, Hitoshi
  • Nakayama, Tomonori

Abstract

A semiconductor device that can be miniaturized or highly integrated is provided. The semiconductor device includes a transistor and an insulator; the insulator is provided over one of a source and a drain of the transistor; the other of the source and the drain of the transistor is provided over the insulator; an opening portion reaching one of the source and the drain is provided in the insulator and the other of the source and the drain; an oxide semiconductor included in the transistor is in contact with a top surface of one of the source and the drain, a side surface of the insulator, and a side surface of the other of the source and the drain that are in the opening portion; a gate insulator of the transistor is provided over the oxide semiconductor; a gate of the transistor is provided over the gate insulator; the oxide semiconductor includes a first region in contact with one of the source and the drain, a second region in contact with the insulator, and a third region in contact with the other of the source and the drain; the first and third regions have lower resistance than the second region; and the second region has a lower potential than the first and third regions.

IPC Classes  ?

58.

SEMICONDUCTOR DEVICE AND METHOD FOR PRODUCING SEMICONDUCTOR DEVICE

      
Application Number IB2026052115
Publication Number 2026/190612
Status In Force
Filing Date 2026-03-05
Publication Date 2026-09-17
Owner SEMICONDUCTOR ENERGY LABORATORY CO., LTD. (Japan)
Inventor
  • Koezuka, Junichi
  • Jintyou, Masami

Abstract

Provided is a semiconductor device comprising micro-sized transistors. The semiconductor device comprises two vertical transistors (a first transistor and a second transistor) and a first insulating layer. The first transistor is a n-channel transistor, and the second transistor is a p-channel transistor. The first insulating layer has a groove portion. A first semiconductor layer functioning as a channel formation region of the first transistor is provided on one side surface of the groove portion, and a second semiconductor layer functioning as a channel formation region of the second transistor is provided on the other side surface of the groove portion. On the first semiconductor layer and the second semiconductor layer, a gate insulating layer and a gate electrode for the two transistors are provided in this order. The source electrodes or the drain electrodes of the two transistors are connected to each other. The two transistors share the gate insulating layer and the gate electrode.

IPC Classes  ?

  • H10D 86/40 - Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs
  • G02F 1/1368 - Active matrix addressed cells in which the switching element is a three-electrode device
  • G09F 9/30 - Indicating arrangements for variable information in which the information is built-up on a support by selection or combination of individual elements in which the desired character or characters are formed by combining individual elements
  • H10D 30/67 - Thin-film transistors [TFT]
  • H10D 84/80 - Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers characterised by the integration of at least one component covered by groups or , e.g. integration of IGFETs
  • H10D 84/85 - Complementary IGFETs, e.g. CMOS
  • H10D 86/60 - Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs wherein the TFTs are in active matrices

59.

SEMICONDUCTOR DEVICE

      
Application Number IB2026052116
Publication Number 2026/190613
Status In Force
Filing Date 2026-03-05
Publication Date 2026-09-17
Owner SEMICONDUCTOR ENERGY LABORATORY CO., LTD. (Japan)
Inventor
  • Matsuzaki, Takanori
  • Yakubo, Yuto
  • Onuki, Tatsuya
  • Inoue, Hiroki

Abstract

Provided is a novel semiconductor device. This semiconductor device comprises a first storage circuit including a flip-flop circuit, and a second storage circuit including first to third transistors and a storage element. A first terminal of the first transistor is electrically connected to a first terminal of the first storage circuit. A second terminal of the first transistor is electrically connected to a first terminal of the second transistor and a first terminal of the storage element. A second terminal of the second transistor is electrically connected to a first terminal of the third transistor and a second terminal of the first storage circuit. A magnetic tunnel junction element is used as the storage element.

IPC Classes  ?

  • H10B 61/00 - Magnetic memory devices, e.g. magnetoresistive RAM [MRAM] devices
  • G11C 14/00 - Digital stores characterised by arrangements of cells having volatile and non-volatile storage properties for back-up when the power is down
  • H10D 30/67 - Thin-film transistors [TFT]
  • H10D 84/83 - Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers characterised by the integration of at least one component covered by groups or , e.g. integration of IGFETs of only field-effect components of only insulated-gate FETs [IGFET]
  • H10D 84/85 - Complementary IGFETs, e.g. CMOS
  • H10D 86/40 - Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs
  • H10N 50/80 - Constructional details

60.

CONVERSATION DEVICE AND CONVERSATION METHOD

      
Application Number 19471208
Status Pending
Filing Date 2024-04-08
First Publication Date 2026-09-17
Owner SEMICONDUCTOR ENERGY LABORATORY CO., LTD. (Japan)
Inventor
  • Momo, Junpei
  • Hayashi, Kentaro

Abstract

A conversation device having high security is provided. The conversation device includes a reception unit, a processing unit, and a presentation unit. The reception unit has a function of receiving input information showing a user's instruction in a conversation. The processing unit has a function of performing processing using the monitoring model and a function of performing processing using the conversational model. The processing unit has a function of determining whether or not to transmit the input information to the conversational model, on the basis of the input information with the use of the monitoring model. In the case where the monitoring model transmits the input information to the conversational model, the processing unit has a function of generating output information on the basis of the input information with the use of the conversational model. The output information can show a response in a conversation. The presentation unit has a function of presenting the output information and a function of presenting error information showing that the output information is not presented. The conversational model is a language model, which is a different type of model from the monitoring model.

IPC Classes  ?

  • G06F 40/40 - Processing or translation of natural language

61.

SEMICONDUCTOR DEVICE

      
Application Number 19557334
Status Pending
Filing Date 2026-03-05
First Publication Date 2026-09-17
Owner Semiconductor Energy Laboratory Co., Ltd. (Japan)
Inventor
  • Kusunoki, Koji
  • Watanabe, Kazunori

Abstract

A semiconductor device with high display quality is provided. The semiconductor device includes first to eighth transistors, first to third capacitors, and a light-emitting device. A first terminal of the first transistor is connected to a first terminal of the third transistor and a first terminal of the sixth transistor; a gate of the first transistor is connected to a first terminal of the first capacitor and a first terminal of the eighth transistor; a second terminal of the sixth transistor is connected to a first terminal of the seventh transistor and an anode of the light-emitting device; and a second terminal of the third transistor is connected to a second terminal of the eighth transistor and a first terminal of the fourth transistor. A second terminal of the first capacitor is connected to a first terminal of the second transistor, a first terminal of the fifth transistor, a first terminal of the second capacitor, and a first terminal of the third capacitor.

IPC Classes  ?

  • H10H 29/32 - Active-matrix LED displays characterised by the geometry or arrangement of elements within a subpixel, e.g. arrangement of the transistor within its RGB subpixel
  • G09G 3/32 - Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix using controlled light sources using electroluminescent panels semiconductive, e.g. using light-emitting diodes [LED]
  • G09G 3/3233 - Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix using controlled light sources using electroluminescent panels semiconductive, e.g. using light-emitting diodes [LED] organic, e.g. using organic light-emitting diodes [OLED] using an active matrix with pixel circuitry controlling the current through the light-emitting element
  • H03K 17/687 - Electronic switching or gating, i.e. not by contact-making and -breaking characterised by the use of specified components by the use, as active elements, of semiconductor devices the devices being field-effect transistors
  • H10K 59/121 - Active-matrix OLED [AMOLED] displays characterised by the geometry or disposition of pixel elements

62.

IMAGING DEVICE AND ELECTRONIC DEVICE

      
Application Number 19666602
Status Pending
Filing Date 2026-05-04
First Publication Date 2026-09-17
Owner Semiconductor Energy Laboratory Co., Ltd. (Japan)
Inventor
  • Sato, Shunsuke
  • Yoneda, Seiichi
  • Negoro, Yusuke
  • Hirose, Takeya
  • Yamazaki, Shunpei

Abstract

An imaging device that has an image processing function and is capable of operating at high speed is provided. The imaging device has an additional function such as image processing, image data obtained by an imaging operation is binarized in a pixel unit, and a product-sum operation is performed using the binarized data. A memory circuit is provided in the pixel unit and retains a weight coefficient used for the product-sum operation. Thus, an arithmetic operation can be performed without the weight coefficient read from the outside every time, whereby power consumption can be reduced. Furthermore, a pixel circuit, a memory circuit, and the like and a product-sum operation circuit and the like are stacked, so that the lengths of wirings between the circuits can be reduced, and high-speed operation with low power consumption can be performed.

IPC Classes  ?

  • H04N 25/77 - Pixel circuitry, e.g. memories, A/D converters, pixel amplifiers, shared circuits or shared components

63.

Display Panel, Display Device, Input/Output Device, and Data Processing Device

      
Application Number 19666889
Status Pending
Filing Date 2026-05-04
First Publication Date 2026-09-17
Owner Semiconductor Energy Laboratory Co., Ltd. (Japan)
Inventor
  • Suzuki, Tsunenori
  • Niikura, Yasuhiro
  • Hirose, Tomoya
  • Seo, Satoshi

Abstract

A novel display panel that is highly convenient or reliable is provided. The display panel includes a first pixel; the first pixel includes a first display element, a first color conversion layer, and a first absorption layer; the first display element emits first light; the first absorption layer overlaps with the first display element; and the first absorption layer absorbs the first light. Furthermore, the first color conversion layer is sandwiched between the first display element and the first absorption layer; the first color conversion layer converts the first light into second light; and the second light has a spectrum including a high proportion of light with a long wavelength compared with the first light.

IPC Classes  ?

  • G06F 3/044 - Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means by capacitive means
  • G06F 3/041 - Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means
  • G09G 3/3208 - Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix using controlled light sources using electroluminescent panels semiconductive, e.g. using light-emitting diodes [LED] organic, e.g. using organic light-emitting diodes [OLED]
  • H10K 59/38 - Devices specially adapted for multicolour light emission comprising colour filters or colour changing media [CCM]
  • H10K 59/80 - Constructional details
  • H10K 59/12 - Active-matrix OLED [AMOLED] displays

64.

Semiconductor Device And Method For Manufacturing Semiconductor Device

      
Application Number 19671610
Status Pending
Filing Date 2026-05-08
First Publication Date 2026-09-17
Owner Semiconductor Energy Laboratory Co., Ltd. (Japan)
Inventor
  • Shima, Yukinori
  • Okazaki, Kenichi

Abstract

A semiconductor device having favorable electrical characteristics is provided. A highly reliable semiconductor device is provided. The semiconductor device includes a first transistor, a second transistor, a first insulating layer, and a second insulating layer. The first transistor includes a first semiconductor layer, a first gate insulating layer, and a first gate electrode. The first semiconductor layer includes a metal oxide. The second transistor includes a second semiconductor layer, a second gate insulating layer, and a second gate electrode. The second semiconductor layer includes crystalline silicon. The first insulating layer includes a region overlapping with the first transistor with the second insulating layer therebetween. The second insulating layer includes a region overlapping with the second transistor with the first insulating layer therebetween. The second insulating layer has higher film density than the first insulating layer.

IPC Classes  ?

  • H10D 86/60 - Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs wherein the TFTs are in active matrices
  • H10D 86/01 - Manufacture or treatment
  • H10D 86/40 - Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs

65.

DISPLAY DEVICE

      
Application Number 19682479
Status Pending
Filing Date 2026-05-20
First Publication Date 2026-09-17
Owner Semiconductor Energy Laboratory Co., Ltd. (Japan)
Inventor
  • Kusunoki, Koji
  • Watanabe, Kazunori
  • Yoshimoto, Satoshi
  • Atsumi, Tomoaki
  • Kubota, Daisuke
  • Kusumoto, Naoto

Abstract

A high-resolution display device with reduced display unevenness is provided. In the display device, a plurality of pixels are included over a substrate; each of the plurality of pixels includes a transistor and a light-emitting element; the light-emitting element includes a first electrode, an EL layer over the first electrode, and a second electrode over the EL layer; the first electrode is electrically connected to the transistor; in the plurality of pixels, the first electrodes in adjacent pixels are separated by an insulating layer; the second electrode includes a conductive material having light-transmitting property with respect to visible light; the second electrode of each of the plurality of pixels is shared; and light is emitted from the second electrode side. A wiring is included; in a plane view with respect to the substrate, the wiring is placed in a region where the EL layer is not placed; and the second electrode is placed over and in contact with the wiring.

IPC Classes  ?

  • H10K 59/122 - Pixel-defining structures or layers, e.g. banks
  • H10K 59/131 - Interconnections, e.g. wiring lines or terminals
  • H10K 59/80 - Constructional details

66.

MEMORY DEVICE AND ELECTRONIC DEVICE

      
Application Number 19168866
Status Pending
Filing Date 2024-04-01
First Publication Date 2026-09-17
Owner SEMICONDUCTOR ENERGY LABORATORY CO., LTD. (Japan)
Inventor
  • Yoshizumi, Kensuke
  • Oikawa, Yoshiaki
  • Kusumoto, Naoto

Abstract

A memory device with few transistor manufacturing steps is provided. Each of a first selection transistor, a cell transistor, and a second selection transistor included in a memory string includes a cylindrical structure body. The structure body includes an oxide semiconductor, an insulator, and a conductor concentrically in an inward direction from a side surface. In the memory string, the transistors can be arranged in the lateral direction, and the first selection transistor and the second selection transistor can be formed in the same step. Accordingly, the number of transistor manufacturing steps can be reduced.

IPC Classes  ?

  • H10B 43/35 - EEPROM devices comprising charge-trapping gate insulators characterised by the memory core region with cell select transistors, e.g. NAND
  • H10B 43/27 - EEPROM devices comprising charge-trapping gate insulators characterised by three-dimensional arrangements, e.g. with cells on different height levels with source and drain on different levels, e.g. with sloping channels the channels comprising vertical portions, e.g. U-shaped channels

67.

SEMICONDUCTOR DEVICE AND METHOD FOR PRODUCING SEMICONDUCTOR DEVICE

      
Application Number IB2026052112
Publication Number 2026/190611
Status In Force
Filing Date 2026-03-05
Publication Date 2026-09-17
Owner SEMICONDUCTOR ENERGY LABORATORY CO., LTD. (Japan)
Inventor
  • Jintyou, Masami
  • Shima, Yukinori
  • Koezuka, Junichi

Abstract

Provided is a semiconductor device comprising a transistor having a large on-current. The semiconductor device comprises a semiconductor layer, a first electrically conductive layer, a second electrically conductive layer, a third electrically conductive layer, a first insulation layer, and a second insulation layer. The first insulating layer has a first opening reaching the first conductive layer. The semiconductor layer includes a metal oxide and is in contact with an upper surface and a side surface of the first insulating layer and with an upper surface of the first conductive layer. The second conductive layer has a region in contact with the upper surface of the semiconductor layer, and a second opening overlapping the first opening. The lower surface end of the second opening of the second conductive layer coincides with, or is positioned further inside of, the upper surface end of the second opening side of the semiconductor layer. The second insulating layer is provided on the semiconductor layer and the second conductive layer so as to have a region located inside the first opening and a region located inside the second opening. The third conductive layer is provided on the second insulating layer so as to have a region located inside the first opening.

IPC Classes  ?

  • H10D 30/67 - Thin-film transistors [TFT]
  • G02F 1/1368 - Active matrix addressed cells in which the switching element is a three-electrode device
  • G09F 9/30 - Indicating arrangements for variable information in which the information is built-up on a support by selection or combination of individual elements in which the desired character or characters are formed by combining individual elements

68.

SECONDARY BATTERY AND ELECTROLYTE SOLUTION

      
Application Number IB2026052166
Publication Number 2026/190620
Status In Force
Filing Date 2026-03-06
Publication Date 2026-09-17
Owner SEMICONDUCTOR ENERGY LABORATORY CO., LTD. (Japan)
Inventor
  • Ishimoto, Takuya
  • Takahashi, Tatsuyoshi
  • Ochiai, Teruaki

Abstract

Provided is a secondary battery or an electrolyte solution that exhibits excellent battery characteristics below zero. The secondary battery has an electrolyte solution, wherein: the electrolyte solution has a first organic compound, a second organic compound, and a lithium salt; the electrolyte solution has a freezing point of lower than -30°C; the lithium salt has LiPF6; the lithium ion coordination energy of the first organic compound or the lithium ion coordination energy of the second organic compound is -35[kJ/mol] or less; and the difference between the lithium ion coordination energy of the first organic compound and the lithium ion coordination energy of the second organic compound is 5 [kJ/mol] or less.

IPC Classes  ?

  • H01M 10/0569 - Liquid materials characterised by the solvents
  • H01M 4/133 - Electrodes based on carbonaceous material, e.g. graphite-intercalation compounds or CFx
  • H01M 4/587 - Carbonaceous material, e.g. graphite-intercalation compounds or CFx for inserting or intercalating light metals
  • H01M 10/052 - Li-accumulators
  • H01M 10/0567 - Liquid materials characterised by the additives
  • H01M 10/0568 - Liquid materials characterised by the solutes

69.

SEMICONDUCTOR DEVICE

      
Application Number IB2026052167
Publication Number 2026/190621
Status In Force
Filing Date 2026-03-06
Publication Date 2026-09-17
Owner SEMICONDUCTOR ENERGY LABORATORY CO., LTD. (Japan)
Inventor
  • Kurata, Motomu
  • Okuno, Naoki
  • Hiura, Yoshikazu
  • Hodo, Ryota
  • Suzuki, Akio
  • Murakawa, Tsutomu
  • Yakubo, Yuto
  • Yamazaki, Shunpei

Abstract

Provided is a semiconductor device which has good electrical characteristics. The semiconductor device comprises: an oxide semiconductor; a first conductor and a second conductor which are located on the oxide semiconductor; a third conductor which is in contact with the upper surface of the first conductor; a fourth conductor which is in contact with the upper surface of the second conductor; a first insulator which is disposed on the third conductor and the fourth conductor and has an opening in a region between the third conductor and the fourth conductor; a second insulator which is disposed on the oxide semiconductor in the opening; and a fifth conductor which is disposed on the second insulator in the opening. The oxide semiconductor contains indium. The first conductor and the second conductor each contain a conductive oxide. The sum of the contact resistance between the first conductor and the oxide semiconductor and the contact resistance between the second conductor and the oxide semiconductor is equal to or less than 2 × 104 Ω.

IPC Classes  ?

  • H10D 30/67 - Thin-film transistors [TFT]
  • H10D 1/62 - Capacitors having potential barriers
  • H10D 84/80 - Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers characterised by the integration of at least one component covered by groups or , e.g. integration of IGFETs
  • H10D 84/83 - Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers characterised by the integration of at least one component covered by groups or , e.g. integration of IGFETs of only field-effect components of only insulated-gate FETs [IGFET]

70.

METHOD FOR FORMING METAL OXIDE, AND SEMICONDUCTOR DEVICE

      
Application Number IB2026052168
Publication Number 2026/190622
Status In Force
Filing Date 2026-03-06
Publication Date 2026-09-17
Owner SEMICONDUCTOR ENERGY LABORATORY CO., LTD. (Japan)
Inventor
  • Miyairi, Hidekazu
  • Tagashira, Ryo
  • Matsuki, Mitsuhiro
  • Hiura, Yoshikazu

Abstract

Provided is a semiconductor device having good electrical properties. This method for forming a metal oxide includes: a first step for forming, on an insulator, an island-shaped first layer having crystals; a second step for forming a metal oxide covering the first layer; a third step for processing the metal oxide into an island shape; and a fourth step for crystallizing the metal oxide. In the third step, the island-shaped metal oxide has a first region, a second region, and a third region. The first region is in contact with the first layer. The second region is adjacent to the first region and is located between the first region and the third region. In a plan view, the width of the third region along a first direction is narrower than the width of the second region along the first direction. The third step is performed at a temperature lower than the temperature of the fourth step.

IPC Classes  ?

  • H10D 30/01 - Manufacture or treatment
  • H10B 10/00 - Static random access memory [SRAM] devices
  • H10B 12/00 - Dynamic random access memory [DRAM] devices
  • H10B 53/30 - Ferroelectric RAM [FeRAM] devices comprising ferroelectric memory capacitors characterised by the memory core region
  • H10D 30/67 - Thin-film transistors [TFT]
  • H10D 84/80 - Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers characterised by the integration of at least one component covered by groups or , e.g. integration of IGFETs
  • H10D 84/83 - Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers characterised by the integration of at least one component covered by groups or , e.g. integration of IGFETs of only field-effect components of only insulated-gate FETs [IGFET]
  • H10P 14/20 -
  • H10P 14/24 -
  • H10P 14/60 -

71.

SEMICONDUCTOR DEVICE AND METHOD FOR PRODUCING SEMICONDUCTOR DEVICE

      
Application Number IB2026052169
Publication Number 2026/190623
Status In Force
Filing Date 2026-03-06
Publication Date 2026-09-17
Owner SEMICONDUCTOR ENERGY LABORATORY CO., LTD. (Japan)
Inventor
  • Yamazaki, Shunpei
  • Okuno, Naoki
  • Arai, Takahiro
  • Murakawa, Tsutomu
  • Fujii, Teruyuki

Abstract

Provided is a semiconductor device that has excellent electrical properties. This semiconductor device comprises a metal oxide layer, a gate insulating layer on the metal oxide layer, and a gate electrode on the gate insulating layer. The metal oxide layer has a first portion and a second portion on the first portion. The value of the potential barrier of the second portion is lower than the value of the potential barrier of the first portion. The value of the potential barrier of the second portion is at least 0 meV and less than 7 meV. The first portion includes a first element. The first element is at least one of gallium and aluminum.

IPC Classes  ?

  • H10D 30/67 - Thin-film transistors [TFT]
  • C23C 14/08 - Oxides
  • C23C 14/34 - Sputtering
  • C23C 16/22 - Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of inorganic material, other than metallic material
  • C23C 16/40 - Oxides
  • C23C 16/455 - Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into the reaction chamber or for modifying gas flows in the reaction chamber
  • H10D 30/01 - Manufacture or treatment
  • H10D 84/83 - Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers characterised by the integration of at least one component covered by groups or , e.g. integration of IGFETs of only field-effect components of only insulated-gate FETs [IGFET]
  • H10D 87/00 - Integrated devices comprising both bulk components and either SOI or SOS components on the same substrate
  • H10K 59/12 - Active-matrix OLED [AMOLED] displays
  • H10K 59/121 - Active-matrix OLED [AMOLED] displays characterised by the geometry or disposition of pixel elements
  • H10K 71/00 - Manufacture or treatment specially adapted for the organic devices covered by this subclass
  • H10P 14/22 -
  • H10P 14/24 -
  • H10P 14/692 -
  • H10P 50/20 -

72.

ELECTRONIC DEVICE AND OPERATION METHOD THEREOF

      
Application Number 19489285
Status Pending
Filing Date 2024-07-18
First Publication Date 2026-09-10
Owner Semiconductor Energy Laboratory Co., Ltd. (Japan)
Inventor
  • Hatsumi, Ryo
  • Ikeda, Hisao
  • Nakamura, Daiki
  • Nishimura, Tomotaka

Abstract

An electronic device with good visibility of display is provided. The electronic device includes a reflective liquid crystal display device for displaying information, and part of external light taken into the electronic device can be supplied to the reflective liquid crystal display device to be used as a light source of display light. Thus, the visibility of display can be increased even when external light is intense. Furthermore, since external light is utilized for display, power consumption can be reduced compared with a transmissive liquid crystal display device that constantly uses a light source, a self-luminous organic EL display device, and the like.

IPC Classes  ?

  • G02B 27/01 - Head-up displays
  • G02F 1/1335 - Structural association of cells with optical devices, e.g. polarisers or reflectors
  • G02F 1/13357 - Illuminating devices
  • G02F 1/13363 - Birefringent elements, e.g. for optical compensation

73.

INFORMATION PROCESSING DEVICE AND INFORMATION PROCESSING METHOD

      
Application Number 19551721
Status Pending
Filing Date 2026-02-27
First Publication Date 2026-09-10
Owner SEMICONDUCTOR ENERGY LABORATORY CO., LTD. (Japan)
Inventor
  • Momo, Junpei
  • Higashi, Kazuki
  • Akimoto, Kengo
  • Hososhima, Hiroki
  • Nakamura, Aoi
  • Hyberg, Jonatan

Abstract

After first and second documents are received, a text generation language model generates a summary sentence of the second document. A difference presentation language model presents a difference in the first document from the summary sentence. When the difference is not appropriate, the difference presentation language model is made to present a difference again on the basis of a first instruction document created by a user. When the difference is appropriate, the difference presentation language model is made to confirm that the difference is absent in the second document. The difference presentation language model is fine-tuned using a plurality of data points each including an order sentence, two learning texts, and a learning response sentence. Among the plurality of data points, some of the learning response sentences show the absence of a difference between the two learning texts, and the rest show a difference between the two learning texts.

IPC Classes  ?

  • G06F 40/166 - Editing, e.g. inserting or deleting
  • G06F 40/40 - Processing or translation of natural language

74.

Light-Emitting Device and Light-Emitting Apparatus

      
Application Number 19657978
Status Pending
Filing Date 2026-04-24
First Publication Date 2026-09-10
Owner Semiconductor Energy Laboratory Co., Ltd. (Japan)
Inventor
  • Yoshiyasu, Yui
  • Kawakami, Sachiko
  • Hashimoto, Naoaki
  • Suzuki, Tsunenori
  • Seo, Satoshi

Abstract

A light-emitting device with high resistance to heat in a fabrication process is provided. The light-emitting device includes an EL layer between an anode and a cathode. The EL layer includes at least a light-emitting layer and an electron-transport layer that includes a first electron-transport layer in contact with the light-emitting layer and a second electron-transport layer in contact with the first electron-transport layer. The first electron-transport layer includes a first heteroaromatic compound including at least one heteroaromatic ring. The second electron-transport layer includes a second heteroaromatic compound that includes at least one heteroaromatic ring and is different from the first heteroaromatic compound. The first heteroaromatic compound has a difference of 20° C. or less between the crystallization temperature (Tpc) of a powder state and the crystallization temperature (Ttc) of a thin film state. The second heteroaromatic compound has a difference of 100° C. or less between Tpc and Ttc.

IPC Classes  ?

  • H10K 50/16 - Electron transporting layers
  • C07D 401/14 - Heterocyclic compounds containing two or more hetero rings, having nitrogen atoms as the only ring hetero atoms, at least one ring being a six-membered ring with only one nitrogen atom containing three or more hetero rings
  • C07D 403/10 - Heterocyclic compounds containing two or more hetero rings, having nitrogen atoms as the only ring hetero atoms, not provided for by group containing two hetero rings linked by a carbon chain containing aromatic rings
  • C07D 403/14 - Heterocyclic compounds containing two or more hetero rings, having nitrogen atoms as the only ring hetero atoms, not provided for by group containing three or more hetero rings
  • C07D 409/10 - Heterocyclic compounds containing two or more hetero rings, at least one ring having sulfur atoms as the only ring hetero atoms containing two hetero rings linked by a carbon chain containing aromatic rings
  • C07D 471/04 - Ortho-condensed systems
  • C07D 491/048 - Ortho-condensed systems with only one oxygen atom as ring hetero atom in the oxygen-containing ring the oxygen-containing ring being five-membered
  • C07D 519/00 - Heterocyclic compounds containing more than one system of two or more relevant hetero rings condensed among themselves or condensed with a common carbocyclic ring system not provided for in groups or
  • C07F 7/22 - Tin compounds
  • C07F 15/00 - Compounds containing elements of Groups 8, 9, 10 or 18 of the Periodic Table
  • H10K 50/17 - Carrier injection layers
  • H10K 85/30 - Coordination compounds
  • H10K 85/60 - Organic compounds having low molecular weight

75.

POWER STORAGE SYSTEM, VEHICLE, AND ELECTRONIC DEVICE

      
Application Number 19659041
Status Pending
Filing Date 2026-04-27
First Publication Date 2026-09-10
Owner Semiconductor Energy Laboratory Co., Ltd. (Japan)
Inventor
  • Ikeda, Takayuki
  • Tsukamoto, Yosuke
  • Osada, Takeshi
  • Inoue, Hiroki
  • Kimura, Kiyotaka
  • Sato, Shunsuke
  • Mizuguchi, Toshiki

Abstract

Provided is a power storage system, a secondary battery control system, a secondary battery measurement circuit, or the like that consumes low power. Provided is a power storage system, a secondary battery control system, a secondary battery measurement circuit, or the like that is highly integrated. The power storage system includes a secondary battery and a measurement circuit; the measurement circuit includes a resistor, a capacitor, and an inductor; one terminal of the resistor is electrically connected to one electrode of the capacitor; the other terminal of the resistor is electrically connected to one terminal of the inductor; one terminal of the inductor is electrically connected to a positive electrode of the secondary battery; and the measurement circuit has a function of measuring impedance of the secondary battery by measuring current of the resistor.

IPC Classes  ?

  • G01R 31/389 - Measuring internal impedance, internal conductance or related variables
  • H01M 10/42 - Methods or arrangements for servicing or maintenance of secondary cells or secondary half-cells
  • H01M 10/48 - Accumulators combined with arrangements for measuring, testing or indicating the condition of cells, e.g. the level or density of the electrolyte

76.

ELECTRONIC DEVICE AND COMMUNICATION SYSTEM

      
Application Number 19661834
Status Pending
Filing Date 2026-04-29
First Publication Date 2026-09-10
Owner Semiconductor Energy Laboratory Co., Ltd. (Japan)
Inventor
  • Yamazaki, Shunpei
  • Tsukamoto, Yosuke
  • Kato, Kiyoshi
  • Onuki, Tatsuya
  • Oikawa, Yoshiaki
  • Yoshizumi, Kensuke

Abstract

A multifunctional display apparatus or electronic device is provided. An electronic device that can switch between VR display and AR display is provided. The electronic device includes a first display apparatus, a second display apparatus, a lens, a screen, a wearing tool, and a housing. The wearing tool has a function of fixing the housing to a head. The housing has a function of being transformed into a first mode that closes to block view and a second mode that opens to allow a front side to be viewed. The electronic device has a function of providing a first image displayed on the first display apparatus through the lens and the screen in the first mode, and a function of providing a second image projected to the screen from the second display apparatus in the second mode.

IPC Classes  ?

  • G02B 27/01 - Head-up displays
  • G06F 1/16 - Constructional details or arrangements
  • G02B 27/00 - Optical systems or apparatus not provided for by any of the groups ,
  • H10K 59/12 - Active-matrix OLED [AMOLED] displays

77.

POSITIVE ELECTRODE ACTIVE MATERIAL, SECONDARY BATTERY, ELECTRONIC DEVICE, AND VEHICLE

      
Application Number 18876331
Status Pending
Filing Date 2023-06-09
First Publication Date 2026-09-10
Owner SEMICONDUCTOR ENERGY LABORATORY CO., LTD. (Japan)
Inventor
  • Mikami, Mayumi
  • Saito, Jo
  • Tanemura, Kazuki
  • Yamazaki, Shunpei

Abstract

A positive electrode active material with a small decrease in discharging capacity in charging and discharging cycles is provided. The positive electrode active material contains cobalt, nickel, and oxygen. The proportion of nickel in the sum of the cobalt and the nickel, Ni/(Co+Ni), is greater than 0.175 and less than or equal to 0.215. When the positive electrode active material in a state of being charged to 4.5 V (vs. Li/Li+) is analyzed by powder X-ray diffraction using CuKα1 radiation, diffraction peaks are observed at at least two or more of 2θ±18.526±0.1°, 2θ=37.391±0.1°, 2θ=37.628±0.1°, 2θ=39.015±0.1°, 2θ=44.947±0.1°, 2θ=49.029±0.1°, and 2θ=58.857±0.1°.

IPC Classes  ?

  • H01M 4/525 - Selection of substances as active materials, active masses, active liquids of inorganic oxides or hydroxides of nickel, cobalt or iron of mixed oxides or hydroxides containing iron, cobalt or nickel for inserting or intercalating light metals, e.g. LiNiO2, LiCoO2 or LiCoOxFy
  • B60L 50/64 - Constructional details of batteries specially adapted for electric vehicles
  • C01G 53/42 - Complex oxides containing nickel and at least one other metal element containing alkali metals, e.g. LiNiO2

78.

LCNO

      
Application Number 1936481
Status Registered
Filing Date 2026-07-14
Registration Date 2026-07-14
Owner Semiconductor Energy Laboratory Co., Ltd. (Japan)
NICE Classes  ?
  • 01 - Chemical and biological materials for industrial, scientific and agricultural use
  • 09 - Scientific and electric apparatus and instruments
  • 42 - Scientific, technological and industrial services, research and design

Goods & Services

Chemicals; chemical elements; oxides; aromatics [chemicals]; organic halogenides; nitrogen compounds; heterocyclic compounds; chemicals for fabricating semiconductors; chemicals used as raw materials for semiconductor elements; chemical agents for forming electrodes; chemicals used as raw materials for electrodes; chemicals used as raw materials for electrode of secondary batteries; chemicals for industrial purposes or manufacturing process; metallic oxides for industrial purposes; non-metallic oxides for industrial purposes; chemical agents for forming insulators; chemicals used as raw materials for insulators; chemicals used as raw materials for electroluminescence (EL) elements; ionic liquids for secondary batteries. Solar batteries; batteries; storage batteries; lithium ion secondary batteries; telecommunication machines and apparatus; semiconductor elements; electronic circuits; liquid crystal displays; liquid crystal display panels; displays using organic electroluminescence (EL) elements; memory chips; memory modules; semiconductor memories; computer memory devices; flash memory cards; semiconductor integrated circuits including CPUs; semiconductor chips for image processing; programmable semiconductor chips; semiconductor elements for image sensors; digital cameras and accessories or parts thereof; digital video cameras and accessories thereof; CMOS cameras; CCD cameras; touch panels; measuring machines, apparatus, and accessories or parts thereof; photographic machines, apparatus, and accessories thereof; cinematographic machines and apparatus; electrodes for electronic components or semiconductor elements; electrodes for lithium ion secondary batteries; electrodes and parts thereof; on-board liquid crystal display devices; on-board visual display units; on-board organic electroluminescence (EL) display devices; mobile phones; smartphones; television apparatus; sound reproduction apparatus; computers and computer peripheral devices; notebook computers; laptop computers; tablet computers; personal computers; microcomputers; other computers; computer monitors; touch panels for computers; electronic tags; integrated circuit cards (smart cards); card readers for integrated circuit cards or magnetic cards; card writers for integrated circuit cards or magnetic card; radio transmitters and receivers; digital data memory devices; optical machines and apparatus; video telephones; telecommunication machines and apparatus for video telephone system; coin counting or coin sorting machines; photo copy machines; electronic calculators; electronic desk calculators; voting machines; flat panel display screens; head mounted displays; random access memory (RAM) cards; memory card readers and memory card writers; data memory devices; semiconductor memory devices; storage mediums recorded with computer programs; computer data storage mediums; electronic circuits (not including those recorded with computer programs); graphic boards; computer keyboards; motherboards; electronic circuit boards; computer hardware; computer hard disks; solid state drives; liquid crystal displays with touch sensor function; organic EL displays with touch sensor function; navigation devices; display devices for car navigation systems; personal digital assistants in the shape of a watch; mobile computers in the shape of a watch; smartphones in the shape of a watch; electronic publications; portable terminals for displaying electronic publications; electronic control systems for automobiles; measuring machines and apparatus for detecting information relating to automobiles; electronic calculator programs; applications for computer software (commercially available and downloadable via telecommunications lines); computer software (recorded); magnetic cards with recorded computer programs; computer programs (recorded); computer programs (commercially available and downloadable via telecommunications lines); computer software for cloud computing; downloadable software for cloud computing; downloadable computer programs and downloadable computer software for artificially generating human voice and text; downloadable computer programs and downloadable computer software for processing, generating, understanding, and analyzing natural language; downloadable computer programs and downloadable computer software for machine learning-based language and speech processing software; downloadable computer chatbot software for simulating conversations; downloadable computer programs and downloadable computer software for creating and generating text. Technical research; testing, research, and development in the field of chemistry; testing, research, and development relating to science; testing, research, and development relating to machines and apparatus; testing, research, and development of metal materials; testing, research, and development in the fields of material science and electrical engineering; testing, research, and development relating to electricity; testing, research, and development relating to telecommunication machines and apparatus; testing, research, and development relating to electronic circuits, semiconductor elements, integrated circuits, and large-scale integrated circuits; testing, research, and development relating to semiconductors; testing, research, and development relating to metal oxides, semiconductors, and telecommunication machines and apparatus; providing technical research information relating to manufacture and processing of metal oxides, semiconductors, and telecommunication machines and apparatus; testing, investigation, or research relating to science; providing information on testing, investigation, or research relating to science; industrial development; providing information relating to technical research; providing information and data relating to scientific and technical research and development; providing scientific and technical information; technical consultancy relating to product development; design of electronic circuits, semiconductor elements, integrated circuits, and large-scale integrated circuits; providing consultancy or information relating to design of electronic circuits, semiconductor power elements, integrated circuits, and large-scale integrated circuits; design, coding, or maintenance of electronic calculator programs; providing electronic calculator programs; maintenance of computer software; design of computer software; consultancy relating to design, coding, or maintenance of computer software; technological advice relating to computers, automobiles and industrial machines; leasing computer software; installing computer programs; providing application software by online (SaaS); updating computer software; providing computer software for cloud computing; design, coding, or maintenance of operating software for accessing and using cloud computing network; leasing operating software for accessing and using cloud computing network; design and development of operating software for accessing and using cloud computing network; providing online non-downloadable computer software for artificially generating human voice and text; providing online non-downloadable computer software for processing, generating, understanding, and analyzing natural language; providing online non-downloadable computer software for machine learning-based language and speech processing software; providing online non-downloadable computer chatbot software for simulating conversations; providing online non-downloadable computer software for creating and generating text; research and development in the field of artificial intelligence; research, design, and development of computer programs and computer software.

79.

Light-Emitting Device

      
Application Number 19555039
Status Pending
Filing Date 2026-03-03
First Publication Date 2026-09-10
Owner Semiconductor Energy Laboratory Co., Ltd. (Japan)
Inventor
  • Watabe, Takeyoshi
  • Ohsawa, Nobuharu

Abstract

A light-emitting device having favorable characteristics and a wide range of material choices. The light-emitting device includes an anode over an insulating surface, a cathode opposite to the anode, and a first electron-transport layer and a second electron-transport layer which are between the anode and the cathode. The first electron-transport layer and the second electron-transport layer are in contact with each other. The second electron-transport layer and the cathode are in contact with each other. The GSP_Slope (mV/nm) of an evaporated film of a material included in the second electron-transport layer is larger than the GSP_Slope (mV/nm) of an evaporated film of a material included in the first electron-transport layer. The thickness of the second electron-transport layer is greater than 0 nm and less than 10 nm. The GSP_Slope (mV/nm) is represented by ΔV/Δd, where ΔV (mV) is an amount of change in a surface potential with respect to an amount of change in a thickness Δd (nm).

IPC Classes  ?

80.

Light-Emitting Element, Light-Emitting Device, Electronic Device, and Lighting Device

      
Application Number 19656543
Status Pending
Filing Date 2026-04-23
First Publication Date 2026-09-10
Owner Semiconductor Energy Laboratory Co, Ltd. (Japan)
Inventor
  • Nonaka, Yusuke
  • Seo, Satoshi
  • Osaka, Harue
  • Suzuki, Tsunenori
  • Watabe, Takeyoshi

Abstract

To increase emission efficiency of a fluorescent light-emitting element by efficiently utilizing a triplet exciton generated in a light-emitting layer. The light-emitting layer of the light-emitting element includes at least a host material and a guest material. The triplet exciton generated from the host material in the light-emitting layer is changed to a singlet exciton by triplet-triplet annihilation (TTA). The guest material (fluorescent dopant) is made to emit light by energy transfer from the singlet exciton. Thus, the emission efficiency of the light-emitting element is improved.

IPC Classes  ?

  • H10K 50/11 - OLEDs or polymer light-emitting diodes [PLED] characterised by the electroluminescent [EL] layers
  • H10K 50/15 - Hole transporting layers
  • H10K 50/19 - Tandem OLEDs
  • H10K 85/30 - Coordination compounds
  • H10K 85/60 - Organic compounds having low molecular weight
  • H10K 101/10 - Triplet emission
  • H10K 101/30 - Highest occupied molecular orbital [HOMO], lowest unoccupied molecular orbital [LUMO] or Fermi energy values
  • H10K 101/40 - Interrelation of parameters between multiple constituent active layers or sublayers, e.g. HOMO values in adjacent layers

81.

SEMICONDUCTOR DEVICE AND METHOD FOR DRIVING SEMICONDUCTOR DEVICE

      
Application Number 19659866
Status Pending
Filing Date 2026-04-27
First Publication Date 2026-09-10
Owner SEMICONDUCTOR ENERGY LABORATORY CO., LTD. (Japan)
Inventor
  • Matsuzaki, Takanori
  • Onuki, Tatsuya
  • Saito, Toshihiko

Abstract

A novel semiconductor device is provided. The semiconductor device includes a memory cell including a transistor and a capacitor that includes a ferroelectric; a word line; a bit line; and a plate line. A gate of the transistor is electrically connected to the word line. One of a source and a drain of the transistor is electrically connected to the bit line. The other of the source and the drain of the transistor is electrically connected to one electrode of the capacitor. The other electrode of the capacitor is electrically connected to the plate line. The semiconductor device has a function of supplying a potential that controls an on state or an off state of the transistor to the word line, a function of supplying a first potential or a second potential to the bit line, and a function of supplying a third potential, a fourth potential, or a fifth potential to the plate line.

IPC Classes  ?

  • G11C 11/22 - Digital stores characterised by the use of particular electric or magnetic storage elementsStorage elements therefor using electric elements using ferroelectric elements
  • H10B 53/30 - Ferroelectric RAM [FeRAM] devices comprising ferroelectric memory capacitors characterised by the memory core region
  • H10D 1/68 - Capacitors having no potential barriers
  • H10D 30/67 - Thin-film transistors [TFT]

82.

Light-Emitting Element

      
Application Number 19666635
Status Pending
Filing Date 2026-05-04
First Publication Date 2026-09-10
Owner SEMICONDUCTOR ENERGY LABORATORY CO., LTD. (Japan)
Inventor Seo, Satoshi

Abstract

Provided is a light-emitting element with high external quantum efficiency and a low drive voltage. The light-emitting element includes a light-emitting layer which contains a phosphorescent compound and a material exhibiting thermally activated delayed fluorescence between a pair of electrodes, wherein a peak of a fluorescence spectrum and/or a peak of a phosphorescence spectrum of the material exhibiting thermally activated delayed fluorescence overlap(s) with a lowest-energy-side absorption band in an absorption spectrum of the phosphorescent compound, and wherein the phosphorescent compound exhibits phosphorescence in the light-emitting layer by voltage application between the pair of electrodes.

IPC Classes  ?

  • C09K 11/02 - Use of particular materials as binders, particle coatings or suspension media therefor
  • C09K 11/06 - Luminescent, e.g. electroluminescent, chemiluminescent, materials containing organic luminescent materials
  • H10F 77/40 - Optical elements or arrangements
  • H10K 50/11 - OLEDs or polymer light-emitting diodes [PLED] characterised by the electroluminescent [EL] layers
  • H10K 50/12 - OLEDs or polymer light-emitting diodes [PLED] characterised by the electroluminescent [EL] layers comprising dopants
  • H10K 50/15 - Hole transporting layers
  • H10K 50/16 - Electron transporting layers
  • H10K 50/17 - Carrier injection layers
  • H10K 85/30 - Coordination compounds
  • H10K 85/60 - Organic compounds having low molecular weight
  • H10K 101/00 - Properties of the organic materials covered by group
  • H10K 101/10 - Triplet emission
  • H10K 101/20 - Delayed fluorescence emission
  • H10K 101/30 - Highest occupied molecular orbital [HOMO], lowest unoccupied molecular orbital [LUMO] or Fermi energy values
  • H10K 101/40 - Interrelation of parameters between multiple constituent active layers or sublayers, e.g. HOMO values in adjacent layers
  • H10K 102/00 - Constructional details relating to the organic devices covered by this subclass

83.

SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE

      
Application Number 19164702
Status Pending
Filing Date 2024-03-25
First Publication Date 2026-09-10
Owner Semiconductor Energy Laboratory Co., Ltd. (Japan)
Inventor
  • Iguchi, Takahiro
  • Jintyou, Masami

Abstract

Provided is a semiconductor device including a transistor having high saturation. The semiconductor device is provided with a vertical transistor including a back gate electrode. In the semiconductor device, a lower electrode, a spacer, and an upper electrode are provided in this order. The spacer includes a first opening portion reaching the lower electrode, and the upper electrode includes a second opening portion including a region overlapping with the first opening portion. The back gate electrode is provided in the first opening portion and includes a region in contact with the lower electrode. A back gate insulating layer, a semiconductor layer, a gate insulating layer, and a gate electrode are provided in this order to cover the back gate electrode. After the formation of the first opening portion and the second opening portion, a conductive film is formed to cover the first opening portion and is subjected to anisotropic etching, whereby the back gate electrode can be formed. An insulating film is formed to cover the back gate electrode and is subjected to anisotropic etching, whereby the back gate insulating layer can be formed.

IPC Classes  ?

  • H10D 30/67 - Thin-film transistors [TFT]
  • H10D 30/01 - Manufacture or treatment
  • H10D 86/01 - Manufacture or treatment
  • H10D 86/40 - Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs
  • H10D 86/60 - Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs wherein the TFTs are in active matrices
  • H10K 59/121 - Active-matrix OLED [AMOLED] displays characterised by the geometry or disposition of pixel elements
  • H10K 59/122 - Pixel-defining structures or layers, e.g. banks
  • H10K 59/123 - Connection of the pixel electrodes to the thin film transistors [TFT]
  • H10K 65/00 - Integrated devices, or assemblies of multiple devices, comprising at least one organic light-emitting element and at least one organic radiation-sensitive element, e.g. organic opto-couplers

84.

SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SEMICONDUCTOR DEVICE

      
Application Number 19164713
Status Pending
Filing Date 2024-03-25
First Publication Date 2026-09-10
Owner Semiconductor Energy Laboratory Co., Ltd. (Japan)
Inventor
  • Suzawa, Hideomi
  • Kikuchi, Akihiro

Abstract

A transistor with low parasitic capacitance is provided. A semiconductor device with favorable electrical characteristics is provided. The semiconductor device includes a transistor whose source electrode and drain electrode are positioned at different levels and an insulating layer provided between the source electrode and the drain electrode; the insulating layer includes a first opening reaching one of the source electrode and the drain electrode; the other of the source electrode and the drain electrode is provided over the insulating layer and includes a second opening overlapping with the first opening; a semiconductor layer includes a region provided in the first opening; a gate insulating layer and a gate electrode are provided in this order over the semiconductor layer; the gate electrode has a two-layer structure; the end portion of the lower layer of the gate electrode overlaps with the other of the source electrode and the drain electrode; the upper layer of the gate electrode includes a first region extending outward from the end portion of the lower layer; and a gap is provided between the first region and the other of the source electrode and the drain electrode.

IPC Classes  ?

  • H10B 12/00 - Dynamic random access memory [DRAM] devices

85.

Semiconductor Device And Method For Manufacturing The Semiconductor Device

      
Application Number 19165313
Status Pending
Filing Date 2024-03-11
First Publication Date 2026-09-10
Owner Semiconductor Energy Laboratory Co., Ltd. (Japan)
Inventor
  • Yamazaki, Shunpei
  • Jinbo, Yasuhiro
  • Hodo, Ryota
  • Murakawa, Tsutomu
  • Oota, Masashi
  • Saito, Satoru
  • Kunitake, Hitoshi

Abstract

A transistor with small parasitic capacitance is provided. A semiconductor device with favorable electrical characteristics is provided. The semiconductor device includes a first conductive layer, a second conductive layer, a third conductive layer, an oxide semiconductor layer, a first insulating layer, and a second insulating layer. The first insulating layer is positioned over the first conductive layer. The second conductive layer is positioned over the first insulating layer. The first insulating layer and the second conductive layer have an opening reaching the first conductive layer. In the opening, the oxide semiconductor layer is in contact with at least the top surface of the first conductive layer, a side surface of the first insulating layer, and a side surface of the second conductive layer. The second insulating layer is positioned over the oxide semiconductor layer in the opening. The third conductive layer overlaps with the oxide semiconductor layer with the second insulating layer therebetween in the opening. In a cross-sectional view, the width of the third conductive layer is smaller than or equal to the width of the opening in the second conductive layer.

IPC Classes  ?

  • H10D 30/67 - Thin-film transistors [TFT]
  • H10B 12/00 - Dynamic random access memory [DRAM] devices
  • H10B 53/10 - Ferroelectric RAM [FeRAM] devices comprising ferroelectric memory capacitors characterised by the top-view layout
  • H10B 53/20 - Ferroelectric RAM [FeRAM] devices comprising ferroelectric memory capacitors characterised by the three-dimensional arrangements, e.g. with cells on different height levels
  • H10B 53/30 - Ferroelectric RAM [FeRAM] devices comprising ferroelectric memory capacitors characterised by the memory core region
  • H10B 53/40 - Ferroelectric RAM [FeRAM] devices comprising ferroelectric memory capacitors characterised by the peripheral circuit region
  • H10D 30/01 - Manufacture or treatment
  • H10D 86/40 - Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs
  • H10D 86/60 - Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs wherein the TFTs are in active matrices
  • H10K 59/121 - Active-matrix OLED [AMOLED] displays characterised by the geometry or disposition of pixel elements
  • H10K 59/122 - Pixel-defining structures or layers, e.g. banks
  • H10K 59/123 - Connection of the pixel electrodes to the thin film transistors [TFT]
  • H10K 59/124 - Insulating layers formed between TFT elements and OLED elements
  • H10K 59/131 - Interconnections, e.g. wiring lines or terminals

86.

SEMICONDUCTOR DEVICE

      
Application Number 19165660
Status Pending
Filing Date 2024-03-18
First Publication Date 2026-09-10
Owner SEMICONDUCTOR ENERGY LABORATORY CO., LTD. (Japan)
Inventor
  • Fujita, Masashi
  • Kurokawa, Yoshiyuki
  • Godo, Hiromichi

Abstract

A novel semiconductor device is provided. A power management portion and a data retention portion are provided in a first layer; a setting information retention portion, a power switch portion, and a backup portion are provided in a second layer over the first layer; the data retention portion has a function of retaining data; the power management portion has a function of supplying an instruction for controlling power gating to the power switch portion and supplying, to the setting information retention portion, setting information indicating whether to block power supply to the data retention portion by the power gating; the setting information retention portion has a function of retaining the setting information supplied from the power management portion; the power switch portion has a function of switching whether to block power supply to the data retention portion on the basis of the instruction and the setting information retained in the setting information retention portion; and the backup portion has a function of storing and retaining the data on the basis of a signal supplied from the power management portion.

IPC Classes  ?

  • G11C 11/417 - Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing, timing or power reduction for memory cells of the field-effect type
  • G11C 11/4074 - Power supply or voltage generation circuits, e.g. bias voltage generators, substrate voltage generators, back-up power, power control circuits
  • H10D 1/68 - Capacitors having no potential barriers
  • H10D 30/67 - Thin-film transistors [TFT]
  • H10D 86/40 - Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs
  • H10D 86/80 - Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple passive components, e.g. resistors, capacitors or inductors
  • H10W 20/41 -

87.

LIGHT-EMITTING DEVICE, DISPLAY DEVICE, DISPLAY MODULE, AND ELECTRONIC DEVICE

      
Application Number 19165700
Status Pending
Filing Date 2024-03-25
First Publication Date 2026-09-10
Owner SEMICONDUCTOR ENERGY LABORATORY CO., LTD. (Japan)
Inventor
  • Aoyama, Tomoya
  • Hodo, Ryota
  • Sasagawa, Shinya
  • Jinbo, Yasuhiro

Abstract

A novel light-emitting device which is highly convenient, useful, or reliable can be provided. The light-emitting device includes a first electrode, a second electrode, a first unit, and a first layer. The second electrode overlaps with the first electrode, the second electrode contains a metal atom, and the second electrode contains a carbon atom at a predetermined concentration. The first unit is sandwiched between the first electrode and the second electrode, and the first unit contains a first light-emitting material. The first layer is sandwiched between the second electrode and the first unit, the first layer contains the first organic compound and the second organic compound, the first organic compound has an acid dissociation constant pKa larger than or equal to 8, and the second organic compound has a polarization term δp smaller than or equal to a predetermined value in the solubility parameter δ.

IPC Classes  ?

88.

Semiconductor Device

      
Application Number 19165711
Status Pending
Filing Date 2024-03-11
First Publication Date 2026-09-10
Owner Semiconductor Energy Laboratory Co., Ltd. (Japan)
Inventor
  • Isaka, Fumito
  • Egi, Yuji
  • Numata, Shiyuu
  • Miyata, Shoki
  • Matsuzaki, Takanori
  • Takahashi, Masahiro
  • Yamazaki, Shunpei

Abstract

A novel semiconductor device is provided. The semiconductor device includes a first conductive layer, a first insulating layer over the first conductive layer, a second conductive layer over the first insulating layer, a first semiconductor layer, a second insulating layer over the first semiconductor layer, a third insulating layer over the second insulating layer, and a third conductive layer over the third insulating layer. An opening portion reaching the first conductive layer is provided in the first insulating layer and the second conductive layer. In the opening portion, the first semiconductor layer includes a region in contact with the top surface of the first conductive layer, a region in contact with a side surface of the first insulating layer, and a region in contact with a side surface of the second conductive layer. The second insulating layer has a barrier property against oxygen. The third insulating layer is a ferroelectric containing hafnium, zirconium, at least one of the Group 3 elements in the periodic table, and oxygen, and the content percentage of at least one of the Group 3 elements in the periodic table in the third insulating layer is higher than or equal to 0.1 atomic % and lower than or equal to 5 atomic %.

IPC Classes  ?

  • H10B 53/30 - Ferroelectric RAM [FeRAM] devices comprising ferroelectric memory capacitors characterised by the memory core region
  • H10B 12/00 - Dynamic random access memory [DRAM] devices
  • H10B 53/20 - Ferroelectric RAM [FeRAM] devices comprising ferroelectric memory capacitors characterised by the three-dimensional arrangements, e.g. with cells on different height levels
  • H10D 1/68 - Capacitors having no potential barriers
  • H10D 30/67 - Thin-film transistors [TFT]
  • H10D 30/69 - IGFETs having charge trapping gate insulators, e.g. MNOS transistors
  • H10D 64/68 - Electrodes having a conductor capacitively coupled to a semiconductor by an insulator, e.g. MIS electrodes characterised by the insulator, e.g. by the gate insulator

89.

Semiconductor Device

      
Application Number 19166382
Status Pending
Filing Date 2024-03-14
First Publication Date 2026-09-10
Owner Semiconductor Energy Laboratory Co., Ltd. (Japan)
Inventor
  • Yamazaki, Shunpei
  • Matsuzaki, Takanori
  • Okamoto, Yuki
  • Kunitake, Hitoshi

Abstract

A semiconductor device with a novel structure is provided. First to third element layers are included. The second element layer is stacked over the first element layer. The third element layer is stacked over the second element layer. A first storage portion is provided in the second element layer. A second storage portion is provided in the third element layer. The first element layer includes a first sense amplifier circuit portion electrically connected to the first storage portion, and a second sense amplifier circuit portion electrically connected to the second storage portion. The first sense amplifier circuit portion and the second sense amplifier circuit portion each include a first transistor including a first semiconductor layer including silicon in a channel formation region. The first storage portion includes a second transistor including a second semiconductor layer including an oxide semiconductor in a channel formation region. The second storage portion includes a third transistor including a third semiconductor layer including an oxide semiconductor in a channel formation region. The third element layer provided with the second storage portion is provided by stacking a plurality of element layers.

IPC Classes  ?

  • H10B 12/00 - Dynamic random access memory [DRAM] devices
  • G11C 11/405 - Digital stores characterised by the use of particular electric or magnetic storage elementsStorage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells with charge regeneration common to a multiplicity of memory cells, i.e. external refresh with three charge-transfer gates, e.g. MOS transistors, per cell
  • G11C 11/4091 - Sense or sense/refresh amplifiers, or associated sense circuitry, e.g. for coupled bit-line precharging, equalising or isolating

90.

SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME

      
Application Number 19167637
Status Pending
Filing Date 2024-03-25
First Publication Date 2026-09-10
Owner SEMICONDUCTOR ENERGY LABORATORY CO., LTD. (Japan)
Inventor
  • Jintyou, Masami
  • Shima, Yukinori
  • Nakada, Masataka
  • Koezuka, Junichi
  • Okazaki, Kenichi
  • Iguchi, Takahiro

Abstract

A semiconductor device that occupies a small area is provided. The semiconductor device includes a first insulating layer, a second insulating layer over the first insulating layer, and a transistor. The transistor includes a semiconductor layer, a third insulating layer, a fourth insulating layer, a gate electrode, a source electrode, and a drain electrode. The source electrode and the drain electrode are provided over the first insulating layer. The second insulating layer has an opening reaching the first insulating layer and overlapping with a part of the source electrode and a part of the drain electrode. The semiconductor layer and the third insulating layer are provided along a perimeter of the opening. The semiconductor layer is provided in contact with a side surface of the second insulating layer in the opening, a top surface of the first insulating layer in the opening, a top surface of the source electrode, and a top surface of the drain electrode. The third insulating layer is positioned over the semiconductor layer. The fourth insulating layer covers the third insulating layer and the semiconductor layer and is in contact with the first insulating layer. The gate electrode overlaps with the opening and is positioned over the fourth insulating layer. At least a part of the semiconductor layer is opposite to the gate electrode with the third insulating layer and the fourth insulating layer therebetween.

IPC Classes  ?

  • H10K 59/121 - Active-matrix OLED [AMOLED] displays characterised by the geometry or disposition of pixel elements
  • H10K 59/12 - Active-matrix OLED [AMOLED] displays

91.

POSITIVE ELECTRODE ACTIVE MATERIAL PARTICLES AND LITHIUM ION SECONDARY BATTERY

      
Application Number IB2026051963
Publication Number 2026/185684
Status In Force
Filing Date 2026-03-02
Publication Date 2026-09-10
Owner SEMICONDUCTOR ENERGY LABORATORY CO., LTD. (Japan)
Inventor
  • Yamazaki, Shunpei
  • Momma, Yohei
  • Yoshitomi, Shuhei
  • Takahashi, Masahiro
  • Fukai, Shuji
  • Sekikawa, Fuminori

Abstract

The present invention provides positive electrode active material particles that have low lithium ion diffusion resistance. Positive electrode active material particles according to the present invention include lithium, cobalt, oxygen, magnesium, fluorine, nickel, and aluminum. The positive electrode active material particles have O-Mg-F linkages. The positive electrode active material particles have an edge region that includes, in order from the inside to the outside, a region that has a layered rock salt–type crystal structure of the R-3m space group, a region that has a spinel-type crystal structure, and a region that has a rock salt–type crystal structure. It is preferable that surface layer portions of the positive electrode active material particles have O-Mg-F linkages. It is preferable that the percentage of magnesium in O-Mg-F linkages at the surface layer portions as analyzed by XPS be 5%–30%.

IPC Classes  ?

  • H01M 4/525 - Selection of substances as active materials, active masses, active liquids of inorganic oxides or hydroxides of nickel, cobalt or iron of mixed oxides or hydroxides containing iron, cobalt or nickel for inserting or intercalating light metals, e.g. LiNiO2, LiCoO2 or LiCoOxFy
  • H01M 4/36 - Selection of substances as active materials, active masses, active liquids
  • H01M 10/052 - Li-accumulators
  • H01M 10/0568 - Liquid materials characterised by the solutes
  • H01M 10/0569 - Liquid materials characterised by the solvents

92.

DISPLAY DEVICE

      
Application Number IB2026051964
Publication Number 2026/185685
Status In Force
Filing Date 2026-03-02
Publication Date 2026-09-10
Owner SEMICONDUCTOR ENERGY LABORATORY CO., LTD. (Japan)
Inventor
  • Nakazawa, Yasutaka
  • Sato, Rai
  • Idojiri, Satoru
  • Okazaki, Kenichi
  • Eguchi, Shingo

Abstract

The present invention provides a display device in which a high definition is easily achieved. The present invention also provides a display device that has a high display quality and a high definition. The present invention additionally provides a display device that has a high contrast. The present invention further provides a display device that is highly reliable. The display device includes an insulating layer, a partition wall on the insulating layer, a pixel electrode, an EL layer on the pixel electrode, and an upper electrode. The insulating layer covers an end of the pixel electrode, a first partition wall includes a first layer and a second layer on the first layer, the upper electrode includes a region in contact with the side surface of the first layer and a region in contact with the upper surface of the EL layer, and an angle formed by the bottom surface of the first layer and the side surface of the first layer is greater than 90 degrees and less than 180 degrees. With respect to a first material included in the insulating layer, a force required for separating a second material included in the first layer is less than 8 N. When the second material and a third material included in the second layer are wet-etched using the same solution, the etching rate for the third material is slower than the etching rate for the second material.

IPC Classes  ?

  • H10K 59/122 - Pixel-defining structures or layers, e.g. banks
  • G09F 9/30 - Indicating arrangements for variable information in which the information is built-up on a support by selection or combination of individual elements in which the desired character or characters are formed by combining individual elements
  • H10K 50/19 - Tandem OLEDs
  • H10K 50/824 - Cathodes combined with auxiliary electrodes
  • H10K 59/80 - Constructional details
  • H10K 71/20 - Changing the shape of the active layer in the devices, e.g. patterning

93.

DISPLAY DEVICE AND METHOD FOR MANUFACTURING DISPLAY DEVICE

      
Application Number IB2026051965
Publication Number 2026/185686
Status In Force
Filing Date 2026-03-02
Publication Date 2026-09-10
Owner SEMICONDUCTOR ENERGY LABORATORY CO., LTD. (Japan)
Inventor
  • Nakazawa, Yasutaka
  • Sato, Rai
  • Idojiri, Satoru
  • Okazaki, Kenichi
  • Eguchi, Shingo

Abstract

Provided is a display device in which high definition is easily achieved. The display device comprises a pixel electrode, an EL layer, an upper electrode, and a partition wall. The partition wall is spaced apart from the pixel electrode in plan view. The EL layer contains a light-emitting compound and is in contact with an upper surface of the pixel electrode. The partition wall is electrically conductive and has a first portion, a second portion, and a third portion from the top. In a cross-sectional view, the width of the third portion is smaller than that of the first portion and larger than that of the second portion. The upper electrode covers the upper surface and an end portion of the EL layer and is in contact with the third portion.

IPC Classes  ?

  • H10K 59/122 - Pixel-defining structures or layers, e.g. banks
  • G09F 9/00 - Indicating arrangements for variable information in which the information is built-up on a support by selection or combination of individual elements
  • G09F 9/30 - Indicating arrangements for variable information in which the information is built-up on a support by selection or combination of individual elements in which the desired character or characters are formed by combining individual elements
  • H10K 50/824 - Cathodes combined with auxiliary electrodes
  • H10K 59/80 - Constructional details
  • H10K 59/123 - Connection of the pixel electrodes to the thin film transistors [TFT]
  • H10K 71/20 - Changing the shape of the active layer in the devices, e.g. patterning

94.

Organic Compound, Light-Emitting Device, Light-Emitting Apparatus, Electronic Device, and Lighting Device

      
Application Number 19545971
Status Pending
Filing Date 2026-02-20
First Publication Date 2026-09-03
Owner Semiconductor Energy Laboratory Co., Ltd. (Japan)
Inventor
  • Yoshiyasu, Yui
  • Yoshizumi, Hideko
  • Watabe, Takeyoshi
  • Seo, Satoshi

Abstract

A novel organometallic complex is provided. One embodiment of the present invention provides a novel organometallic complex having a high quantum yield. An Ir complex has a structure including a 1H-naphtho[1,2-d]imidazole skeleton as a ligand and being represented by General Formula (G-1) below. Of Ns included in the 1H-naphtho[1,2-d]imidazole skeleton, N that is not bonded to Ir is bonded to a substituted or unsubstituted aryl group. A novel organometallic complex is provided. One embodiment of the present invention provides a novel organometallic complex having a high quantum yield. An Ir complex has a structure including a 1H-naphtho[1,2-d]imidazole skeleton as a ligand and being represented by General Formula (G-1) below. Of Ns included in the 1H-naphtho[1,2-d]imidazole skeleton, N that is not bonded to Ir is bonded to a substituted or unsubstituted aryl group. A novel organometallic complex is provided. One embodiment of the present invention provides a novel organometallic complex having a high quantum yield. An Ir complex has a structure including a 1H-naphtho[1,2-d]imidazole skeleton as a ligand and being represented by General Formula (G-1) below. Of Ns included in the 1H-naphtho[1,2-d]imidazole skeleton, N that is not bonded to Ir is bonded to a substituted or unsubstituted aryl group. In General Formula (G-1), each of R1 to R10 independently represents any of hydrogen, an alkyl group having 1 to 6 carbon atoms, a substituted or unsubstituted cycloalkyl group having 3 to 7 carbon atoms, a substituted or unsubstituted aryl group having 6 to 25 carbon atoms, and an electron-withdrawing group, and Ar represents a substituted or unsubstituted aryl group having 6 to 25 carbon atoms.

IPC Classes  ?

  • H10K 85/30 - Coordination compounds
  • C07F 15/00 - Compounds containing elements of Groups 8, 9, 10 or 18 of the Periodic Table
  • C09K 11/06 - Luminescent, e.g. electroluminescent, chemiluminescent, materials containing organic luminescent materials
  • H10K 50/11 - OLEDs or polymer light-emitting diodes [PLED] characterised by the electroluminescent [EL] layers
  • H10K 101/10 - Triplet emission

95.

ORGANIC COMPOUND AND LIGHT-EMITTING DEVICE

      
Application Number 19546223
Status Pending
Filing Date 2026-02-20
First Publication Date 2026-09-03
Owner SEMICONDUCTOR ENERGY LABORATORY CO., LTD. (Japan)
Inventor
  • Tada, Anna
  • Kawakami, Sachiko
  • Hashimoto, Naoaki
  • Suzuki, Tsunenori

Abstract

A novel organic compound and a light-emitting device using the organic compound are provided. The organic compound is represented by General Formula (G1). In General Formula (G1), Ar1 represents any one of General Formulae (g1-1) to (g1-3). Each of R1 to R8 independently represents hydrogen, an alkyl group having 1 to 6 carbon atoms, a cycloalkyl group having 3 to 10 carbon atoms, an alkoxy group having 1 to 6 carbon atoms, a substituted or unsubstituted aryl group having 6 to 15 carbon atoms, or a substituted or unsubstituted heteroaryl group having 1 to 30 carbon atoms. Any one of R1 to R4 represents General Formula (g2-1) or (g2-2). Each of Ar2 and Ar3 independently represents a substituted or unsubstituted aryl group having 6 to 60 carbon atoms or a substituted or unsubstituted heteroaryl group having 1 to 60 carbon atoms. A novel organic compound and a light-emitting device using the organic compound are provided. The organic compound is represented by General Formula (G1). In General Formula (G1), Ar1 represents any one of General Formulae (g1-1) to (g1-3). Each of R1 to R8 independently represents hydrogen, an alkyl group having 1 to 6 carbon atoms, a cycloalkyl group having 3 to 10 carbon atoms, an alkoxy group having 1 to 6 carbon atoms, a substituted or unsubstituted aryl group having 6 to 15 carbon atoms, or a substituted or unsubstituted heteroaryl group having 1 to 30 carbon atoms. Any one of R1 to R4 represents General Formula (g2-1) or (g2-2). Each of Ar2 and Ar3 independently represents a substituted or unsubstituted aryl group having 6 to 60 carbon atoms or a substituted or unsubstituted heteroaryl group having 1 to 60 carbon atoms.

IPC Classes  ?

  • H10K 85/60 - Organic compounds having low molecular weight
  • C07D 405/10 - Heterocyclic compounds containing both one or more hetero rings having oxygen atoms as the only ring hetero atoms, and one or more rings having nitrogen as the only ring hetero atom containing two hetero rings linked by a carbon chain containing aromatic rings
  • H10K 50/15 - Hole transporting layers
  • H10K 50/17 - Carrier injection layers

96.

TOUCH PANEL

      
Application Number 19554775
Status Pending
Filing Date 2026-03-03
First Publication Date 2026-09-03
Owner SEMICONDUCTOR ENERGY LABORATORY CO., LTD. (Japan)
Inventor Miyake, Hiroyuki

Abstract

A touch panel with higher sensing accuracy or higher detection sensitivity is provided. The touch panel includes a first conductive layer, a second conductive layer, a plurality of display elements, and a scan line. In a plan view, the first conductive layer has an outline including a first portion that is linear and parallel to a first direction. In the plan view, the second conductive layer has an outline including a second portion that is linear and parallel to the first direction. The first portion and the second portion face each other. The display element is in a position not overlapping with the first conductive layer nor the second conductive layer. The scan line has a portion extending in a second direction. An angle between the first direction and the second direction is greater than or equal to 30° and less than or equal to 60°.

IPC Classes  ?

  • G06F 3/041 - Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means
  • G06F 3/044 - Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means by capacitive means

97.

DISPLAY DEVICE, METHOD FOR MANUFACTURING DISPLAY DEVICE, AND ELECTRONIC DEVICE

      
Application Number 19577579
Status Pending
Filing Date 2026-03-25
First Publication Date 2026-09-03
Owner SEMICONDUCTOR ENERGY LABORATORY CO., LTD. (Japan)
Inventor
  • Yamazaki, Shunpei
  • Ikeda, Takayuki
  • Hodo, Ryota
  • Yanagisawa, Yuichi

Abstract

A display device capable of displaying high-quality images can be provided. A display device includes a first light-emitting element, a second light-emitting element, a first protective layer, a second protective layer, and a gap. The first light-emitting element includes a first lower electrode, a first EL layer over the first lower electrode, a first upper electrode over the first EL layer, and the second light-emitting element includes a second lower electrode, a second EL layer over the second lower electrode, and a second upper electrode over the second EL layer. The first light-emitting element and the second light-emitting element are adjacent to each other. The first protective layer is provided over the first light-emitting element and the second light-emitting element and includes a region in contact with the side surface of the first EL layer and the side surface of the second EL layer. The second protective layer is provided over the first protective layer. The gap is provided between the first EL layer and the second EL layer and is provided between the first protective layer and the second protective layer.

IPC Classes  ?

  • H10K 50/11 - OLEDs or polymer light-emitting diodes [PLED] characterised by the electroluminescent [EL] layers
  • H10K 59/12 - Active-matrix OLED [AMOLED] displays
  • H10K 59/121 - Active-matrix OLED [AMOLED] displays characterised by the geometry or disposition of pixel elements
  • H10K 59/131 - Interconnections, e.g. wiring lines or terminals
  • H10K 59/80 - Constructional details
  • H10K 102/00 - Constructional details relating to the organic devices covered by this subclass

98.

DISPLAY DEVICE AND METHOD FOR FABRICATING THE DISPLAY DEVICE

      
Application Number 19658085
Status Pending
Filing Date 2026-04-24
First Publication Date 2026-09-03
Owner SEMICONDUCTOR ENERGY LABORATORY CO., LTD. (Japan)
Inventor
  • Yamazaki, Shunpei
  • Seo, Satoshi

Abstract

A display device in which a puddle in the vicinity of a partition of a light-emitting element is reduced when a light-emitting layer is formed by a wet process is provided. The display device includes a first anode; a second anode adjacent to the first anode in an X direction; a third anode adjacent to the first anode in a Y direction; a hole-injection layer provided across the first anode to the third anode; a partition provided over the hole-injection layer; a first light-emitting layer; a second light-emitting layer; a third light-emitting layer; and a cathode. The partition includes, in a top view, a first region positioned between the first anode and the third anode and extending in the X direction, and a second region positioned between the first anode and the second anode and extending in the Y direction. The height of the first region is larger than the height of the second region in a cross-sectional view of the partition.

IPC Classes  ?

  • H10K 59/122 - Pixel-defining structures or layers, e.g. banks
  • H10K 50/10 - OLEDs or polymer light-emitting diodes [PLED]
  • H10K 50/15 - Hole transporting layers
  • H10K 50/17 - Carrier injection layers
  • H10K 59/12 - Active-matrix OLED [AMOLED] displays
  • H10K 59/131 - Interconnections, e.g. wiring lines or terminals
  • H10K 59/35 - Devices specially adapted for multicolour light emission comprising red-green-blue [RGB] subpixels
  • H10K 59/80 - Constructional details
  • H10K 71/13 - Deposition of organic active material using liquid deposition, e.g. spin coating using printing techniques, e.g. ink-jet printing or screen printing
  • H10K 71/60 - Forming conductive regions or layers, e.g. electrodes
  • H10K 77/10 - Substrates, e.g. flexible substrates
  • H10K 102/00 - Constructional details relating to the organic devices covered by this subclass

99.

Positive Electrode Active Material, Method for Manufacturing Positive Electrode Active Material, and Secondary Battery

      
Application Number 19658897
Status Pending
Filing Date 2026-04-27
First Publication Date 2026-09-03
Owner SEMICONDUCTOR ENERGY LABORATORY CO., LTD. (Japan)
Inventor
  • Ochiai, Teruaki
  • Kawakami, Takahiro
  • Mikami, Mayumi
  • Momma, Yohei
  • Takahashi, Masahiro
  • Tsuruta, Ayae

Abstract

A positive electrode active material which can improve cycle characteristics of a secondary battery is provided. Two kinds of regions are provided in a superficial portion of a positive electrode active material such as lithium cobaltate which has a layered rock-salt crystal structure. The inner region is a non-stoichiometric compound containing a transition metal such as titanium, and the outer region is a compound of representative elements such as magnesium oxide. The two kinds of regions each have a rock-salt crystal structure. The inner layered rock-salt crystal structure and the two kinds of regions in the superficial portion are topotaxy; thus, a change of the crystal structure of the positive electrode active material generated by charging and discharging can be effectively suppressed. In addition, since the outer coating layer in contact with an electrolyte solution is the compound of representative elements which is chemically stable, the secondary battery having excellent cycle characteristics can be obtained.

IPC Classes  ?

  • H01M 4/131 - Electrodes based on mixed oxides or hydroxides, or on mixtures of oxides or hydroxides, e.g. LiCoOx
  • H01M 4/02 - Electrodes composed of, or comprising, active material
  • H01M 4/1315 - Electrodes based on mixed oxides or hydroxides, or on mixtures of oxides or hydroxides, e.g. LiCoOx containing halogen atoms, e.g. LiCoOxFy
  • H01M 4/134 - Electrodes based on metals, Si or alloys
  • H01M 4/1391 - Processes of manufacture of electrodes based on mixed oxides or hydroxides, or on mixtures of oxides or hydroxides, e.g. LiCoOx
  • H01M 4/13915 - Processes of manufacture of electrodes based on mixed oxides or hydroxides, or on mixtures of oxides or hydroxides, e.g. LiCoOx containing halogen atoms, e.g. LiCoOxFy
  • H01M 4/36 - Selection of substances as active materials, active masses, active liquids
  • H01M 4/525 - Selection of substances as active materials, active masses, active liquids of inorganic oxides or hydroxides of nickel, cobalt or iron of mixed oxides or hydroxides containing iron, cobalt or nickel for inserting or intercalating light metals, e.g. LiNiO2, LiCoO2 or LiCoOxFy
  • H01M 4/62 - Selection of inactive substances as ingredients for active masses, e.g. binders, fillers
  • H01M 4/86 - Inert electrodes with catalytic activity, e.g. for fuel cells
  • H01M 10/0525 - Rocking-chair batteries, i.e. batteries with lithium insertion or intercalation in both electrodesLithium-ion batteries

100.

Lithium-Ion Secondary Battery

      
Application Number 18869512
Status Pending
Filing Date 2023-06-05
First Publication Date 2026-09-03
Owner Semiconductor Energy Laboratory Co., Ltd. (Japan)
Inventor
  • Kimura, Masayuki
  • Nakao, Taisuke
  • Kuriki, Kazutaka

Abstract

A lithium-ion secondary battery with excellent cycle performance and safety is provided. The lithium-ion secondary battery includes a positive electrode, a negative electrode, and an electrolyte solution. The positive electrode includes lithium cobalt oxide whose median diameter (D50) is greater than 12 μm. The lithium cobalt oxide includes magnesium in its surface portion. The negative electrode includes a graphite particle, a silicon particle, and a high molecular including a carboxy group.

IPC Classes  ?

  • H01M 10/052 - Li-accumulators
  • H01M 4/02 - Electrodes composed of, or comprising, active material
  • H01M 4/36 - Selection of substances as active materials, active masses, active liquids
  • H01M 4/38 - Selection of substances as active materials, active masses, active liquids of elements or alloys
  • H01M 4/525 - Selection of substances as active materials, active masses, active liquids of inorganic oxides or hydroxides of nickel, cobalt or iron of mixed oxides or hydroxides containing iron, cobalt or nickel for inserting or intercalating light metals, e.g. LiNiO2, LiCoO2 or LiCoOxFy
  • H01M 4/583 - Carbonaceous material, e.g. graphite-intercalation compounds or CFx
  • H01M 4/62 - Selection of inactive substances as ingredients for active masses, e.g. binders, fillers
  • H01M 10/0563 - Liquid materials, e.g. for Li-SOCl2 cells
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