The 41st Institute of China Electronics Technology Group Corporation

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G01R 23/16 - Spectrum analysisFourier analysis 2
G01R 27/32 - Measuring attenuation, gain, phase shift, or derived characteristics of electric four-pole networks, i.e. two-port networksMeasuring transient response in circuits having distributed constants 2
G01R 31/00 - Arrangements for testing electric propertiesArrangements for locating electric faultsArrangements for electrical testing characterised by what is being tested not provided for elsewhere 2
G01J 1/06 - Restricting the angle of incident light 1
G01J 3/28 - Investigating the spectrum 1
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Found results for  patents

1.

MICROWAVE-SIGNAL TRANSMISSION PATH ASSEMBLY AND SINGLE-POLE SIX-THROW COAXIAL ELECTROMECHANICAL SWITCH

      
Application Number CN2017116813
Publication Number 2019/100476
Status In Force
Filing Date 2017-12-18
Publication Date 2019-05-31
Owner THE 41ST INSTITUTE OF CHINA ELECTRONICS TECHNOLOGY GROUP CORPORATION (China)
Inventor
  • Bu, Xiangrui
  • Chai, Jin
  • Zhu, Jie
  • Xiong, Weihua
  • Wen, Chunhua

Abstract

A microwave-signal transmission path assembly (3) comprises an intermediate connector (31), six peripheral connectors (32), a transmission reed (33), and a cavity (34). Each connector is composed of an inner conductor (35), an outer conductor (36), and a dielectric support (37). The inner conductor (35) is fixed by means of the dielectric support (37) and placed inside the outer conductor (36) to form a coaxial structure. The cavity (34) is connected with the outer conductor (36). The transmission reed (33) is in contact with the inner conductor (35). The invention achieves high transmission efficiency.

IPC Classes  ?

2.

F-OFDM MODULATION METHOD AND APPARATUS SUITABLE FOR 5G SYSTEM

      
Application Number CN2017115188
Publication Number 2019/052033
Status In Force
Filing Date 2017-12-08
Publication Date 2019-03-21
Owner THE 41ST INSTITUTE OF CHINA ELECTRONICS TECHNOLOGY GROUP CORPORATION (China)
Inventor
  • Xu, Lantian
  • Liu, Zushen
  • Ling, Yunzhi
  • Lin, Yihui

Abstract

Disclosed is an F-OFDM modulation method suitable for a 5G system. The method involves: firstly, allocating input data as multiple paths of sub-bandwidth data according to the configured number of sub-bandwidths; then carrying out sub-carrier zero-frequency mapping on various pieces of sub-band data so as to generate multiple paths of symbol data; determining the minimum length of IFFT, and carrying out an IFFT operation at the minimum length; determining a CP length, and completing the addition of CP for IFFT data; determining the number of insertions of zero, and completing sampling rate matching; designing a low-pass filter to complete low-frequency filtering of matched sampling rate data, and carrying out frequency spectrum shifting and time-domain data splicing to complete the output of modulated sub-bandwidth data; and finally, combining all modulated sub-bandwidth data in order to complete F-OFDM modulation. By means of carrying out zero-frequency mapping on sub-bandwidth data and reducing the lengths of IFFT and filter operations, the present invention enables the calculation amount to be only 1/N of the original, thereby satisfying the low delay requirement generated by a 5G system for an F-OFDM signal.

IPC Classes  ?

  • H04L 27/26 - Systems using multi-frequency codes

3.

NOVEL RCCK-MOUNT WIDEBAND SOLID STATE POWER AMPLIFIER

      
Application Number CN2017106564
Publication Number 2018/218851
Status In Force
Filing Date 2017-10-17
Publication Date 2018-12-06
Owner THE 41ST INSTITUTE OF CHINA ELECTRONICS TECHNOLOGY GROUP CORPORATION (China)
Inventor
  • Ning, Yuemin
  • Wang, Qi
  • Liu, Jinxian
  • Piao, Zhiqi
  • Wang, Tao
  • Zhang, Wenqiang
  • Sun, Guoquan

Abstract

A rack-mount wideband solid state power amplifier. Active power amplifier modules (1) are distributed on the upper and lower surfaces of a radiator (3); a multi-channel spatial power combiner (2) is interpenetrated in the middle of the radiator (3); and an input signal of the power amplifier firstly enters, by means of a one-to-four power splitter, four active power amplifier modules (1) for amplification, and then is combined by means of the multi-channel spatial power combiner (2) to be outputted. The solution above not only effectively solves the problem of heat dissipation, but also greatly improves the power capacity of the system.

IPC Classes  ?

  • H03F 1/30 - Modifications of amplifiers to reduce influence of variations of temperature or supply voltage
  • H03F 3/20 - Power amplifiers, e.g. Class B amplifiers, Class C amplifiers
  • H05K 7/20 - Modifications to facilitate cooling, ventilating, or heating
  • G01S 7/02 - Details of systems according to groups , , of systems according to group

4.

Device and method of testing dual-frequency nonlinear vector network parameters

      
Application Number 15752692
Grant Number 10168369
Status In Force
Filing Date 2016-09-06
First Publication Date 2018-08-23
Grant Date 2019-01-01
Owner THE 41ST INSTITUTE OF CHINA ELECTRONICS TECHNOLOGY GROUP CORPORATION (China)
Inventor
  • Yang, Baoguo
  • Nian, Fushun
  • Liang, Shengli
  • Li, Shubiao
  • Wang, Zunfeng
  • Cao, Zhiying
  • Zhang, Qinglong
  • Li, Mingmin

Abstract

A device and method of testing the dual-frequency nonlinear vector network parameters. In view of the challenge of the nonlinear behavioral model characterization of the microwave device components, and the current situation of the nonlinear vector network parameter testing, the disclosed device and method of testing the dual-frequency nonlinear vector network parameters redefines the nonlinear model parameters of the nonlinear device components, gives the definition of the test parameter (W-parameter), solves the challenges of the dual-frequency nonlinear behavioral model characterization and testing for the microwave device components, and makes it more convenient to measure the nonlinear characteristics of the mixer, amplifier and passive device components.

IPC Classes  ?

  • G01R 27/32 - Measuring attenuation, gain, phase shift, or derived characteristics of electric four-pole networks, i.e. two-port networksMeasuring transient response in circuits having distributed constants
  • G01R 31/00 - Arrangements for testing electric propertiesArrangements for locating electric faultsArrangements for electrical testing characterised by what is being tested not provided for elsewhere
  • G01R 23/16 - Spectrum analysisFourier analysis
  • G01R 35/00 - Testing or calibrating of apparatus covered by the other groups of this subclass

5.

HAND-HELD FC BUS TESTER

      
Application Number CN2016107496
Publication Number 2018/090395
Status In Force
Filing Date 2016-11-28
Publication Date 2018-05-24
Owner THE 41ST INSTITUTE OF CHINA ELECTRONICS TECHNOLOGY GROUP CORPORATION (China)
Inventor
  • Meng, Xianglu
  • Hu, Yaping
  • Huang, Wennan
  • Su, Tong

Abstract

Disclosed in the present invention is a hand-held FC bus tester, comprising a data capture module, the data capture module capturing data and storing the data in a storage unit, and having data filtering and data triggering functions; a data sending module for sending the data to a tested device by means of an optical interface; a statistics module carrying out statistics on the data captured by the data capture module and the data sent by the data sending module, comprising a short-term statistical value and a cumulative statistical value, and carrying out data interaction with a control module; a man-machine interface for receiving input control information and displaying a test result; and the control module for controlling coordinated operations of the data capture module, the data sending module, the statistics module, a protocol analysis module and the man-machine interface. The problems existing in existing test instruments, such as low integration, inconvenient carrying and high price, are solved, so that the hand-held FC bus tester not only satisfies the requirements for FC protocol analysis and testing but also is simple and easy to use and is convenient to carry.

IPC Classes  ?

  • H04L 12/26 - Monitoring arrangements; Testing arrangements
  • H04L 12/40 - Bus networks
  • H04L 1/00 - Arrangements for detecting or preventing errors in the information received

6.

DUAL-STAGE PREDISTORTION-BASED METHOD FOR CORRECTING ULTRA-WIDEBAND COMPLEX FORMAT VECTOR MODULATION ERROR

      
Application Number CN2016109890
Publication Number 2018/090417
Status In Force
Filing Date 2016-12-14
Publication Date 2018-05-24
Owner THE 41ST INSTITUTE OF CHINA ELECTRONIC TECHNOLOGY GROUP CORPORATION (China)
Inventor
  • Tai, Xin
  • Liu, Liang
  • Fan, Xiaoteng
  • Zuo, Yongfeng
  • Xue, Xiaonan
  • Xu, Mingzhe
  • Li, Zenghong

Abstract

A dual-stage predistortion-based method for correcting an ultra-wideband complex format vector modulation error. A loop of the method comprises: a standard signal generating module, a stage I predistortion error compensator, a stage II predistortion compensator, an origin offset compensator, a transmission channel and a vector modulator. The stage I predistortion error compensator, by forming a filter predistortion, performs reverse cancelling with respect to amplitude and phase frequency response fluctuation characteristics of a wideband vector modulation error. The stage II predistortion error compensator corrects a modulation error that has undergone stage I predistortion balancing and that has wideband characteristics, that is, I/Q gain imbalance and a gain imbalance positive angle error in an entire working band. The origin offset compensator corrects a narrowband modulation error, namely, carrier leakage, by means of an analog device. Vector modulation errors having wideband characteristics are corrected by means of digital predistortion, thus effectively correcting a wideband complex format vector modulation error.

IPC Classes  ?

  • H04L 27/36 - Modulator circuitsTransmitter circuits
  • H03C 7/00 - Modulating electromagnetic waves

7.

BROADBAND HIGH-EFFICIENCY LOCAL OSCILLATOR-INTEGRATED T-SHAPED TERAHERTZ MIXER

      
Application Number CN2016111775
Publication Number 2018/090434
Status In Force
Filing Date 2016-12-23
Publication Date 2018-05-24
Owner THE 41ST INSTITUTE OF CHINA ELECTRONICS TECHNOLOGY GROUP CORPORATION (China)
Inventor
  • Chen, Zhuo
  • Deng, Jianqin
  • Nian, Fushun
  • Jiang, Wanshun
  • Zhang, Wenxing

Abstract

Disclosed in the present invention is a broadband high-efficiency local oscillator-integrated T-shaped terahertz mixer, which relates in particular to the technical field of terahertz-frequency spectrum. The broadband high-efficiency local oscillator-integrated T-shaped terahertz mixer includes an upper cavity and a lower cavity; the upper cavity and the lower cavity abut to form a waveguide structure; a T-shaped circuit is disposed in the upper cavity, and the T-shaped circuit comprises a radio-frequency (RF) signal path, a local oscillation signal path and an intermediate-frequency signal path; the RF signal and the local oscillation signal are combined at an antiparallel diode after the respective paths thereof; the local oscillation signal path comprises: a local oscillation input port, a local oscillation low-pass filter, a frequency multiplier, a local oscillator high-pass filter and a local oscillation duplexer; an output end of the antiparallel diode is connected sequentially to the intermediate-frequency filter and an intermediate-frequency output port.

IPC Classes  ?

8.

DUAL-CHANNEL FOURIER SPECTROMETER AND DETECTING METHOD

      
Application Number CN2016107477
Publication Number 2018/090394
Status In Force
Filing Date 2016-11-28
Publication Date 2018-05-24
Owner THE 41ST INSTITUTE OF CHINA ELECTRONICS TECHNOLOGY GROUP CORPORATION (China)
Inventor
  • Li, Ligong
  • Meng, Xin
  • Han, Shunli
  • Zhang, Zhihui
  • Liu, Jiaqing
  • Jiang, Sheng
  • Wu, Wei
  • Zhang, Peng
  • Nie, Jianhua

Abstract

A dual-channel Fourier spectrometer and a detecting method. The dual-channel Fourier spectrometer comprises: a collimator objective lens (1), a dual-channel interferometer (2), a first detecting module (3), a second detecting module (4) and a data processing system (5) that are sequentially provided along the direction of an optical path, both the first detecting module (3) and the second detecting module (4) being connected to the data processing system (5). The dual-channel interferometer (2) comprises: a beam splitter (21), a first prism (22), a first reflecting mirror (24), a second reflecting mirror (25) and a second prism (23) that are sequentially provided in a clockwise direction and have a common optical axis. The beam splitter (21) is at an angle of 45 degrees to an incident optical axis. The first reflecting mirror (24) and the second reflecting mirror (25) are parallel with the beam splitter (21). The first prism (22) can rotate or swing about the prism’s axis which is perpendicular to a ground plane. The dual-channel Fourier spectrometer can simultaneously acquire two paths of interference information of a light beam transmitted from a detection point, and can demodulate same to obtain the change in light intensity of the detection point over time, thereby effectively eliminating the influence of the changes of light intensity of the detection point on the interference information, and restoring the accurate spectral information of the detection point.

IPC Classes  ?

9.

CRYOGENIC RADIOMETER BLACKBODY CAVITY

      
Application Number CN2016107244
Publication Number 2018/086162
Status In Force
Filing Date 2016-11-25
Publication Date 2018-05-17
Owner THE 41ST INSTITUTE OF CHINA ELECTRONICS TECHNOLOGY GROUP CORPORATION (China)
Inventor
  • Liu, Hongbo
  • Shi, Xueshun
  • Liu, Yulong
  • Liu, Changming
  • Zhao, Kun
  • Chen, Haidong

Abstract

A cryogenic radiometer blackbody cavity comprises a cavity body formed by connecting a side surface (6) of a normal cone, a side surface (5) of a cylinder and a slanted bottom surface (4). An axis (3) of the normal cone and an axis (3) of the cylinder coincide. A generatrix and the axis of the normal cone form an included angle (1). A cavity incident aperture (7) is arranged at the tapered end of the normal cone. A plane in which the cavity incident aperture is located is perpendicular to the axis (3) of the normal cone. The slanted bottom surface (4) and the axis (3) of the cylinder form an included angle (2). The invention adopts a cavity body structure combining a slanted bottom, a cylinder and a cone. The conical light-blocking design can block stray light outside the cavity body, and reduce spilling of reflected light out of the cavity body. An inner wall of the cavity body is coated with a purely specular graphene material, thereby reducing diffuse reflection of optical radiation inside the cavity, and enabling a relatively concentrated temperature distribution and a high temperature response speed.

IPC Classes  ?

  • G01J 5/02 - Constructional details
  • G01J 1/06 - Restricting the angle of incident light
  • H01L 31/02 - SEMICONDUCTOR DEVICES NOT COVERED BY CLASS - Details thereof - Details

10.

MEASUREMENT DEVICE AND METHOD FOR SPECTRAL RESPONSIVITY OF LARGE-APERTURE RADIOMETER

      
Application Number CN2016107242
Publication Number 2018/086161
Status In Force
Filing Date 2016-11-25
Publication Date 2018-05-17
Owner THE 41ST INSTITUTE OF CHINA ELECTRONICS TECHNOLOGY GROUP CORPORATION (China)
Inventor
  • Zhao, Facai
  • Sun, Quanshe
  • Wang, Shaoshui
  • Wang, Guoqquan
  • Zheng, Xiangliang
  • Han, Zhong

Abstract

A measurement method for spectral responsivity of a large-aperture radiometer (6), relating to the field of optical measurement and test. The method comprises: first generate monochromatic light by using a monochromator (14); then the monochromatic light enters a small-aperture integrating sphere (15); finally generate large-aperture uniform monochromatic parallel light subsequent to performing beam expansion by using a collimation system (16), and achieve measurement of spectral responsivity of a large-aperture radiometer by using a small-aperture light beam scanning detection method. Compared with the prior art, the present invention can achieve measurement of absolute spectral responsivity of a large-aperture radiometer by using a small-aperture light beam scanning detection method, and based on an established standard large-aperture radiometer (3), achieves measurement of spectral responsivity of a measured large-aperture radiometer by using a comparison method, and thus, a measurement process is simple, experimentation is convenient, and measurement time is greatly reduced. Also disclosed is a measurement device for spectral responsivity of a large-aperture radiometer.

IPC Classes  ?

  • G01J 3/28 - Investigating the spectrum
  • G01M 11/00 - Testing of optical apparatusTesting structures by optical methods not otherwise provided for

11.

BANDWIDTH MODULATION DOMAIN MEASUREMENT SYSTEM AND METHOD THEREFOR

      
Application Number CN2016107460
Publication Number 2018/032644
Status In Force
Filing Date 2016-11-28
Publication Date 2018-02-22
Owner THE 41ST INSTITUTE OF CHINA ELECTRONIC TECHNOLOGY GROUP CORPORATION (China)
Inventor
  • Du, Nianwen
  • Zhu, Wei
  • Liu, Qiang
  • Bai, Yirong
  • Ding, Jiandong

Abstract

The present invention provides a bandwidth modulation domain measurement system, comprising: a signal synchronization unit, a logic selection unit, a first tapped delay line multipath time delay unit, a second tapped delay line multipath time delay unit, a first data buffer unit, a second data buffer unit, and a processing unit. The signal synchronization unit receives a signal to be measured and uses same as an input, and an output signal of the signal synchronization unit is connected to the logic selection unit. The logic selection unit receives the output signal of the signal synchronization unit and uses same as an input, and an output signal of the logic selection unit is connected to the first tapped delay line multipath time delay unit and the second tapped delay line multipath time delay unit. The first tapped delay line multipath time delay unit is connected to the first data buffer unit. The second tapped delay line multipath time delay unit is connected to the second data buffer unit. Outputs of the first data buffer unit and the second data buffer unit are connected to the processing unit. The measurement system of the present invention features a simple structure, and greatly simplifies circuit and sequence design difficulty and complexity.

IPC Classes  ?

  • G01R 23/175 - Spectrum analysisFourier analysis by delay means, e.g. tapped delay lines

12.

WIDEBAND WIDE-FREQUENCY AGILE SIGNAL MEASUREMENT INSTRUMENT AND MEASUREMENT METHOD

      
Application Number CN2016107463
Publication Number 2018/032645
Status In Force
Filing Date 2016-11-28
Publication Date 2018-02-22
Owner THE 41ST INSTITUTE OF CHINA ELECTRONIC TECHNOLOGY GROUP CORPORATION (China)
Inventor
  • Zhang, Chao
  • Xu, Jianhua
  • Du, Huiwen
  • Xiang, Changbo
  • Zhan, Yongwei

Abstract

A wideband wide-frequency agile signal measurement instrument, comprising: a first frequency mixer and filter unit (404), used to perform a first frequency mixing process on an input signal; a second frequency mixer and filter unit (408), used to perform a second frequency mixing process on an output signal of the first frequency mixer and filter unit (404), and generate a fixed analog intermediate frequency signal; an ADC acquisition unit (409), performs quantization on the analog intermediate frequency signal to generate a digital intermediate frequency signal; an orthogonal transformation unit (410), used to perform orthogonal transformation on the digital intermediate frequency signal, so as to generate an IQ complex signal; a digital filter unit (411), used to perform digital decimation filtering on the IQ signal; a measurement and analysis unit (412), performs processing and analysis on the basis of the IQ signal outputted by the digital filter unit; a display unit (413), used to display measurement results and curves. The wideband wide-frequency agile signal measurement instrument and measurement method can implement measurement and analysis on a frequency agile signal having a frequency agile range greater than an analysis bandwidth of a superheterodyne instrument.

IPC Classes  ?

  • G01R 23/02 - Arrangements for measuring frequency, e.g. pulse repetition rateArrangements for measuring period of current or voltage
  • G01R 23/16 - Spectrum analysisFourier analysis

13.

OTDR EVENT ANALYSIS ALGORITHM BASED ON DIFFERENCE WINDOW AND TEMPLATE MATCHING

      
Application Number CN2016103179
Publication Number 2017/076189
Status In Force
Filing Date 2016-10-25
Publication Date 2017-05-11
Owner THE 41ST INSTITUTE OF CHINA ELECTRONIC TECHNOLOGY GROUP CORPORATION (China)
Inventor
  • Li, Ligong
  • Han, Qiang
  • Zhang, Zhihui
  • Yan, Jisong
  • Hu, Weiliang
  • Han, Shunli
  • Wang, Dongsheng
  • Yan, Baodong
  • Liu, Jianhua

Abstract

Disclosed is an OTDR event analysis algorithm based on difference window and template matching. The OTDR event analysis algorithm comprises: translating a rectangular difference window along an initial point of an OTDR curve to a termination point of the OTDR curve, two intersection points existing between a left boundary and a right boundary of the difference window and the OTDR curve, calculating a vertical axis difference value of the two points before translation each time, and searching for a local maximum value point in obtained difference data, to implement preliminary positioning of an event point; by separately using each event point to be determined as a center, forming characteristic segments by using a plurality of points at the two sides, matching the characteristic segments and sample data in a template library, and determining whether the matched degree meets a requirement; if not, abandoning the event point to be determined; and if yes, retaining the event point to be determined and determining, according to a corresponding template, the type of the event point to be determined. Thresholds or parameters used in the algorithm are embedded in program, thereby avoiding any human intervention. The algorithm has advantages of good anti-noise capability, high robustness, low calculation volume, and the like; the real-time calculation demand is satisfied; and the algorithm can be implemented conveniently in an embedded system.

IPC Classes  ?

  • H04B 10/071 - Arrangements for monitoring or testing transmission systemsArrangements for fault measurement of transmission systems using a reflected signal, e.g. using optical time domain reflectometers [OTDR]

14.

DEVICE AND METHOD FOR TESTING DUAL-BAND NONLINEAR VECTOR NETWORK PARAMETER

      
Application Number CN2016098149
Publication Number 2017/041686
Status In Force
Filing Date 2016-09-06
Publication Date 2017-03-16
Owner THE 41ST INSTITUTE OF CHINA ELECTRONICS TECHNOLOGY GROUP CORPORATION (China)
Inventor
  • Yang, Baoguo
  • Nian, Fushun
  • Liang, Shengli
  • Li, Shubiao
  • Wang, Zunfeng
  • Cao, Zhiying
  • Zhang, Qinglong
  • Xu, Chunqing
  • Li, Mingtai

Abstract

Provided are a device and method for testing a dual-band nonlinear vector network parameter. The device comprises: a frequency reference module (1); selection switches (24, 19, 26, 14, 9, 10, 12); testing ports (28, 21, 16); multiplier selection units (22, 17); receivers (3, 4, 5, 6, 7, 8); couplers (23, 18, 27, 20, 15); a frequency mixer (11); a computer module (2); and loads (13, 25). The device and method redefine a nonlinear model parameter of a nonlinear component and create a definition, namely a W parameter definition, for a testing parameter, thereby solving a problem relating to expression and testing of a dual-band nonlinear behavioral model of a microwave device component, and enabling more convenient measurement of nonlinear characteristics of a frequency mixer, an amplifier, and a passive device component.

IPC Classes  ?

  • G01R 27/32 - Measuring attenuation, gain, phase shift, or derived characteristics of electric four-pole networks, i.e. two-port networksMeasuring transient response in circuits having distributed constants
  • G01R 31/00 - Arrangements for testing electric propertiesArrangements for locating electric faultsArrangements for electrical testing characterised by what is being tested not provided for elsewhere