Apparatus can include an input aperture configured to provide an input beam, primary optics configured to collimate the input beam, a grism situated to receive the collimated input beam and to produce a wavelength dispersed beam, and secondary optics configured to receive and direct the wavelength dispersed beam to a detector. Primary optics can include a primary reflector including an off-axis parabolic mirror, wherein the off-axis parabolic mirror is configured to produce the collimated input beam. Secondary optics can include a first secondary reflector and a second secondary reflector, wherein the first secondary reflector is situated to receive and reflect the wavelength dispersed beam to the second secondary reflector and the second secondary reflector is situated to receive and direct the wavelength dispersed beam to the detector.
Systems and methods for analyzing a liquid sample. One system includes a first surface including at least a part of a first electrode and a second surface including at least a part of a second electrode. The second surface is positioned opposite the first surface for holding a microvolume liquid sample between the first surface and the second surface by surface tension. The system also includes an electronic processing unit electrically coupled to at least one of the first electrode and the second electrode for receiving electrical signals from the liquid sample to measure an electrochemical property of the liquid sample.
Disclosed herein are various systems and methods for optical emission spectroscopy. In some examples a substrate can be formed from conductive layers separated by a dielectric layer, the substrate having at least one recess therein, and the recess having an aperture therethrough. A chamber then encloses the area over the recess, the chamber including chamber walls, a gas inlet, and a gas outlet to allow a gas to fill the chamber. An arc is then created across the substrate using the conductive layers. The arc may form a plasma using the gas inside the chamber. The plasma then ablates a surface of a specimen, generating photons that can then be analyzed by a spectrometer.
G01N 21/25 - ColourSpectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
G01N 21/67 - Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light electrically excited, e.g. electroluminescence using electric arcs or discharges
4.
POINT CLOUD FOR SAMPLE IDENTIFICATION AND DEVICE CONFIGURATION
Scientific instrument support systems and related methods, computing devices, and computer-readable media for aligning scientific instruments. The method includes, generating, with a first scientific instrument, a first point cloud representative of a sample, wherein the first point cloud is in an n-dimensional space and n is an integer, and generating, with a second scientific instrument different from the first scientific instrument, a second point cloud representative of the sample, wherein the second point cloud is in an m-dimensional space, different from the n-dimensional space associated with the first point cloud and wherein m is an integer. The method includes generating an offset between the first point cloud and the second point cloud using a transformation relating the n-dimensional space to the m-dimensional space, and aligning an output of the second scientific instrument with an output of the first scientific instrument based on the offset.
System and methods for spectrophotometers are described that can utilize ferrules configured to hold a sample test droplet therebetween via surface tension. Light sources in the systems can shine a light on the test droplet and an output of reflected or refracted light can be measured, which can assist in various testing and analysis procedures. Nanoscale or microscale structures can be incorporated on the ferrules to create hydrophobic or superhydrophobic surfaces. This helps prevent test droplets from wetting the ferrules surfaces and helps prevent polluting or mixing of test materials. The ferrules can therefore achieve certain self-cleaning capabilities and test results are more accurate.
H01J 49/04 - Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locksArrangements for external adjustment of electron- or ion-optical components
6.
SYSTEMS AND METHODS FOR SPECTROSCOPIC INSTRUMENT CALIBRATION
Disclosed herein are scientific instrument support systems, as well as related methods, computing devices, and computer-readable media. For example, in some embodiments, a method of supporting spectroscopic calibration may include: generating a base calibration model using data from multiple base spectroscopic instruments, and finetuning the base calibration model using data from a target spectroscopic instrument to generate a target calibration model for use with the target spectroscopic instrument. In some embodiments, the number of wavelengths used in generating the base calibration model and/or the target calibration model may be less than the total number of wavelengths represented in the output of the spectroscopic instruments.
G01J 3/18 - Generating the spectrumMonochromators using diffraction elements, e.g. grating
G01D 18/00 - Testing or calibrating apparatus or arrangements provided for in groups
G01N 21/67 - Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light electrically excited, e.g. electroluminescence using electric arcs or discharges
H01J 49/00 - Particle spectrometers or separator tubes
7.
OPTICAL EXTRACTION PROBE FOR ELECTRON MICROSCOPE AND OTHER VACUUM CHAMBERS
A beam extraction system is provided. The beam extraction system includes a first focusing optic, a second focusing optic, and an optic relay coupled to the first focusing optic and the second focusing optic. The first focusing optic is configured to form a light beam from light collected from a sample positioned at a focal point of the first focusing optic. The second focusing optic is configured to couple the light beam to a detector. The optic relay provides an optic path for the light beam from the first focusing optic to the second focusing optic.
A web gauging system and methods of using the web gauging system are described. The web gauging system includes a supercontinuum Laser providing a light beam. A beam expander is configured to expand the light beam and provide an expanded beam to a sample illumination area. A detector unit configured to detect a sample light from the illumination area. A moving web can be placed in the illumination area, where the web gauging system measures parameters of the web.
An embodiment of a support structure for adjusting the position of a plurality of optical elements is described that comprises a base plate comprising a centering pin, a first translation slot, and a second translation slot; and a translatable plate configured to operatively couple with a plurality of the optical elements and move relative to the base plate, wherein the translatable plate comprises a centering slot configured to engage with the centering pin, a first cam configured to engage with the first translation slot and control movement of the translatable plate along a first axis, and a second cam configured to engage with the second translation slot and control movement of the translatable plate along a second axis.
G02B 7/182 - Mountings, adjusting means, or light-tight connections, for optical elements for prismsMountings, adjusting means, or light-tight connections, for optical elements for mirrors for mirrors
An embodiment of a shutter assembly is described that comprises a support structure with a number of stations and operatively coupled to a motor configured to translate each of the stations to a position in front of a detector, wherein a first station comprises a first aperture, a first charged particle filter, and a first window; and a second station comprises a second aperture larger than the first aperture, a second charged particle filter, and a second window thinner than the first window.
G21K 1/04 - Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diaphragms, collimators using variable diaphragms, shutters, choppers
G21K 1/02 - Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diaphragms, collimators
An embodiment of a charged particle filter is described that comprises a plurality of magnets, each having a surface sloped at an angle relative to a plane defined by a line from a center of a field of view on a detector to the center of a field of view on a platform. In the described embodiment, the sloped surfaces are positioned to form a bore that comprises a magnetic field gradient that is strongest at a first aperture on a side of the bore proximate to the detector.
An embodiment of a phase mask is described that comprises a light blocking layer disposed on a substrate, where the light blocking layer has a number of optically transmissive regions each configured as a first pattern. The first pattern includes two segments that have different phase configurations from each other, and the light blocking layer includes at least three angular orientations of the first pattern.
Methods and apparatuses are disclosed whereby structured illumination microscopy (SIM) is applied to a scanning microscope, such as a confocal laser scanning microscope or sample scanning microscope, in order to improve spatial resolution. Particular aspects of the disclosure relate to the discovery of important advances in the ability to (i) increase light throughput to the sample, thereby increasing the signal/noise ratio and/or decreasing exposure time, as well as (ii) decrease the number of raw images to be processed, thereby decreasing image acquisition time. Both effects give rise to significant improvements in overall performance, to the benefit of users of scanning microscopy.
G01B 11/25 - Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. moiré fringes, on the object
An embodiment of a method of automatically generating a background measurement in a spectrometer is described that comprises the steps of: collecting a plurality of candidate scans in the spectrometer; determining for each of the plurality of candidate scans if the candidate scan correlates to an orthonormal basis set that is associated with a recent background description; saving each candidate scan that correlates to the orthonormal basis set as a background scan in a scan cache; and generating a new background measurement from a plurality of the background scans stored in the scan cache if a current background measurement is older than a preselected time interval.
Aspects of the disclosure relate to utilizing independently stored validation keys to enable auditing of instrument measurement data maintained in a blockchain. A computing platform may receive, from a first block generator, a first data block comprising first measurement data captured by a first instrument and associated with a sample. Subsequently, the computing platform may receive a first validation key for the first data block calculated from contents of the first data block. Then, the computing platform may store the first data block and the first validation key for the first data block in a blockchain associated with the data management computing platform. Next, the computing platform may send the first validation key for the first data block to a data escrow database system, which may cause the data escrow database system to store the first validation key in a validation keys database.
G06F 21/62 - Protecting access to data via a platform, e.g. using keys or access control rules
G06F 21/64 - Protecting data integrity, e.g. using checksums, certificates or signatures
G06F 21/70 - Protecting specific internal or peripheral components, in which the protection of a component leads to protection of the entire computer
G06F 21/71 - Protecting specific internal or peripheral components, in which the protection of a component leads to protection of the entire computer to assure secure computing or processing of information
16.
VERTICAL-CAVITY SURFACE EMITTING LASER SUPPORT ASSEMBLY
A laser mount assembly includes a lens holder including a collimating lens. A laser subassembly is positioned adjacent the lens holder and includes a vertical-cavity surface-emitting laser, a thermal electric cooler, and a thermistor. A printed circuit board is positioned adjacent the laser subassembly and includes a plurality of heating components. The heating components heat the area between the lens holder and the laser subassembly.
A stray light reducing apparatus includes a light source and an entrance slit positioned to pass through light from the light source. A first monochromator mirror is positioned to reflect light passed through the entrance slit. A diffractive surface is positioned to receive and diffract light reflected by the first monochromator mirror. A second monochromator mirror is positioned to reflect light diffracted by the diffractive surface. An exit slit is positioned to pass through light reflected by the second monochromator mirror. A cuvette is positioned to pass through light passed through the exit slit. A long-pass interference filter is positioned to receive light from the light source, reflect light that has a wavelength below a selected value, and pass through light having a wavelength above the selected value. A first sample detector is positioned to receive light reflected by the long-pass interference filter.
A diffuse reflectance apparatus includes a housing (58) having a window (56) formed therein, and a diffuse reflectance mirror (52) spaced from the window (56) and having an aperture (50) extending therethrough. A light source (34) provides a beam of light (36). A first mirror assembly (46) is positioned to reflect the beam of light (36) through the aperture (50) such that it passes through the window (56). A second mirror assembly (68) is positioned to reflect scattered light (66) from the concave mirror (52) to a detector (44).
A mixing apparatus (10) includes a well plate assembly (12) including a fixed support (30), and a well (14) movable with respect to the fixed support. A fixed sensor mount (18) has a first portion disposed above the well and a second portion disposed within the well. A plurality of electromagnets (26) are operable to move the well plate assembly vertically with respect to the fixed sensor mount and the fixed support.
A mirror assembly has one or more axes of motion and includes a mirror that is movable and forms an acute angle with a plane orthogonal to its axis of motion. The mirror assembly may include a first reflective mirror surface in the incoming optical path that is movable and forms an acute angle with a plane orthogonal to its axis of motion, and a second reflective mirror surface in the outgoing optical path that is movable and forms an acute angle with a plane orthogonal to its axis of motion and is moveable in a linear translation to scan the mirror in the interferometer in a way to generate a normal interferogram.
G02B 7/182 - Mountings, adjusting means, or light-tight connections, for optical elements for prismsMountings, adjusting means, or light-tight connections, for optical elements for mirrors for mirrors
G01J 3/453 - Interferometric spectrometry by correlation of the amplitudes
G02B 26/08 - Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the direction of light
A sensing device includes a first substrate having a plurality of TSVs extending therethrough, and a second substrate positioned adjacent the first substrate, with the TSVs being electrically connected to the second substrate. At least one carbon nanotube sensor is positioned on the first substrate. Each of a plurality of contact pads is positioned on the first substrate and on one of the carbon nanotube sensors such that each contact pad is electrically connected to one of the TSVs and the one of the carbon nanotube sensors, and such that an end of the one of the carbon nanotube sensors is embedded in the contact pad.
B82Y 15/00 - Nanotechnology for interacting, sensing or actuating, e.g. quantum dots as markers in protein assays or molecular motors
G01N 27/12 - Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance by investigating resistance of a solid body in dependence upon absorption of a fluidInvestigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance by investigating resistance of a solid body in dependence upon reaction with a fluid
22.
CARBON NANOTUBE-BASED DEVICE FOR SENSING MOLECULAR INTERACTION
Devices and methods are disclosed having (a) an exposed semiconducting single walled carbon nanotube channel (10) on the surface of a substrate (20), wherein the exposed semiconducting single walled carbon nanotube channel is functionalized with a capture moiety cognate to a target analyte, (b) a source electrode and a drain electrode (50) connceting opposite ends of the exposed semiconducting single walled carbon nanotube channel, and (c) wherein the source electrode and the drain electrode are electrically connected in a manner to detect changes in current through the exposed semiconducting single walled carbon nanotube channel in response to analyte in contact therewith. Preferably the semiconducting carbon nanotube network is modified with pyrene butyric acid.
A spectroscopy system and method in which the optical path following the interferometer includes a Jacquinot stop (70) having an aperture disposed substantially at its focal point. The Jacquinot stop includes a reflective surface (74) substantially non-orthogonal to the longitudinal axis of the path and facing the source of the IR signal containing an interferogram. The aperture (72) passes an inner portion of the incident IR signal, while the reflective surface reflects an outer portion. The reflected outer portion of the incident IR signal, which contains erroneous spectral information due to inherent flaws in the interferometer optics, is thereby effectively removed from the original incident IR signal ultimately used to irradiate the sample, and yet still be made available for use in monitoring background spectra of the sampling optics.
Aspects of the present disclosure are directed to a mirror bearing for an interferometer. An example mirror bearing includes a stationary mounting member and a mobile mirror assembly configured for slidable movement relative to the mounting member along its longitudinal axis. The mounting member is configured for rigid attachment to an interferometer body. A bore extends through the mounting member along its longitudinal axis. A drive coil receiving area of the mounting member is configured to hold a drive coil coupled thereto. The mobile mirror assembly includes a tube configured to receive, at one end of the tube, an end of the mounting member. The mobile mirror assembly also includes a mirror coupled to the opposite end of the tube. A drive magnet is disposed within the tube and is configured to be received within the bore of the mounting member when the mirror bearing is in an assembled configuration.
G02B 7/182 - Mountings, adjusting means, or light-tight connections, for optical elements for prismsMountings, adjusting means, or light-tight connections, for optical elements for mirrors for mirrors
An apparatus (19) for providing a variable sized aperture for an imaging device includes a first plate (22) having a first plurality of plate apertures (24) extending therethrough and a second plate (30) having a second plurality of plate apertures (32) extending therethrough. A first motor (20) is operably connected to the first plate and a second motor (26) is operably connected to the second plate. The first and second motors are configured to move the first plate and the second plate with respect to one another so as to align any of the first plurality of plate apertures with any of the second plurality of plate apertures to define a plurality of light beam apertures.
An embodiment of a ruggedized interferometer is described that comprises a light source (210) that generates a beam of light; a fixed mirror (207); a moving mirror (205) that travels along a linear path; a beam splitter (215) that directs a first portion of the beam of light to the fixed mirror and a second portion of the beam of light to the moving mirror, wherein the beam splitter recombines the first portion reflected from the fixed mirror and the second portion reflected from the moving mirror; and a servo control (203) that applies a substantial degree of force to the moving mirror at initiation of a turnaround period, wherein the substantial degree of force is sufficient to redirect the moving mirror traveling at a high velocity to an opposite direction of travel on the linear path.
An embodiment of a calibration element for an analytical microscope is described that comprises a substantially non-periodic pattem of features that exhibit contrast when illuminated by a light beam.
A process of analyzing a sample by Raman spectroscopy and X-ray photoelectron spectroscopy (XPS) includes providing a sample having a sample surface within a vacuum chamber, performing a Raman spectroscopic analysis on a plurality of selected areas of the sample surface within the vacuum chamber to map an area of the sample surface comprising the selected areas, the Raman spectroscopic analysis including identifying one or more chemical and/or structural features of the sample surface in one or more of the selected areas of the sample surface, and performing an X-ray photoelectron spectroscopy (XPS) analysis of one or more selected areas of the sample surface containing at least one chemical and/or structural feature identified by the Raman spectroscopic analysis, wherein the duration of the XPS analysis of a given selected area of the sample surface is longer than the duration of the Raman spectroscopic analysis of that given selected area.
A charged particle filter includes a magnetic deflector having a bore (220) along an axis thereof passing through the magnetic deflector from a sample end to a detector end of the magnetic deflector, and through which bore charged particles pass when in use, the magnetic deflector being formed from two magnets (250, 260) positioned around the bore, with a gap (270) between the two magnets, the two magnets each having a linear central section (280, 281) and two ends (285, 286, 295, 296), each end forming a curved or slanted surface (at 285, 286, 295, 296), the curved surface having in some embodiments an aspect ratio defined by a height in a range of between one tenth and ten times the gap between the two magnets, and a width in a range of between one tenth and ten times the gap.
An image analysis system includes a video camera that collects YUV color images of a liquid sample disposed between a capital and a pedestal, the color images being collected while a light source shines light through an optical beam path between the capital and the pedestal, and a processor adapted to i) obtain from the YUV color images a grayscale component image and a light scatter component image, and ii) obtain at least one binary image of the grayscale component image and at least one binary image of the light scatter component image.
An apparatus (50) includes a first pedestal surface (13) coupled to a swing arm (54) and to a light source with a first optical fiber (18a). The apparatus further includes a magnet (1), a base plate (52), a mechanical stop (53) coupled to the base plate, and a second pedestal surface (15) mechanically coupled to said base plate and configured to receive a liquid sample, said second pedestal surface being coupled to a spectrometer with a second optical fiber (18b), and the distance between the two surfaces defining an optical path length for optical sample analysis. The apparatus further includes a magnetic flux sensor (10), e.g. a Hall sensor, located between north and south magnetic flux fields of the magnet such that the magnetic flux reaching the sensor while the mechanical stop is in physical contact with the swing arm provides a linear range of output of the magnetic flux sensor, and a processor adapted to calibrate the point for minimum optical path length using a threshold magnetic flux field emitted from the magnet and detected by the magnetic flux sensor.
G01D 5/00 - Mechanical means for transferring the output of a sensing memberMeans for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for convertingTransducers not specially adapted for a specific variable
G01N 21/31 - Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
A sample cell (100) includes a cell body (110) having a proximal end (120), a distal end (130), a circumference (140), and a sample holding surface (145) on the proximal end, an o-ring (160) around the circumference, a cap (170) disposed over the proximal end of the cell body, the cap forming a seal with the o-ring, and a window (180) in the cap located at an adjustable distance (185) from the sample holding surface.
The present invention is thus directed to an automated system (200) of varying the optical path length in a sample that a light from a spectrophotometer (9) must travel through. Such arrangements allow a user to easily vary the optical path length while also providing the user with an easy way to clean and prepare a transmission cell for optical interrogation. Such path length control can be automatically controlled by a programmable control system to quickly collect and stores data from different path lengths as needed for different spectrographic analysis. Moreover, the system utilizes configured wedge shaped windows (5, 5') to best minimize the reflections of light which cause periodic variation in transmission at different wave lengths (commonly described as "channel spectra"). Such a system, as presented herein, is able to return best-match spectra with far fewer computational steps and greater speed than if all possible combinations of reference spectra are considered.
An all-graphite interferometer bearing assembly is introduced that allows the movement of a movable mirror in a Michelson interferometer without degradation during use. The assembly includes a stationary hollow graphite tube and a movable assembly which includes a mirror and a monolithic graphite member slidably disposed within the bore of the graphite tube that is composed of the same grade of graphite material as the monolithic graphite member. The result is a robust novel moving mirror arrangement in a Michelson interferometer that enables precise mirror alignment control, a long stroke length, excellent vibration damping and reduced sensitivity to external vibrations.
The present invention is thus directed to an automated system and method of varying the optical path length in a sample that a light from a spectrophotometer must travel through. Such arrangements allow a user to easily vary the optical path length while also providing the user with an easy way to clean and prepare a transmission cell for optical interrogation. Such path length control can be automatically controlled by a programmable control system to quickly collect and stores data from different path lengths as needed for different spectrographic analysis. Such a methodology and system, as presented herein, is able to return best-match spectra with far fewer computational steps and greater speed than if all possible combinations of reference spectra are considered.
Coatings for optical devices, such as beamsplitters, are provided. The coatings include at least one bilayer of a layer of a material having an index of refraction n1 in contact with a layer of a material having an index of refraction n2 and an uppermost layer of a material having an index of refraction n3 over the bilayer, wherein n3 > n2 > n1. The bilayer(s) can be composed of BaF2 and KRS5. The uppermost layer can be composed of Ge. Certain coatings provide beamsplitters which exhibit highly efficient emission over broad spectral ranges.
B23K 26/067 - Dividing the beam into multiple beams, e.g. multi-focusing
B05D 5/06 - Processes for applying liquids or other fluent materials to surfaces to obtain special surface effects, finishes or structures to obtain multicolour or other optical effects
37.
SPECTROMETER WITH BUILT-IN ATR AND ACCESSORY COMPARTMENT
A spectrometer includes a light source, an interferometer, an accessory compartment, a sample analysis device, a first and a second optical element, and an actuator. The light source transmits light toward the interferometer which forms modulated light. The accessory compartment accepts a sample analysis accessory device and includes a first wall having a first light port. The sample analysis device performs attenuated total reflectance analysis of a sample and includes a crystal, a tip configured to press the sample against the crystal, and a detector configured to detect light after reflection within the crystal. The first optical element receives and reflects the modulated light toward the first light port. The actuator moves the second optical element between a first position wherein the second optical element receives the modulated light and reflects the modulated light toward the crystal and a second position wherein the second optical element does not receive the modulated light and allows the first optical element to receive the modulated light.
MCR (Multi-component regression) estimates pure component time- and/or spatial series spectra as extracted from infrared or other spectroscopy, which are capable of being compared to spectra in a reference library to find the best matches. The best match spectra can then each in turn be combined with the reference spectra, with the combinations also being screened for best matches versus any one of the estimated pure component time/space series spectra. These resulting best matches can then also undergo the foregoing combination and comparison steps. The process can repeat in this manner in an unbounded fashion if desired until an appropriate stopping point is reached, for example, when a desired number of best matches are identified, when some predetermined number of iterations has been performed, etc. This methodology is able to return best-match spectra with far fewer computational steps and greater speed than if all possible combinations of reference spectra are considered.
G01N 21/35 - Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
A novel emission and transmission optical spectrometer is introduced herein, which is capable of optically interrogating solid or liquid samples of organic, inorganic or polymeric chemistry, for pharmaceutical research, forensic and liquid analyses, used for identification, purity check, and/or structural study of chemicals. The beneficial aspects of the system are a single sample compartment as confined within the walls of the spectrometer housing, a more compact accessory, and the capability of making both emission (e.g., Raman and Fluorescence) and Infrared (IR, NIR) transmission measurements at designed sample points.
An optical device is provided that includes a converging lens device, a transmitting optical fiber, a sample holder, and a receiving optical fiber. The converging lens device focuses light onto the transmitting optical fiber, which receives the focused light through an entrance face and transmits the light from an exit face, through a sample, and onto the receiving optical fiber. The sample holder holds the sample for analysis. The receiving optical fiber receives the light through an entrance face of the receiving optical fiber after transmission through the sample. The converging lens device is positioned to focus the light onto the entrance face of the transmitting optical fiber such that a half-angle of the angular distribution of the focused light that reaches the entrance face of the transmitting optical fiber is selected to underfill an entrance aperture of the entrance face of the receiving optical fiber in both a spatial dimension and an angular dimension.
A novel arrangement of Schwarzschild Cassegrainian objective coupled with a far-field visible imaging system that does not interfere with the interrogating (IR) beam is introduced. Typical (IR) microscopes that incorporate a Cassegrainian objective have difficulty in locating desired target sample regions based on the inherent limited field-of-view. Because commonly applied visible imaging accessories upstream must use the same numerical aperture based on the reflective geometry, such systems also suffer a limited field of view. To overcome such difficulties, the novel embodiments herein involve placing a visible camera with its optical axis collinear with the IR and primary visible beampath of the microscope but outside the optical path that provides the (IR) image magnification.
The embodiments of the present invention are directed to addressing the complexity, sample geometry, and even pressure feedback issues associated with mechanical-only mechanisms. In particular, by utilizing one or more bellows capsules in an attenuated total internal reflection (ATR) instrument as a pressure vessel that can expand, contract, and tilt in all directions, the mechanisms disclosed herein can substantially apply uniform pressure to an interposed sample surface to include non-orthogonal sample surfaces, and thus conform to any sample geometry within such instruments. The result of the novel arrangements described herein is to provide a user with a convenient and simple interface for operating the interrogating ATR optical instrument.
A novel means of provided velocity control of an interferometer wherein one of the moving components includes the beamsplitter element is introduced herein. Using a moving beamsplitter and coupled flexure mounting allows improved velocity control because the low mass of the beamsplitter enables the systems disclosed herein to respond faster than conventional mirror velocity controlled interferometer instruments with a resultant lower velocity error so as to provide a more stable and lower noise spectra from the analytical instrument. The control of the velocity of the beamsplitter and if desired, one or both of the configured mirrors, reduces the time wasted changing velocity at the ends of each scan. The result is an increase in data collection available in any given experiment time frame. Such desirable arrangements of the present invention thus allow scans to be collected at higher rates, which beneficially increase the ability to monitor rapidly changing systems.
A novel soft beamsplitter mounting system as part of an interferometer to protect the beamsplitter substrate from external stresses and thus preserve optical flatness is introduced. The soft mounting system enables such protection by being more flexible that the beamspitter substrate so external forces deforms the mount rather than the beamsplitter. Although the soft beamsplitter mounting configurations disclosed herein protects the beamsplitter, the interferometer itself is less stable because the mounts of the present invention allows the beamspltter to tilt more easily than other components held in the interferometer. The improved tilt control embodiments of the present invention turns this seemingly deleterious effect into a cost saving benefit by using the inexpensive soft mounting system as a flexure to allow an improved active control system to maintain tilt alignment in a system that is more rugged than conventional interferometers.
A novel means of provided a hybrid flexure mounted moving mirror component in an interferometer is introduced herein. In particular, a linear bearing in combination with a novel flexure mounting having novel tilt and velocity control of the moving optical component is provided. Such an arrangement enables correction of the errors at the mirror itself while also solving the problem of isolating vibration and noise caused by the imperfections in the bearing surfaces used in many conventional interferometers. Using such a coupled flexure mounting of the present invention, in addition to the above benefits, also enhances velocity control because the resultant low mass of the moving mirror assembly enables the systems disclosed herein to respond faster than conventional mirror velocity controlled interferometer instruments and with a lower velocity error so as to provide a more stable and lower noise spectra from the analytical instrument.
A novel means of correcting the motion (17) of an analytical instrument (10) having a diffraction grating (16) is introduced herein based on the determination of the optimal theoretical parameters in the equation of grating angle versus a selected wavelength. Such a desirable correction method of the present invention not only reduces the amount of wavelength error at the calibration points but also in a novel fashion beneficially corrects for errors in a time - efficient manner between the calibration points to a greater degree than conventional calibration methods.
A novel software application method, as integrated with various scientific instalments, is introduced herein that allows new capabilities to be added to the language at runtime without, if desired, having to re-compile the application. As part of the -software capabilities, the macro programming language presented herein enables automated connection, between inputs and outputs of action statements within a script with visual feedback for configuration verification, As another aspect, the macro programming language of the present invention provides for automation of different spectroscopic applications which if desired, also allows for the automatic generation, of a configurable user interface connected to the intent of the macro.
An infrared (IR) source apparatus that includes a desired infrared source element coupled to an insulating housing so to minimize overall source inefficiency at desired optical bandwidths is introduced. The insulation itself is machined or configured in a way so that the infrared source element is in contact with a designed cavity in the insulation so that the IR source image becomes the average of the insulation material and the infrared element. Such an arrangement of the present invention increases the emissivity of the IR source below about 1500 wave numbers, more often, below about 1100 wave numbers, and even more particularly, at about 1079 wave numbers. Accordingly, the combined emissivity of the infrared source and the insulation substantially enhances spectral emission and eliminates or reduces spectral artifacts from the formation of oxides on the infrared source surfaces.
An X-ray spectroscope collects an energy-dispersive spectrum from a sample under analysis, and generates a list of candidate elements that may be present in the sample. A wavelength dispersive spectral collector is then tuned to obtain X-ray intensity measurements at the energies/wavelengths of some or all of the candidate elements, thereby verifying whether or not these candidate elements are in fact present in the sample. Additionally, the alignment of the wavelength dispersive spectral collector versus the sample can be optimized by tuning the wavelength dispersive spectral collector to the energy/wavelength of a selected one of the candidate elements — preferably one whose presence in the sample has been verified, or one which has a high likelihood of being present in the sample - and then varying the alignment of the wavelength dispersive spectral collector versus the sample until the wavelength dispersive spectral collector returns the maximum intensity reading for the selected candidate element. Intensity readings for the other candidate elements can then be collected at this optimized alignment.
G01N 23/223 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
G01N 23/225 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material using electron or ion microprobes
50.
EFFICIENT SPECTRAL MATCHING, PARTICULARLY FOR MULTICOMPONENT SPECTRA
An unknown spectrum obtained from infrared or other spectroscopy can be compared to spectra in a reference library to find the best matches. The best match spectra can then each in turn be combined with the reference spectra, with the combinations also being screened for best matches versus the unknown spectrum. These resulting best matches can then also undergo the foregoing combination and comparison steps. The process can repeat in this manner until an appropriate stopping point is reached, for example, when a desired number of best matches are identified, when some predetermined number of iterations has been performed, etc. This methodology is able to return best-match spectra (and combinations of spectra) with far fewer computational steps and greater speed than if all possible combinations of reference spectra are considered.
G01N 21/35 - Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
In an energy dispersive spectrometer wherein event (particle/photon) detection is performed by counting events spaced by greater than a shaping time, events which are spaced by less than the shaping time are also collected and counted. These 'combined events' are treated similarly to 'single events' which are spaced by greater than the shaping time, and can be used to generate combined-event spectra for comparison and/or use with the conventional single-event spectra. The combined-event spectra can be compared to the single-event spectra to provide an indication of data quality; can be subtracted from the single-event spectra to remove artifacts, and/or can be deconvolved into a single-event spectrum to increase the resolution of the single-event spectrum.
In an analytical instrument having a radiation detector, such as an electron microscope with an X-ray detector, a thermoelectric element (such as one or more Peltier junctions) is driven by a cooling power supply to cool the detector and thereby decrease measurement noise. Oil condensates and ice can then form on the detector owing to residual water vapor and vacuum pump oil in the analysis chamber, and these contaminants can interfere with measurement accuracy. To assist in reducing this problem, the thermoelectric element can be powered in the reverse of its cooling mode, thereby heating the detector and evaporating the contaminants. After the detector is cleared of contaminants, it may again be cooled and measurements may resume. Preferably, the thermoelectric element is heated by a power supply separate from the one that provides the cooling power, though it can also be possible to utilize a single power supply to provide both heating and cooling modes.
In a spectrometer, preferably in a spectrometric microscope, light from a specimen is collected at a collector objective element and delivered to a camera element, which in turn provides the light to a photosensitive detector. A focal plane is provided between the collector objective element and the camera element, and one or more aperture arrays may be situated in the focal plane to restrict the detector's field of view of the specimen to the areas within the apertures. By utilizing aperture arrays with apertures of different sizes and shapes, the spatial resolution of the spectrometer readings may be varied without the need to vary the optics of the spectrometer. As a result, if the optics are optimized to minimize vignetting, spatial resolution may be varied without adverse increases in vignetting.
In a spectroscopic microscope, a video image of a specimen is analyzed to identify regions having different appearances, and thus presumptively different properties. The sizes and locations of the identified regions are then used to position the specimen to align each region with an aperture, and to set the aperture to a size appropriate for collecting a spectrum from the region in question. The spectra can then be analyzed to identify the substances present within each region of the specimen. Information on the identified substances can then be presented to the user along with the image of the specimen.
In a spectrometer, preferably in a spectrometric microscope, input light is provided from a light source to a specimen via a source objective element (e.g., a Schwarzchild objective), and the aperture of the light source is matched to the aperture of the source objective element to maximize light throughput to the specimen. The light from the specimen is then collected at a collector objective element and delivered to a camera element, which in turn provides the light to a photosensitive detector. The apertures of the camera element and the collector objective element are also matched to maximize light throughput from the specimen to the detector. As a result, light loss from vignetting effects is reduced, improving the intensity and uniformity of illumination and the sensitivity and accuracy of spectral measurements.
G01J 3/10 - Arrangements of light sources specially adapted for spectrometry or colorimetry
G01N 21/35 - Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
56.
AUTOMATIC MATERIAL LABELING DURING SPECTRAL IMAGE DATA ACQUISITION
A system for performing spectral microanalysis delivers analysis results during the course of data collection As spectra are collected from pixels on a specimen, the system periodically analyzes the spectra to statistically derive underlying spectra representing proposed specimen components(A), wherein the derived spectra combine in varying proportions to result (at least approximately) in the measured spectra at each pixel Those pixels having the same dominant proposed component, and/or which contain at least approximately the same proportions of the proposed components, may then have their measured spectra combined (i e, added or averaged) (C, D) These spectra may then be cross-referenced via reference libraries to identify the components actually present(E) During the foregoing analysis, the measured spectra are preferably condensed, as by reducing the number of energy channels /intervals making up the measured spectra and/or by combining the measured spectra of adjacent pixels, to reduce the size of the data cube and expedite analysis results (G).
G01N 31/00 - Investigating or analysing non-biological materials by the use of the chemical methods specified in the subgroupsApparatus specially adapted for such methods
G06F 19/00 - Digital computing or data processing equipment or methods, specially adapted for specific applications (specially adapted for specific functions G06F 17/00;data processing systems or methods specially adapted for administrative, commercial, financial, managerial, supervisory or forecasting purposes G06Q;healthcare informatics G16H)
An X-ray detector using a semiconductor detector, most preferably a Silicon Drift Detector, utilizes a field effect transistor or other voltage-controlled resistance to generate an output voltage proportional to its input charge (which is generated by the X-ray photons incident on the semiconductor detector). To keep the charge (and thus the output voltage) to an acceptable range - one wherein the relationship between output voltage and input charge is substantially proportional - a feedback circuit is provided between the output and input terminals, wherein the charge on the input terminal is depleted when the output voltage begins leaving the desired range. Preferably, this is done by a comparator which monitors the output voltage, and provides a reset signal to the input terminal when it begins moving out of range. Alternatively or additionally, the reset signal may be a pulse supplied to the input terminal from a pulse generator activated by the comparator.
A confocal spectrometer provides astigmatic optics which supply a monochromator or spectrograph with the image of a sample, with the astigmatic optics thereby providing separate first and second (tangential and sagittal) focal planes for the image. The monochromator/spectrograph has an entrance slit (120) oriented along one of the focal planes, and this slit defines the spectral resolution of the monochromator/spectrograph and the field of view of the sample in one direction (in one focal plane). A supplemental slit (132) is situated outside the monochromator/spectrograph adjacent the entrance slit, with the supplemental slit being oriented along the other focal plane. The supplemental slit therefore defines the field of view of the sample in a perpendicular direction (in the other focal plane) By varying the width of the supplemental and/or entrance slits (132, 120), one may easily achieve the desired field of view.
A system is provided wherein spectrometer measurements, and/or measurements from other analytical instruments, are transmitted to a processing station which determines the component substances of the sample(s) subjected to the measurements. The names of the component substances are then inserted into database search queries related to matters such as handling precautions, causes/sources of the substances, remedies and neutralizing agents for the substances, regulations related to the substances, etc. The results of the search queries are then provided to the personnel who made the measurements, preferably wirelessly and almost immediately after the measurements were made. The system therefore provides nearly immediate guidance as to what substances are present and how to handle them, which can be useful for inexperienced personnel in hazardous response, contraband detection, industrial process control, and other situations.
THERMO ELECTRON SCIENTIFIC INSTRUMENTALS LLC (USA)
Inventor
Jiang, Eric
Deck, Francis, J.
Abstract
A spectrometer generates Vibrational Circular Dichroism (VCD) measurements having an exceedingly high signal-to-noise ratio, as well as a greater wavelength range over which measurements may be accurately provided. This is achieved by utilizing reflective optics (preferably solely reflective optics, i.e., no refractive elements) to supply a concentrated and collimated input light beam to a sample within a sample cell, and similarly collecting the light output from the sample cell via reflective optics for supply to a detector.
A spectrometer collects background spectra during the idle time in which it is not collecting spectra from a sample. These spectra are collected over a range of exposure times, allowing the background reading on each pixel to be modeled as a function of exposure time. When sample spectra are then collected, the exposure time for the sample spectra can be used with the modeled function to compute an estimated background within the sample spectra. The estimated background can then be subtracted from the sample spectra, thereby reducing the noise therein.
A spectrometer operator may specify a desired signal to noise ratio (SNR) to be attained when collecting spectra from a sample. The SNR from a single brief sample exposure is used to determine the maximum exposure time achievable without overloading the spectrometer. If the desired SNR is greater than the SNR of an exposure using the maximum exposure time, multiple exposures can be. taken at the maximum exposure time, and can be combined (e.g., averaged or summed) to obtain a spectrum having a SNR which at least approximates the one desired. If the desired SNR is less than the SNR of an exposure using the maximum exposure time, then only a single exposure is needed, and the exposure time can be scaled using the SNR from the single brief sample exposure to achieve a SNR which at least approximates the one desired.
A mixing bin for the blending of materials (e.g., pharmaceuticals, foodstuffs, etc.) bears a spectrometer which monitors the characteristics of the material being tumbled within the bin interior to thereby obtain an indication of the degree to which the material is mixed. An accelerometer also rides on the mixing bin with the spectrometer, and it monitors the position of the mixing bin as it rotates. The accelerometer measurements can then be used to trigger the taking and/or recordation of spectrometer measurements at times during which the material within the bin falls against the spectrometer's input window, thereby promoting greater accuracy in spectrometer measurements, and/or at the same bin position, thereby promoting greater uniformity between spectrometer measurements.
A spectroscopic microscope (100) includes a laser or other light source (172) which emits light from the entrance aperture (136) of it spectrograph (137), and also includes a light sensor (165) situated on the microscope sample stage (140) upon which a specimen is t situated for microscopic/spectrometric analysis. The sample stage (140) is positioned such that the signal from the light sensor (165) maximized, thereby indicating good alignment between the sample stage (140) and spectrograph (137). Additionally, the microscope sample stage (140) bears a light source (160) which can emit light to be detected by a light sensor (115) situated at the vantage point a user/viewer utilizing the microscope (100), and such a light sensor (115) can simply take the form of a video camera or other image recordation unit associated with the microscope (100). The sample stage (140) can also be positioned to optimize the signal at the lig sensor (115) to signify good alignment between the sample stage (140) and the microscope (100).
A monochromator for use in a spectrograph admits light from an aperture to a primary reflector (preferably an off-axis parabolic mirror) which collimates the input light with low aberration and directs it to a diffraction grating. The component wavelengths of the input light are then directed to first and second secondary reflectors (preferably spherical or toroidal mirrors), which are chosen to cooperatively focus the component wavelengths in ordered bands across an array detector while each at least substantially cancels the effects of any aberrations introduced by the other. By choosing optical elements which supply the grating with input light with low aberration, and then choosing optical elements which receive the component wavelengths from the grating and which offset any aberrations introduced by the other receiving optical elements, wavelength resolution at the detector can be enhanced.
Spectra obtained from spectrographic readings from a sample can be filtered for artifacts, e.g., distorted data points arising from cosmic ray interference, by subtracting one spectrum from another to obtain a difference spectrum; smoothing the difference spectrum; and then calculating the difference between the smoothed and unsmoothed difference spectra to obtain a noise spectrum. The resulting noise spectrum, which represents localized differences between the original spectra, can then be reviewed for readings which exceed the norm by some predetermined amount (e.g., readings which exceed the average level of the noise spectrum by some percentage). These excessive readings constitute distorted data points, and the corresponding points on the spectra can have their values adjusted to eliminate the excessive readings, thereby removing the artifacts.
An optical probe for use in infrared, near infrared, Raman, and other spectrometers includes a probe outer surface 200 with a cavity defined therein The probe emits light into a sample via emission locations 208 on the probe outer surface, at least one being in the cavity The light emitted into the sample is then located at collection locations 210, 212 which include at least two of (a) a reflectan collection location 210 located on the probe outer surface for collecting diffusely reflected light from any adjacent sample, (b) a transmittance collection location 212 situated in the cavity and receiving light transmitted across the cavity from an emission locatio situated on an opposite side of the cavity, and (c) a transflectance collection location 314 situated in the cavity and receiving transflected light emitted form an emission location in the cavity, with such light being reflected from a side of the cavity opposite the transflectance collection location.
A spectrometer (100) includes a light source (102) providing output light (106) to the bundled input ends (108) of multiple light pipes (110). The light pipes (110) branch into sets (118) between their input ends (108) and output ends (114), with each set (118) illuminating a sample detector (126) (via a sample chamber (122)) for measuring light scattered or emitted by a sample, or a reference detector (128) for obtaining a reference/datum measurement of the supplied light, so that comparison of measurements from the sample detector (126) and the reference detector (128) allows compensation of the sample detector measurements for drift. Efficient and accurate measurement is further assured by arraying the multiple light pipes (110) in each set (118) about the input bundle (116) so that each set receives at least substantially the same amount of light from the light source (102).
G03H 1/02 - Holographic processes or apparatus using light, infrared, or ultraviolet waves for obtaining holograms or for obtaining an image from themDetails peculiar thereto Details
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