Thermo Electron Scientific Instruments LLC

United States of America

Back to Profile

1-6 of 6 for Thermo Electron Scientific Instruments LLC Sort by
Query
Patent
Canada - CIPO
Excluding Subsidiaries
Aggregations Reset Report
Date
2024 1
Before 2021 5
IPC Class
G01J 3/42 - Absorption spectrometryDouble-beam spectrometryFlicker spectrometryReflection spectrometry 3
G01J 3/02 - SpectrometrySpectrophotometryMonochromatorsMeasuring colours Details 2
G01J 3/10 - Arrangements of light sources specially adapted for spectrometry or colorimetry 2
G01N 21/03 - Cuvette constructions 2
G01D 5/00 - Mechanical means for transferring the output of a sensing memberMeans for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for convertingTransducers not specially adapted for a specific variable 1
See more
Status
Pending 2
Registered / In Force 4
Found results for  patents

1.

NANO AND MICROSCALE PATTERNED SURFACES FOR CENTERING A DROPLET

      
Document Number 03274677
Status Pending
Filing Date 2023-12-07
Open to Public Date 2024-06-13
Owner THERMO ELECTRON SCIENTIFIC INSTRUMENTS LLC (USA)
Inventor
  • Robinson, Margaret E.
  • Ashmead, Damian W.

IPC Classes  ?

  • G01J 3/02 - SpectrometrySpectrophotometryMonochromatorsMeasuring colours Details
  • G01J 3/10 - Arrangements of light sources specially adapted for spectrometry or colorimetry
  • G01J 3/42 - Absorption spectrometryDouble-beam spectrometryFlicker spectrometryReflection spectrometry
  • G01N 21/01 - Arrangements or apparatus for facilitating the optical investigation
  • H01J 49/04 - Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locksArrangements for external adjustment of electron- or ion-optical components

2.

MIRROR ALIGNMENT IN OPTICAL SCIENTIFIC INSTRUMENTS

      
Document Number 03087232
Status In Force
Filing Date 2018-12-28
Open to Public Date 2019-07-04
Grant Date 2023-01-03
Owner THERMO ELECTRON SCIENTIFIC INSTRUMENTS LLC (USA)
Inventor Coffin, John Magie

Abstract

A mirror assembly has one or more axes of motion and includes a mirror that is movable and forms an acute angle with a plane orthogonal to its axis of motion. The mirror assembly may include a first reflective mirror surface in the incoming optical path that is movable and forms an acute angle with a plane orthogonal to its axis of motion, and a second reflective mirror surface in the outgoing optical path that is movable and forms an acute angle with a plane orthogonal to its axis of motion and is moveable in a linear translation to scan the mirror in the interferometer in a way to generate a normal interferogram.

IPC Classes  ?

  • G02B 7/182 - Mountings, adjusting means, or light-tight connections, for optical elements for prismsMountings, adjusting means, or light-tight connections, for optical elements for mirrors for mirrors
  • G02B 7/198 - Mountings, adjusting means, or light-tight connections, for optical elements for prismsMountings, adjusting means, or light-tight connections, for optical elements for mirrors for mirrors with means for adjusting the mirror relative to its support
  • G02B 26/10 - Scanning systems

3.

PATH LENGTH CALIBRATION SYSTEM AND METHOD

      
Document Number 02995730
Status In Force
Filing Date 2016-08-25
Open to Public Date 2017-03-23
Grant Date 2024-04-02
Owner THERMO ELECTRON SCIENTIFIC INSTRUMENTS LLC (USA)
Inventor
  • Ashmead, Damian W.
  • Howard, James V.
  • Kim, Kevin K.
  • Braasch, Andrew Martin

Abstract


An apparatus includes a first pedestal surface coupled to i) a swing arm and
to ii) a light
source. The apparatus further includes a magnet, a base plate, a mechanical
stop coupled to
the base plate, and a second pedestal surface mechanically coupled to said
base plate and
configured to receive a liquid sample, said second pedestal surface being
coupled to a
spectrometer. The apparatus further includes a magnetic flux sensor located
between north
and south magnetic flux fields of the magnet such that the magnetic flux
reaching the sensor
while the mechanical stop is in physical contact with the swing arm provides a
linear range
of output of the magnetic flux sensor, and a processor adapted to calibrate
the point for
minimum optical path length using a threshold magnetic flux field emitted from
the magnet
and detected by the magnetic flux sensor.

IPC Classes  ?

  • G01D 5/00 - Mechanical means for transferring the output of a sensing memberMeans for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for convertingTransducers not specially adapted for a specific variable
  • G01N 21/03 - Cuvette constructions
  • G01N 21/31 - Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry

4.

IMAGE ANALYSIS SYSTEM AND METHOD

      
Document Number 02995732
Status Pending
Filing Date 2016-08-29
Open to Public Date 2017-03-23
Owner THERMO ELECTRON SCIENTIFIC INSTRUMENTS LLC (USA)
Inventor
  • Grenov, Alexander
  • Ashmead, Damian W.
  • Kim, Kevin K.
  • Deck, Francis J.
  • Kauffold, Chris Xavier

Abstract

An image analysis system includes a video camera that collects YUV color images of a liquid sample disposed between a capital and a pedestal, the color images being collected while a light source shines light through an optical beam path between the capital and the pedestal, and a processor adapted to i) obtain from the YUV color images a grayscale component image and a light scatter component image, and ii) obtain at least one binary image of the grayscale component image and at least one binary image of the light scatter component image.

IPC Classes  ?

  • G01N 21/03 - Cuvette constructions
  • G01N 21/25 - ColourSpectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
  • G01N 21/51 - Scattering, i.e. diffuse reflection within a body or fluid inside a container, e.g. in an ampoule

5.

OPTICAL SPECTROMETER WITH UNDERFILLED FIBER OPTIC SAMPLE INTERFACE

      
Document Number 02840940
Status In Force
Filing Date 2012-05-31
Open to Public Date 2013-01-17
Grant Date 2016-04-26
Owner THERMO ELECTRON SCIENTIFIC INSTRUMENTS LLC (USA)
Inventor
  • Ashmead, Damian W.
  • Deck, Francis J.

Abstract

An optical device is provided that includes a converging lens device, a transmitting optical fiber, a sample holder, and a receiving optical fiber. The converging lens device focuses light onto the transmitting optical fiber, which receives the focused light through an entrance face and transmits the light from an exit face, through a sample, and onto the receiving optical fiber. The sample holder holds the sample for analysis. The receiving optical fiber receives the light through an entrance face of the receiving optical fiber after transmission through the sample. The converging lens device is positioned to focus the light onto the entrance face of the transmitting optical fiber such that a half-angle of the angular distribution of the focused light that reaches the entrance face of the transmitting optical fiber is selected to underfill an entrance aperture of the entrance face of the receiving optical fiber in both a spatial dimension and an angular dimension.

IPC Classes  ?

  • G01J 3/02 - SpectrometrySpectrophotometryMonochromatorsMeasuring colours Details
  • G01J 3/10 - Arrangements of light sources specially adapted for spectrometry or colorimetry
  • G01J 3/42 - Absorption spectrometryDouble-beam spectrometryFlicker spectrometryReflection spectrometry
  • G01N 21/47 - Scattering, i.e. diffuse reflection

6.

SPECTROMETER FOR ANALYSIS OF MULTIPLE SAMPLES

      
Document Number 02622996
Status In Force
Filing Date 2006-10-10
Open to Public Date 2007-04-26
Grant Date 2012-07-17
Owner THERMO ELECTRON SCIENTIFIC INSTRUMENTS LLC (USA)
Inventor
  • Ebersole, Matthew D.
  • Iverson, John R.

Abstract

A spectrometer (100) includes a light source (102) providing output light (106) to the bundled input ends (108) of multiple light pipes (110). The light pipes (110) branch into sets (118) between their input ends (108) and output ends (114), with each set (118) illuminating a sample detector (126) (via a sample chamber (122)) for measuring light scattered or emitted by a sample, or a reference detector (128) for obtaining a reference/datum measurement of the supplied light, so that comparison of measurements from the sample detector (126) and the reference detector (128) allows compensation of the sample detector measurements for drift. Efficient and accurate measurement is further assured by arraying the multiple light pipes (110) in each set (118) about the input bundle (116) so that each set receives at least substantially the same amount of light from the light source (102).

IPC Classes  ?

  • G01J 3/42 - Absorption spectrometryDouble-beam spectrometryFlicker spectrometryReflection spectrometry