- All sections
- H - Electricity
- H01J - Electric discharge tubes or discharge lamps
- H01J 37/256 - Tubes for spot-analysing by electron or ion beamsMicroanalysers using scanning beams
Patent holdings for IPC class H01J 37/256
Total number of patents in this class: 72
10-year publication summary
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0
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3
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4
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1
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3
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4
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1
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1
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1
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2
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| 2016 | 2017 | 2018 | 2019 | 2020 | 2021 | 2022 | 2023 | 2024 | 2025 |
Principal owners for this class
| Owner |
All patents
|
This class
|
|---|---|---|
| FEI Company | 944 |
10 |
| Hitachi High-Tech Corporation | 5297 |
10 |
| Bruker Nano GmbH | 65 |
4 |
| Axcelis Technologies, Inc. | 408 |
3 |
| KLA-Tencor Corporation | 2544 |
3 |
| University of Connecticut | 842 |
3 |
| Centre National de La Recherche Scientifique | 10418 |
2 |
| Fibics Incorporated | 26 |
2 |
| Gatan, Inc. | 105 |
2 |
| Hitachi, Ltd. | 15467 |
1 |
| Applied Materials, Inc. | 18565 |
1 |
| Varian Semiconductor Equipment Associates, Inc. | 1231 |
1 |
| Applied Materials Israel, Ltd. | 614 |
1 |
| Massachusetts Institute of Technology | 10041 |
1 |
| President and Fellows of Harvard College | 5972 |
1 |
| Carl Zeiss SMT GmbH | 2973 |
1 |
| Arkema Inc. | 1060 |
1 |
| Carl Zeiss NTS GmbH | 31 |
1 |
| Carl Zeiss NTS, LLC | 27 |
1 |
| Delmic B.V. | 12 |
1 |
| Other owners | 22 |