- All sections
- G - Physics
- G01Q - Scanning-probe techniques or apparatusapplications of scanning-probe techniques, e.g. scanning-probe microscopy [spm]
- G01Q 20/00 - Monitoring the movement or position of the probe
Patent holdings for IPC class G01Q 20/00
Total number of patents in this class: 88
10-year publication summary
|
12
|
8
|
10
|
1
|
3
|
5
|
1
|
3
|
4
|
0
|
| 2017 | 2018 | 2019 | 2020 | 2021 | 2022 | 2023 | 2024 | 2025 | 2026 |
Principal owners for this class
| Owner |
All patents
|
This class
|
|---|---|---|
| Bruker Nano, Inc. | 354 |
13 |
| Infinitesima Limited | 69 |
4 |
| Nederlandse Organisatie voor Toegepast-natuurwetenschappelijk Onderzoek TNO | 2393 |
4 |
| Shimadzu Corporation | 6252 |
3 |
| General Electric Company | 13791 |
2 |
| National University Corporation Kanazawa University | 248 |
2 |
| Park Systems Corp. | 35 |
2 |
| The Penn State Research Foundation | 1564 |
2 |
| SensApex Oy | 14 |
2 |
| UT-Battelle, LLC | 1479 |
2 |
| Zyvex Labs, LLC | 16 |
2 |
| Paris Sciences et Lettres - Quartier Latin | 218 |
2 |
| Sorbonne Universite | 1341 |
2 |
| Nearfield Instruments B.V. | 53 |
2 |
| Innovatum Instruments Inc. | 3 |
2 |
| Hitachi High-Tech Analysis Corporation | 285 |
2 |
| The Regents of the University of California | 20315 |
1 |
| International Business Machines Corporation | 61840 |
1 |
| Centre National de La Recherche Scientifique | 10726 |
1 |
| Hitachi High-Tech Science Corporation | 50 |
1 |
| Other owners | 36 |