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  • All sections
  • G - Physics
  • G01Q - Scanning-probe techniques or apparatusapplications of scanning-probe techniques, e.g. scanning-probe microscopy [spm]
  • G01Q 20/00 - Monitoring the movement or position of the probe

Patent holdings for IPC class G01Q 20/00

Total number of patents in this class: 86

10-year publication summary

12
12
8
11
1
3
5
1
3
2
2016 2017 2018 2019 2020 2021 2022 2023 2024 2025

Principal owners for this class

Owner
All patents
This class
Bruker Nano, Inc.
337
13
Infinitesima Limited
66
4
Nederlandse Organisatie voor Toegepast-natuurwetenschappelijk Onderzoek TNO
2367
4
Hitachi High-Tech Science Corporation
324
3
General Electric Company
13829
2
Shimadzu Corporation
6132
2
National University Corporation Kanazawa University
246
2
Park Systems Corp.
33
2
The Penn State Research Foundation
1505
2
SensApex Oy
14
2
UT-Battelle, LLC
1447
2
Zyvex Labs, LLC
17
2
Paris Sciences et Lettres - Quartier Latin
208
2
Sorbonne Universite
1250
2
Innovatum Instruments Inc.
3
2
The Regents of the University of California
19812
1
International Business Machines Corporation
61023
1
Centre National de La Recherche Scientifique
10321
1
Koninklijke Philips Electronics N.V.
10018
1
Caterpillar Inc.
9472
1
Other owners 35

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