- All sections
- G - Physics
- G01N - Investigating or analysing materials by determining their chemical or physical properties
- G01N 23/18 - Investigating the presence of defects or foreign matter
Patent holdings for IPC class G01N 23/18
Total number of patents in this class: 706
10-year publication summary
|
28
|
47
|
50
|
54
|
56
|
59
|
78
|
100
|
68
|
64
|
| 2016 | 2017 | 2018 | 2019 | 2020 | 2021 | 2022 | 2023 | 2024 | 2025 |
Principal owners for this class
| Owner |
All patents
|
This class
|
|---|---|---|
| Ishida Co., Ltd. | 536 |
40 |
| FUJIFILM Corporation | 29702 |
37 |
| Hamamatsu Photonics K.K. | 4461 |
14 |
| Toray Industries, Inc. | 7002 |
12 |
| Anritsu Corporation | 411 |
12 |
| Yxlon International GmbH | 47 |
12 |
| The Boeing Company | 20139 |
10 |
| Bruker Nano, Inc. | 347 |
10 |
| Job Corporation | 31 |
10 |
| System Square Inc. | 30 |
10 |
| Tracerco Limited | 90 |
10 |
| Tsinghua University | 5969 |
9 |
| Nuctech Company Limited | 1424 |
9 |
| Illinois Tool Works Inc. | 11519 |
8 |
| KLA Corporation | 1616 |
8 |
| Topgolf Callaway Brands Corp. | 2062 |
8 |
| AIX Scan, Inc. | 10 |
8 |
| Hitachi High-Tech Science Corporation | 285 |
7 |
| Varex Imaging Corporation | 306 |
7 |
| Xavis Co., Ltd. | 22 |
7 |
| Other owners | 458 |