- All sections
- G - Physics
- G01N - Investigating or analysing materials by determining their chemical or physical properties
- G01N 21/88 - Investigating the presence of flaws, defects or contamination
Patent holdings for IPC class G01N 21/88
Total number of patents in this class: 6929
10-year publication summary
|
473
|
517
|
606
|
621
|
621
|
618
|
567
|
615
|
679
|
46
|
| 2017 | 2018 | 2019 | 2020 | 2021 | 2022 | 2023 | 2024 | 2025 | 2026 |
Principal owners for this class
| Owner |
All patents
|
This class
|
|---|---|---|
| KLA-Tencor Corporation | 2527 |
275 |
| KLA Corporation | 1702 |
275 |
| LG Energy Solution, Ltd. | 16343 |
101 |
| FUJIFILM Corporation | 29976 |
95 |
| Hitachi High-Tech Corporation | 5528 |
87 |
| Samsung Electronics Co., Ltd. | 150361 |
86 |
| Omron Corporation | 7326 |
79 |
| ASML Netherlands B.V. | 7629 |
71 |
| The Boeing Company | 20080 |
68 |
| Panasonic Intellectual Property Management Co., Ltd. | 32753 |
64 |
| NEC Corporation | 36393 |
58 |
| Contemporary Amperex Technology Co., Limited | 8148 |
55 |
| Koh Young Technology Inc. | 351 |
51 |
| Taiwan Semiconductor Manufacturing Company, Ltd. | 46375 |
49 |
| Applied Materials, Inc. | 19474 |
46 |
| Boe Technology Group Co., Ltd. | 42179 |
42 |
| Canon Inc. | 41390 |
41 |
| Applied Materials Israel, Ltd. | 633 |
41 |
| Samsung Display Co., Ltd. | 36881 |
40 |
| Tokyo Electron Limited | 13266 |
39 |
| Other owners | 5266 |