- All sections
- G - Physics
- G01B - Measuring length, thickness or similar linear dimensionsmeasuring anglesmeasuring areasmeasuring irregularities of surfaces or contours
- G01B 5/28 - Measuring arrangements characterised by the use of mechanical techniques for measuring roughness or irregularity of surfaces
Patent holdings for IPC class G01B 5/28
Total number of patents in this class: 448
10-year publication summary
|
30
|
29
|
27
|
35
|
28
|
12
|
15
|
12
|
14
|
6
|
| 2016 | 2017 | 2018 | 2019 | 2020 | 2021 | 2022 | 2023 | 2024 | 2025 |
Principal owners for this class
| Owner |
All patents
|
This class
|
|---|---|---|
| Mitutoyo Corporation | 1250 |
36 |
| Tokyo Seimitsu Co., Ltd. | 339 |
18 |
| The Boeing Company | 20053 |
15 |
| Bruker Nano, Inc. | 339 |
14 |
| Carl Zeiss Industrielle Messtechnik GmbH | 440 |
6 |
| Carl Mahr Holding GmbH | 109 |
5 |
| JENOPTIK Industrial Metrology Germany GmbH | 14 |
5 |
| Renishaw plc | 763 |
5 |
| NEC Corporation | 35687 |
4 |
| Hitachi, Ltd. | 15495 |
4 |
| Agc, Inc. | 4845 |
4 |
| The Regents of the University of California | 19929 |
3 |
| Sumitomo Electric Industries, Ltd. | 15495 |
3 |
| Commissariat à l'énergie atomique et aux energies alternatives | 10912 |
3 |
| Boe Technology Group Co., Ltd. | 41217 |
3 |
| Acellent Technologies, Inc. | 35 |
3 |
| Fisher Controls International LLC | 1476 |
3 |
| Frito-Lay North America, Inc. | 1325 |
3 |
| Hysitron, Inc. | 35 |
3 |
| KLA-Tencor Corporation | 2544 |
3 |
| Other owners | 305 |