- All sections
- G - Physics
- G01B - Measuring length, thickness or similar linear dimensionsmeasuring anglesmeasuring areasmeasuring irregularities of surfaces or contours
- G01B 15/02 - Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness
Patent holdings for IPC class G01B 15/02
Total number of patents in this class: 459
10-year publication summary
31
|
33
|
36
|
42
|
44
|
41
|
35
|
31
|
30
|
14
|
2016 | 2017 | 2018 | 2019 | 2020 | 2021 | 2022 | 2023 | 2024 | 2025 |
Principal owners for this class
Owner |
All patents
|
This class
|
---|---|---|
Nova Measuring Instruments Inc. | 70 |
17 |
PaneraTech, Inc. | 33 |
15 |
FUJIFILM Corporation | 29305 |
11 |
Schlumberger Technology Corporation | 10673 |
8 |
Pioneer Corporation | 4377 |
8 |
Kabushiki Kaisha Toshiba, doing business as Toshiba Corporation | 6270 |
8 |
KLA Corporation | 1532 |
8 |
Applied Materials Israel, Ltd. | 611 |
7 |
Commissariat à l'énergie atomique et aux energies alternatives | 10924 |
7 |
Rigaku Corporation | 434 |
7 |
Yokogawa Electric Corporation | 1739 |
7 |
Samsung Electronics Co., Ltd. | 145416 |
6 |
Honeywell International Inc. | 13525 |
6 |
Toshiba Infrastructure Systems & Solutions Corporation | 1058 |
6 |
Sharp Kabushiki Kaisha | 18775 |
6 |
Hitachi High-Tech Corporation | 5282 |
6 |
Topgolf Callaway Brands Corp. | 2043 |
6 |
Halliburton Energy Services, Inc. | 20862 |
5 |
Hitachi High-Technologies Corporation | 2004 |
5 |
KLA-Tencor Corporation | 2545 |
5 |
Other owners | 305 |